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G01J2001/446
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2001/446
Photodiode
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for extracting avalanche signal
Patent number
12,222,241
Issue date
Feb 11, 2025
QUDOOR TECHNOLOGIES INC.
Liuping Chen
G01 - MEASURING TESTING
Information
Patent Grant
Dual-amplifier circuit for optical signals
Patent number
12,216,002
Issue date
Feb 4, 2025
Viavi Solutions Inc.
Christopher Russell Wagner
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Photocurrent amplification circuit, amplification control method, o...
Patent number
12,216,003
Issue date
Feb 4, 2025
BOE Technology Group Co., Ltd.
Xinshe Yin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Display panel and display devices with light detection circuits
Patent number
12,213,369
Issue date
Jan 28, 2025
Shanghai Tianma Micro-Electronics Co., Ltd.
Feng Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Anti-blooming buffered direct injection pixels
Patent number
12,203,808
Issue date
Jan 21, 2025
Raytheon Company
Micky Harris
G01 - MEASURING TESTING
Information
Patent Grant
Solid-state image sensor and electronic device
Patent number
12,207,008
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Tatsuki Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodetecting device for detecting different wavelengths
Patent number
12,196,610
Issue date
Jan 14, 2025
Artilux, Inc.
Yen-Cheng Lu
G01 - MEASURING TESTING
Information
Patent Grant
Optical distance measuring device
Patent number
12,189,057
Issue date
Jan 7, 2025
Denso Corporation
Noriyuki Ozaki
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for high-sensitivity radiation sensing
Patent number
12,174,064
Issue date
Dec 24, 2024
AMS-OSRAM AG
Rajesh Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with sequentially-coupled charge storage and ass...
Patent number
12,169,142
Issue date
Dec 17, 2024
Quantum-Si Incorporated
Eric A. G. Webster
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodiodes without excess noise
Patent number
12,170,341
Issue date
Dec 17, 2024
SRI International
Winston K. Chan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-domain filtering of gamma events
Patent number
12,163,830
Issue date
Dec 10, 2024
Avago Technologies International Sales Pte. Limited
Thomas Frach
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Silicon photomultipliers reflective pulse compression
Patent number
12,164,070
Issue date
Dec 10, 2024
Thorlabs, Inc.
Bill Radtke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control device, control method, non-transitory computer-readable st...
Patent number
12,163,827
Issue date
Dec 10, 2024
Denso Corporation
Kenta Azuma
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric conversion apparatus
Patent number
12,163,829
Issue date
Dec 10, 2024
Canon Kabushiki Kaisha
Mahito Shinohara
G01 - MEASURING TESTING
Information
Patent Grant
Sensing system and signal processing apparatus
Patent number
12,164,077
Issue date
Dec 10, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Atsumi Niwa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Methods and devices for obtaining silicon photomultiplier data
Patent number
12,163,828
Issue date
Dec 10, 2024
Meso Scale Technologies, LLC.
Manish Kochar
G01 - MEASURING TESTING
Information
Patent Grant
APD bias circuit with dual analog feedback loop control
Patent number
12,163,831
Issue date
Dec 10, 2024
SIGNIFY HOLDING B.V.
Haimin Tao
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric conversion device
Patent number
12,160,676
Issue date
Dec 3, 2024
Canon Kabushiki Kaisha
Masayuki Tsuchiya
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated circuit with sequentially-coupled charge storage and ass...
Patent number
12,152,936
Issue date
Nov 26, 2024
Quantum-Si Incorporated
Eric A. G. Webster
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Breakdown voltage detection
Patent number
12,140,622
Issue date
Nov 12, 2024
X-FAB Global Services GmbH
Alexander Zimmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detection, localization and signaling of sing...
Patent number
12,135,238
Issue date
Nov 5, 2024
Politecnico di Milano
Federica Alberta Villa
G01 - MEASURING TESTING
Information
Patent Grant
Detection device and detection method using avalanche diode array a...
Patent number
12,132,882
Issue date
Oct 29, 2024
PixArt Imaging Inc.
Tso-Sheng Tsai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Voltage control system
Patent number
12,123,773
Issue date
Oct 22, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Masato Takemoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pixel cell, image sensor and method for operating a pixel cell with...
Patent number
12,123,771
Issue date
Oct 22, 2024
ams Sensors Belgium BVBA
Adi Xhakoni
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Hold operations for light-to-frequency sensors
Patent number
12,123,770
Issue date
Oct 22, 2024
ams International AG
Ravi Kumar Adusumalli
G01 - MEASURING TESTING
Information
Patent Grant
Integrated photodetector with charge storage bin of varied detectio...
Patent number
12,123,772
Issue date
Oct 22, 2024
Quantum-Si Incorporated
Thomas Raymond Thurston
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Control of linear trans-impedance amplifier (TIA) during settling a...
Patent number
12,126,312
Issue date
Oct 22, 2024
II-VI DELAWARE, INC.
Dinup Sukumaran
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus providing a plurality of light beams
Patent number
12,123,975
Issue date
Oct 22, 2024
STMicroelectronics (Research & Development) Limited
Christopher Townsend
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for interference reduction in optical sensing...
Patent number
12,123,774
Issue date
Oct 22, 2024
Avago Technologies International Sales Pte. Limited
Junjie Lu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIGHT DETECTION DEVICE AND ELECTRONIC DEVICE
Publication number
20250052609
Publication date
Feb 13, 2025
Sony Semiconductor Solutions Corporation
KAZUHIRO GOI
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC CONVERSION DEVICE
Publication number
20250056138
Publication date
Feb 13, 2025
Canon Kabushiki Kaisha
Masayuki Tsuchiya
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
AMBIENT LIGHT SENSOR AND ELECTRONIC DEVICE
Publication number
20250044150
Publication date
Feb 6, 2025
Shenzhen Goodix Technology Co., Ltd.
