Optical microscopes coupled with SPM

Industry

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G01Q30/025

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/025Optical microscopes coupled with SPM

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe nanotomograph comprising an optical analysis module
- Patent number 11,150,266
- Issue date Oct 19, 2021
- NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sub-diffraction infrared imaging and spect...
- Patent number 10,969,405
- Issue date Apr 6, 2021
- Photothermal Spectroscopy Corp.
- Roshan Shetty
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,895,585
- Issue date Jan 19, 2021
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 10,753,990
- Issue date Aug 25, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for generating three-dimensional image of poly...
- Patent number 10,740,948
- Issue date Aug 11, 2020
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for positioning a micro- or nano-object under...
- Patent number 10,705,115
- Issue date Jul 7, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Stéphane Campidelli
- G02 - OPTICS
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,613,115
- Issue date Apr 7, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method for determining mass and/or mechanical...
- Patent number 10,564,182
- Issue date Feb 18, 2020
- Universitat Basel
- David Martinez-Martin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Characterizing a height profile of a sample by side view imaging
- Patent number 10,488,434
- Issue date Nov 26, 2019
- Anton Paar GmbH
- Martin Godec-Schönbacher
- G01 - MEASURING TESTING
Information Patent Grant
Vibration damping connector and use of the vibration damping connector
- Patent number 10,379,372
- Issue date Aug 13, 2019
- INL-INTERNATIONAL IBERIAN NANOTECHNOLOGY LABORATORY
- Pieter De Beule
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 10,228,389
- Issue date Mar 12, 2019
- Bruker Nano, Inc.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Sample vessel retention structure for scanning probe microscope
- Patent number 10,175,263
- Issue date Jan 8, 2019
- Bruker Nano, Inc.
- Charles Meyer
- G02 - OPTICS
Information Patent Grant
Fiber-coupled metal-tip near-field chemical imaging spectroscopy
- Patent number 10,145,799
- Issue date Dec 4, 2018
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,088,499
- Issue date Oct 2, 2018
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 10,041,971
- Issue date Aug 7, 2018
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Nanoantenna scanning probe tip, and fabrication methods
- Patent number 10,012,674
- Issue date Jul 3, 2018
- The Regents of the University of California
- Tyler Jamison Dill
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,678,104
- Issue date Jun 13, 2017
- Hitachi High-Tech Science Corporation
- Hiroyoshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of ex vivo cells for disease state detection and therapeut...
- Patent number 9,678,105
- Issue date Jun 13, 2017
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter multimodal microscope objective for mechanobiology
- Patent number 9,588,327
- Issue date Mar 7, 2017
- The Board of Trustees of the University of Illinois
- Kimani Toussaint
- G02 - OPTICS
Information Patent Grant
Systems and methods for non-destructive surface chemical analysis o...
- Patent number 9,568,495
- Issue date Feb 14, 2017
- AIST-NT, Inc.
- Sergey A. Saunin
- G01 - MEASURING TESTING
Information Patent Grant
Scanning mechanism and scanning probe microscope
- Patent number 9,519,005
- Issue date Dec 13, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 9,506,947
- Issue date Nov 29, 2016
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,482,690
- Issue date Nov 1, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection instrument
- Patent number 9,428,384
- Issue date Aug 30, 2016
- Jizhong He
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compound microscope
- Patent number 9,347,969
- Issue date May 24, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANN...
- Publication number 20220026462
- Publication date Jan 27, 2022
- GTHERANOSTICS CO., LTD.
- Hidemi SHIGEKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20200386832
- Publication date Dec 10, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20200191827
- Publication date Jun 18, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULE
- Publication number 20190219608
- Publication date Jul 18, 2019
- CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
- Alexander Mihaylovich ALEKSEEV
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190212361
- Publication date Jul 11, 2019
- BRUKER NANO, INC.
- Charles MEYER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR POSITIONING A MICRO- OR NANO-OBJECT UNDER...
- Publication number 20190170787
- Publication date Jun 6, 2019
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Stéphane CAMPIDELLI
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED...
- Publication number 20190011478
- Publication date Jan 10, 2019
- OLYMPUS CORPORATION
- Yoshitsugu UEKUSA
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20180246143
- Publication date Aug 30, 2018
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
FIBER-COUPLED METAL-TIP NEAR-FIELD CHEMICAL IMAGING SPECTROSCOPY
- Publication number 20180238806
- Publication date Aug 23, 2018
- Baylor University
- Zhenrong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
A VIBRATION DAMPING CONNECTOR AND USE OF THE VIBRATION DAMPING CONN...
- Publication number 20180231794
- Publication date Aug 16, 2018
- INL-International Iberian Nanotechnology Laboratory
- Pieter De Beule
- G02 - OPTICS
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20180188286
- Publication date Jul 5, 2018
- Bruker Nano, Inc.
- Charles MEYER
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR RAPID SUB-DIFFRACTION INFRARED IMAGING AND...
- Publication number 20180180642
- Publication date Jun 28, 2018
- Anaysis Instruments Corp.
- Roshan Shetty
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180106832
- Publication date Apr 19, 2018
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INFRARED SCATTERING SCANNING NEAR-FIELD OP...
- Publication number 20170160309
- Publication date Jun 8, 2017
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Application
NANOANTENNA SCANNING PROBE TIP, AND FABRICATION METHODS
- Publication number 20170115323
- Publication date Apr 27, 2017
- The Regents of the University of California
- Tyler Jamison Dill
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND METHOD FOR DETERMINING MASS AND/OR MECHANICAL...
- Publication number 20170052211
- Publication date Feb 23, 2017
- UNIVERSITAT BASEL
- David MARTINEZ-MARTIN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPE MEASURING DEVICE
- Publication number 20170023611
- Publication date Jan 26, 2017
- UNIVERSITAT BASEL
- David MARTINEZ-MARTIN
- G02 - OPTICS
Information Patent Application
Systems and Methods for Non-Destructive Surface Chemical Analysis o...
- Publication number 20160341764
- Publication date Nov 24, 2016
- AIST-NT, Inc.
- Sergey A. Saunin
- G01 - MEASURING TESTING
Information Patent Application
Multiple Integrated Tips Scanning Probe Microscope
- Publication number 20160252545
- Publication date Sep 1, 2016
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20150301078
- Publication date Oct 22, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
Raman microscope and electron microscope analytical system
- Publication number 20150279616
- Publication date Oct 1, 2015
- WITec GmbH
- Jaroslav Jiruse
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20140143912
- Publication date May 22, 2014
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING

Optical microscopes coupled with SPM

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale scanning sensors

Automated optimization of AFM light source positioning

Nanoscale scanning sensors

Method and apparatus for measuring magnetic field strength

Automated optimization of AFM light source positioning

Scanning probe nanotomograph comprising an optical analysis module

Method and apparatus for sub-diffraction infrared imaging and spect...

Multiple integrated tips scanning probe microscope

Method and apparatus for measuring magnetic field strength

Apparatus and method for generating three-dimensional image of poly...

Method and apparatus for positioning a micro- or nano-object under...

Multiple integrated tips scanning probe microscope

Measuring device and method for determining mass and/or mechanical...

Characterizing a height profile of a sample by side view imaging

Vibration damping connector and use of the vibration damping connector

Method and apparatus for infrared scattering scanning near-field op...

Sample vessel retention structure for scanning probe microscope

Fiber-coupled metal-tip near-field chemical imaging spectroscopy

Scanning probe microscope

Nanoscale scanning sensors

Nanoantenna scanning probe tip, and fabrication methods

Scanning probe microscope

Analysis of ex vivo cells for disease state detection and therapeut...

Nanoindenter multimodal microscope objective for mechanobiology

Systems and methods for non-destructive surface chemical analysis o...

Scanning mechanism and scanning probe microscope

System and method for non-contact microscopy for three-dimensional...

Scanning probe microscope

Inspection instrument

Compound microscope

Patents Applicationslast 30 patents

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

SCANNING PROBE MICROSCOPE

NANOSCALE SCANNING SENSORS

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

NANOSCALE SCANNING SENSORS

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANN...

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULE

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR POSITIONING A MICRO- OR NANO-OBJECT UNDER...

OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED...

NANOSCALE SCANNING SENSORS

FIBER-COUPLED METAL-TIP NEAR-FIELD CHEMICAL IMAGING SPECTROSCOPY

A VIBRATION DAMPING CONNECTOR AND USE OF THE VIBRATION DAMPING CONN...

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR RAPID SUB-DIFFRACTION INFRARED IMAGING AND...

SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR INFRARED SCATTERING SCANNING NEAR-FIELD OP...

NANOANTENNA SCANNING PROBE TIP, AND FABRICATION METHODS

MEASURING DEVICE AND METHOD FOR DETERMINING MASS AND/OR MECHANICAL...

ATOMIC FORCE MICROSCOPE MEASURING DEVICE

Systems and Methods for Non-Destructive Surface Chemical Analysis o...

Multiple Integrated Tips Scanning Probe Microscope

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...

Raman microscope and electron microscope analytical system

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...