Particle-permeable windows

Industry

CPC
H01J2237/164

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/164Particle-permeable windows

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis in air
- Patent number 10,354,834
- Issue date Jul 16, 2019
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection of a lithographic mask that is protected by a pellicle
- Patent number 10,156,785
- Issue date Dec 18, 2018
- Applied Materials Israel Ltd.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 10,157,724
- Issue date Dec 18, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for assembling an electron exit window and an electron exit...
- Patent number 10,032,596
- Issue date Jul 24, 2018
- Tetra Laval Holdings & Finance S.A.
- Luca Poppi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electron microscope with multiple types of integrated x-ray detecto...
- Patent number 9,972,474
- Issue date May 15, 2018
- FEI Company
- Cornelis van Beek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 9,875,877
- Issue date Jan 23, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron exit window foil
- Patent number 9,852,874
- Issue date Dec 26, 2017
- Tetra Laval Holdings & Finance S.A.
- Luca Poppi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged-particle-beam device, specimen-image acquisition method, an...
- Patent number 9,741,530
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample image acquiring method
- Patent number 9,741,526
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis in air
- Patent number 9,704,688
- Issue date Jul 11, 2017
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,673,020
- Issue date Jun 6, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source arrangement for a charged particle beam dev...
- Patent number 9,666,404
- Issue date May 30, 2017
- ICT Integrated Circuit Testing Gesellschaft für Halbleiteprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample storage container, charged particle beam apparatus, and imag...
- Patent number 9,564,288
- Issue date Feb 7, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,543,111
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical inspection of electronic devices using electron-beam ind...
- Patent number 9,523,714
- Issue date Dec 20, 2016
- Photon Dynamics, Inc.
- Alexander Kadyshevitch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and optical axis adjustment method
- Patent number 9,466,457
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assembly and method for reducing foil wrinkles
- Patent number 9,437,389
- Issue date Sep 6, 2016
- Tetra Laval Holdings & Finance S.A.
- Andreas Åberg
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 9,431,213
- Issue date Aug 30, 2016
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron exit window foil
- Patent number 9,384,934
- Issue date Jul 5, 2016
- Tetra Laval Holdings & Finance S.A.
- Luca Poppi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Inspection of a lithographic mask that is protected by a pellicle
- Patent number 9,366,954
- Issue date Jun 14, 2016
- Applied Materials Israel Ltd.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle beam device
- Patent number 9,263,232
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, position adjusting method for diaphra...
- Patent number 9,251,996
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,165,741
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,105,442
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 9,076,631
- Issue date Jul 7, 2015
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,921,786
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assembly and method for reducing foil wrinkles
- Patent number 8,907,554
- Issue date Dec 9, 2014
- Tetra Laval Holdings & Finance S.A.
- Ulrika Linné
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface, a method for observing an object within a non-vacuum env...
- Patent number 8,779,358
- Issue date Jul 15, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam exit window in electron beam emitter and method for f...
- Patent number 8,766,523
- Issue date Jul 1, 2014
- Hitachi Zosen Corporation
- Steven R. Walther
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20180122617
- Publication date May 3, 2018
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTOR...
- Publication number 20180033589
- Publication date Feb 1, 2018
- FEI Company
- Frederick H. Schamber
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20170271125
- Publication date Sep 21, 2017
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter J. STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20160343538
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...
- Publication number 20160336145
- Publication date Nov 17, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150380207
- Publication date Dec 31, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Storage Container, Charged Particle Beam Apparatus, and Imag...
- Publication number 20150255244
- Publication date Sep 10, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150213999
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON EXIT WINDOW FOIL
- Publication number 20150028220
- Publication date Jan 29, 2015
- Tetra Laval Holdings & Finance S.A.
- Luca Poppi
- B32 - LAYERED PRODUCTS
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20140361166
- Publication date Dec 11, 2014
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140175278
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...
- Publication number 20140151553
- Publication date Jun 5, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrical Inspection of Electronic Devices Using Electron-Beam Ind...
- Publication number 20140132299
- Publication date May 15, 2014
- Photon Dynamics, Inc.
- Alexander Kadyshevitch
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20140117232
- Publication date May 1, 2014
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140021347
- Publication date Jan 23, 2014
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20130313430
- Publication date Nov 28, 2013
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE PRODUCTION OF RADIOISOTOPES
- Publication number 20130182807
- Publication date Jul 18, 2013
- Taylor Ramon Wilson
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ASSEMBLY AND METHOD FOR REDUCING FOIL WRINKLES
- Publication number 20130094993
- Publication date Apr 18, 2013
- Tetra Laval Holdings & Finance S.A.
- Ulrika Linné
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER EXIT WINDOW
- Publication number 20130009077
- Publication date Jan 10, 2013
- HITACHI ZOSEN CORPORATION
- Steven R. Walther
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ASSEMBLY AND METHOD FOR REDUCING FOIL WRINKLES
- Publication number 20130000253
- Publication date Jan 3, 2013
- Tetra Laval Holdings & Finance S.A.
- Andreas Åberg
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20120241608
- Publication date Sep 27, 2012
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...
- Publication number 20120160999
- Publication date Jun 28, 2012
- UChicago Argonne, LLC
- Nestor J. Zaluzec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MONITORING THE INTENSITY OF AN ELECTRON BEAM
- Publication number 20110233414
- Publication date Sep 29, 2011
- KHS GmbH
- Gernot Keil
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
VACUUMED DEVICE AND A SCANNING ELECTRON MICROSCOPE
- Publication number 20110210247
- Publication date Sep 1, 2011
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20110168889
- Publication date Jul 14, 2011
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Application
Emitter Exit Window
- Publication number 20110012495
- Publication date Jan 20, 2011
- Advanced Electron Beams, Inc.
- Steven R. Walther
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...
- Publication number 20100140470
- Publication date Jun 10, 2010
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM GENERATING APPARATUS
- Publication number 20090212681
- Publication date Aug 27, 2009
- HAMAMATSU PHOTONICS K. K.
- Tatsuya Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Window With Coated Silicon Support Structure
- Publication number 20090173897
- Publication date Jul 9, 2009
- Keith W. Decker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
IRRADIATING DEVICE AND METHOD FOR CONTROLLING THE SAME
- Publication number 20080067406
- Publication date Mar 20, 2008
- Yaohong Liu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Particle-permeable windows

