CPC
G01N21/63
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University of Science and Technology of China
Shuiming Hu
G01 - MEASURING TESTING
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The Trustees of Columbia University In the City of New York
Wei Min
G01 - MEASURING TESTING
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Xiuling Zhu
G01 - MEASURING TESTING
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MGI Tech Co., Ltd.
Heming Jiang
G01 - MEASURING TESTING
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GUANGZHOU LUXVISIONS INNOVATION TECHNOLOGY LIMITED
Chih-Hung Lai
G01 - MEASURING TESTING
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Hamamatsu Photonics K.K.
Tomonori Nakamura
G01 - MEASURING TESTING
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DiaMon Tech AG
Alexander Bauer
G01 - MEASURING TESTING
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University of Maryland, College Park
Giuliano Scarcelli
G02 - OPTICS
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GenNext Technologies, Inc.
Scot Randy Weinberger
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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GenNext Technologies, Inc.
Scot Randy Weinberger
G01 - MEASURING TESTING
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GenNext Technologies, Inc.
Scot Randy Weinberger
G01 - MEASURING TESTING
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The Regents of the University of Michigan
Xudong Fan
G01 - MEASURING TESTING
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C2Sense, Inc.
Timothy Manning Swager
G06 - COMPUTING CALCULATING COUNTING
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FemtoMetrix, Inc.
Viktor Koldiaev
G01 - MEASURING TESTING
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Hamamatsu Photonics K.K.
Yuu Takiguchi
G01 - MEASURING TESTING
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Hach Company
Angella Nicholle Greenawalt
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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FemtoMetrix, Inc.
Ming Lei
G01 - MEASURING TESTING
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Ford Global Technologies, LLC
Reinoud Wolffenbuttel
G01 - MEASURING TESTING
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BioAxial SAS
Gabriel Y Sirat
G01 - MEASURING TESTING
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Sony Group Corporation
Tetsu Ogawa
G06 - COMPUTING CALCULATING COUNTING
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Johnson Controls Tyco IP Holdings LLP
William F. McQuade
G05 - CONTROLLING REGULATING
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Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
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HITACHI HIGH-TECH CORPORATION
Yoshifumi Sekiguchi
G01 - MEASURING TESTING
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S.T. Japan Inc.
Takao Nakagawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Radiation Monitoring Devices, Inc.
Harish B. Bhandari
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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OndaVia, Inc.
Mark C. Peterman
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Washington University
Quing Zhu
G06 - COMPUTING CALCULATING COUNTING
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William Marsh Rice University
Dmitri Lapotko
G01 - MEASURING TESTING
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UT-Battelle, LLC
Ali Passian
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Ciencia, Inc.
William D. Page
C01 - INORGANIC CHEMISTRY
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MGI TECH CO., LTD.
HEMING JIANG
G01 - MEASURING TESTING
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ROBERT BOSCH GmbH
Reinhold Fiess
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Bioaxial SAS
Gabriel Y Sirat
G02 - OPTICS
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ATONARP INC.
Lukas BRUECKNER
G01 - MEASURING TESTING
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Wayne State University
Jitao ZHANG
G01 - MEASURING TESTING
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HAMAMATSU PHOTONICS K. K.
Tomonori Nakamura
G01 - MEASURING TESTING
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Purdue Research Foundation
Garth Jason Simpson
G01 - MEASURING TESTING
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University of Maryland, College Park
Giuliano SCARCELLI
G01 - MEASURING TESTING
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Trustees of Dartmouth College
John X.J. Zhang
G01 - MEASURING TESTING
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Wayne State University
Jitao ZHANG
G01 - MEASURING TESTING
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Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
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Patent Application
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Kayvan Forouhesh Tehrani
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Wayne State University
Jitao ZHANG
G01 - MEASURING TESTING
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UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
Shuiming Hu
G01 - MEASURING TESTING
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KLA Corporation
Qiang Zhao
G02 - OPTICS
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UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
Shuiming Hu
G01 - MEASURING TESTING
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SOUTH CHINA UNIVERSITY OF TECHNOLOGY
Zongtao LI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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FemtoMetrix, Inc.
Timothy M. Wong
G02 - OPTICS
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FemtoMetrix, Inc.
Anatoly A. Shtykov
G01 - MEASURING TESTING
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Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
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The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
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Temple University - Of The Commonwealth System of Higher Education
Hai-Lung Dai
G01 - MEASURING TESTING
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Brown University
Peter Weber
G01 - MEASURING TESTING
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GenNext Technologies, Inc.
Scot Randy Weinberger
H01 - BASIC ELECTRIC ELEMENTS
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GRIP Molecular Technologies, Inc.
John Lalonde
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Vidya Holdings Ltd
Marko Dorrestijn
G01 - MEASURING TESTING
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Patent Application
Hanieh FATTAHI
G01 - MEASURING TESTING
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Philip Teague
G01 - MEASURING TESTING
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University of Utah Research Foundation
JOHN CONBOY
G01 - MEASURING TESTING
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Applied Materials, Inc.
Subramanya P. HERLE
G01 - MEASURING TESTING
