On wafer testing

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CPC
H01S5/0042

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HELECTRICITY H01Electric elements H01SDEVICES USING STIMULATED EMISSION H01S5/00Semiconductor lasers

Current Industry

H01S5/0042On wafer testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Wafer level analysis for VCSEL screening
- Patent number 12,224,550
- Issue date Feb 11, 2025
- Mellanox Technologies, Ltd.
- Tali Septon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array device manufacturing method, manufacturing apparatus, and sto...
- Patent number 12,107,382
- Issue date Oct 1, 2024
- Sumitomo Electric Industries, Ltd.
- Ryosuke Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VCSEL binning for optical interconnects
- Patent number 11,955,778
- Issue date Apr 9, 2024
- Mellanox Technologies, Ltd.
- Tali Septon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified emitter array
- Patent number 11,916,356
- Issue date Feb 27, 2024
- Lumentum Operations LLC
- Vincent V. Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon photonics light source
- Patent number 11,728,614
- Issue date Aug 15, 2023
- MARVELL ASIA PTE. LTD.
- Xiaoguang He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature control for bottom emitting wafer-level vertical cavity...
- Patent number 11,698,411
- Issue date Jul 11, 2023
- Lumentum Operations LLC
- Eric R. Hegblom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrow sized laser diode
- Patent number 11,664,643
- Issue date May 30, 2023
- KYOCERA SLD Laser, Inc.
- James W. Raring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VCSEL array layout
- Patent number 11,594,860
- Issue date Feb 28, 2023
- II-VI DELAWARE, INC.
- André Bisig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical-cavity surface-emitting laser fabrication on large wafer
- Patent number 11,588,299
- Issue date Feb 21, 2023
- Mellanox Technologies, Ltd.
- Vladimir Iakovlev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method of reflection spectrum of vertical cavity surfac...
- Patent number 11,482,830
- Issue date Oct 25, 2022
- Visual Photonics Epitaxy Co., Ltd.
- Chao-Hsing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source for integrated silicon photonics
- Patent number 11,444,429
- Issue date Sep 13, 2022
- MARVELL ASIA PTE. LTD.
- Xiaoguang He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature control for bottom-emitting wafer-level vertical cavity...
- Patent number 11,340,290
- Issue date May 24, 2022
- Lumentum Operations LLC
- Eric R. Hegblom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low cost optical package
- Patent number 11,336,077
- Issue date May 17, 2022
- Vixar, Inc.
- William Hogan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrow sized laser diode
- Patent number 11,217,966
- Issue date Jan 4, 2022
- KYOCERA SLD Laser, Inc.
- James W. Raring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser integration into a silicon photonics platform
- Patent number 11,133,645
- Issue date Sep 28, 2021
- Cisco Technology, Inc.
- Jock T. Bovington
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor laser wafer and semiconductor laser
- Patent number 11,114,821
- Issue date Sep 7, 2021
- Kabushiki Kaisha Toshiba
- Kei Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source for integrated silicon photonics
- Patent number 10,951,003
- Issue date Mar 16, 2021
- INPHI CORPORATION
- Xiaoguang He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-mount laser apparatus and output optical power monitoring m...
- Patent number 10,923,877
- Issue date Feb 16, 2021
- Huawei Technologies Co., Ltd.
- Kaisheng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor laser device and method of produc...
- Patent number 10,554,010
- Issue date Feb 4, 2020
- Sumitomo Electric Industries, Ltd.
- Yukihiro Tsuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increasing accuracy in the wavelength of semiconductor lasers
- Patent number 10,522,975
- Issue date Dec 31, 2019
- Mellanox Technologies Silicon Photonics Inc.
- Albert Michael Benzoni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrow sized laser diode
- Patent number 10,490,980
- Issue date Nov 26, 2019
- Soraa Laser Diode, Inc.
- James W. Raring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating surface-emitting laser
- Patent number 10,416,227
- Issue date Sep 17, 2019
- Sumitomo Electric Industries, Ltd.
- Ryosuke Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light emitting device
- Patent number 10,381,802
- Issue date Aug 13, 2019
- PHILIPS PHOTONICS GMBH
- Stephan Gronenborn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface emitting laser element and atomic oscillator
- Patent number 10,170,887
- Issue date Jan 1, 2019
- Ricoh Company, Ltd.
- Ryoichiro Suzuki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High reliability etched-facet photonic devices
- Patent number 10,103,517
- Issue date Oct 16, 2018
- MACOM Technology Solutions Holdings, Inc.
- Alex A. Behfar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High reliability etched-facet photonic devices
- Patent number 10,103,518
- Issue date Oct 16, 2018
- MACOM Technology Solutions Holdings, Inc.
- Alex A. Behfar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge-emitting etched-facet lasers
- Patent number 10,044,168
- Issue date Aug 7, 2018
- MACON TECHNOLOGY SOLUTIONS HOLDINGS, INC.
- Alex A. Behfar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge-emitting etched-facet lasers
- Patent number 10,038,298
- Issue date Jul 31, 2018
- MACOM Technology Solutions Holdings, Inc.
- Alex A. Behfar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low cost optical package
- Patent number 9,991,673
- Issue date Jun 5, 2018
- Vixar, Inc.
- William Hogan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge-emitting etched-facet lasers
- Patent number 9,893,488
- Issue date Feb 13, 2018
- MACOM Technology Solutions Holdings, Inc.
