Photo emission

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CPC
H01J2237/06333

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/06333Photo emission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron beam applicator, emission axis verification...
- Patent number 12,080,507
- Issue date Sep 3, 2024
- Photo electron Soul Inc.
- Hokuto Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron gun component, electron beam applicator, and...
- Patent number 11,842,879
- Issue date Dec 12, 2023
- Photo electron Soul Inc.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam writing apparatus and cathode life span prediction me...
- Patent number 11,749,491
- Issue date Sep 5, 2023
- NuFlare Technology, Inc.
- Satoshi Nakahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Incident axis alignment method for electron gun equipped with photo...
- Patent number 11,417,494
- Issue date Aug 16, 2022
- Photo electron Soul Inc.
- Reiki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,251,011
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,087,947
- Issue date Aug 10, 2021
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasmon-excited electron beam array for complementary patterning
- Patent number 10,861,668
- Issue date Dec 8, 2020
- Purdue Research Foundation
- Liang Pan
- G02 - OPTICS
Information Patent Grant
System and method for photocathode illumination inspection
- Patent number 10,840,055
- Issue date Nov 17, 2020
- KLA Corporation
- Gildardo Delgado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode designs and methods of generating an electron beam usi...
- Patent number 10,804,069
- Issue date Oct 13, 2020
- KLA-Tencor Corporation
- Katerina Ioakeimidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam generation and measurement
- Patent number 10,748,737
- Issue date Aug 18, 2020
- KLA-Tencor Corporation
- Katerina Ioakeimidi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal encapsulated photocathode electron emitter
- Patent number 10,714,295
- Issue date Jul 14, 2020
- KLA-Tencor Corporation
- Gildardo R. Delgado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handheld material analyser
- Patent number 10,712,296
- Issue date Jul 14, 2020
- ORION ENGINEERING LIMITED
- Vladimir Vishnyakov
- G01 - MEASURING TESTING
Information Patent Grant
Silicon electron emitter designs
- Patent number 10,607,806
- Issue date Mar 31, 2020
- KLA-Tencor Corporation
- Frances Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode designs and methods of generating an electron beam usi...
- Patent number 10,535,493
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Katerina Ioakeimidi
- G02 - OPTICS
Information Patent Grant
High voltage feedthrough assembly, time-resolved transmission elect...
- Patent number 10,366,861
- Issue date Jul 30, 2019
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Julian Hirscht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 10,157,722
- Issue date Dec 18, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Activation chamber, kit used in treatment device and treatment devi...
- Patent number 9,934,926
- Issue date Apr 3, 2018
- National University Corporation Nagoya University
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated photoemission sources and scalable photoemission structures
- Patent number 9,881,762
- Issue date Jan 30, 2018
- International Business Machines Corporation
- Ravi K. Bonam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array of carbon nanotube micro-tip structures
- Patent number 9,734,976
- Issue date Aug 15, 2017
- Tsinghua University
- Yang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for electron microscope with multiple cathodes
- Patent number 9,464,998
- Issue date Oct 11, 2016
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Carbon nanotube based micro-tip structure and method for making the...
- Patent number 9,437,391
- Issue date Sep 6, 2016
- Tsinghua University
- Yang Wei
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
High-speed multiframe dynamic transmission electron microscope imag...
- Patent number 9,373,479
- Issue date Jun 21, 2016
- Lawrence Livermore National Security, LLC
- Bryan W. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-speed multi-frame dynamic transmission electron microscope ima...
- Patent number 9,269,527
- Issue date Feb 23, 2016
- Lawrence Livermore National Security, LLC
- Bryan W. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for electron emission and device including such a...
- Patent number 9,263,229
- Issue date Feb 16, 2016
- Centre National de la Recherche Scientifique (Cnrs)
- Arnaud Arbouet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode high-frequency electron-gun cavity apparatus
- Patent number 9,224,571
- Issue date Dec 29, 2015
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION
- Junji Urakawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High-speed multiframe dynamic transmission electron microscope imag...
- Patent number 9,165,743
- Issue date Oct 20, 2015
- Lawrence Livermore National Security, LLC
- Bryan W. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,024,256
- Issue date May 5, 2015
- Board of Trustees of Michigan State University
- Chong-Yu Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 8,895,922
- Issue date Nov 25, 2014
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Jean Berney
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample observing device and sample observing method
