Optical microscope

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CPC
Y10S977/869

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/869Optical microscope

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Fluorescent nanoscopy device and method
- Patent number 9,028,757
- Issue date May 12, 2015
- Super Resolution Technologies LLC
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning tunneling microscope assembly, reactor, and system
- Patent number 8,893,309
- Issue date Nov 18, 2014
- The Regents of the University of California
- Feng Tao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fluorescent nanoscopy device and method
- Patent number 8,668,872
- Issue date Mar 11, 2014
- Super Resolution Technologies LLC
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fluorescent nanoscopy method
- Patent number 8,334,143
- Issue date Dec 18, 2012
- Stereonic International, Inc.
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fluorescent nanoscopy method
- Patent number 8,110,405
- Issue date Feb 7, 2012
- Stereonic International, Inc.
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Fluorescent nanoscopy method
- Patent number 7,803,634
- Issue date Sep 28, 2010
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for viewing through blood
- Patent number 7,758,499
- Issue date Jul 20, 2010
- C2Cure, Inc.
- Doron Adler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Probe microscope system suitable for observing sample of long body
- Patent number 7,507,957
- Issue date Mar 24, 2009
- SII NanoTechnology Inc.
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Grant
Sensors for electrochemical, electrical or topographical analysis
- Patent number 7,444,856
- Issue date Nov 4, 2008
- The Board of Trustees of the Leland Stanford Junior University
- Friedrich B. Prinz
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyzing a specimen using atomic force mic...
- Patent number 7,430,898
- Issue date Oct 7, 2008
- KLA-Tencor Technologies Corp.
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a force curve measurement on a sample
- Patent number 7,387,035
- Issue date Jun 17, 2008
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneously depositing and observing ma...
- Patent number 7,381,949
- Issue date Jun 3, 2008
- Coincident Bearns Licensing Corporation
- Michael Mauck
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,312,619
- Issue date Dec 25, 2007
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Tailoring domain engineered structures in ferroelectric materials
- Patent number 7,151,257
- Issue date Dec 19, 2006
- Ramot At Tel-Aviv University Ltd.
- Gil Rosenman
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube probe and method for manufacturing same
- Patent number 7,138,627
- Issue date Nov 21, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,098,678
- Issue date Aug 29, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 7,095,020
- Issue date Aug 22, 2006
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneously depositing and observing ma...
- Patent number 7,078,852
- Issue date Jul 18, 2006
- Coincident Beams Licensing Corporation
- Michael Mauck
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of manufacturing a carbon nanotube device
- Patent number 7,076,871
- Issue date Jul 18, 2006
- Fuji Xerox Co., Ltd.
- Kazunaga Horiuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coated nanotube surface signal probe
- Patent number 7,064,341
- Issue date Jun 20, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Force scanning probe microscope
- Patent number 7,044,007
- Issue date May 16, 2006
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method for use thereof
- Patent number 7,017,398
- Issue date Mar 28, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Carbon nanotube with a graphitic outer layer
- Patent number 7,011,884
- Issue date Mar 14, 2006
- University of Central Florida Research Foundation, Inc.
- Lee Chow
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope with improved probe head mount
- Patent number 6,951,129
- Issue date Oct 4, 2005
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with improved probe tip mount
- Patent number 6,945,100
- Issue date Sep 20, 2005
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,943,574
- Issue date Sep 13, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneously depositing and observing ma...
- Patent number 6,906,453
- Issue date Jun 14, 2005
- Coincident Beams Licensing Corporation
- Michael Mauck
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron microscope
- Patent number 6,888,139
- Issue date May 3, 2005
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 6,818,891
- Issue date Nov 16, 2004
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneously depositing and observing ma...
- Patent number 6,815,880
- Issue date Nov 9, 2004
- Coincident Beams Licensing Corporation
- Michael Mauck
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
FLUORESCENT NANOSCOPY DEVICE AND METHOD
- Publication number 20140127079
- Publication date May 8, 2014
- Super Resolution Technologies LLC
- Andrey Alexeevich Klimov
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENT NANOSCOPY DEVICE AND METHOD
- Publication number 20130099136
- Publication date Apr 25, 2013
- Stereonic International, Inc.
- Andrey Alexeevich Klimov
- G01 - MEASURING TESTING
Information Patent Application
Scanning Tunneling Microscope Assembly, Reactor, and System
- Publication number 20120244038
- Publication date Sep 27, 2012
- The Regents of the University of California
- Feng Tao
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENT NANOSCOPY METHOD
- Publication number 20120133740
- Publication date May 31, 2012
- Stereonic International, Inc.
- Andrey Alexeevich KLIMOV
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF FLUORESCENT NANOSCOPY
- Publication number 20110175982
- Publication date Jul 21, 2011
- Andrey Alexeevich Klimov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Fluorescent nanoscopy method
- Publication number 20090045353
- Publication date Feb 19, 2009
- Klimov Andrey Alexeevich
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for simultaneously depositing and observing ma...
- Publication number 20080258073
- Publication date Oct 23, 2008
- Coincident Beams Licensing Corporation
- Michael Mauck
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR VIEWING THROUGH BLOOD
- Publication number 20070100241
- Publication date May 3, 2007
- C2CURE, INC.
- Doron Adler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method and apparatus for simultaneously depositing and observing ma...
- Publication number 20060289793
- Publication date Dec 28, 2006
- Coincident Beams Licensing Corporation
- Michael Mauck
- G01 - MEASURING TESTING
Information Patent Application
FORCE SCANNING PROBE MICROSCOPE
- Publication number 20060283240
- Publication date Dec 21, 2006
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20060255818
- Publication date Nov 16, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Carbon nanotube with a graphitic outer layer: process and application
- Publication number 20060228288
- Publication date Oct 12, 2006
- University of Central Florida
- Lee Chow
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Sensors for electrochemical, electrical or topographical analysis
- Publication number 20060213259
- Publication date Sep 28, 2006
- Friedrich B. Prinz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A CARBON NANOTUBE DEVICE
- Publication number 20060123628
- Publication date Jun 15, 2006
- FUJI XEROX CO., LTD
- Kazunaga Horiuchi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe microscope system suitable for observing sample of long body
- Publication number 20060060778
- Publication date Mar 23, 2006
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050184746
- Publication date Aug 25, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for simultaneously depositing and observing ma...
- Publication number 20050161616
- Publication date Jul 28, 2005
- Microtrue Machine Tool Corporation
- Michael Mauck
- G01 - MEASURING TESTING
Information Patent Application
Force scanning probe microscope
- Publication number 20050081610
- Publication date Apr 21, 2005
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Active probe for an atomic force microscope and method for use thereof
- Publication number 20050066714
- Publication date Mar 31, 2005
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050040836
- Publication date Feb 24, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20050029450
- Publication date Feb 10, 2005
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Tailoring domain engineered structures in ferroelectric materials
- Publication number 20050023462
- Publication date Feb 3, 2005
- Ramot at Tel-Aviv University Ltd.
- Gil Rosenman
- G02 - OPTICS
Information Patent Application
Method and apparatus for simultaneously depositing and observing ma...
- Publication number 20040207308
- Publication date Oct 21, 2004
- Michael Mauck
- G01 - MEASURING TESTING
Information Patent Application
Coated nanotube surface signal probe
- Publication number 20040168527
- Publication date Sep 2, 2004
- DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Intra vascular imaging method and apparatus
- Publication number 20040147806
- Publication date Jul 29, 2004
- Doron Adler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Scanning probe microscope with improved probe tip mount
- Publication number 20040140424
- Publication date Jul 22, 2004
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope with improved probe head mount
- Publication number 20040140426
- Publication date Jul 22, 2004
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for simultaneously depositing and observing ma...
- Publication number 20030201397
- Publication date Oct 30, 2003
- Michael Mauck
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20030201393
- Publication date Oct 30, 2003
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED OPTICAL PROFILOMETRY AND PROJECTION MICROSCOPY OF INTEGRAT...
- Publication number 20030203590
- Publication date Oct 30, 2003
- Wenge Yang
- G01 - MEASURING TESTING

