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G01J2009/0253

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2009/0253of wavelength

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Patents Grantslast 30 patents

Information Patent Grant
Interferometer with at least one dispersive element
- Patent number 11,988,562
- Issue date May 21, 2024
- SYSTEMS & TECHNOLOGY RESEARCH, LLC
- Scott Bloom
- G01 - MEASURING TESTING
Information Patent Grant
Coherent light detection system and method
- Patent number 11,047,742
- Issue date Jun 29, 2021
- The Boeing Company
- Thomas G. Chrien
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analysing an electromagnetic wave in high def...
- Patent number 11,029,214
- Issue date Jun 8, 2021
- PHASICS
- Benoît Wattellier
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength shifting in spectrally-controlled interferometry
- Patent number 10,816,408
- Issue date Oct 27, 2020
- APRE INSTRUMENTS, LLC
- Chase Salsbury
- G01 - MEASURING TESTING
Information Patent Grant
Radius-of-curvature measurement by spectrally-controlled interferom...
- Patent number 10,746,537
- Issue date Aug 18, 2020
- APRE INSTRUMENTS, INC.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment based on spectrally-controlled interferometry
- Patent number 10,422,700
- Issue date Sep 24, 2019
- APRE INSTRUMENTS, INC.
- Artur Olszak
- G01 - MEASURING TESTING
Information Patent Grant
Closed-loop interferometric sensor using loop gain for determining...
- Patent number 10,302,411
- Issue date May 28, 2019
- ABB Schweiz AG
- Xun Gu
- G01 - MEASURING TESTING
Information Patent Grant
Spatial-domain low-coherence quantitative phase microscopy
- Patent number 10,156,479
- Issue date Dec 18, 2018
- University of Pittsburgh of the Commonwealth System of Higher Education
- Yang Liu
- G02 - OPTICS
Information Patent Grant
Method and apparatus for high resolution monitoring of optical signals
- Patent number 6,687,009
- Issue date Feb 3, 2004
- Nortel Networks Limited
- Rongqing Hui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for high resolution monitoring of optical signals
- Patent number 6,493,088
- Issue date Dec 10, 2002
- Nortel Networks Limited
- Rongqing Hui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital pulse counting method for measuring the optical path differ...
- Patent number 5,066,128
- Issue date Nov 19, 1991
- Canadian Marconi Co.
- Zhuo-Jun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for two-wavelength interferometry with optical...
- Patent number 4,907,886
- Issue date Mar 13, 1990
- Wild Heerburgg, AG
- Rene Dandliker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENT
- Publication number 20220326086
- Publication date Oct 13, 2022
- Systems & Technology Research, LLC
- Scott Bloom
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER
- Publication number 20220276098
- Publication date Sep 1, 2022
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
COHERENT LIGHT DETECTION SYSTEM AND METHOD
- Publication number 20210148764
- Publication date May 20, 2021
- The Boeing Company
- THOMAS G. CHRIEN
- G01 - MEASURING TESTING
Information Patent Application
System for Measuring Optical Phase of a Specimen Using Defocused Im...
- Publication number 20200249095
- Publication date Aug 6, 2020
- WAVEFRONT ANALYSIS INC
- Thomas D. Milster
- G01 - MEASURING TESTING
Information Patent Application
RADIUS-OF-CURVATURE MEASUREMENT BY SPECTRALLY-CONTROLLED INTERFEROM...
- Publication number 20180306575
- Publication date Oct 25, 2018
- APRE INSTRUMENTS, LLC
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL-DOMAIN LOW-COHERENCE QUANTITATIVE PHASE MICROSCOPY
- Publication number 20150204728
- Publication date Jul 23, 2015
- University of Pittsburgh of the Commonwealth System of Higher Education
- Yang Liu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for high resolution monitoring of optical signals
- Publication number 20030025912
- Publication date Feb 6, 2003
- Rongqing Hui
- G01 - MEASURING TESTING

of wavelength

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Interferometer with at least one dispersive element

Coherent light detection system and method

Method and device for analysing an electromagnetic wave in high def...

Wavelength shifting in spectrally-controlled interferometry

Radius-of-curvature measurement by spectrally-controlled interferom...

Optical alignment based on spectrally-controlled interferometry

Closed-loop interferometric sensor using loop gain for determining...

Spatial-domain low-coherence quantitative phase microscopy

Method and apparatus for high resolution monitoring of optical signals

Method and apparatus for high resolution monitoring of optical signals

Digital pulse counting method for measuring the optical path differ...

Method and apparatus for two-wavelength interferometry with optical...

Patents Applicationslast 30 patents

INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENT

LASER INTERFEROMETER

COHERENT LIGHT DETECTION SYSTEM AND METHOD

System for Measuring Optical Phase of a Specimen Using Defocused Im...

RADIUS-OF-CURVATURE MEASUREMENT BY SPECTRALLY-CONTROLLED INTERFEROM...

SPATIAL-DOMAIN LOW-COHERENCE QUANTITATIVE PHASE MICROSCOPY

Method and apparatus for high resolution monitoring of optical signals