- Alex A. Behfar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER FABRICATION
- Publication number 20240356300
- Publication date Oct 24, 2024
- ams Sensors Asia Pte. Ltd.
- Baiming GUO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON PHOTONICS LIGHT SOURCE
- Publication number 20220407285
- Publication date Dec 22, 2022
- Marvell Asia Pte Ltd.
- Xiaoguang HE
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL FOR BOTTOM EMITTING WAFER-LEVEL VERTICAL CAVITY...
- Publication number 20220283220
- Publication date Sep 8, 2022
- Lumentum Operations LLC
- Eric R. HEGBLOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL ANALYSIS FOR VCSEL SCREENING
- Publication number 20220239056
- Publication date Jul 28, 2022
- Mellanox Technologies TLV Ltd.
- Tali Septon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY DEVICE MANUFACTURING METHOD, MANUFACTURING APPARATUS, AND STO...
- Publication number 20220115833
- Publication date Apr 14, 2022
- Sumitomo Electric Industries, Ltd.
- Ryosuke KUBOTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE-EMITTING LASER MEASURING METHOD, MANUFACTURING METHOD, MEAS...
- Publication number 20220069548
- Publication date Mar 3, 2022
- Sumitomo Electric Industries, Ltd.
- Ryosuke KUBOTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL-CAVITY SURFACE-EMITTING LASER FABRICATION ON LARGE WAFER
- Publication number 20210313770
- Publication date Oct 7, 2021
- MELLANOX TECHNOLOGIES, LTD.
- Vladimir Iakovlev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT SOURCE FOR INTEGRATED SILICON PHOTONICS
- Publication number 20210265805
- Publication date Aug 26, 2021
- INPHI CORPORATION
- Xiaoguang HE
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD OF REFLECTION SPECTRUM OF VERTICAL CAVITY SURFAC...
- Publication number 20210075185
- Publication date Mar 11, 2021
- VISUAL PHOTONICS EPITAXY CO., LTD.
- Chao-Hsing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TESTING DEVICE OF FLIP CHIP VCSEL
- Publication number 20210013693
- Publication date Jan 14, 2021
- Ben-Mou YU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PRODUCING SEMICONDUCTOR LASER DEVICE AND METHOD OF PRODUC...
- Publication number 20180331491
- Publication date Nov 15, 2018
- Sumitomo Electric Industries, Ltd.
- Yukihiro TSUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW COST OPTICAL PACKAGE
- Publication number 20180269649
- Publication date Sep 20, 2018
- Vixar Inc.
- William Hogan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDGE-EMITTING ETCHED-FACET LASERS
- Publication number 20180109070
- Publication date Apr 19, 2018
- MACOM Technology Solutions Holdings, Inc.
- Alex A. BEHFAR
- G01 - MEASURING TESTING
Information Patent Application
EDGE-EMITTING ETCHED-FACET LASERS
- Publication number 20180090907
- Publication date Mar 29, 2018
- MACOM Technology Solutions Holdings, Inc.
- Alex A. BEHFAR
- G01 - MEASURING TESTING
Information Patent Application
High-efficiency vertical emitters with improved heat sinking
- Publication number 20160336717
- Publication date Nov 17, 2016
- Apple Inc.
- Chin Han Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL CAVITY SURFACE EMITTING LASER ARRAY AND METHOD FOR MANUFAC...
- Publication number 20160156157
- Publication date Jun 2, 2016
- Murata Manufacturing Co., Ltd.
- Ippei MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL CAVITY SURFACE EMITTING LASER ARRAY
- Publication number 20160141839
- Publication date May 19, 2016
- Murata Manufacturing Co., Ltd.
- Ippei MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VCSEL Packaging
- Publication number 20150069113
- Publication date Mar 12, 2015
- Princeton Optronics Inc.
- Qing Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES
- Publication number 20140286370
- Publication date Sep 25, 2014
- BinOptics Corporation
- Alex A. BEHFAR
- G02 - OPTICS
Information Patent Application
HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES
- Publication number 20140287544
- Publication date Sep 25, 2014
- BinOptics Corporation
- Alex A. BEHFAR
- G02 - OPTICS
Information Patent Application
HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES
- Publication number 20140287545
- Publication date Sep 25, 2014
- BinOptics Corporation
- Alex A. BEHFAR
- G02 - OPTICS
Information Patent Application
HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES
- Publication number 20140286368
- Publication date Sep 25, 2014
- BinOptics Corporation
- Alex A. BEHFAR
- G02 - OPTICS
Information Patent Application
LOW COST OPTICAL PACKAGE
- Publication number 20140160751
- Publication date Jun 12, 2014
- Vixar Inc.
- William Hogan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-YIELD HIGH-PRECISION DISTRIBUTED FEEDBACK LASER BASED ON AN ARRAY
- Publication number 20140140363
- Publication date May 22, 2014
- Santur Corporation
- Bardia Pezeshki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING OPTICAL MODULATOR, AND OPTICAL MODULATOR
- Publication number 20140087493
- Publication date Mar 27, 2014
- Mitsubishi Electric Corporation
- Kimitaka Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE-EMITTING LASER ELEMENT, ATOMIC OSCILLATOR, AND SURFACE-EMIT...
- Publication number 20130335155
- Publication date Dec 19, 2013
- RICOH COMPANY LTD.
- Shunichi Sato
- B82 - NANO-TECHNOLOGY
Information Patent Application
EDGE-EMITTING ETCHED-FACET LASERS
- Publication number 20130156059
- Publication date Jun 20, 2013
- BinOptics Corporation
- Alex A. BEHFAR
- G01 - MEASURING TESTING
Information Patent Application
LASER CHARACTERIZATION SYSTEM AND PROCESS
- Publication number 20120268743
- Publication date Oct 25, 2012
- Yin Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PERFORMING BURN-IN TEST
- Publication number 20120269047
- Publication date Oct 25, 2012
- TDK Corporation
- Koji Shimazawa
- G01 - MEASURING TESTING
Information Patent Application
AlGaInN-Based Lasers Produced Using Etched Facet Technology
- Publication number 20120149141
- Publication date Jun 14, 2012
- ALEX A. BEHFAR
- B82 - NANO-TECHNOLOGY

