Pattern generation

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CPC
G11C29/56004

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/56004Pattern generation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Memory with parallel main and test interfaces
- Patent number 12,243,610
- Issue date Mar 4, 2025
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test method, memory test apparatus, memory test device, and...
- Patent number 12,237,036
- Issue date Feb 25, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaolei Li
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and memory system
- Patent number 12,211,572
- Issue date Jan 28, 2025
- Samsung Electronics Co., Ltd.
- Kyoungho Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die testing for a memory device
- Patent number 12,211,571
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,174,717
- Issue date Dec 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock generating circuit and method for trimming period of oscillat...
- Patent number 12,169,419
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Hyunil Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing system and testing method
- Patent number 12,142,340
- Issue date Nov 12, 2024
- Realtek Semiconductor Corporation
- Shih-Chieh Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Analog signals monitoring for functional safety
- Patent number 12,131,792
- Issue date Oct 29, 2024
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Grant
Latch performance detection method, device and electronic device
- Patent number 12,106,816
- Issue date Oct 1, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,099,424
- Issue date Sep 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device and test system including the same
- Patent number 11,989,459
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Hongjun Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Path based controls for ATE mode testing of multicell memory circuit
- Patent number 11,933,844
- Issue date Mar 19, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference bits test and repair using memory built-in self-test
- Patent number 11,929,136
- Issue date Mar 12, 2024
- SIEMENS INDUSTRY SOFTWARE INC.
- Jongsin Yun
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic generation of ATPG mode signals for testing multipath memor...
- Patent number 11,879,940
- Issue date Jan 23, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for verifying and analyzing memory for high perfo...
- Patent number 11,862,275
- Issue date Jan 2, 2024
- KingTiger Technology (Canada) Inc.
- Bosco Chun Sang Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test systems and memory test methods
- Patent number 11,862,278
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method for control chip and related device
- Patent number 11,862,268
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test methods and related devices
- Patent number 11,854,642
- Issue date Dec 26, 2023
- Changxin Memory Technologies, Inc.
- Heng-Chia Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 11,830,561
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Youngmin Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,755,410
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Redundancy analysis method and redundancy analysis apparatus
- Patent number 11,631,474
- Issue date Apr 18, 2023
- UIF (University Industry Foundation), Yonsei University
- Sung Ho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory training methods and related devices
- Patent number 11,631,451
- Issue date Apr 18, 2023
- Changxin Memory Technologies, Inc.
- Guangteng Long
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller structural testing with automated test vectors
- Patent number 11,598,808
- Issue date Mar 7, 2023
- Micron Technology, Inc.
- Michael Richard Spica
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and test system including the same
- Patent number 11,520,528
- Issue date Dec 6, 2022
- Samsung Electronics Co., Ltd.
- Hongjun Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device, method of testing the same and test sy...
- Patent number 11,501,846
- Issue date Nov 15, 2022
- Samsung Electronics Co., Ltd.
- Sanglok Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,429,482
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test method and related device
- Patent number 11,393,553
- Issue date Jul 19, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 11,295,829
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analyzing apparatus and failure analyzing method
- Patent number 11,162,995
- Issue date Nov 2, 2021
- TOSHIBA MEMORY CORPORATION
- Yukinobu Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing method, device, electronic apparatus and computer read...
- Patent number 11,145,386
- Issue date Oct 12, 2021
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ruei-Yuan Guo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY MODULE, OPERATING METHOD OF MEMORY MODULE, AND MEMORY SYSTEM...
- Publication number 20250087293
- Publication date Mar 13, 2025
- Samsung Electronics Co., Ltd.
- JINSEONG YUN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE
- Publication number 20240395355
- Publication date Nov 28, 2024
- ETRON TECHNOLOGY, INC.
- Chun Shiah
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING
- Publication number 20240371460
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Smruti Subhash Jhaveri
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...
- Publication number 20240347129
- Publication date Oct 17, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...
- Publication number 20240296901
- Publication date Sep 5, 2024
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...
- Publication number 20240274222
- Publication date Aug 15, 2024
- Tektronix, Inc.
- Swapnil Jhawar
- G11 - INFORMATION STORAGE
Information Patent Application
MODE REGISTER UPDATE (MRUPD) MODE
- Publication number 20240249795
- Publication date Jul 25, 2024
- Intel Corporation
- Saravanan SETHURAMAN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...
- Publication number 20240233857
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Kuihan Ko
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE
- Publication number 20240212783
- Publication date Jun 27, 2024
- KINGTIGER Testing Technology (SZ) Ltd.
- Bosco Chun Sang LAI
- G11 - INFORMATION STORAGE
Information Patent Application
CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...
- Publication number 20240212784
- Publication date Jun 27, 2024
- Intel NDTM US LLC
- Ashish SHUKLA
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
- Publication number 20240193058
- Publication date Jun 13, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Latch Performance Detection Method, Device and Electronic Device
- Publication number 20240170092
- Publication date May 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
- Publication number 20240071556
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM
- Publication number 20240071557
- Publication date Feb 29, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhi YANG
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic Address Scramble
- Publication number 20240071464
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Erik T. Barmon
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES
- Publication number 20240055068
- Publication date Feb 15, 2024
- Rambus Inc.
- Srinivas Satish Babu Bamdhamravuri
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...
- Publication number 20240021265
- Publication date Jan 18, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaolei LI
- G11 - INFORMATION STORAGE
Information Patent Application
Analog Signals Monitoring for Functional Safety
- Publication number 20230268023
- Publication date Aug 24, 2023
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20230230652
- Publication date Jul 20, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- Shih-Chieh LIN
- G11 - INFORMATION STORAGE
Information Patent Application
REFERENCE BITS TEST AND REPAIR USING MEMORY BUILT-IN SELF-TEST
- Publication number 20230178172
- Publication date Jun 8, 2023
- Siemens Industry Software Inc.
- Jongsin Yun
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
- Publication number 20230094273
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Youngmin LEE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20230091567
- Publication date Mar 23, 2023
- Samsung Electronics Co., Ltd.
- Hongjun JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY TEST SYSTEMS AND MEMORY TEST METHODS
- Publication number 20230055639
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20220358013
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY TEST METHODS AND RELATED DEVICES
- Publication number 20220343994
- Publication date Oct 27, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Heng-Chia CHANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY TRAINING METHODS AND RELATED DEVICES
- Publication number 20220319568
- Publication date Oct 6, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Guangteng LONG
- G11 - INFORMATION STORAGE
Information Patent Application
TEST METHOD FOR CONTROL CHIP AND RELATED DEVICE
- Publication number 20220223219
- Publication date Jul 14, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi SHI
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR VERIFYING AND ANALYZING MEMORY FOR HIGH PERFO...
- Publication number 20220148673
- Publication date May 12, 2022
- Bosco Chun Sang Lai
- G11 - INFORMATION STORAGE
Information Patent Application
REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS
- Publication number 20220130486
- Publication date Apr 28, 2022
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sung Ho Kang
- G11 - INFORMATION STORAGE
Information Patent Application
ON-DIE TESTING FOR A MEMORY DEVICE
- Publication number 20220108761
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE

