of timing

Industry

CPC
G11C29/50012

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/50012of timing

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Non-volatile memory octo mode program and erase operation method wi...
- Patent number 12,243,609
- Issue date Mar 4, 2025
- SK keyfoundry Inc.
- Weon-Hwa Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor chip and sequence checking circuit
- Patent number 12,224,028
- Issue date Feb 11, 2025
- Global Unichip Corporation
- Shih-Cheng Kao
- G11 - INFORMATION STORAGE
Information Patent Grant
TSV check circuit with replica path
- Patent number 12,224,275
- Issue date Feb 11, 2025
- Micron Technology, Inc.
- Harutaka Makabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for supporting command bus training mode and method o...
- Patent number 12,217,823
- Issue date Feb 4, 2025
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Timing-drift calibration
- Patent number 12,094,553
- Issue date Sep 17, 2024
- RAMBUS INC.
- Yohan U. Frans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for adjusting margin, circuit for adjusting margin and memory
- Patent number 12,033,685
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Biao Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power signaling interface
- Patent number 11,996,160
- Issue date May 28, 2024
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
DDR SDRAM signal calibration device and method
- Patent number 11,978,497
- Issue date May 7, 2024
- Realtek Semiconductor Corporation
- Kuo-Wei Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for duty cycle adjustment of a semiconducto...
- Patent number 11,955,977
- Issue date Apr 9, 2024
- Dean D. Gans
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for tuning an external memory interface
- Patent number 11,935,613
- Issue date Mar 19, 2024
- Texas Instruments Incorporated
- Zachary John Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for optimizing semiconductor device placement on a substrat...
- Patent number 11,929,139
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Delay fault testing of pseudo static controls
- Patent number 11,768,726
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Aravinda Acharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor for performance variation of memory read and write character...
- Patent number 11,742,051
- Issue date Aug 29, 2023
- ARM Limited
- Amit Chhabra
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method of testing memory device and non-transitory compu...
- Patent number 11,735,283
- Issue date Aug 22, 2023
- NANYA TECHNOLOGY CORPORATION
- Po-Hsun Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for supporting command bus training mode and method o...
- Patent number 11,715,504
- Issue date Aug 1, 2023
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for self-test mode abort circuit
- Patent number 11,705,214
- Issue date Jul 18, 2023
- Micron Technologv. Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-adaptive read voltage adjustment using boundary error statisti...
- Patent number 11,688,485
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Tingjun Xie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Drift tracking feedback for communication channels
- Patent number 11,669,124
- Issue date Jun 6, 2023
- RAMBUS INC.
- Scott C Best
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing signal calibration for a memory device
- Patent number 11,651,814
- Issue date May 16, 2023
- Micron Technology, Inc.
- Jaeil Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and semiconductor memory system including the test cir...
- Patent number 11,538,549
- Issue date Dec 27, 2022
- SK hynix Inc.
- Jong Seok Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory sub-system self-testing operations
- Patent number 11,514,995
- Issue date Nov 29, 2022
- Micron Technology, Inc.
- Nathan A. Eckel
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for detecting margin of circuit operating at certain speed
- Patent number 11,488,683
- Issue date Nov 1, 2022
- Realtek Semiconductor Corporation
- Chun-Yi Kuo
- G11 - INFORMATION STORAGE
Information Patent Grant
Mission mode Vmin prediction and calibration
- Patent number 11,462,294
- Issue date Oct 4, 2022
- Advanced Micro Devices, Inc.
- Ashish Jain
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous signaling interface with over-clocked timing reference
- Patent number 11,450,356
- Issue date Sep 20, 2022
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system and management method of characteristic information o...
- Patent number 11,424,004
- Issue date Aug 23, 2022
- Kioxia Corporation
- Junji Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-adaptive read voltage adjustment using directional error stati...
- Patent number 11,410,743
- Issue date Aug 9, 2022
- Micron Technology, Inc.
- Tingjun Xie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system and data transmission method
- Patent number 11,410,712
- Issue date Aug 9, 2022
- LONGITUDE LICENSING LIMITED
- Yoshinori Matsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Preemptive read refresh in memories with time-varying error rates
- Patent number 11,404,141
- Issue date Aug 2, 2022
- Micron Technology, Inc.
- Tingjun Xie