On wafer testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wafer level analysis for VCSEL screening

Array device manufacturing method, manufacturing apparatus, and sto...

VCSEL binning for optical interconnects

Modified emitter array

Silicon photonics light source

Temperature control for bottom emitting wafer-level vertical cavity...

Narrow sized laser diode

VCSEL array layout

Vertical-cavity surface-emitting laser fabrication on large wafer

Measurement method of reflection spectrum of vertical cavity surfac...

Light source for integrated silicon photonics

Temperature control for bottom-emitting wafer-level vertical cavity...

Low cost optical package

Narrow sized laser diode

Laser integration into a silicon photonics platform

Semiconductor laser wafer and semiconductor laser

Light source for integrated silicon photonics

Surface-mount laser apparatus and output optical power monitoring m...

Method of producing semiconductor laser device and method of produc...

Increasing accuracy in the wavelength of semiconductor lasers

Narrow sized laser diode

Method of fabricating surface-emitting laser

Light emitting device

Surface emitting laser element and atomic oscillator

High reliability etched-facet photonic devices

High reliability etched-facet photonic devices

Edge-emitting etched-facet lasers

Edge-emitting etched-facet lasers

Low cost optical package

Edge-emitting etched-facet lasers

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER FABRICATION

SILICON PHOTONICS LIGHT SOURCE

TEMPERATURE CONTROL FOR BOTTOM EMITTING WAFER-LEVEL VERTICAL CAVITY...

WAFER LEVEL ANALYSIS FOR VCSEL SCREENING

ARRAY DEVICE MANUFACTURING METHOD, MANUFACTURING APPARATUS, AND STO...

SURFACE-EMITTING LASER MEASURING METHOD, MANUFACTURING METHOD, MEAS...

VERTICAL-CAVITY SURFACE-EMITTING LASER FABRICATION ON LARGE WAFER

LIGHT SOURCE FOR INTEGRATED SILICON PHOTONICS

MEASUREMENT METHOD OF REFLECTION SPECTRUM OF VERTICAL CAVITY SURFAC...

WAFER TESTING DEVICE OF FLIP CHIP VCSEL

METHOD OF PRODUCING SEMICONDUCTOR LASER DEVICE AND METHOD OF PRODUC...

LOW COST OPTICAL PACKAGE

EDGE-EMITTING ETCHED-FACET LASERS

EDGE-EMITTING ETCHED-FACET LASERS

High-efficiency vertical emitters with improved heat sinking

VERTICAL CAVITY SURFACE EMITTING LASER ARRAY AND METHOD FOR MANUFAC...

VERTICAL CAVITY SURFACE EMITTING LASER ARRAY

VCSEL Packaging

HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES

HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES

HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES

HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES

LOW COST OPTICAL PACKAGE

HIGH-YIELD HIGH-PRECISION DISTRIBUTED FEEDBACK LASER BASED ON AN ARRAY

METHOD OF MANUFACTURING OPTICAL MODULATOR, AND OPTICAL MODULATOR

SURFACE-EMITTING LASER ELEMENT, ATOMIC OSCILLATOR, AND SURFACE-EMIT...

EDGE-EMITTING ETCHED-FACET LASERS

LASER CHARACTERIZATION SYSTEM AND PROCESS

METHOD FOR PERFORMING BURN-IN TEST

AlGaInN-Based Lasers Produced Using Etched Facet Technology