Permanent magnetic lenses

Industry

CPC
H01J37/143

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/143Permanent magnetic lenses

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for selectively transmitting objects
- Patent number 11,666,924
- Issue date Jun 6, 2023
- Paul Neiser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Counter pole with permanent magnets
- Patent number 11,417,493
- Issue date Aug 16, 2022
- FEI Company
- Lubomír Tůma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 11,075,053
- Issue date Jul 27, 2021
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetically microfocused electron emission source
- Patent number 11,037,753
- Issue date Jun 15, 2021
- KLA Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,468,227
- Issue date Nov 5, 2019
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,032,600
- Issue date Jul 24, 2018
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,812,283
- Issue date Nov 7, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,799,484
- Issue date Oct 24, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for optimizing diffusion section of electron beam
- Patent number 9,767,985
- Issue date Sep 19, 2017
- Huazhong University of Science & Technology
- Jiang Huang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle source
- Patent number 9,754,760
- Issue date Sep 5, 2017
- Hermes Microvision Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tubular permanent magnet used in a multi-electron beam device
- Patent number 9,418,815
- Issue date Aug 16, 2016
- Param Corporation
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Permanent magnet based high performance multi-axis immersion electr...
- Patent number 9,165,745
- Issue date Oct 20, 2015
- Maglen Pte Ltd
- Tao Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,921,784
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Permanent magnet lens array
- Patent number 8,698,094
- Issue date Apr 15, 2014
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnet for ion beam irradiation apparatus equipped with protective...
- Patent number 8,476,602
- Issue date Jul 2, 2013
- Nissin Ion Equipment Co., Ltd.
- Dan Nicolaescu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-column electron beam exposure apparatus and magnetic field ge...
- Patent number 8,390,201
- Issue date Mar 5, 2013
- Advantest Corp.
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for the field emission of particles and production method
- Patent number 8,242,674
- Issue date Aug 14, 2012
- Josef Sellmair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron lens and charged particle beam apparatus
- Patent number 7,759,652
- Issue date Jul 20, 2010
- Hitachi High-Technologies Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer
- Patent number 7,569,816
- Issue date Aug 4, 2009
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source having an extraction electrode provided with a...
- Patent number 7,372,195
- Issue date May 13, 2008
- Applied Materials, Inc.
- Steven T. Coyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus with permanent magnetic lenses
- Patent number 7,285,785
- Issue date Oct 23, 2007
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus with permanent magnetic lenses
- Patent number 7,064,325
- Issue date Jun 20, 2006
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3812365
- Patent number 3,812,365
- Issue date May 21, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3324433
- Patent number 3,324,433
- Issue date Jun 6, 1967
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3250961
- Patent number 3,250,961
- Issue date May 10, 1966
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3021458
- Patent number 3,021,458
- Issue date Feb 13, 1962
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2928004
- Patent number 2,928,004
- Issue date Mar 8, 1960
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2858443
- Patent number 2,858,443
- Issue date Oct 28, 1958
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2804548
- Patent number 2,804,548
- Issue date Aug 27, 1957
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2761991
- Patent number 2,761,991
- Issue date Sep 4, 1956
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope
- Publication number 20240242923
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Michiko SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL SYSTEM AND CHARGED PARTICLE APPARATUS
- Publication number 20240212969
- Publication date Jun 27, 2024
- Nikon Corporation
- Takakuni GOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjustable Permanent Magnetic Lens Having Thermal Control Device
- Publication number 20240021403
- Publication date Jan 18, 2024
- IMS Nanofabrication GmbH
- Dietmar Puchberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjustable Permanent Magnetic Lens Having Shunting Device
- Publication number 20230360878
- Publication date Nov 9, 2023
- IMS Nanofabrication GmbH
- Dietmar Puchberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE PARTICLE BEAM SYSTEM WITH A CONTRAST CORRECTION LENS SYSTEM
- Publication number 20230207251
- Publication date Jun 29, 2023
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COUNTER POLE WITH PERMANENT MAGNETS
- Publication number 20220199354
- Publication date Jun 23, 2022
- FEI Company
- Lubomír Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20220068589
- Publication date Mar 3, 2022
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20200126753
- Publication date Apr 23, 2020
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetically Microfocused Electron Emission Source
- Publication number 20200013579
- Publication date Jan 9, 2020
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20190057833
- Publication date Feb 21, 2019
- HERMES MICROVISION, INC.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125202
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125203
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125204
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR OPTIMIZING DIFFUSION SECTION OF ELECTRON BEAM
- Publication number 20160189914
- Publication date Jun 30, 2016
- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Jiang HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20160163500
- Publication date Jun 9, 2016
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Permanent Magnet Based High Performance Multi-Axis Immersion Electr...
- Publication number 20140326895
- Publication date Nov 6, 2014
- Tao Luo
- Tao Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON LENS AND THE ELECTRON BEAM DEVICE
- Publication number 20140252245
- Publication date Sep 11, 2014
- PARAM CORPORATION
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON LENS AND THE ELECTRON BEAM DEVICE
- Publication number 20130134322
- Publication date May 30, 2013
- PARAM CORPORATION
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120211654
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNET FOR ION BEAM IRRADIATION APPARATUS EQUIPPED WITH PROTECTIVE...
- Publication number 20110204250
- Publication date Aug 25, 2011
- NISSIN ION EQUIPMENT CO., LTD.
- Dan NICOLAESCU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Multi-column electron beam exposure apparatus and magnetic field ge...
- Publication number 20110148297
- Publication date Jun 23, 2011
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE FOR THE FIELD EMISSION OF PARTICLES AND PRODUCTION METHOD
- Publication number 20100090579
- Publication date Apr 15, 2010
- Josef Sellmair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Column Using A Magnetic Lens Layer Having Permanent Magnets
- Publication number 20100084566
- Publication date Apr 8, 2010
- Ho Seob Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090057558
- Publication date Mar 5, 2009
- HITACHI
- Toru Iwaya
- G01 - MEASURING TESTING
Information Patent Application
Electron Lens and Charged Particle Beam Apparatus
- Publication number 20080067396
- Publication date Mar 20, 2008
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam source for use in electron gun
- Publication number 20070057617
- Publication date Mar 15, 2007
- APPLIED MATERIALS, INC.
- Steven T. Coyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus with permanent magnetic lenses
- Publication number 20060197030
- Publication date Sep 7, 2006
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope array for inspection and lithography
- Publication number 20060033035
- Publication date Feb 16, 2006
- Mordechai Itzkovitch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus with permanent magnetic lenses
- Publication number 20050236568
- Publication date Oct 27, 2005
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS

Permanent magnetic lenses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and methods for selectively transmitting objects

Counter pole with permanent magnets

Charged particle source

Magnetically microfocused electron emission source

Charged particle source

Charged particle source

Charged particle source

Charged particle source

Device and method for optimizing diffusion section of electron beam

Charged particle source

Tubular permanent magnet used in a multi-electron beam device

Permanent magnet based high performance multi-axis immersion electr...

Scanning electron microscope

Permanent magnet lens array

Magnet for ion beam irradiation apparatus equipped with protective...

Multi-column electron beam exposure apparatus and magnetic field ge...

Device for the field emission of particles and production method

Electron lens and charged particle beam apparatus

Electron spectrometer

Electron beam source having an extraction electrode provided with a...

Apparatus with permanent magnetic lenses

Apparatus with permanent magnetic lenses

3812365

3324433

3250961

3021458

2928004

2858443

2804548

2761991

Patents Applicationslast 30 patents

Electron Microscope

CHARGED PARTICLE OPTICAL SYSTEM AND CHARGED PARTICLE APPARATUS

Adjustable Permanent Magnetic Lens Having Thermal Control Device

Adjustable Permanent Magnetic Lens Having Shunting Device

MULTIPLE PARTICLE BEAM SYSTEM WITH A CONTRAST CORRECTION LENS SYSTEM

COUNTER POLE WITH PERMANENT MAGNETS

CHARGED PARTICLE SOURCE

CHARGED PARTICLE SOURCE

Magnetically Microfocused Electron Emission Source

Charged Particle Source

Charged Particle Source

Charged Particle Source

Charged Particle Source

DEVICE AND METHOD FOR OPTIMIZING DIFFUSION SECTION OF ELECTRON BEAM

Charged Particle Source

Permanent Magnet Based High Performance Multi-Axis Immersion Electr...

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

SCANNING ELECTRON MICROSCOPE

MAGNET FOR ION BEAM IRRADIATION APPARATUS EQUIPPED WITH PROTECTIVE...

Multi-column electron beam exposure apparatus and magnetic field ge...

DEVICE FOR THE FIELD EMISSION OF PARTICLES AND PRODUCTION METHOD

Electron Column Using A Magnetic Lens Layer Having Permanent Magnets

SCANNING ELECTRON MICROSCOPE

Electron Lens and Charged Particle Beam Apparatus

Electron beam source for use in electron gun

Apparatus with permanent magnetic lenses

Electron microscope array for inspection and lithography

Apparatus with permanent magnetic lenses