Optical elements other than lenses

Industry

CPC
G01N2021/9511

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/9511Optical elements other than lenses

Industries

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Optical sample characterization
- Patent number 12,152,994
- Issue date Nov 26, 2024
- LUMUS LTD.
- Eitan Ronen
- G01 - MEASURING TESTING
Information Patent Grant
Product inspection system and method
- Patent number 12,117,404
- Issue date Oct 15, 2024
- TE CONNECTIVITY SOLUTIONS GmbH
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and device determining soiling of a shield
- Patent number 12,099,019
- Issue date Sep 24, 2024
- OTT HydroMet B.V.
- Xander Olivier Van Mechelen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Methods and devices for processing and retrieving defect informatio...
- Patent number 12,092,587
- Issue date Sep 17, 2024
- BEIJING ZHONGXIANGYING TECHNOLOGY CO., LTD.
- Haijin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Optical-based validation of orientations of internal facets
- Patent number 12,078,476
- Issue date Sep 3, 2024
- LUMUS LTD.
- Ido Eisenberg
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus
- Patent number 12,044,616
- Issue date Jul 23, 2024
- Toyota Jidosha Kabushiki Kaisha
- Masashi Furukawa
- G02 - OPTICS
Information Patent Grant
Optical inspection device for optical performance test of display d...
- Patent number 12,025,571
- Issue date Jul 2, 2024
- Samsung Display Co., Ltd.
- Gil Yeong Park
- G02 - OPTICS
Information Patent Grant
Monitoring mirror reflectance using solar illumination
- Patent number 11,971,321
- Issue date Apr 30, 2024
- Raytheon Company
- Stephen J. Schiller
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Optical-based validation of orientations of internal facets
- Patent number 11,747,137
- Issue date Sep 5, 2023
- LUMUS LTD.
- Ido Eisenberg
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece holder for utilization in metrology system for measuring...
- Patent number 11,635,291
- Issue date Apr 25, 2023
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Method, computer program product, device and system for determining...
- Patent number 11,499,887
- Issue date Nov 15, 2022
- Saab AB
- Per Anders Eidet
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for an advanced charged controller for wafer i...
- Patent number 11,482,399
- Issue date Oct 25, 2022
- ASML Netherlands B.V.
- Jian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terminal device
- Patent number 11,381,671
- Issue date Jul 5, 2022
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Fan Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device for optical inspection of empty and liquid-filled containers
- Patent number 11,275,033
- Issue date Mar 15, 2022
- Seidenader Maschinenbau GmbH
- Matthias Knuelle
- G01 - MEASURING TESTING
Information Patent Grant
Method and device determining soiling of a shield
- Patent number 11,181,485
- Issue date Nov 23, 2021
- OTT HydroMet B.V.
- Xander Olivier Van Mechelen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Body-worn device with tamper detection, dirt alerting and dirt comp...
- Patent number 11,169,096
- Issue date Nov 9, 2021
- Cell Detect, Inc.
- David Segal
- G01 - MEASURING TESTING
Information Patent Grant
Reflected light measurement device
- Patent number 11,016,036
- Issue date May 25, 2021
- OPT GATE CO., LTD.
- Masayuki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the thickness of a contaminating layer and/o...
- Patent number 10,627,217
- Issue date Apr 21, 2020
- Carl Zeiss SMT GmbH
- Irene Ament
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for inspecting spatial light modulator, and expos...
- Patent number 10,598,606
- Issue date Mar 24, 2020
- Nikon Corporation
- Tomoharu Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for inspecting spatial light modulator, and expos...
- Patent number 10,557,801
- Issue date Feb 11, 2020
- Nikon Corporation
- Tomoharu Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position detection method and optical module
- Patent number 10,557,755
- Issue date Feb 11, 2020
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
DOE defect monitoring utilizing total internal reflection
- Patent number 10,444,111
- Issue date Oct 15, 2019
- Apple Inc.
- Brian S. Medower
- G02 - OPTICS
Information Patent Grant
Surface defects evaluation system and method for spherical optical...
- Patent number 10,444,160
- Issue date Oct 15, 2019
- Zhejiang University
- Yongying Yang
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damage to a converter device
- Patent number 10,436,714
- Issue date Oct 8, 2019
- Osram GmbH
- Peter Hoehmann
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Methods and apparatus for determining geometric properties of optic...
- Patent number 10,378,996
- Issue date Aug 13, 2019
- HERAEUS QUARTZ NORTH AMERICA LLC
- Ivan Rasnik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conductive film, display device having the same, and method of eval...
- Patent number 10,338,008
- Issue date Jul 2, 2019
- Fujifilm Corporation
- Kazuchika Iwami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for inspecting spatial light modulator, and expos...
- Patent number 10,317,346
- Issue date Jun 11, 2019
- Nikon Corporation
- Tomoharu Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing apparatus and manufacturing apparatus for testing light emi...
- Patent number 10,302,412
- Issue date May 28, 2019
- Samsung Electronics Co., Ltd.
- Young Hyo Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical fiber connector inspector with two-dimensional scanning fun...
- Patent number 10,254,196
