Particular movement or positioning of scanning tip

Industry

CPC
Y10S977/851

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

Current Industry

Y10S977/851Particular movement or positioning of scanning tip

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe-based lithography method
- Patent number 8,387,160
- Issue date Feb 26, 2013
- International Business Machines Corporation
- Michel Despont
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 8,209,766
- Issue date Jun 26, 2012
- Park Systems Corp.
- Sang-il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanometer scale instrument for biochemically, chemically, or cataly...
- Patent number 8,046,843
- Issue date Oct 25, 2011
- General Nanotechnology L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe apparatus
- Patent number 8,035,089
- Issue date Oct 11, 2011
- Canon Kabushiki Kaisha
- Takao Kusaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for direct fabrication of nanostructures
- Patent number 7,998,528
- Issue date Aug 16, 2011
- Massachusetts Institute of Technology
- Brian Hubert
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,954,165
- Issue date May 31, 2011
- National University Corporation Kanazawa University
- Toshio Ando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus
- Patent number 7,904,966
- Issue date Mar 8, 2011
- Japan Science and Technology Agency
- Dai Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe in pulsed-force mode, digital and in real time
- Patent number 7,877,816
- Issue date Jan 25, 2011
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Peter Spizig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe-based lithography method
- Patent number 7,862,858
- Issue date Jan 4, 2011
- International Business Machines Corporation
- Michel Despont
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-sensing tweezer devices and associated methods for micro and n...
- Patent number 7,735,358
- Issue date Jun 15, 2010
- Insitutec, Inc.
- Marcin B. Bauza
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 7,644,447
- Issue date Jan 5, 2010
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope system
- Patent number 7,578,853
- Issue date Aug 25, 2009
- Honda Motor Co., Ltd.
- Tatsuya Hattori
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe apparatus
- Patent number 7,569,817
- Issue date Aug 4, 2009
- Canon Kabushiki Kaisha
- Takao Kusaka
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control of deposition in dip pen nanolithography
- Patent number 7,541,062
- Issue date Jun 2, 2009
- The United States of America as represented by the Secretary of the Navy
- Paul E. Sheehan
- G01 - MEASURING TESTING
Information Patent Grant
Nanometer scale data storage device and associated positioning system
- Patent number 7,535,817
- Issue date May 19, 2009
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe-based lithography method
- Patent number 7,491,425
- Issue date Feb 17, 2009
- International Business Machines Corporation
- Michel Despont
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,456,400
- Issue date Nov 25, 2008
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of bonding nano-tip using electrochemical...
- Patent number 7,452,432
- Issue date Nov 18, 2008
- Korean Advanced Institute of Science and Technology
- Soo Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyzing a specimen using atomic force mic...
- Patent number 7,430,898
- Issue date Oct 7, 2008
- KLA-Tencor Technologies Corp.
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy method and apparatus utilizing sample pitch
- Patent number 7,429,732
- Issue date Sep 30, 2008
- Veeco Instruments Inc.
- David A. Kneeburg
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus of spatially resolved electroluminescence of...
- Patent number 7,358,490
- Issue date Apr 15, 2008
- Northwestern University
- Mark C. Hersam
- G01 - MEASURING TESTING
Information Patent Grant
Precision machining method using a near-field scanning optical micr...
- Patent number 7,323,657
- Issue date Jan 29, 2008
- Matsushita Electric Industrial Co., Ltd.
- Chen-Hsiung Cheng
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for sensing a sample
- Patent number 7,278,301
- Issue date Oct 9, 2007
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Grant
Method for modifying existing micro-and nano-structures using a nea...
- Patent number 7,198,961
- Issue date Apr 3, 2007
- Matsushita Electric Industrial Co., Ltd.
- Ming Li
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and apparatus for scanning in scanning probe microscopy and...
- Patent number 7,178,387
- Issue date Feb 20, 2007
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Multi-dimensional force sensing for scanning probe microscopy using...
- Patent number 7,137,291
- Issue date Nov 21, 2006
- Xidex Corporation
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 7,095,020
- Issue date Aug 22, 2006
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Nanometer scale data storage device and associated positioning system
- Patent number 7,042,828
- Issue date May 9, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Active probe for an atomic force microscope and method for use thereof
- Patent number 7,017,398
- Issue date Mar 28, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tip orientation adjustment method for atomic force microscopy
- Patent number 6,978,654
- Issue date Dec 27, 2005
- Infineon Technologies AG