- Patent number 8,884,225
- Issue date Nov 11, 2014
- Ebara Corporation
- Tsutomu Karimata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...
- Publication number 20240412938
- Publication date Dec 12, 2024
- ATTOLIGHT AG
- Nicolas Tappy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION...
- Publication number 20240412939
- Publication date Dec 12, 2024
- PHOTO ELECTRON SOUL INC.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELEC...
- Publication number 20240212967
- Publication date Jun 27, 2024
- PHOTO ELECTRON SOUL INC.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230402246
- Publication date Dec 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Creating Multiple Electron Beams with a Photocathode Film
- Publication number 20230395349
- Publication date Dec 7, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJE...
- Publication number 20230230794
- Publication date Jul 20, 2023
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON GUN COMPONENT, ELECTRON BEAM APPLICATION DEV...
- Publication number 20230207249
- Publication date Jun 29, 2023
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON MICROSCOPE
- Publication number 20220406558
- Publication date Dec 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSED GENERATOR OF ELECTRICALLY CHARGED PARTICLES AND METHOD FOR U...
- Publication number 20220367139
- Publication date Nov 17, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Marie GELEOC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICES WITH SEMICONDUCTOR ULTRAVIOLET LIGHT SOURCE
- Publication number 20220301804
- Publication date Sep 22, 2022
- Gaska Consulting, LLC
- Remigijus Gaska
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM WRITING APPARATUS AND CATHODE LIFE SPAN PREDICTION ME...
- Publication number 20220230834
- Publication date Jul 21, 2022
- NuFlare Technology, Inc.
- Satoshi NAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCIDENT AXIS ALIGNMENT METHOD FOR ELECTRON GUN EQUIPPED WITH PHOTO...
- Publication number 20210375578
- Publication date Dec 2, 2021
- PHOTO ELECTRON SOUL INC.
- Reiki Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20200303152
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HANDHELD MATERIAL ANALYSER
- Publication number 20200088660
- Publication date Mar 19, 2020
- ORION ENGINEERING LIMITED
- Vladimir VISHNYAKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL ENCAPSULATED PHOTOCATHODE ELECTRON EMITTER
- Publication number 20200090895
- Publication date Mar 19, 2020
- KLA-Tencor Corporation
- Gildardo R. Delgado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Photocathode Illumination Inspection
- Publication number 20190295804
- Publication date Sep 26, 2019
- KLA-Tencor Corporation
- Gildardo Delgado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMON-EXCITED ELECTRON BEAM ARRAY FOR COMPLEMENTARY PATTERNING
- Publication number 20190019648
- Publication date Jan 17, 2019
- Purdue Research Foundation
- Liang Pan
- G02 - OPTICS
Information Patent Application
ACTIVATION CHAMBER AND KIT USED IN TREATMENT DEVICE FOR LOWERING EL...
- Publication number 20160172144
- Publication date Jun 16, 2016
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ELECTRON MICROSCOPE WITH MULTIPLE CATHODES
- Publication number 20160005566
- Publication date Jan 7, 2016
- California Institute of Technology
- Ahmed H. Zewail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-SPEED MULTIFRAME DYNAMIC TRANSMISSION ELECTRON MICROSCOPE IMAG...
- Publication number 20160005567
- Publication date Jan 7, 2016
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Bryan W. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-SPEED MULTI-FRAME DYNAMIC TRANSMISSION ELECTRON MICROSCOPE IMA...
- Publication number 20150332888
- Publication date Nov 19, 2015
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Bryan W. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Speed Multiframe Dynamic Transmission Electron Microscope Imag...
- Publication number 20150235800
- Publication date Aug 20, 2015
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Bryan W. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20140346355
- Publication date Nov 27, 2014
- Board of Trustees of Michigan State University
- Chong-Yu Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN CONFIGURED TO GENERATE CHARGED PARTICLES
- Publication number 20140346368
- Publication date Nov 27, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20140014848
- Publication date Jan 16, 2014
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20130341527
- Publication date Dec 26, 2013
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE
- Jean Berney
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ALIGNMENT OF AN ATOM BEAM WITH AN ELECTRIC FIELD IN THE PRODUCTION...
- Publication number 20130320202
- Publication date Dec 5, 2013
- United States of America, as represented by the Secretary of Commerce, NIST
- Jabez McClelland
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CARBON NANOTUBE BASED MICRO-TIP STRUCTURE AND METHOD FOR MAKING THE...
- Publication number 20130224429
- Publication date Aug 29, 2013
- HON HAI Precision Industry CO., LTD.
- YANG WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deconvolution of Time-Gated Cathodoluminescence Images
- Publication number 20130193342
- Publication date Aug 1, 2013
- ATTOLIGHT SA
- Jean Berney
- G01 - MEASURING TESTING