- Issue date Apr 9, 2019
- Lightel Technologies, Inc.
- Ge Zhou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS
- Publication number 20240393108
- Publication date Nov 28, 2024
- LUMUS LTD.
- Ido EISENBERG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
- Publication number 20240319110
- Publication date Sep 26, 2024
- SAMSUNG DISPLAY CO., LTD.
- Gil Yeong PARK
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for detecting defects of reflective element
- Publication number 20240103026
- Publication date Mar 28, 2024
- Hong-I Tsai
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATIO...
- Publication number 20240094141
- Publication date Mar 21, 2024
- Beijing Zhongxiangying Technology Co., Ltd.
- Haijin WANG
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- Publication number 20240035986
- Publication date Feb 1, 2024
- Hitachi Astemo, Ltd.
- Takahiro FUJIOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS
- Publication number 20230366675
- Publication date Nov 16, 2023
- LUMUS LTD.
- Ido EISENBERG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF THICK FILMS AND HIGH ASPECT RATIO STRUCTURES
- Publication number 20230341337
- Publication date Oct 26, 2023
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD OF INSPECTION OF AN INNER SURFACE OF A HOLLOW BODY
- Publication number 20230273133
- Publication date Aug 31, 2023
- CIN ADVANCED SYSTEMS GROUP, S.L.
- Jorge Marina Juarez
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...
- Publication number 20230204517
- Publication date Jun 29, 2023
- HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.
- TIAN-TIAN FAN
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRECISION VPD-DC SCAN
- Publication number 20230118379
- Publication date Apr 20, 2023
- PVA TePla AG
- Robert BEIKLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THz MEASURING DEVICE AND THz MEASURING METHOD FOR MEASURING A TRANS...
- Publication number 20230095853
- Publication date Mar 30, 2023
- CiTEX Holding GmbH
- Marius THIEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ASSESSING THE QUALITY OF A COMPONENT OF OPTICAL MATERIAL
- Publication number 20230087046
- Publication date Mar 23, 2023
- SCHOTT AG
- Thomas Korb
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20230060883
- Publication date Mar 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeru UTSUGI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS
- Publication number 20230044993
- Publication date Feb 9, 2023
- Toyota Jidosha Kabushiki Kaisha
- Masashi FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
Optical Sample Characterization
- Publication number 20230037873
- Publication date Feb 9, 2023
- LUMUS LTD.
- Eitan RONEN
- G01 - MEASURING TESTING
Information Patent Application
Product Inspection System and Method
- Publication number 20230021095
- Publication date Jan 19, 2023
- Tyco Electronics (Shanghai) Co. Ltd.
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Application
MONITORING MIRROR REFLECTANCE USING SOLAR ILLUMINATION
- Publication number 20220214246
- Publication date Jul 7, 2022
- Raytheon Company
- Stephen J. Schiller
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
A METHOD, COMPUTER PROGRAM PRODUCT, DEVICE AND SYSTEM FOR DETERMINI...
- Publication number 20220155175
- Publication date May 19, 2022
- SAAB AB
- Per Anders EIDET
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL DEVICE
- Publication number 20220116490
- Publication date Apr 14, 2022
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Fan Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND DEVICE DETERMINING SOILING OF A SHIELD
- Publication number 20220082512
- Publication date Mar 17, 2022
- KIPP & ZONEN B.V.
- Xander Olivier Van Mechelen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
- Publication number 20220057337
- Publication date Feb 24, 2022
- SAMSUNG DISPLAY CO., LTD.
- Gil Yeong PARK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING SURFACE UNIFORMITY
- Publication number 20220011238
- Publication date Jan 13, 2022
- 3M Innovative Properties Company
- Francis T. Caruso
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR AN ADVANCED CHARGED CONTROLLER FOR WAFER I...
- Publication number 20200273662
- Publication date Aug 27, 2020
- ASML Netherlands B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR INSPECTING SPATIAL LIGHT MODULATOR, AND EXPOS...
- Publication number 20190293568
- Publication date Sep 26, 2019
- NIKON CORPORATION
- Tomoharu FUJIWARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ILLUMINATION DEVICE HAVING PHOSPHOR WHEEL
- Publication number 20180172220
- Publication date Jun 21, 2018
- OSRAM GMBH
- Jasmin Muster
- F21 - LIGHTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20180100812
- Publication date Apr 12, 2018
- Fujitsu Limited
- Toshinobu Akazawa
- G01 - MEASURING TESTING
Information Patent Application
Surface defects evaluation system and method for spherical optical...
- Publication number 20170292916
- Publication date Oct 12, 2017
- ZHEJIANG UNIVERSITY
- Yongying Yang
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE FILM, DISPLAY DEVICE HAVING THE SAME, AND METHOD OF EVAL...
- Publication number 20170102342
- Publication date Apr 13, 2017
- FUJIFILM CORPORATION
- Kazuchika IWAMI
- B32 - LAYERED PRODUCTS
Information Patent Application
Optical Components
- Publication number 20160231257
- Publication date Aug 11, 2016
- Pasi Kostamo
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD OF DEFECT SIZE OF PHOTOMASK BLANK, SELECTION METH...
- Publication number 20160116837
- Publication date Apr 28, 2016
- Shin-Etsu Chemical Co., Ltd.
- Tsuneo TERASAWA
- G01 - MEASURING TESTING

