Optical discs

Industry

CPC
G01N21/9506

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/9506Optical discs

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optical disc device and recording and reproduction device
- Patent number 12,014,761
- Issue date Jun 18, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yuuichi Kuze
- G11 - INFORMATION STORAGE
Information Patent Grant
Dark-field optical inspection device
- Patent number 11,965,834
- Issue date Apr 23, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece holder for utilization in metrology system for measuring...
- Patent number 11,635,291
- Issue date Apr 25, 2023
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of spherical surfaces
- Patent number 11,047,675
- Issue date Jun 29, 2021
- Valerie Peidous
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods using interference in light reflected from ar...
- Patent number 10,388,320
- Issue date Aug 20, 2019
- Seagate Technology LLC
- Joachim Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Features maps of articles with polarized light
- Patent number 10,152,998
- Issue date Dec 11, 2018
- Seagate Technology LLC
- David M. Tung
- G11 - INFORMATION STORAGE
Information Patent Grant
Photon emitter array including photon emitters with different orien...
- Patent number 9,869,639
- Issue date Jan 16, 2018
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Reflective surfaces for surface features of an article
- Patent number 9,863,876
- Issue date Jan 9, 2018
- Seagate Technology LLC
- Joachim W. Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Classification of surface features using fluoresence
- Patent number 9,810,633
- Issue date Nov 7, 2017
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Photon emitter array
- Patent number 9,581,554
- Issue date Feb 28, 2017
- Seagate Technology LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Surface features mapping
- Patent number 9,488,593
- Issue date Nov 8, 2016
- Seagate Technology LLC
- Joachim W. Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Reflective surfaces for surface features of an article
- Patent number 9,217,714
- Issue date Dec 22, 2015
- Seagate Technology LLC
- Joachim W. Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Surface features mapping
- Patent number 9,036,142
- Issue date May 19, 2015
- Seagate Technology LLC
- Joachim W. Ahner
- G01 - MEASURING TESTING
Information Patent Grant
Luminous flux branching element and mask defect inspection apparatus
- Patent number 8,767,200
- Issue date Jul 1, 2014
- Nuflare Technology, Inc.
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Object holding apparatus, and inspection apparatus
- Patent number 8,686,383
- Issue date Apr 1, 2014
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Grant
Optical surface defect inspection apparatus and optical surface def...
- Patent number 8,547,547
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Shintaro Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Process for enhancing dye polymer recording yields by pre-scanning...
- Patent number 8,472,020
- Issue date Jun 25, 2013
- Cinram Group, Inc.
- Thomas I. Sweeney
- G11 - INFORMATION STORAGE
Information Patent Grant
Disk surface inspection apparatus, inspection system thereof, and i...
- Patent number 8,253,935
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Substrate holding apparatus, and inspection or processing apparatus
- Patent number 8,183,549
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a pattern shape
- Patent number 8,040,772
- Issue date Oct 18, 2011
- Hitachi High-Technologies Corporation
- Keiya Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical recording using a waveguide structure and a phase change me...
- Patent number 8,009,545
- Issue date Aug 30, 2011
- Seagate Technology LLC
- Dorothea Buechel
- G11 - INFORMATION STORAGE
Information Patent Grant
Substrate holding apparatus, and inspection or processing apparatus
- Patent number 7,999,242
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting defect of optical disc
- Patent number 7,983,128
- Issue date Jul 19, 2011
- Sunplus Technology Co., Ltd.
- Ching-Chuan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Particulate determination method
- Patent number 7,974,790
- Issue date Jul 5, 2011
- Panasonic Corporation
- Junji Tada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects on a disk surface
- Patent number 7,898,652
- Issue date Mar 1, 2011
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Optical discs for measuring analytes
- Patent number 7,889,615
- Issue date Feb 15, 2011
- Vindur Technologies, Inc.
- Mark O. Worthington
- G01 - MEASURING TESTING
Information Patent Grant
Optical disc drive, optical storage medium, optical storage medium...
- Patent number 7,869,326
- Issue date Jan 11, 2011
- Panasonic Corporation
- Shin-ichi Kadowaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for using imperfections and irregularities in...
- Patent number 7,804,079
- Issue date Sep 28, 2010
- Uniloc USA, Inc.
- Ric B. Richardson
- G11 - INFORMATION STORAGE
Information Patent Grant
Edge inspection apparatus
- Patent number 7,800,748
- Issue date Sep 21, 2010
- Nikon Corporation
- Naoshi Sakaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Substrate holding apparatus, and inspection or processing apparatus
