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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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Patents Grantslast 30 patents

Information Patent Grant
Low-noise spectroscopic imaging system with steerable substantially...
- Patent number 11,803,044
- Issue date Oct 31, 2023
- Daylight Solutions, Inc.
- Jeremy A. Rowlette
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise spectroscopic imaging system using substantially coherent...
- Patent number 11,194,143
- Issue date Dec 7, 2021
- Daylight Solutions, Inc.
- Jeremy A. Rowlette
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise spectroscopic imaging system using substantially coherent...
- Patent number 10,795,139
- Issue date Oct 6, 2020
- Daylight Solutions, Inc.
- Jeremy A. Rowlette
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise spectroscopic imaging system using substantially coherent...
- Patent number 10,437,032
- Issue date Oct 8, 2019
- Daylight Solutions, Inc.
- Jeremy A. Rowlette
- G01 - MEASURING TESTING
Information Patent Grant
Modulating spectroscopic imaging system using substantially coheren...
- Patent number 10,437,033
- Issue date Oct 8, 2019
- Daylight Solutions, Inc.
- Jeremy Rowlette
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic module control method
- Patent number 10,247,608
- Issue date Apr 2, 2019
- Panasonic Corporation
- Soichiro Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous overlapping order spectral imager and method
- Patent number 10,151,632
- Issue date Dec 11, 2018
- Raytheon Company
- John F. Silny
- G01 - MEASURING TESTING
Information Patent Grant
Visible-infrared plane grating imaging spectrometer
- Patent number 9,689,744
- Issue date Jun 27, 2017
- Massachusetts Institute of Technology
- Michael P. Chrisp
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer provided with an optical shutter
- Patent number 5,631,735
- Issue date May 20, 1997
- Minolta Co., Ltd.
- Yoshiroh Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer provided with an optical shutter
- Patent number 5,570,180
- Issue date Oct 29, 1996
- Minolta Co., Ltd.
- Yoshiroh Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer provided with an optical shutter
- Patent number 5,457,530
- Issue date Oct 10, 1995
- Minolta Co., Ltd.
- Yoshiroh Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Holographic grating imaging spectrometer
- Patent number 5,139,335
- Issue date Aug 18, 1992
- Sets, Inc.
- Thomas F. Lundeen
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength calibration method and apparatus
- Patent number 4,971,439
- Issue date Nov 20, 1990
- Beckman Instruments, Inc.
- James R. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with direct drive high speed oscillating grating
- Patent number 4,969,739
- Issue date Nov 13, 1990
- NIRSystems Incorporated
- Philip A. McGee
- G01 - MEASURING TESTING
Information Patent Grant
Holographic diffraction grating system for rapid scan spectral anal...
- Patent number 4,285,596
- Issue date Aug 25, 1981
- Neotec Corporation
- Isaac J. Landa
- G01 - MEASURING TESTING
Information Patent Grant
Rapid scan spectral analysis system utilizing higher order spectral...
- Patent number 4,264,205
- Issue date Apr 28, 1981
- Neotec Corporation
- Isaac J. Landa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODULATING SPECTROSCOPIC IMAGING SYSTEM USING SUBSTANTIALLY COHEREN...
- Publication number 20180100999
- Publication date Apr 12, 2018
- Daylight Solutions, Inc.
- Jeremy Rowlette
- G02 - OPTICS
Information Patent Application
Dual band hyperspectral imaging spectrometer
- Publication number 20040257563
- Publication date Dec 23, 2004
- Northrop Grumman Corporation
- Harold E. Miller
- G01 - MEASURING TESTING

Order selection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Low-noise spectroscopic imaging system with steerable substantially...

Low-noise spectroscopic imaging system using substantially coherent...

Low-noise spectroscopic imaging system using substantially coherent...

Low-noise spectroscopic imaging system using substantially coherent...

Modulating spectroscopic imaging system using substantially coheren...

Spectroscopic module control method

Simultaneous overlapping order spectral imager and method

Visible-infrared plane grating imaging spectrometer

Spectrometer provided with an optical shutter

Spectrometer provided with an optical shutter

Spectrometer provided with an optical shutter

Holographic grating imaging spectrometer

Wavelength calibration method and apparatus

Spectrometer with direct drive high speed oscillating grating

Holographic diffraction grating system for rapid scan spectral anal...

Rapid scan spectral analysis system utilizing higher order spectral...

Patents Applicationslast 30 patents

MODULATING SPECTROSCOPIC IMAGING SYSTEM USING SUBSTANTIALLY COHEREN...

Dual band hyperspectral imaging spectrometer