Photo-emission

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CPC
H01J2237/2855

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2855Photo-emission

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Patents Grantslast 30 patents

Information Patent Grant
Aperture device and analyzer arrangement
- Patent number 11,942,316
- Issue date Mar 26, 2024
- SCIENTA OMICRON AB
- Peter Amann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
- Patent number 11,688,581
- Issue date Jun 27, 2023
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for atomic probe tomography
- Patent number 10,903,045
- Issue date Jan 26, 2021
- Imec VZW
- Paul van der Heide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for using multimodal imaging to determine struc...
- Patent number 10,707,052
- Issue date Jul 7, 2020
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and method for using multimodal imaging to determine struct...
- Patent number 10,446,368
- Issue date Oct 15, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector supplement device for spectroscopy setup
- Patent number 10,366,863
- Issue date Jul 30, 2019
- EMPA Eidgenossische Materialprufungs-und Forschungsanstalt
- Davide Bleiner
- G01 - MEASURING TESTING
Information Patent Grant
Sample chamber device for electron microscope, and electron microsc...
- Patent number 10,312,049
- Issue date Jun 4, 2019
- Korea Research Institute of Standards and Science
- Bok Lae Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 10,157,722
- Issue date Dec 18, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Near-field optical transmission electron emission microscope
- Patent number 9,653,258
- Issue date May 16, 2017
- Krzysztof Grzelakowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 8,674,317
- Issue date Mar 18, 2014
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 8,497,476
- Issue date Jul 30, 2013
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Combination laser and charged particle beam system
- Patent number 8,314,410
- Issue date Nov 20, 2012
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection method and electron beam inspection apparatus
- Patent number 8,288,722
- Issue date Oct 16, 2012
- Hitachi, Ltd.
- Masaki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 8,076,654
- Issue date Dec 13, 2011
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,915,583
- Issue date Mar 29, 2011
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection method and electron beam inspection apparatus
- Patent number 7,863,565
- Issue date Jan 4, 2011
- Hitachi, Ltd.
- Masaki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Laser atom probe
- Patent number 7,683,318
- Issue date Mar 23, 2010
- Imago Scientific Instruments Corporation
- Joseph H. Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron optical component
- Patent number 7,608,838
- Issue date Oct 27, 2009
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,442,931
- Issue date Oct 28, 2008
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 7,391,036
- Issue date Jun 24, 2008
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,154,091
- Issue date Dec 26, 2006
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser stimulated atom probe characterization of semiconductor and d...
- Patent number 7,122,806
- Issue date Oct 17, 2006
- William W. Chism II
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle analyzer
- Patent number 5,506,414
- Issue date Apr 9, 1996
- Fisons plc
- Peter Coxon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle analyser
- Patent number 5,451,783
- Issue date Sep 19, 1995
- Fisons plc
- Peter Coxon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR
- Publication number 20240395499
- Publication date Nov 28, 2024
- RINKEN
- Takahiro SHIMOJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD
- Publication number 20230071801
- Publication date Mar 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURE DEVICE AND ANALYSER ARRANGEMENT
- Publication number 20220020580
- Publication date Jan 20, 2022
- SCIENTA OMICRON AB
- Peter AMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE
- Publication number 20210313141
- Publication date Oct 7, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20200020507
- Publication date Jan 16, 2020
- Atomnaut Inc.
- Peter V. LIDDICOAT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20190074160
- Publication date Mar 7, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR SUPPLEMENT DEVICE FOR SPECTROSCOPY SETUP
- Publication number 20180350556
- Publication date Dec 6, 2018
- EMPA Eidgenössische Materialprüfungs- und Forschunsanstalt
- Davide BLEINER
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...
- Publication number 20180158645
- Publication date Jun 7, 2018
- Korea Research Institute of Standards and Science
- Bok Lae CHO
- G02 - OPTICS
Information Patent Application
Near-field Optical Transmission Electron Emission Microscope
- Publication number 20160254120
- Publication date Sep 1, 2016
- Krzysztof Grzelakowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20140014848
- Publication date Jan 16, 2014
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
Vector Potential Photoelectron Microscope
- Publication number 20120298861
- Publication date Nov 29, 2012
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20120235036
- Publication date Sep 20, 2012
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGR...
- Publication number 20120117696
- Publication date May 10, 2012
- International Business Machines Corporation
- Michael Hatzistergos
- B82 - NANO-TECHNOLOGY
Information Patent Application
Laser Atom Probe and Laser Atom Probe Analysis Methods
- Publication number 20120080596
- Publication date Apr 5, 2012
- IMEC
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SURFACE INSPECTION APPARATUS AND METHOD
- Publication number 20120049063
- Publication date Mar 1, 2012
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
ATOM PROBE PULSE ENERGY
- Publication number 20110260054
- Publication date Oct 27, 2011
- Imago Scientific Instruments Corporation
- Joseph H. Bunton
- B82 - NANO-TECHNOLOGY
Information Patent Application
Combination Laser and Charged Particle Beam System
- Publication number 20110248164
- Publication date Oct 13, 2011
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam inspection method and electron beam inspection apparatus
- Publication number 20110068267
- Publication date Mar 24, 2011
- Hitachi, Ltd.
- Masaki Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON IMAGING APPARATUS WITH IMAGE PROCESSING
- Publication number 20110017909
- Publication date Jan 27, 2011
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE
- Publication number 20090236521
- Publication date Sep 24, 2009
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam inspection method and electron beam inspection apparatus
- Publication number 20080315093
- Publication date Dec 25, 2008
- Hitachi, Ltd.
- Masaki Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Sample surface inspection apparatus and method
- Publication number 20080265159
- Publication date Oct 30, 2008
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
Method and system for ultrafast photoelectron microscope
- Publication number 20080017796
- Publication date Jan 24, 2008
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser Atom Probe
- Publication number 20070205358
- Publication date Sep 6, 2007
- Joseph H. Bunton
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and system for ultrafast photoelectron microscope
- Publication number 20050253069
- Publication date Nov 17, 2005
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample surface inspection apparatus and method
- Publication number 20050158653
- Publication date Jul 21, 2005
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
Laser stimulated atom probe characterization of semiconductor and d...
- Publication number 20050017174
- Publication date Jan 27, 2005
- William W. Chism
- G01 - MEASURING TESTING