- Patent number 7,723,709
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL DISC DEVICE AND RECORDING AND REPRODUCTION DEVICE
- Publication number 20240021214
- Publication date Jan 18, 2024
- Yuuichi KUZE
- G11 - INFORMATION STORAGE
Information Patent Application
DARK-FIELD OPTICAL INSPECTING DEVICE
- Publication number 20210349037
- Publication date Nov 11, 2021
- Unity Semiconductor
- Mayeul DURAND DE GEVIGNEY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF SPHERICAL SURFACES
- Publication number 20200378755
- Publication date Dec 3, 2020
- Valerie Peidous
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE
- Publication number 20160169802
- Publication date Jun 16, 2016
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE EDGE INSPECTION
- Publication number 20140354980
- Publication date Dec 4, 2014
- SEAGATE TECHNOLOGY LLC
- David M. Tung
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE
- Publication number 20140160481
- Publication date Jun 12, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim W. Ahner
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE
- Publication number 20140098364
- Publication date Apr 10, 2014
- SEAGATE TECHNOLOGY LLC
- Joachim Walter Ahner
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTING APPARATUS HAVING DOUBLE RECIPE PROCESSING FUNCTION
- Publication number 20140043603
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Yu YANAKA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FEATURES MAPPING
- Publication number 20130301040
- Publication date Nov 14, 2013
- SEAGATE TECHNOLOGY LLC
- Joachim W. Ahner
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20130286386
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Shigeru SERIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE INSPECTION METHOD AND DISK SURFACE INSPECTION DEVICE
- Publication number 20130258328
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Nobuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
LUMINOUS FLUX BRANCHING ELEMENT AND MASK DEFECT INSPECTION APPARATUS
- Publication number 20130176559
- Publication date Jul 11, 2013
- NuFlare Technology, Inc.
- Riki OGAWA
- G02 - OPTICS
Information Patent Application
SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS
- Publication number 20120205850
- Publication date Aug 16, 2012
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
Method for Inspection and Detection of Defects on Surfaces of Disc-...
- Publication number 20120163698
- Publication date Jun 28, 2012
- KLA-TENCOR MIE GMBH
- Detlef Michelsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sheet Wafer Defect Mitigation
- Publication number 20120131766
- Publication date May 31, 2012
- Max Era, Inc.
- Leo van Glabbeek
- C30 - CRYSTAL GROWTH
Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20120075625
- Publication date Mar 29, 2012
- Shintaro TAMURA
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS
- Publication number 20110260080
- Publication date Oct 27, 2011
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISC DRIVE, OPTICAL STORAGE MEDIUM, OPTICAL STORAGE MEDIUM...
- Publication number 20110085430
- Publication date Apr 14, 2011
- Shin-ichi Kadowaki
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND I...
- Publication number 20100201975
- Publication date Aug 12, 2010
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS
- Publication number 20100196127
- Publication date Aug 5, 2010
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE FOR CHARACTERIZING MATERIALS USED FOR OPTICAL STORAGE
- Publication number 20100091625
- Publication date Apr 15, 2010
- COMMISSARIAT A L'ENERGIE ATOMIQUE
- Salim MIMOUNI
- G01 - MEASURING TESTING
Information Patent Application
Optical Recording Using a Waveguide Structure and a Phase Change Me...
- Publication number 20100008208
- Publication date Jan 14, 2010
- Seagate Technology LLC
- Dorothea Buechel
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISCS FOR MEASURING ANALYTES
- Publication number 20090316547
- Publication date Dec 24, 2009
- Mark O. Worthington
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
OPTICAL DISC DRIVE, OPTICAL STORAGE MEDIUM, OPTICAL STORAGE MEDIUM...
- Publication number 20090279405
- Publication date Nov 12, 2009
- Shin-ichi Kadowaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A PATTERN SHAPE
- Publication number 20090262621
- Publication date Oct 22, 2009
- Keiya SAITO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISC ASSEMBLIES FOR PERFORMING ASSAYS
- Publication number 20090231980
- Publication date Sep 17, 2009
- Vindur Technologies, Inc.
- Mark Oscar Worthington
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DISK INSPECTION APPARATUS AND METHOD
- Publication number 20090207245
- Publication date Aug 20, 2009
- FUJIFILM CORPORATION
- Yoichi Hayashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE
- Publication number 20090190123
- Publication date Jul 30, 2009
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Edge inspection apparatus
- Publication number 20090086196
- Publication date Apr 2, 2009
- Nikon Corporation
- Naoshi Sakaguchi
- G01 - MEASURING TESTING
Information Patent Application
Wafer Edge Inspection
- Publication number 20090059236
- Publication date Mar 5, 2009
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING

Optical discs

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical disc device and recording and reproduction device

Dark-field optical inspection device

Workpiece holder for utilization in metrology system for measuring...

Method and apparatus for inspection of spherical surfaces

Apparatus and methods using interference in light reflected from ar...

Features maps of articles with polarized light

Photon emitter array including photon emitters with different orien...

Reflective surfaces for surface features of an article

Classification of surface features using fluoresence

Photon emitter array

Surface features mapping

Reflective surfaces for surface features of an article

Surface features mapping

Luminous flux branching element and mask defect inspection apparatus

Object holding apparatus, and inspection apparatus

Optical surface defect inspection apparatus and optical surface def...

Process for enhancing dye polymer recording yields by pre-scanning...

Disk surface inspection apparatus, inspection system thereof, and i...

Substrate holding apparatus, and inspection or processing apparatus

Method and apparatus for inspecting a pattern shape

Optical recording using a waveguide structure and a phase change me...

Substrate holding apparatus, and inspection or processing apparatus

Apparatus and method for detecting defect of optical disc

Particulate determination method

Method and apparatus for detecting defects on a disk surface

Optical discs for measuring analytes

Optical disc drive, optical storage medium, optical storage medium...

Method and apparatus for using imperfections and irregularities in...

Edge inspection apparatus

Substrate holding apparatus, and inspection or processing apparatus

Patents Applicationslast 30 patents

OPTICAL DISC DEVICE AND RECORDING AND REPRODUCTION DEVICE

DARK-FIELD OPTICAL INSPECTING DEVICE

METHOD AND APPARATUS FOR INSPECTION OF SPHERICAL SURFACES

CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE

ARTICLE EDGE INSPECTION

REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE

CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE

SURFACE INSPECTING APPARATUS HAVING DOUBLE RECIPE PROCESSING FUNCTION

SURFACE FEATURES MAPPING

OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...

DISK SURFACE INSPECTION METHOD AND DISK SURFACE INSPECTION DEVICE

LUMINOUS FLUX BRANCHING ELEMENT AND MASK DEFECT INSPECTION APPARATUS

SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS

Method for Inspection and Detection of Defects on Surfaces of Disc-...

Sheet Wafer Defect Mitigation

OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...

SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS

OPTICAL DISC DRIVE, OPTICAL STORAGE MEDIUM, OPTICAL STORAGE MEDIUM...

DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND I...

SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS

TEST DEVICE FOR CHARACTERIZING MATERIALS USED FOR OPTICAL STORAGE

Optical Recording Using a Waveguide Structure and a Phase Change Me...

OPTICAL DISCS FOR MEASURING ANALYTES

OPTICAL DISC DRIVE, OPTICAL STORAGE MEDIUM, OPTICAL STORAGE MEDIUM...

METHOD AND APPARATUS FOR INSPECTING A PATTERN SHAPE

OPTICAL DISC ASSEMBLIES FOR PERFORMING ASSAYS

DISK INSPECTION APPARATUS AND METHOD

METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE

Edge inspection apparatus

Wafer Edge Inspection