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TIMING-DRIFT CALIBRATION
- Publication number 20250054561
- Publication date Feb 13, 2025
- Rambus Inc.
- Yohan U. Frans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS
- Publication number 20240296875
- Publication date Sep 5, 2024
- NVIDIA Corporation
- Jason Golbus
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE
- Publication number 20240233855
- Publication date Jul 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Zachary John BROWN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM
- Publication number 20240203519
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Giuseppe La Rosa
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20240177743
- Publication date May 30, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND MEMORY MODULE HAVING VARIOUS OPERAT...
- Publication number 20240096404
- Publication date Mar 21, 2024
- Samsung Electronics Co., Ltd.
- GUNHEE CHO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT
- Publication number 20240055067
- Publication date Feb 15, 2024
- Global Unichip Corporation
- Shih-Cheng KAO
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES
- Publication number 20240055068
- Publication date Feb 15, 2024
- Rambus Inc.
- Srinivas Satish Babu Bamdhamravuri
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...
- Publication number 20230317128
- Publication date Oct 5, 2023
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD OF TESTING MEMORY DEVICE AND NON-TRANSITORY COMPU...
- Publication number 20230187006
- Publication date Jun 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Po-Hsun CHANG
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY OCTO MODE PROGRAM AND ERASE OPERATION METHOD WI...
- Publication number 20230087413
- Publication date Mar 23, 2023
- KEY FOUNDRY CO., LTD.
- Weon-Hwa JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20230068666
- Publication date Mar 2, 2023
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND DATA TRANSMISSION METHOD
- Publication number 20230018344
- Publication date Jan 19, 2023
- Longitude Licensing Limited
- Yoshinori Matsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL DETECTION SYSTEM AND MEMORY DETECTION METHOD
- Publication number 20230012586
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jianyong QIN
- G11 - INFORMATION STORAGE
Information Patent Application
DRIFT TRACKING FEEDBACK FOR COMMUNICATION CHANNELS
- Publication number 20220300030
- Publication date Sep 22, 2022
- Rambus Inc.
- Scott C. Best
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20220283219
- Publication date Sep 8, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
TIMING-DRIFT CALIBRATION
- Publication number 20220223224
- Publication date Jul 14, 2022
- Rambus Inc.
- Yohan U. Frans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MISSION MODE VMIN PREDICTION AND CALIBRATION
- Publication number 20220189576
- Publication date Jun 16, 2022
- ADVANCED MICRO DEVICES, INC.
- Ashish Jain
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR DUTY CYCLE ADJUSTMENT OF A SEMICONDUCTO...
- Publication number 20220149828
- Publication date May 12, 2022
- Micron Technology, Inc.
- Dean D. Gans
- G11 - INFORMATION STORAGE
Information Patent Application
TIMING SIGNAL CALIBRATION FOR A MEMORY DEVICE
- Publication number 20220115054
- Publication date Apr 14, 2022
- Micron Technology, Inc.
- Jaeil Kim
- G11 - INFORMATION STORAGE
Information Patent Application
DELAY FAULT TESTING OF PSEUDO STATIC CONTROLS
- Publication number 20220091919
- Publication date Mar 24, 2022
- TEXAS INSTRUMENTS INCORPORATED
- ARAVINDA ACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT AND SEMICONDUCTOR MEMORY SYSTEM INCLUDING THE TEST CIR...
- Publication number 20220076775
- Publication date Mar 10, 2022
- SK HYNIX INC.
- Jong Seok JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM AND TEST METHOD
- Publication number 20220076768
- Publication date Mar 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- YiFei PAN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...
- Publication number 20220059148
- Publication date Feb 24, 2022
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Device for detecting margin of circuit operating at certain speed
- Publication number 20220036962
- Publication date Feb 3, 2022
- REALTEK SEMICONDUCTOR CORPORATION
- CHUN-YI KUO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMORY SYSTEM AND MANAGEMENT METHOD OF CHARACTERISTIC INFORMATION O...
- Publication number 20220005543
- Publication date Jan 6, 2022
- KIOXIA Corporation
- Junji MORI
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-ADAPTIVE READ VOLTAGE ADJUSTMENT USING BOUNDARY ERROR STATISTI...
- Publication number 20210358561
- Publication date Nov 18, 2021
- Micron Technology, Inc.
- Tingjun Xie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sensor for Performance Variation of Memory Read and Write Character...
- Publication number 20210343359
- Publication date Nov 4, 2021
- ARM Limited
- Amit Chhabra
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR SELF-TEST MODE ABORT CIRCUIT
- Publication number 20210304835
- Publication date Sep 30, 2021
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Non-volatile memory octo mode program and erase operation method wi...

