of particle spectrometer type

Industry

CPC
H01J41/10

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas Discharge tubes for evacuation by diffusion of ions

Current Industry

H01J41/10of particle spectrometer type

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Chamber for an ionization vacuum gauge
- Patent number 12,154,771
- Issue date Nov 26, 2024
- INFICON AG
- Urs Wälchli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzer
- Patent number 8,296,090
- Issue date Oct 23, 2012
- Horiba Stec, Co., Ltd.
- Junji Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry unit
- Patent number 8,138,473
- Issue date Mar 20, 2012
- Ulvac, Inc.
- Toyoaki Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,582,885
- Issue date Sep 1, 2009
- Hitachi High-Technologies Corp.
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole mass spectrometer and vacuum device using the same
- Patent number 7,332,714
- Issue date Feb 19, 2008
- Vaclab Inc.
- Fumio Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact ion gauge using micromachining and MISOC devices
- Patent number 7,057,170
- Issue date Jun 6, 2006
- Northrop Grumman Corporation
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization vacuum gauge
- Patent number 7,049,823
- Issue date May 23, 2006
- Varian S.p.A.
- Raffaele Correale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,198,105
- Issue date Mar 6, 2001
- Helix Technology Corporation
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,046,456
- Issue date Apr 4, 2000
- Helix Technology Corporation
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,025,723
- Issue date Feb 15, 2000
- Granville-Phillips Company
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for linearization of ion currents in a quadrupole mass analyzer
- Patent number 5,889,281
- Issue date Mar 30, 1999
- Leybold Inficon, Inc.
- David H. Holkeboer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion collecting electrode for total pressure collector
- Patent number 5,834,770
- Issue date Nov 10, 1998
- Leybold Inficon, Inc.
- David H. Holkeboer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual ion source
- Patent number 5,808,308
- Issue date Sep 15, 1998
- Leybold Inficon Inc.
- David H. Holkeboer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of operating quadrupole mass spectrometers...
- Patent number 4,535,236
- Issue date Aug 13, 1985
- VG Instruments Group Limited
- Jonathan H. Batey
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHAMBER FOR AN IONIZATION VACUUM GAUGE
- Publication number 20240194465
- Publication date Jun 13, 2024
- INFICON AG
- Urs WÄLCHLI
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY UNIT
- Publication number 20100213363
- Publication date Aug 26, 2010
- ULVAC, Inc.
- Toyoaki Nakajima
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZER
- Publication number 20100076712
- Publication date Mar 25, 2010
- HORIBA STEC, CO., LTD.
- Junji Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Method of Using the Same
- Publication number 20090090854
- Publication date Apr 9, 2009
- ULVAC, INC.
- Toyoaki Nakajima
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20060231773
- Publication date Oct 19, 2006
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quadrupole mass spectrometer and vacuum device using the same
- Publication number 20060226355
- Publication date Oct 12, 2006
- Fumio Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact ion gauge using micromachining and MISOC devices
- Publication number 20050199805
- Publication date Sep 15, 2005
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionisation vacuum gauge
- Publication number 20050028602
- Publication date Feb 10, 2005
- Raffaele Correale
- B82 - NANO-TECHNOLOGY

of particle spectrometer type

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chamber for an ionization vacuum gauge

Gas analyzer

Mass spectrometry unit

Charged particle beam apparatus

Quadrupole mass spectrometer and vacuum device using the same

Compact ion gauge using micromachining and MISOC devices

Ionization vacuum gauge

Miniature ionization gauge utilizing multiple ion collectors

Miniature ionization gauge utilizing multiple ion collectors

Miniature ionization gauge utilizing multiple ion collectors

Method for linearization of ion currents in a quadrupole mass analyzer

Ion collecting electrode for total pressure collector

Dual ion source

Apparatus for and method of operating quadrupole mass spectrometers...

Patents Applicationslast 30 patents

CHAMBER FOR AN IONIZATION VACUUM GAUGE

MASS SPECTROMETRY UNIT

GAS ANALYZER

Mass Spectrometer and Method of Using the Same

Charged particle beam apparatus

Quadrupole mass spectrometer and vacuum device using the same

Compact ion gauge using micromachining and MISOC devices

Ionisation vacuum gauge