Pattern generation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory with parallel main and test interfaces

Memory test method, memory test apparatus, memory test device, and...

Semiconductor device and memory system

On-die testing for a memory device

Apparatus, systems, and methods for dynamically reconfigured semico...

Clock generating circuit and method for trimming period of oscillat...

Testing system and testing method

Analog signals monitoring for functional safety

Latch performance detection method, device and electronic device

Apparatus, systems, and methods for dynamically reconfigured semico...

Semiconductor memory device and test system including the same

Path based controls for ATE mode testing of multicell memory circuit

Reference bits test and repair using memory built-in self-test

Dynamic generation of ATPG mode signals for testing multipath memor...

System and method for verifying and analyzing memory for high perfo...

Memory test systems and memory test methods

Test method for control chip and related device

Memory test methods and related devices

Storage devices and methods of operating storage devices

Systems and methods for correcting data errors in memory

Redundancy analysis method and redundancy analysis apparatus

Semiconductor memory training methods and related devices

Controller structural testing with automated test vectors

Semiconductor memory device and test system including the same

Semiconductor memory device, method of testing the same and test sy...

Systems and methods for correcting data errors in memory

Memory test method and related device

Built-in self-test (BIST) engine configured to store a per pattern...

Failure analyzing apparatus and failure analyzing method

Chip testing method, device, electronic apparatus and computer read...

Patents Applicationslast 30 patents

MEMORY MODULE, OPERATING METHOD OF MEMORY MODULE, AND MEMORY SYSTEM...

MEMORY DEVICE

SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...

SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...

TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...

MODE REGISTER UPDATE (MRUPD) MODE

MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...

METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE

CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...

APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...

Latch Performance Detection Method, Device and Electronic Device

MEMORY WITH PARALLEL MAIN AND TEST INTERFACES

FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM

Dynamic Address Scramble

SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES

MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...

Analog Signals Monitoring for Functional Safety

TESTING SYSTEM AND TESTING METHOD

REFERENCE BITS TEST AND REPAIR USING MEMORY BUILT-IN SELF-TEST

STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES

SEMICONDUCTOR MEMORY DEVICE AND TEST SYSTEM INCLUDING THE SAME

MEMORY TEST SYSTEMS AND MEMORY TEST METHODS

Systems and Methods for Correcting Data Errors in Memory

MEMORY TEST METHODS AND RELATED DEVICES

SEMICONDUCTOR MEMORY TRAINING METHODS AND RELATED DEVICES

TEST METHOD FOR CONTROL CHIP AND RELATED DEVICE

SYSTEM AND METHOD FOR VERIFYING AND ANALYZING MEMORY FOR HIGH PERFO...

REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS

ON-DIE TESTING FOR A MEMORY DEVICE