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray analysis in air

Inspection of a lithographic mask that is protected by a pellicle

Electron scanning microscope and image generation method

Method for assembling an electron exit window and an electron exit...

Electron microscope with multiple types of integrated x-ray detecto...

Electron scanning microscope and image generation method

Electron exit window foil

Charged-particle-beam device, specimen-image acquisition method, an...

Charged particle beam apparatus and sample image acquiring method

X-ray analysis in air

Charged particle beam device, method for adjusting charged particle...

Charged particle source arrangement for a charged particle beam dev...

Sample storage container, charged particle beam apparatus, and imag...

Charged particle beam device

Electrical inspection of electronic devices using electron-beam ind...

Observation apparatus and optical axis adjustment method

Scanning electron microscope

Assembly and method for reducing foil wrinkles

Scanning electron microscope, an interface and a method for observi...

Electron exit window foil

Inspection of a lithographic mask that is protected by a pellicle

Charged particle beam device

Charged particle beam device, position adjusting method for diaphra...

Charged particle beam device, method for adjusting charged particle...

Charged particle beam apparatus

Interface, a method for observing an object within a non-vacuum env...

Charged particle beam apparatus

Assembly and method for reducing foil wrinkles

Interface, a method for observing an object within a non-vacuum env...

Electron beam exit window in electron beam emitter and method for f...

Patents Applicationslast 30 patents

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTOR...

X-RAY ANALYSIS IN AIR

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...

SCANNING ELECTRON MICROSCOPE

Sample Storage Container, Charged Particle Beam Apparatus, and Imag...

Charged Particle Beam Apparatus

ELECTRON EXIT WINDOW FOIL

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...

Electrical Inspection of Electronic Devices Using Electron-Beam Ind...

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

DEVICE AND METHOD FOR THE PRODUCTION OF RADIOISOTOPES

ASSEMBLY AND METHOD FOR REDUCING FOIL WRINKLES

EMITTER EXIT WINDOW

ASSEMBLY AND METHOD FOR REDUCING FOIL WRINKLES

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...

METHOD AND DEVICE FOR MONITORING THE INTENSITY OF AN ELECTRON BEAM

VACUUMED DEVICE AND A SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

Emitter Exit Window

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENV...

ELECTRON BEAM GENERATING APPARATUS

Radiation Window With Coated Silicon Support Structure

IRRADIATING DEVICE AND METHOD FOR CONTROLLING THE SAME