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G01N2030/642
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2030/642
photoionisation detectors
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Patents Grants
last 30 patents
Information
Patent Grant
Gas phase component analysis device and gas phase component analysi...
Patent number
12,013,381
Issue date
Jun 18, 2024
FRONTIER LABORATORIES LTD.
Chuichi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Photoionization detector automated zero level calibration
Patent number
11,714,073
Issue date
Aug 1, 2023
Honeywell International Inc.
Guangli Xie
G01 - MEASURING TESTING
Information
Patent Grant
System, apparatus, and method for monitoring organic compounds in a...
Patent number
11,614,431
Issue date
Mar 28, 2023
Yale University
Drew Gentner
G01 - MEASURING TESTING
Information
Patent Grant
Dielectric barrier discharge ionization detector
Patent number
11,558,952
Issue date
Jan 17, 2023
Shimadzu Corporation
Kei Shinada
G01 - MEASURING TESTING
Information
Patent Grant
Photoionization detector automated zero level calibration
Patent number
11,480,554
Issue date
Oct 25, 2022
Honeywell International Inc.
Guangli Xie
G01 - MEASURING TESTING
Information
Patent Grant
Simulated distillation using gas chromatography with vacuum ultravi...
Patent number
11,401,471
Issue date
Aug 2, 2022
ExxonMobil Technology and Engineering Company
Frank C. Wang
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Photo-ionization device with improved linearity and stability
Patent number
11,143,619
Issue date
Oct 12, 2021
Nanova Environmental, Inc.
Biyan Chen
G01 - MEASURING TESTING
Information
Patent Grant
System, apparatus, and method for monitoring organic compounds in a...
Patent number
11,125,732
Issue date
Sep 21, 2021
Yale University
Drew Gentner
G01 - MEASURING TESTING
Information
Patent Grant
Photoionization detector automated zero level calibration
Patent number
10,969,371
Issue date
Apr 6, 2021
Honeywell International Inc.
Guangli Xie
G01 - MEASURING TESTING
Information
Patent Grant
Photoionization detector automated zero level calibration
Patent number
10,782,273
Issue date
Sep 22, 2020
Honeywell International Inc.
Guangli Xie
G01 - MEASURING TESTING
Information
Patent Grant
Discharge-based photo ionisation detector for use with a gas chroma...
Patent number
10,761,059
Issue date
Sep 1, 2020
MECANIQUE ANALYTIQUE INC.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Microfluidic photoionization detector
Patent number
10,705,061
Issue date
Jul 7, 2020
The Regents of the University of Michigan
Xudong Fan
G01 - MEASURING TESTING
Information
Patent Grant
Discharge ionization detector
Patent number
10,634,644
Issue date
Apr 28, 2020
Shimadzu Corporation
Kei Shinada
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optimal chemical analysis
Patent number
10,175,198
Issue date
Jan 8, 2019
Inficon, Inc.
Shawn Michael Briglin
G01 - MEASURING TESTING
Information
Patent Grant
Method for ion detection
Patent number
9,857,340
Issue date
Jan 2, 2018
John N. Driscoll
G01 - MEASURING TESTING
Information
Patent Grant
Method for ion detection
Patent number
9,423,386
Issue date
Aug 23, 2016
John N. Driscoll
G01 - MEASURING TESTING
Information
Patent Grant
Photo ionization detector for gas chromatography having at least tw...
Patent number
9,188,570
Issue date
Nov 17, 2015
Valco Instruments Company, L.P.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed discharge helium ionization detector with multiple combined...
Patent number
8,963,554
Issue date
Feb 24, 2015
Valco Instruments Company, L.P.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Photo ionization detector for gas chromatography having two separat...
Patent number
8,829,914
Issue date
Sep 9, 2014
Valco Instruments Company, L.P.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Discharge ionization current detector
Patent number
8,421,470
Issue date
Apr 16, 2013
Osaka University
Katsuhisa Kitano
G01 - MEASURING TESTING
Information
Patent Grant
Micro discharge device capable of low voltage discharges in a varie...
Patent number
8,196,449
Issue date
Jun 12, 2012
Honeywell International Inc.
Adam Dewey McBrady
G01 - MEASURING TESTING
Information
Patent Grant
Gas analysis method
Patent number
8,017,405
Issue date
Sep 13, 2011
The BOC Group, Inc.
Ravi Jain
G01 - MEASURING TESTING
Information
Patent Grant
Phased micro analyzer VIII
Patent number
7,779,671
Issue date
Aug 24, 2010
Honeywell International Inc.
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Grant
Phased micro analyzer VIII
Patent number
7,530,257
Issue date
May 12, 2009
Honeywell International Inc.
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Grant
Micro ion pump
Patent number
7,494,326
Issue date
Feb 24, 2009
Honeywell International Inc.
Ulrich Bonne
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Ionization-based detection
Patent number
7,476,852
Issue date
Jan 13, 2009
Honeywell International Inc.
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determination of water and for normal phas...
Patent number
7,419,831
Issue date
Sep 2, 2008
Dow Global Technologies, Inc.
Nile Nelson Frawley
G01 - MEASURING TESTING
Information
Patent Grant
Phased micro analyzer V, VI
Patent number
7,367,216
Issue date
May 6, 2008
Honeywell International Inc.
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Grant
Phased micro analyzer IV
Patent number
7,104,112
Issue date
Sep 12, 2006
Honeywell International Inc.