Optical microscope

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fluorescent nanoscopy device and method

Scanning tunneling microscope assembly, reactor, and system

Fluorescent nanoscopy device and method

Fluorescent nanoscopy method

Fluorescent nanoscopy method

Fluorescent nanoscopy method

Method and apparatus for viewing through blood

Probe microscope system suitable for observing sample of long body

Sensors for electrochemical, electrical or topographical analysis

Methods and systems for analyzing a specimen using atomic force mic...

Method of making a force curve measurement on a sample

Method and apparatus for simultaneously depositing and observing ma...

Multiple local probe measuring device and method

Tailoring domain engineered structures in ferroelectric materials

Nanotube probe and method for manufacturing same

Multiple local probe measuring device and method

Sensing mode atomic force microscope

Method and apparatus for simultaneously depositing and observing ma...

Method of manufacturing a carbon nanotube device

Coated nanotube surface signal probe

Force scanning probe microscope

Active probe for an atomic force microscope and method for use thereof

Carbon nanotube with a graphitic outer layer

Scanning probe microscope with improved probe head mount

Scanning probe microscope with improved probe tip mount

Multiple local probe measuring device and method

Method and apparatus for simultaneously depositing and observing ma...

Electron microscope

Sensing mode atomic force microscope

Method and apparatus for simultaneously depositing and observing ma...

Patents Applicationslast 30 patents

FLUORESCENT NANOSCOPY DEVICE AND METHOD

FLUORESCENT NANOSCOPY DEVICE AND METHOD

Scanning Tunneling Microscope Assembly, Reactor, and System

FLUORESCENT NANOSCOPY METHOD

METHOD OF FLUORESCENT NANOSCOPY

Fluorescent nanoscopy method

Method and apparatus for simultaneously depositing and observing ma...

METHOD FOR VIEWING THROUGH BLOOD

Method and apparatus for simultaneously depositing and observing ma...

FORCE SCANNING PROBE MICROSCOPE

Multiple local probe measuring device and method

Carbon nanotube with a graphitic outer layer: process and application

Sensors for electrochemical, electrical or topographical analysis

METHOD OF MANUFACTURING A CARBON NANOTUBE DEVICE

Probe microscope system suitable for observing sample of long body

Multiple local probe measuring device and method

Method and apparatus for simultaneously depositing and observing ma...

Force scanning probe microscope

Active probe for an atomic force microscope and method for use thereof

Multiple local probe measuring device and method

Sensing mode atomic force microscope

Tailoring domain engineered structures in ferroelectric materials

Method and apparatus for simultaneously depositing and observing ma...

Coated nanotube surface signal probe

Intra vascular imaging method and apparatus

Scanning probe microscope with improved probe tip mount

Scanning probe microscope with improved probe head mount

Method and apparatus for simultaneously depositing and observing ma...

Electron microscope

COMBINED OPTICAL PROFILOMETRY AND PROJECTION MICROSCOPY OF INTEGRAT...