Peak detecting in spectrum

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G01J2003/2859

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/2859Peak detecting in spectrum

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Patents Grantslast 30 patents

Information Patent Grant
Peak determination in two-dimensional optical spectra
- Patent number 12,163,837
- Issue date Dec 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen Schlueter
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for element identification via optical emission s...
- Patent number 12,140,478
- Issue date Nov 12, 2024
- Agilent Technologies, Inc.
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis system, learned model generation method, and sample...
- Patent number 12,117,343
- Issue date Oct 15, 2024
- National Institute of Advanced Industrial Science and Technology
- Yoshiyuki Teramoto
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral image measurement device and calibration method there...
- Patent number 12,104,956
- Issue date Oct 1, 2024
- SEOUL VIOSYS CO., LTD.
- Seong Tae Jang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for finding the peak wavelength of the spectrum s...
- Patent number 12,078,537
- Issue date Sep 3, 2024
- Nicoya Lifesciences Inc.
- Udayan Kanade
- G01 - MEASURING TESTING
Information Patent Grant
Method for the identification of an incorrectly calibrated or non-c...
- Patent number 11,913,875
- Issue date Feb 27, 2024
- Evonik Operations GmbH
- Ingolf Reimann
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,781,994
- Issue date Oct 10, 2023
- Yokogawa Electric Corporation
- Syuhei Okada
- G01 - MEASURING TESTING
Information Patent Grant
Learning method, management device, and management program
- Patent number 11,556,853
- Issue date Jan 17, 2023
- Tokyo Electron Limited
- Yuki Kataoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of one or more spectral features in a spectrum of a...
- Patent number 11,293,856
- Issue date Apr 5, 2022
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Julius Krause
- G01 - MEASURING TESTING
Information Patent Grant
Hyper-spectral image measurement device and calibration method ther...
- Patent number 11,274,966
- Issue date Mar 15, 2022
- SEOUL VIOSYS CO., LTD.
- Seong Tae Jang
- G01 - MEASURING TESTING
Information Patent Grant
Discharge detection system and discharge detection method
- Patent number 11,009,466
- Issue date May 18, 2021
- SUBARU CORPORATION
- Takayuki Nishi
- G01 - MEASURING TESTING
Information Patent Grant
Method for the correction of background signals in a spectrum
- Patent number 10,760,966
- Issue date Sep 1, 2020
- Analytik Jena AG
- Eike Thamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrowband laser apparatus and spectral linewidth measuring apparatus
- Patent number 10,741,991
- Issue date Aug 11, 2020
- Gigaphoton Inc.
- Takahito Kumazaki
- G01 - MEASURING TESTING
Information Patent Grant
Infrared detection system
- Patent number 10,684,168
- Issue date Jun 16, 2020
- SHARP KABUSHIKI KAISHA
- Tazuko Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Detector, correction method and calibration method of detector, det...
- Patent number 10,677,720
- Issue date Jun 9, 2020
- SHARP KABUSHIKI KAISHA
- Tazuko Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Spectral image correcting apparatus and spectral image correcting m...
- Patent number 10,627,290
- Issue date Apr 21, 2020
- Samsung Electronics Co., Ltd.
- Yun S Park
- G01 - MEASURING TESTING
Information Patent Grant
Hyper-spectral image measurement device and calibration method ther...
- Patent number 10,551,248
- Issue date Feb 4, 2020
- SEOUL VIOSYS CO., LTD.
- Seong Tae Jang
- G02 - OPTICS
Information Patent Grant
Mass spectrometric data analyzer and program for analyzing mass spe...
- Patent number 10,466,104
- Issue date Nov 5, 2019
- Shimadzu Corporation
- Yosihiro Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the non-destructive testing of a casing
- Patent number 10,458,906
- Issue date Oct 29, 2019
- SAFRAN AIRCRAFT ENGINES
- Jean-Louis Romero
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave spectrometry system
- Patent number 10,345,150
- Issue date Jul 9, 2019
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Seiji Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Attenuated light beam peak frequency modification
- Patent number 10,095,055
- Issue date Oct 9, 2018
- Viavi Solutions Inc.
- Chris Wagner
- G02 - OPTICS
Information Patent Grant
Tag reading using targeted spatial spectral detection
- Patent number 10,024,717
- Issue date Jul 17, 2018
- TruTag Technologies, Inc.
- Timothy Learmonth
- G01 - MEASURING TESTING
Information Patent Grant
Method for assessing the damage to a paint-covered composite materi...
- Patent number 9,797,829
- Issue date Oct 24, 2017
- Aircelle
- Andre Baillard
- G01 - MEASURING TESTING
Information Patent Grant
Self-referencing cavity enhanced spectroscopy (SRCES) systems and m...
- Patent number 9,778,110
- Issue date Oct 3, 2017
- Picarro, Inc.
- Chris W. Rella
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for sensing parameters using Fiber Bragg Grati...
- Patent number 9,726,538
- Issue date Aug 8, 2017
- OPTILAB, LLC
- Henry H. Hung
- G01 - MEASURING TESTING
Information Patent Grant
Deconvoluted band representation for infrared spectrum compression
- Patent number 5,311,445
- Issue date May 10, 1994
- Board of Regents of the University of Oklahoma
- Robert L. White
- G01 - MEASURING TESTING
Information Patent Grant
Material analysis using reflected light
- Patent number 4,629,322
- Issue date Dec 16, 1986
- The United States of America as represented by the Secretary of the Army
- John H. Pollard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Binned Spectrographic Analyzer of Pulses within a Signal
- Publication number 20240353259
- Publication date Oct 24, 2024
