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Patterned x-ray emitting target
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Patent number 11,996,259
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Issue date May 28, 2024
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NOVA MEASURING INSTRUMENTS INC.
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David A. Reed
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H01 - BASIC ELECTRIC ELEMENTS
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X-ray analyzer
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Patent number 11,467,103
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Issue date Oct 11, 2022
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APPLIED SCIENCE LABORATORY CO., LTD.
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Hiroyoshi Soejima
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Deterioration analyzing method
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Patent number 9,851,342
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Issue date Dec 26, 2017
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Sumitomo Rubber Industries, Ltd.
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Fusae Kaneko
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Electron spectroscopy apparatus
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Issue date Oct 29, 1996
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Agency of Industrial Science & Technology, Ministry of International Trade &...
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Toshihisa Tomie
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G01 - MEASURING TESTING
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