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Bimetal operated indicator
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Patent number 4,169,381
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Issue date Oct 2, 1979
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VDO Adolf Schindling AG
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Arthur Skopil
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G01 - MEASURING TESTING
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Radiation detector
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Patent number 3,931,573
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Issue date Jan 6, 1976
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General Microwave Corporation
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Samuel Hopfer
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G01 - MEASURING TESTING
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2625132
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Patent number 2,625,132
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Issue date Jan 13, 1953
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G01 - MEASURING TESTING
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2615085
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Patent number 2,615,085
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Issue date Oct 21, 1952
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G01 - MEASURING TESTING
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2520897
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Patent number 2,520,897
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Issue date Aug 29, 1950
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G01 - MEASURING TESTING
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2520899
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Patent number 2,520,899
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Issue date Aug 29, 1950
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G01 - MEASURING TESTING
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2520898
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Patent number 2,520,898
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Issue date Aug 29, 1950
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G01 - MEASURING TESTING