photo-electron spectrum [ESCA, XPS]

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CPC
G01N2223/085

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/085photo-electron spectrum [ESCA, XPS]

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 12,359,911
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 11,906,291
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for measuring energy of electrons
- Patent number 10,386,314
- Issue date Aug 20, 2019
- National University Corporation Nagoya University
- Toru Ujihara
- G01 - MEASURING TESTING
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deterioration analyzing method
- Patent number 9,851,342
- Issue date Dec 26, 2017
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photoelectron spectroscopy apparatus and method of use
- Patent number 7,399,963
- Issue date Jul 15, 2008
- ReVera Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and method of spectroscopy
- Patent number 6,104,029
- Issue date Aug 15, 2000
- VG Systems Ltd.
- Peter Coxon
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy apparatus
- Patent number 5,569,916
- Issue date Oct 29, 1996
- Agency of Industrial Science & Technology, Ministry of International Trade &...
- Toshihisa Tomie
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle energy analyzer
- Patent number 4,546,254
- Issue date Oct 8, 1985
- Shimadzu Corporation
- Hiroshi Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for charged particle spectroscopy
- Patent number 4,255,656
- Issue date Mar 10, 1981
- Kratos Limited
- Andrew Barrie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE
- Publication number 20250180497
- Publication date Jun 5, 2025
- PHOTOELECTRON INTELLECTUAL PROPERTY HOLDINGS LLC
- Peter Cumpson
- G01 - MEASURING TESTING
Information Patent Application
CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...
- Publication number 20250113439
- Publication date Apr 3, 2025
- Kabushiki Kaisha Toshiba
- Yukihisa MATSUMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
- Publication number 20240151522
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu LEE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
SCREENING/ANALYSIS OF FLUOROCARBONS USING X-RAY PHOTOELECTRON SPECT...
- Publication number 20220373486
- Publication date Nov 24, 2022
- The Penn State Research Foundation
- Sara A. LINCOLN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...
- Publication number 20220082515
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ENERGY OF ELECTRONS
- Publication number 20190079033
- Publication date Mar 14, 2019
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Toru UJIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20180269054
- Publication date Sep 20, 2018
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20140361161
- Publication date Dec 11, 2014
- VG SCIENTA AB
- Björn Wannberg
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION ANALYZING METHOD
- Publication number 20140349407
- Publication date Nov 27, 2014
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Application
Photoelectron spectroscopy apparatus and method of use
- Publication number 20070069125
- Publication date Mar 29, 2007
- Bruno W. Schueler
- G01 - MEASURING TESTING

photo-electron spectrum [ESCA, XPS]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of calculating thickness of graphene layer and method of mea...

Electron spectroscopy based techniques for determining various chem...

Characterizing and measuring in small boxes using XPS with multiple...

Patterned x-ray emitting target

Characterizing and measuring in small boxes using XPS with multiple...

Method of calculating thickness of graphene layer and method of mea...

X-ray reflectometry apparatus and method thereof for measuring thre...

System and method using x-rays for depth-resolving metrology and an...

X-ray analyzer

Apparatus and method for measuring energy of electrons

Analyser arrangement for particle spectrometer

Deterioration analyzing method

Photoelectron spectroscopy apparatus and method of use

Spectrometer and method of spectroscopy

Electron spectroscopy apparatus

Charged particle energy analyzer

Apparatus for charged particle spectroscopy

Patents Applicationslast 30 patents

IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE

CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...

PATTERNED X-RAY EMITTING TARGET

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

SCREENING/ANALYSIS OF FLUOROCARBONS USING X-RAY PHOTOELECTRON SPECT...

SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...

APPARATUS AND METHOD FOR MEASURING ENERGY OF ELECTRONS

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

DETERIORATION ANALYZING METHOD

Photoelectron spectroscopy apparatus and method of use