- The United States of America, as represented by the Secretary of the Navy
- Dwane F. Sample
- G01 - MEASURING TESTING
Information Patent Application
COLORANT COMPENSATION USING RELATIVE COLORANT VOLUMES
- Publication number 20240308233
- Publication date Sep 19, 2024
- Hewlett-Packard Development Company, L.P.
- Jan Morovic
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SYSTEM AND METHOD FOR FINDING THE PEAK WAVELENGTH OF THE SPECTRUM S...
- Publication number 20240175749
- Publication date May 30, 2024
- Nicoya Lifesciences Inc.
- Udayan KANADE
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20240099586
- Publication date Mar 28, 2024
- Hamamatsu Photonics K.K.
- Tomomi IIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A SPECTRAL PEAK
- Publication number 20230194344
- Publication date Jun 22, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Ning Ning Pan
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer
- Publication number 20230168125
- Publication date Jun 1, 2023
- Shimadzu Corporation
- Ryoji HIRAOKA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEM, LEARNED MODEL GENERATION METHOD, AND SAMPLE...
- Publication number 20230070781
- Publication date Mar 9, 2023
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Yoshiyuki TERAMOTO
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR WAVELENGTH CALIBRATION
- Publication number 20230052878
- Publication date Feb 16, 2023
- ams Sensors Singapore Pte. Ltd.
- Javier MIGUEL SÁNCHEZ
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING OPTICAL SPECTRA
- Publication number 20230018735
- Publication date Jan 19, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Ayrat MURTAZIN
- G01 - MEASURING TESTING
Information Patent Application
INFLAMMABLE SPARK ESTIMATION SYSTEM
- Publication number 20220364921
- Publication date Nov 17, 2022
- SUBARU CORPORATION
- Takayuki NISHI
- G01 - MEASURING TESTING
Information Patent Application
DUAL WAVELENGTH COMBINED FINGERPRINT AND HIGH WAVENUMBER RAMAN SPEC...
- Publication number 20220357279
- Publication date Nov 10, 2022
- Vanderbilt University
- Laura E. Masson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20220317056
- Publication date Oct 6, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Syuhei OKADA
- G01 - MEASURING TESTING
Information Patent Application
Peak Determination in Two-Dimensional Optical Spectra
- Publication number 20220252454
- Publication date Aug 11, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen Schlueter
- G01 - MEASURING TESTING
Information Patent Application
Optical Filter and Electronic Device
- Publication number 20220082744
- Publication date Mar 17, 2022
- SEIKO EPSON CORPORATION
- Tomoaki NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE IDENTIFICATION OF AN INCORRECTLY CALIBRATED OR NON-C...
- Publication number 20220026350
- Publication date Jan 27, 2022
- Evonik Operations GmbH
- Ingolf REIMANN
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFICATION OF ONE OR MORE SPECTRAL FEATURES IN A SPECTRUM OF A...
- Publication number 20210181093
- Publication date Jun 17, 2021
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Julius KRAUSE
- G01 - MEASURING TESTING
Information Patent Application
DISCHARGE DETECTION SYSTEM AND DISCHARGE DETECTION METHOD
- Publication number 20200141872
- Publication date May 7, 2020
- SUBARU CORPORATION
- Takayuki NISHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL IMAGE CORRECTING APPARATUS AND SPECTRAL IMAGE CORRECTING M...
- Publication number 20190391015
- Publication date Dec 26, 2019
- Samsung Electronics Co., Ltd.
- Yun S PARK
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR, CORRECTION METHOD AND CALIBRATION METHOD OF DETECTOR, DET...
- Publication number 20190162656
- Publication date May 30, 2019
- Sharp Kabushiki Kaisha
- TAZUKO KITAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS DATA ANALYZING APPARATUS AND MASS ANALYSIS DATA ANALY...
- Publication number 20180340827
- Publication date Nov 29, 2018
- Shimadzu Corporation
- Yosihiro YAMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFRARED DETECTION SYSTEM
- Publication number 20180299326
- Publication date Oct 18, 2018
- Sharp Kabushiki Kaisha
- Tazuko KITAZAWA
- G01 - MEASURING TESTING
Information Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
- Publication number 20180292261
- Publication date Oct 11, 2018
- TruTag Technologies, Inc.
- Timothy Learmonth
- G01 - MEASURING TESTING
Information Patent Application
NARROWBAND LASER APPARATUS AND SPECTRAL LINEWIDTH MEASURING APPARATUS
- Publication number 20180254600
- Publication date Sep 6, 2018
- Gigaphoton Inc.
- Takahito KUMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE NON-DESTRUCTIVE TESTING OF A CASING
- Publication number 20180217057
- Publication date Aug 2, 2018
- SAFRAN AIRCRAFT ENGINES
- Jean-Louis Romero
- G01 - MEASURING TESTING
Information Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
- Publication number 20170146402
- Publication date May 25, 2017
- TruTag Technologies, Inc.
- Timothy Learmonth
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATED LIGHT BEAM PEAK FREQUENCY MODIFICATION
- Publication number 20170082874
- Publication date Mar 23, 2017
- Viavi Solutions Inc.
- Chris WAGNER
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR SENSING PARAMETERS USING FIBER BRAGG GRATI...
- Publication number 20160103017
- Publication date Apr 14, 2016
- Henry H. Hung
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ANALYZING NOISE IN AN ELECTROPHYSIOLOGY STUDY
- Publication number 20150012222
- Publication date Jan 8, 2015
- GENERAL ELECTRIC COMPANY
- Adrian F. Warner
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE OPTICAL BIOSENSOR MEASURING APPARATUS AND MEASUREMENT METH...
- Publication number 20100124790
- Publication date May 20, 2010
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Hyunsung Ko
- G01 - MEASURING TESTING

