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Phased array of beams
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G01J2009/0203
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2009/0203
Phased array of beams
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Patents Grants
last 30 patents
Information
Patent Grant
Calculation method, recording method, optical film, and phase modul...
Patent number
11,573,527
Issue date
Feb 7, 2023
Toppan Printing Co., Ltd.
Akihito Kagotani
B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information
Patent Grant
Optical detector for measuring respective phases of multiple beams...
Patent number
9,945,731
Issue date
Apr 17, 2018
HRL Laboratories, LLC
Oleg M. Efimov
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus, measuring method, and method of manufacturing...
Patent number
9,091,534
Issue date
Jul 28, 2015
Canon Kabushiki Kaisha
Hitoshi Iijima
G01 - MEASURING TESTING
Information
Patent Grant
Vibration-insensitive interferometer
Patent number
7,405,830
Issue date
Jul 29, 2008
Korea Advanced Institute of Science and Technology (KAIST)
Seung Woo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Direct phase shift measurement between interference patterns using...
Patent number
6,122,056
Issue date
Sep 19, 2000
International Business Machines Corporation
Michael Straight Hibbs
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Detecting a radiation signal
Patent number
5,292,483
Issue date
Mar 8, 1994
Beckman Instruments, Inc.
Wilbur I. Kaye
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for imaging a physical parameter in turbid med...
Patent number
5,203,339
Issue date
Apr 20, 1993
The Government of the United States of America as represented by the Secretar...
Alexander Knuttel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and Method for Gradient Interferometrically Locked Laser Source
Publication number
20230352899
Publication date
Nov 2, 2023
Nutronics, Inc.
Jeffrey D. Barchers
G02 - OPTICS
Information
Patent Application
CALCULATION METHOD, RECORDING METHOD, OPTICAL FILM, AND PHASE MODUL...
Publication number
20190293492
Publication date
Sep 26, 2019
Toppan Printing Co., Ltd.
Akihito KAGOTANI
B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information
Patent Application
MEASURING APPARATUS, MEASURING METHOD, AND METHOD OF MANUFACTURING...
Publication number
20130250099
Publication date
Sep 26, 2013
Canon Kabushiki Kaisha
Hitoshi Iijima
G01 - MEASURING TESTING
Information
Patent Application
Wavefront Sensing Method and Apparatus
Publication number
20110235049
Publication date
Sep 29, 2011
QINETIQ LIMITED
James Gordon Burnett
G01 - MEASURING TESTING
Information
Patent Application
Vibration-insensitive interferometer
Publication number
20060039007
Publication date
Feb 23, 2006
Seung Woo Kim
G01 - MEASURING TESTING