- David James Shuman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...
- Publication number 20120147722
- Publication date Jun 14, 2012
- General Nanotechnology, LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Direct Fabrication of Nanostructures
- Publication number 20110297084
- Publication date Dec 8, 2011
- Massachusetts Institute of Technology
- Brian Hubert
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE-BASED LITHOGRAPHY METHOD
- Publication number 20110020533
- Publication date Jan 27, 2011
- International Business Machines Corporation
- Michel Despont
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERH...
- Publication number 20100170015
- Publication date Jul 1, 2010
- Sang-il PARK
- G01 - MEASURING TESTING
Information Patent Application
Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...
- Publication number 20090324450
- Publication date Dec 31, 2009
- General Nanotechnology, LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE APPARATUS
- Publication number 20090261249
- Publication date Oct 22, 2009
- JAPAN SCIENCE AND TECHNOLOGY AGENCY
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CONTROL OF DEPOSITION IN DIP PEN NANOLITHOGRAPHY
- Publication number 20090255465
- Publication date Oct 15, 2009
- Paul E. Sheehan
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE APPARATUS
- Publication number 20090230320
- Publication date Sep 17, 2009
- Canon Kabushiki Kaisha
- Takao KUSAKA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20090133168
- Publication date May 21, 2009
- National University Corporation Kanazawa University
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE-BASED LITHOGRAPHY METHOD
- Publication number 20090100553
- Publication date Apr 16, 2009
- International Business Machines Corporation
- Michel Despont
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope capable of measuring samples having overh...
- Publication number 20080078932
- Publication date Apr 3, 2008
- PSIA Co, LTD
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope System
- Publication number 20080017809
- Publication date Jan 24, 2008
- Honda Motor Co., Ltd.
- Tatsuya Hattori
- G01 - MEASURING TESTING
Information Patent Application
Self-sensing tweezer devices and associated methods for micro and n...
- Publication number 20070240516
- Publication date Oct 18, 2007
- INSITUTEC, INC.
- Marcin B. Bauza
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SCANNING PROBE APPARATUS
- Publication number 20070158559
- Publication date Jul 12, 2007
- Canon Kabushiki Kaisha
- Takao KUSAKA
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe in pulsed-force mode, digital and in real time
- Publication number 20070114406
- Publication date May 24, 2007
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Peter Spizig
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy method and apparatus utilizing sample pitch
- Publication number 20070075243
- Publication date Apr 5, 2007
- David A. Kneeburg
- G01 - MEASURING TESTING
Information Patent Application
Nanometer scale data storage device and associated positioning system
- Publication number 20060239129
- Publication date Oct 26, 2006
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
System for Sensing a Sample
- Publication number 20060230819
- Publication date Oct 19, 2006
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
System for Sensing a Sample
- Publication number 20060207318
- Publication date Sep 21, 2006
- KLA-Tencor Corporation
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20060113472
- Publication date Jun 1, 2006
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for and method of bonding nano-tip using electrochemical...
- Publication number 20060102271
- Publication date May 18, 2006
- Korea Advanced Institute of Science and Technology
- Soo Hyun Kim
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe-based lithography method
- Publication number 20060091322
- Publication date May 4, 2006
- International Business Machines Corporation
- Michel Despont
- G01 - MEASURING TESTING
Information Patent Application
Thermal control of deposition in dip pen nanolithography
- Publication number 20060040057
- Publication date Feb 23, 2006
- Paul E. Sheehan
- G01 - MEASURING TESTING
Information Patent Application
Precision machining method using a near-field scanning optical micr...
- Publication number 20060027543
- Publication date Feb 9, 2006
- Chen-Hsiung Cheng
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
System for sensing a sample
- Publication number 20050262931
- Publication date Dec 1, 2005
- Thomas McWaid
- G01 - MEASURING TESTING
Information Patent Application
Method for modifying existing micro-and nano-structures using a nea...
- Publication number 20050221577
- Publication date Oct 6, 2005
- Ming Li
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Nanometer scale data storage device and associated positioning system
- Publication number 20050190684
- Publication date Sep 1, 2005
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Active probe for an atomic force microscope and method for use thereof
- Publication number 20050066714
- Publication date Mar 31, 2005
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20050029450
- Publication date Feb 10, 2005
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Scanning tip orientation adjustment method for atomic force microscopy
- Publication number 20050000275
- Publication date Jan 6, 2005
- David James Shuman
- G01 - MEASURING TESTING

