particularly adapted for storage oscilloscopes

Industry

CPC
G01R13/225

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/225particularly adapted for storage oscilloscopes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
User interface for a testing device configured to guide user testin...
- Patent number 11,268,979
- Issue date Mar 8, 2022
- Fluke Corporation
- Erik Johan Gervedink Nijhuis
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system as well as method for analyzing an analog signal
- Patent number 10,620,264
- Issue date Apr 14, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Matching circuit for matching an impedance value and a correspondin...
- Patent number 9,952,256
- Issue date Apr 24, 2018
- Rohde & Schwarz GmbH & Co. KG
- Oliver Landolt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Band overlay separator
- Patent number 9,933,458
- Issue date Apr 3, 2018
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measured data display device with strip chart simulation and table...
- Patent number 4,905,165
- Issue date Feb 27, 1990
- Chino Corporation
- Toshikazu Inden
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Waveform timing alignment system for digital oscilloscopes
- Patent number 4,843,309
- Issue date Jun 27, 1989
- Tektronix, Inc.
- Arif Kareem
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for achieving variable and infinite persistence
- Patent number 4,829,293
- Issue date May 9, 1989
- Hewlett-Packard Company
- Rodney T. Schlater
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Repeated information detection
- Patent number 4,613,857
- Issue date Sep 23, 1986
- Micro Consultants Limited
- Ian C. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Cathode ray oscilloscope with a waveform storage capability
- Patent number 4,542,339
- Issue date Sep 17, 1985
- Iwatsu Electric Co., Ltd.
- Mitsuo Iwakura
- G01 - MEASURING TESTING
Information Patent Grant
Channel multiplier plate CRT scan converter and scan conversion method
- Patent number 4,147,988
- Issue date Apr 3, 1979
- Tektronix, Inc.
- Dennis R. Hall
- G01 - MEASURING TESTING
Information Patent Grant
Method of providing storage dielectric of phosphor particles coated...
- Patent number 4,024,298
- Issue date May 17, 1977
- Tektronix, Inc.
- Ralph Allen Mossman
- G01 - MEASURING TESTING
Information Patent Grant
Bistable storage tube having storage dielectric of phosphor particl...
- Patent number 3,982,150
- Issue date Sep 21, 1976
- Tektronix, Inc.
- Ralph A. Mossman
- G01 - MEASURING TESTING
Information Patent Grant
Channel electron multiplier signal detector and digitizer
- Patent number 3,947,841
- Issue date Mar 30, 1976
- The United States of America as represented by the Secretary of the Army
- Thomas A. Tumolillo
- G01 - MEASURING TESTING
Information Patent Grant
3751688
- Patent number 3,751,688
- Issue date Aug 7, 1973
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
3715619
- Patent number 3,715,619
- Issue date Feb 6, 1973
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
3670200
- Patent number 3,670,200
- Issue date Jun 13, 1972
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3657595
- Patent number 3,657,595
- Issue date Apr 18, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3628081
- Patent number 3,628,081
- Issue date Dec 14, 1971
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
3619622
- Patent number 3,619,622
- Issue date Nov 9, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3611000
- Patent number 3,611,000
- Issue date Oct 5, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3569770
- Patent number 3,569,770
- Issue date Mar 9, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3569771
- Patent number 3,569,771
- Issue date Mar 9, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3506971
- Patent number 3,506,971
- Issue date Apr 14, 1970
- G11 - INFORMATION STORAGE
Information Patent Grant
3439214
- Patent number 3,439,214
- Issue date Apr 15, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3426237
- Patent number 3,426,237
- Issue date Feb 4, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3153699
- Patent number 3,153,699
- Issue date Oct 20, 1964
- G01 - MEASURING TESTING
Information Patent Grant
2914697
- Patent number 2,914,697
- Issue date Nov 24, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2874328
- Patent number 2,874,328
- Issue date Feb 17, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2591738
- Patent number 2,591,738
- Issue date Apr 8, 1952
- G01 - MEASURING TESTING
Information Patent Grant
2438420
- Patent number 2,438,420
- Issue date Mar 23, 1948
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSTRUMENT FOR ANALYZING AN INPUT SIGNAL
- Publication number 20220011347
- Publication date Jan 13, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
USER INTERFACE FOR A TESTING DEVICE CONFIGURED TO GUIDE USER TESTIN...
- Publication number 20190376999
- Publication date Dec 12, 2019
- FLUKE CORPORATION
- Erik Johan Gervedink Nijhuis
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL
- Publication number 20180335474
- Publication date Nov 22, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
BAND OVERLAY SEPARATOR
- Publication number 20160291056
- Publication date Oct 6, 2016
- Tektronix, Inc.
- John J. PICKERD
- G01 - MEASURING TESTING
Information Patent Application
MATCHING CIRCUIT FOR MATCHING AN IMPEDANCE VALUE AND A CORRESPONDIN...
- Publication number 20160156336
- Publication date Jun 2, 2016
- ROHDE & SCHWARZ GMBH & CO. KG
- Oliver Landolt
- G01 - MEASURING TESTING

particularly adapted for storage oscilloscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

User interface for a testing device configured to guide user testin...

Measuring system as well as method for analyzing an analog signal

Matching circuit for matching an impedance value and a correspondin...

Band overlay separator

Measured data display device with strip chart simulation and table...

Waveform timing alignment system for digital oscilloscopes

Method and apparatus for achieving variable and infinite persistence

Repeated information detection

Cathode ray oscilloscope with a waveform storage capability

Channel multiplier plate CRT scan converter and scan conversion method

Method of providing storage dielectric of phosphor particles coated...

Bistable storage tube having storage dielectric of phosphor particl...

Channel electron multiplier signal detector and digitizer

3751688

3715619

3670200

3657595

3628081

3619622

3611000

3569770

3569771

3506971

3439214

3426237

3153699

2914697

2874328

2591738

2438420

Patents Applicationslast 30 patents

INSTRUMENT FOR ANALYZING AN INPUT SIGNAL

USER INTERFACE FOR A TESTING DEVICE CONFIGURED TO GUIDE USER TESTIN...

MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL

BAND OVERLAY SEPARATOR

MATCHING CIRCUIT FOR MATCHING AN IMPEDANCE VALUE AND A CORRESPONDIN...