Photo-emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Aperture device and analyzer arrangement

Apparatus for transmission electron microscopy cathodoluminescence

Atom probe inspection device, field ion microscope, and distortion...

Method and apparatus for atomic probe tomography

Systems and methods for using multimodal imaging to determine struc...

Systems and method for using multimodal imaging to determine struct...

Detector supplement device for spectroscopy setup

Sample chamber device for electron microscope, and electron microsc...

Inspection device

Near-field optical transmission electron emission microscope

Sample surface inspection apparatus and method

Inspection device

Combination laser and charged particle beam system

Electron beam inspection method and electron beam inspection apparatus

Sample surface inspection apparatus and method

Method and system for ultrafast photoelectron microscope

Electron beam inspection method and electron beam inspection apparatus

Laser atom probe

Electron optical component

Method and system for ultrafast photoelectron microscope

Sample surface inspection apparatus and method

Method and system for ultrafast photoelectron microscope

Laser stimulated atom probe characterization of semiconductor and d...

Charged-particle analyzer

Charged-particle analyser

Patents Applicationslast 30 patents

FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR

ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD

APERTURE DEVICE AND ANALYSER ARRANGEMENT

APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE

ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

DETECTOR SUPPLEMENT DEVICE FOR SPECTROSCOPY SETUP

SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...

Near-field Optical Transmission Electron Emission Microscope

INSPECTION DEVICE

Vector Potential Photoelectron Microscope

INSPECTION DEVICE

INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGR...

Laser Atom Probe and Laser Atom Probe Analysis Methods

SAMPLE SURFACE INSPECTION APPARATUS AND METHOD

ATOM PROBE PULSE ENERGY

Combination Laser and Charged Particle Beam System

Electron beam inspection method and electron beam inspection apparatus

ELECTRON IMAGING APPARATUS WITH IMAGE PROCESSING

METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE

Electron beam inspection method and electron beam inspection apparatus

Sample surface inspection apparatus and method

Method and system for ultrafast photoelectron microscope

Laser Atom Probe

Method and system for ultrafast photoelectron microscope

Sample surface inspection apparatus and method

Laser stimulated atom probe characterization of semiconductor and d...