Particular movement or positioning of scanning tip

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning probe-based lithography method

Scanning probe microscope capable of measuring samples having overh...

Nanometer scale instrument for biochemically, chemically, or cataly...

Scanning probe apparatus

Method for direct fabrication of nanostructures

Scanning probe microscope

Scanning probe microscope apparatus

Scanning probe in pulsed-force mode, digital and in real time

Scanning probe-based lithography method

Self-sensing tweezer devices and associated methods for micro and n...

Scanning probe microscope capable of measuring samples having overh...

Scanning probe microscope system

Scanning probe apparatus

Thermal control of deposition in dip pen nanolithography

Nanometer scale data storage device and associated positioning system

Scanning probe-based lithography method

Scanning probe microscope and scanning method

Apparatus for and method of bonding nano-tip using electrochemical...

Methods and systems for analyzing a specimen using atomic force mic...

Scanning probe microscopy method and apparatus utilizing sample pitch

Methods and apparatus of spatially resolved electroluminescence of...

Precision machining method using a near-field scanning optical micr...

System for sensing a sample

Method for modifying existing micro-and nano-structures using a nea...

Method and apparatus for scanning in scanning probe microscopy and...

Multi-dimensional force sensing for scanning probe microscopy using...

Sensing mode atomic force microscope

Nanometer scale data storage device and associated positioning system

Active probe for an atomic force microscope and method for use thereof

Scanning tip orientation adjustment method for atomic force microscopy

Patents Applicationslast 30 patents

Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...

Apparatus for Direct Fabrication of Nanostructures

SCANNING PROBE-BASED LITHOGRAPHY METHOD

SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERH...

Nanometer Scale Instrument for Biochemically, Chemically, or Cataly...

SCANNING PROBE MICROSCOPE APPARATUS

THERMAL CONTROL OF DEPOSITION IN DIP PEN NANOLITHOGRAPHY

SCANNING PROBE APPARATUS

SCANNING PROBE MICROSCOPE

SCANNING PROBE-BASED LITHOGRAPHY METHOD

Scanning probe microscope capable of measuring samples having overh...

Scanning Probe Microscope System

Self-sensing tweezer devices and associated methods for micro and n...

SCANNING PROBE APPARATUS

Scanning probe in pulsed-force mode, digital and in real time

Scanning probe microscopy method and apparatus utilizing sample pitch

Nanometer scale data storage device and associated positioning system

System for Sensing a Sample

System for Sensing a Sample

Scanning probe microscope and scanning method

Apparatus for and method of bonding nano-tip using electrochemical...

Scanning probe-based lithography method

Thermal control of deposition in dip pen nanolithography

Precision machining method using a near-field scanning optical micr...

System for sensing a sample

Method for modifying existing micro-and nano-structures using a nea...

Nanometer scale data storage device and associated positioning system

Active probe for an atomic force microscope and method for use thereof

Sensing mode atomic force microscope

Scanning tip orientation adjustment method for atomic force microscopy