Semiconductor chip and sequence checking circuit

TSV check circuit with replica path

Memory device for supporting command bus training mode and method o...

Methods and apparatus for testing inaccessible interface circuits i...

Timing-drift calibration

Method for adjusting margin, circuit for adjusting margin and memory

Low power signaling interface

DDR SDRAM signal calibration device and method

Apparatuses and methods for duty cycle adjustment of a semiconducto...

Method for tuning an external memory interface

Methods for optimizing semiconductor device placement on a substrat...

Delay fault testing of pseudo static controls

Sensor for performance variation of memory read and write character...

System and method of testing memory device and non-transitory compu...

Memory device for supporting command bus training mode and method o...

Apparatuses and methods for self-test mode abort circuit

Self-adaptive read voltage adjustment using boundary error statisti...

Drift tracking feedback for communication channels

Timing signal calibration for a memory device

Memory controller with integrated test circuitry

Test circuit and semiconductor memory system including the test cir...

Memory sub-system self-testing operations

Device for detecting margin of circuit operating at certain speed

Mission mode Vmin prediction and calibration

Synchronous signaling interface with over-clocked timing reference

Memory system and management method of characteristic information o...

Self-adaptive read voltage adjustment using directional error stati...

Memory system and data transmission method

Preemptive read refresh in memories with time-varying error rates

Patents Applicationslast 30 patents

TIMING-DRIFT CALIBRATION

MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS

METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE

TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

SEMICONDUCTOR MEMORY DEVICE AND MEMORY MODULE HAVING VARIOUS OPERAT...

SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT

SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES

MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

SYSTEM AND METHOD OF TESTING MEMORY DEVICE AND NON-TRANSITORY COMPU...

NON-VOLATILE MEMORY OCTO MODE PROGRAM AND ERASE OPERATION METHOD WI...

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

MEMORY SYSTEM AND DATA TRANSMISSION METHOD

SIGNAL DETECTION SYSTEM AND MEMORY DETECTION METHOD

DRIFT TRACKING FEEDBACK FOR COMMUNICATION CHANNELS

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

TIMING-DRIFT CALIBRATION

MISSION MODE VMIN PREDICTION AND CALIBRATION

APPARATUSES AND METHODS FOR DUTY CYCLE ADJUSTMENT OF A SEMICONDUCTO...

TIMING SIGNAL CALIBRATION FOR A MEMORY DEVICE

DELAY FAULT TESTING OF PSEUDO STATIC CONTROLS

TEST CIRCUIT AND SEMICONDUCTOR MEMORY SYSTEM INCLUDING THE TEST CIR...

TEST SYSTEM AND TEST METHOD

MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...

Device for detecting margin of circuit operating at certain speed

MEMORY SYSTEM AND MANAGEMENT METHOD OF CHARACTERISTIC INFORMATION O...

SELF-ADAPTIVE READ VOLTAGE ADJUSTMENT USING BOUNDARY ERROR STATISTI...

Sensor for Performance Variation of Memory Read and Write Character...

APPARATUSES AND METHODS FOR SELF-TEST MODE ABORT CIRCUIT