Optical elements other than lenses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Defect inspection apparatus and defect inspection method

Optical sample characterization

Product inspection system and method

Method and device determining soiling of a shield

Methods and devices for processing and retrieving defect informatio...

Optical-based validation of orientations of internal facets

Detection apparatus

Optical inspection device for optical performance test of display d...

Monitoring mirror reflectance using solar illumination

Optical-based validation of orientations of internal facets

Workpiece holder for utilization in metrology system for measuring...

Method, computer program product, device and system for determining...

Method and apparatus for an advanced charged controller for wafer i...

Terminal device

Device for optical inspection of empty and liquid-filled containers

Method and device determining soiling of a shield

Body-worn device with tamper detection, dirt alerting and dirt comp...

Reflected light measurement device

Method for determining the thickness of a contaminating layer and/o...

Method and device for inspecting spatial light modulator, and expos...

Method and device for inspecting spatial light modulator, and expos...

Position detection method and optical module

DOE defect monitoring utilizing total internal reflection

Surface defects evaluation system and method for spherical optical...

Detecting damage to a converter device

Methods and apparatus for determining geometric properties of optic...

Conductive film, display device having the same, and method of eval...

Method and device for inspecting spatial light modulator, and expos...

Testing apparatus and manufacturing apparatus for testing light emi...

Optical fiber connector inspector with two-dimensional scanning fun...

Patents Applicationslast 30 patents

OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS

OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...

Apparatus for detecting defects of reflective element

METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATIO...

VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD

OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS

MEASUREMENT OF THICK FILMS AND HIGH ASPECT RATIO STRUCTURES

DEVICE AND METHOD OF INSPECTION OF AN INNER SURFACE OF A HOLLOW BODY

OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...

HIGH PRECISION VPD-DC SCAN

THz MEASURING DEVICE AND THz MEASURING METHOD FOR MEASURING A TRANS...

METHOD FOR ASSESSING THE QUALITY OF A COMPONENT OF OPTICAL MATERIAL

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DETECTION APPARATUS

Optical Sample Characterization

Product Inspection System and Method

MONITORING MIRROR REFLECTANCE USING SOLAR ILLUMINATION

A METHOD, COMPUTER PROGRAM PRODUCT, DEVICE AND SYSTEM FOR DETERMINI...

TERMINAL DEVICE

METHOD AND DEVICE DETERMINING SOILING OF A SHIELD

OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...

METHOD AND SYSTEM FOR CHARACTERIZING SURFACE UNIFORMITY

METHOD AND APPARATUS FOR AN ADVANCED CHARGED CONTROLLER FOR WAFER I...

METHOD AND DEVICE FOR INSPECTING SPATIAL LIGHT MODULATOR, AND EXPOS...

ILLUMINATION DEVICE HAVING PHOSPHOR WHEEL

INSPECTION SYSTEM AND INSPECTION METHOD

Surface defects evaluation system and method for spherical optical...

CONDUCTIVE FILM, DISPLAY DEVICE HAVING THE SAME, AND METHOD OF EVAL...

Optical Components

EVALUATION METHOD OF DEFECT SIZE OF PHOTOMASK BLANK, SELECTION METH...