Fulin LI
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE SIGNAL SOURCE WITH LOW PHASE NOISE
Publication number
20250044151
Publication date
Feb 6, 2025
UNIVERSITAT PADERBORN
Meysam BAHMANIAN
G01 - MEASURING TESTING
Information
Patent Application
ANTI-BLOOMING BUFFERED DIRECT INJECTION PIXELS
Publication number
20250027811
Publication date
Jan 23, 2025
Raytheon Company
Micky Harris
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE AND DETECTION METHOD USING AVALANCHE DIODE ARRAY
Publication number
20250024015
Publication date
Jan 16, 2025
PIXART IMAGING INC.
Tso-Sheng TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PHOTOELECTRIC CONVERSION APPARATUS, PHOTO-DETECTION SYSTEM, AND MOV...
Publication number
20250015070
Publication date
Jan 9, 2025
Canon Kabushiki Kaisha
Yasuharu Ota
B60 - VEHICLES IN GENERAL
Information
Patent Application
DETECTION DEVICE
Publication number
20250012631
Publication date
Jan 9, 2025
Japan Display Inc.
Kaoru ITO
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSOR CIRCUIT
Publication number
20250007474
Publication date
Jan 2, 2025
SensorTek technology Corp.
Hsing-Chien Chu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PHOTODETECTION DEVICE AND PHOTODETECTION SYSTEM
Publication number
20250003746
Publication date
Jan 2, 2025
Sony Semiconductor Solutions Corporation
Ryutaro Homma
G01 - MEASURING TESTING
Information
Patent Application
GEIGER-MODE FOCAL PLANE ARRAY HAVING INCREASED TOLERANCE TO OPTICAL...
Publication number
20240429251
Publication date
Dec 26, 2024
LG Innotek Co., Ltd.
Mark Allen ITZLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AMBIENT LIGHT SENSING SYSTEM
Publication number
20240426653
Publication date
Dec 26, 2024
ams-OSRAM Asia Pacific Pte. Ltd.
Sandeep Vernekar
G01 - MEASURING TESTING
Information
Patent Application
IMAGING SYSTEM, MOVABLE APPARATUS, IMAGING METHOD, AND STORAGE MEDIUM
Publication number
20240430590
Publication date
Dec 26, 2024
Canon Kabushiki Kaisha
Soya Fujimori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT DETECTING DEVICE AND SYSTEM
Publication number
20240413253
Publication date
Dec 12, 2024
Sony Semiconductor Solutions Corporation
Dan LUO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION DEVICE
Publication number
20240393173
Publication date
Nov 28, 2024
Japan Display Inc.
Gen Koide
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20240393172
Publication date
Nov 28, 2024
Hamamatsu Photonics K.K.
Shinya IWASHINA
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC CONVERSION APPARATUS, IMAGING SYSTEM, AND MOVING OBJECT
Publication number
20240393174
Publication date
Nov 28, 2024
Canon Kabushiki Kaisha
Yasuharu Ota
G01 - MEASURING TESTING
Information
Patent Application
Limitation of Noise on Light Detectors using an Aperture
Publication number
20240385320
Publication date
Nov 21, 2024
WAYMO LLC
Pierre-Yves Droz
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE AND ELECTRONIC DEVICE
Publication number
20240379715
Publication date
Nov 14, 2024
Sony Semiconductor Solutions Corporation
Satoe MIYATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Light Detection using an Aperture
Publication number
20240377245
Publication date
Nov 14, 2024
WAYMO LLC
Pierre-Yves DROZ
G01 - MEASURING TESTING
Information
Patent Application
PHOTOCURRENT AMPLIFICATION CIRCUIT, AMPLIFICATION CONTROL METHOD, O...
Publication number
20240377250
Publication date
Nov 14, 2024
BOE TECHNOLOGY GROUP CO., LTD.
Xinshe YIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and Apparatus for Extracting Avalanche Signal
Publication number
20240377251
Publication date
Nov 14, 2024
QUDOOR TECHNOLOGIES INC.
Liuping CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTODETECTOR AND METHOD FOR MANUFACTURING PHOTODETECTOR
Publication number
20240379892
Publication date
Nov 14, 2024
HAMAMATSU PHOTONICS K. K.
Hironori SONOBE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR INTERFERENCE REDUCTION IN OPTICAL SENSING...
Publication number
20240361182
Publication date
Oct 31, 2024
Avago Technologies International Sales Pte. Limited
Junjie LU
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC CONVERSION APPARATUS AND OPTICAL DETECTION SYSTEM
Publication number
20240353258
Publication date
Oct 24, 2024
Canon Kabushiki Kaisha
YASUHARU OTA
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC CONVERSION DEVICE, METHOD OF DRIVING PHOTOELECTRIC CO...
Publication number
20240337532
Publication date
Oct 10, 2024
Canon Kabushiki Kaisha
Yasuharu Ota
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DETECTION DEVICE
Publication number
20240337530
Publication date
Oct 10, 2024
Japan Display Inc.
Keiichi SAITO
G01 - MEASURING TESTING
Information
Patent Application
Superconductor-Based Transistor
Publication number
20240334846
Publication date
Oct 3, 2024
PsiQuantum Corp.
Faraz Najafi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE
Publication number
20240328857
Publication date
Oct 3, 2024
Innolux Corporation
Kazuyuki Hashimoto
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND METHODS FOR DIGITAL DC STABILIZATION OF OPTICAL RECEIVERS
Publication number
20240328851
Publication date
Oct 3, 2024
Xilinx, Inc.
Zhaowen WANG
G01 - MEASURING TESTING