Peak detecting in spectrum

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Peak determination in two-dimensional optical spectra

Method and system for element identification via optical emission s...

Sample analysis system, learned model generation method, and sample...

Hyperspectral image measurement device and calibration method there...

System and method for finding the peak wavelength of the spectrum s...

Method for the identification of an incorrectly calibrated or non-c...

Measurement apparatus and measurement method

Learning method, management device, and management program

Identification of one or more spectral features in a spectrum of a...

Hyper-spectral image measurement device and calibration method ther...

Discharge detection system and discharge detection method

Method for the correction of background signals in a spectrum

Narrowband laser apparatus and spectral linewidth measuring apparatus

Infrared detection system

Detector, correction method and calibration method of detector, det...

Spectral image correcting apparatus and spectral image correcting m...

Hyper-spectral image measurement device and calibration method ther...

Mass spectrometric data analyzer and program for analyzing mass spe...

Method for the non-destructive testing of a casing

Terahertz wave spectrometry system

Attenuated light beam peak frequency modification

Tag reading using targeted spatial spectral detection

Method for assessing the damage to a paint-covered composite materi...

Self-referencing cavity enhanced spectroscopy (SRCES) systems and m...

Apparatus and method for sensing parameters using Fiber Bragg Grati...

Deconvoluted band representation for infrared spectrum compression

Material analysis using reflected light

Patents Applicationslast 30 patents

Binned Spectrographic Analyzer of Pulses within a Signal

COLORANT COMPENSATION USING RELATIVE COLORANT VOLUMES

SYSTEM AND METHOD FOR FINDING THE PEAK WAVELENGTH OF THE SPECTRUM S...

ANALYSIS DEVICE AND ANALYSIS METHOD

METHOD OF ANALYZING A SPECTRAL PEAK

Spectrometer

SAMPLE ANALYSIS SYSTEM, LEARNED MODEL GENERATION METHOD, AND SAMPLE...

DETECTOR WAVELENGTH CALIBRATION

PROCESSING OPTICAL SPECTRA

INFLAMMABLE SPARK ESTIMATION SYSTEM

DUAL WAVELENGTH COMBINED FINGERPRINT AND HIGH WAVENUMBER RAMAN SPEC...

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

Peak Determination in Two-Dimensional Optical Spectra

Optical Filter and Electronic Device

METHOD FOR THE IDENTIFICATION OF AN INCORRECTLY CALIBRATED OR NON-C...

IDENTIFICATION OF ONE OR MORE SPECTRAL FEATURES IN A SPECTRUM OF A...

DISCHARGE DETECTION SYSTEM AND DISCHARGE DETECTION METHOD

SPECTRAL IMAGE CORRECTING APPARATUS AND SPECTRAL IMAGE CORRECTING M...

DETECTOR, CORRECTION METHOD AND CALIBRATION METHOD OF DETECTOR, DET...

MASS ANALYSIS DATA ANALYZING APPARATUS AND MASS ANALYSIS DATA ANALY...

INFRARED DETECTION SYSTEM

TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION

NARROWBAND LASER APPARATUS AND SPECTRAL LINEWIDTH MEASURING APPARATUS

METHOD FOR THE NON-DESTRUCTIVE TESTING OF A CASING

TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION

ATTENUATED LIGHT BEAM PEAK FREQUENCY MODIFICATION

APPARATUS AND METHOD FOR SENSING PARAMETERS USING FIBER BRAGG GRATI...

METHOD AND SYSTEM FOR ANALYZING NOISE IN AN ELECTROPHYSIOLOGY STUDY

PORTABLE OPTICAL BIOSENSOR MEASURING APPARATUS AND MEASUREMENT METH...