Photo emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron gun and electron beam application apparatus

Electron gun, electron beam applicator, emission axis verification...

Electron gun, electron gun component, electron beam applicator, and...

Electron beam writing apparatus and cathode life span prediction me...

Incident axis alignment method for electron gun equipped with photo...

Electron microscope

Electron microscope

Plasmon-excited electron beam array for complementary patterning

System and method for photocathode illumination inspection

Photocathode designs and methods of generating an electron beam usi...

Electron beam generation and measurement

Metal encapsulated photocathode electron emitter

Handheld material analyser

Silicon electron emitter designs

Photocathode designs and methods of generating an electron beam usi...

High voltage feedthrough assembly, time-resolved transmission elect...

Inspection device

Activation chamber, kit used in treatment device and treatment devi...

Integrated photoemission sources and scalable photoemission structures

Array of carbon nanotube micro-tip structures

Method and system for electron microscope with multiple cathodes

Carbon nanotube based micro-tip structure and method for making the...

High-speed multiframe dynamic transmission electron microscope imag...

High-speed multi-frame dynamic transmission electron microscope ima...

Device and method for electron emission and device including such a...

Photocathode high-frequency electron-gun cavity apparatus

High-speed multiframe dynamic transmission electron microscope imag...

Electron microscope

Electron beam apparatus

Sample observing device and sample observing method

Patents Applicationslast 30 patents

SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...

ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION...

ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELEC...

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

Creating Multiple Electron Beams with a Photocathode Film

ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJE...

ELECTRON GUN, ELECTRON GUN COMPONENT, ELECTRON BEAM APPLICATION DEV...

ELECTRON GUN AND ELECTRON MICROSCOPE

PULSED GENERATOR OF ELECTRICALLY CHARGED PARTICLES AND METHOD FOR U...

ELECTRON BEAM DEVICES WITH SEMICONDUCTOR ULTRAVIOLET LIGHT SOURCE

ELECTRON BEAM WRITING APPARATUS AND CATHODE LIFE SPAN PREDICTION ME...

INCIDENT AXIS ALIGNMENT METHOD FOR ELECTRON GUN EQUIPPED WITH PHOTO...

ELECTRON MICROSCOPE

HANDHELD MATERIAL ANALYSER

METAL ENCAPSULATED PHOTOCATHODE ELECTRON EMITTER

System and Method for Photocathode Illumination Inspection

PLASMON-EXCITED ELECTRON BEAM ARRAY FOR COMPLEMENTARY PATTERNING

ACTIVATION CHAMBER AND KIT USED IN TREATMENT DEVICE FOR LOWERING EL...

METHOD AND SYSTEM FOR ELECTRON MICROSCOPE WITH MULTIPLE CATHODES

HIGH-SPEED MULTIFRAME DYNAMIC TRANSMISSION ELECTRON MICROSCOPE IMAG...

HIGH-SPEED MULTI-FRAME DYNAMIC TRANSMISSION ELECTRON MICROSCOPE IMA...

High-Speed Multiframe Dynamic Transmission Electron Microscope Imag...

ELECTRON MICROSCOPE

GUN CONFIGURED TO GENERATE CHARGED PARTICLES

INSPECTION DEVICE

ELECTRON BEAM APPARATUS

ALIGNMENT OF AN ATOM BEAM WITH AN ELECTRIC FIELD IN THE PRODUCTION...

CARBON NANOTUBE BASED MICRO-TIP STRUCTURE AND METHOD FOR MAKING THE...

Deconvolution of Time-Gated Cathodoluminescence Images