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Grant
Air cooled gas discharge detector
Patent number
6,836,060
Issue date
Dec 28, 2004
Agilent Technologies, Inc.
George J. Hudak
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MEASURING SURFACE CARBON LEVEL OF INORGANIC SOLID
Publication number
20250020616
Publication date
Jan 16, 2025
Tokuyama Corporation
Shunsuke HOSAKA
G01 - MEASURING TESTING
Information
Patent Application
PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...
Publication number
20240395524
Publication date
Nov 28, 2024
Drager Safety AG & Co. KGaA
Andre PAPE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOIONIZATION DETECTOR
Publication number
20240345041
Publication date
Oct 17, 2024
ALPHASENSE LIMITED
Ronan BARON
G01 - MEASURING TESTING
Information
Patent Application
PHOTOIONIZATION DETECTOR HAVING IMPROVED GAIN AND REDUCED HUMIDITY...
Publication number
20240297034
Publication date
Sep 5, 2024
Mocon, Inc.
Charles R. Willcox
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOIONIZATION DETECTOR LAMP AND ITS METHOD OF MANUFACTURE
Publication number
20230393095
Publication date
Dec 7, 2023
Honeywell International Inc.
Chuang HUANG
G01 - MEASURING TESTING
Information
Patent Application
PHOTOIONIZATION DETECTOR AUTOMATED ZERO LEVEL CALIBRATION
Publication number
20220390424
Publication date
Dec 8, 2022
Honeywell International Inc.
Guangli XIE
G01 - MEASURING TESTING
Information
Patent Application
PHOTOIONIZATION DETECTOR AUTOMATED ZERO LEVEL CALIBRATION
Publication number
20210181170
Publication date
Jun 17, 2021
Honeywell International Inc.
Guangli XIE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MONITORING FOR THE PRESENCE OF VOLATILE ORGAN...
Publication number
20210041411
Publication date
Feb 11, 2021
Computational International LLC
Ken Pingsheng HU
G01 - MEASURING TESTING
Information
Patent Application
PHOTOIONIZATION DETECTOR AUTOMATED ZERO LEVEL CALIBRATION
Publication number
20200371077
Publication date
Nov 26, 2020
HONEYWELL INTERNATIONAL INC.
Guangli XIE
G01 - MEASURING TESTING
Information
Patent Application
MICROFLUIDIC PHOTOIONIZATION DETECTOR
Publication number
20180164261
Publication date
Jun 14, 2018
The Regents of the University of Michigan
Xudong FAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR OPTIMAL CHEMICAL ANALYSIS
Publication number
20170234834
Publication date
Aug 17, 2017
Inficon, Inc.
Shawn Michael Briglin
G01 - MEASURING TESTING
Information
Patent Application
Method for ion detection
Publication number
20160327526
Publication date
Nov 10, 2016
John N. Driscoll
G01 - MEASURING TESTING
Information
Patent Application
Photo ionization detector for gas chromatography having at least tw...
Publication number
20140347062
Publication date
Nov 27, 2014
Valco Instruments Company, L.P.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Application
Photo ionization detector for gas chromatography having two separat...
Publication number
20140132277
Publication date
May 15, 2014
Valco Instruments Company, L.P.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Application
Pulsed discharge helium ionization detector with multiple combined...
Publication number
20140053627
Publication date
Feb 27, 2014
Valco Instruments Company, Inc.
Stanley D. Stearns
G01 - MEASURING TESTING
Information
Patent Application
Discharge Ionization Current Detector
Publication number
20110133746
Publication date
Jun 9, 2011
Shimadzu Corporation
Kei SHINADA
G01 - MEASURING TESTING
Information
Patent Application
Discharge Ionization Current Detector
Publication number
20110018546
Publication date
Jan 27, 2011
OSAKA UNIVERSITY
Katsuhisa Kitano
G01 - MEASURING TESTING
Information
Patent Application
MICRO DISCHARGE DEVICE CAPABLE OF LOW VOLTAGE DISCHARGES IN A VARIE...
Publication number
20100045159
Publication date
Feb 25, 2010
Honeywell International Inc.
Adam Dewey McBrady
G01 - MEASURING TESTING
Information
Patent Application
PHASED MICRO ANALYZER VIII
Publication number
20090100906
Publication date
Apr 23, 2009
Honeywell International Inc.
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Gas analysis method
Publication number
20070031974
Publication date
Feb 8, 2007
Ravi Jain
G01 - MEASURING TESTING
Information
Patent Application
Ionization-based detection
Publication number
20060289809
Publication date
Dec 28, 2006
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Micro ion pump
Publication number
20050141999
Publication date
Jun 30, 2005
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Phased micro analyzer VIII
Publication number
20050142662
Publication date
Jun 30, 2005
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Phased VII micro fluid analyzer having a modular structure
Publication number
20050063865
Publication date
Mar 24, 2005
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Phased micro analyzer V, VI
Publication number
20050042139
Publication date
Feb 24, 2005
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Phased micro analyzer IV
Publication number
20040259265
Publication date
Dec 23, 2004
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Gas ionization sensor
Publication number
20040245993
Publication date
Dec 9, 2004
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for determination of water and for normal phas...
Publication number
20040241863
Publication date
Dec 2, 2004
Nile N Frawley
G01 - MEASURING TESTING
Information
Patent Application
Micro-plasma sensor system
Publication number
20040223882
Publication date
Nov 11, 2004
Ulrich Bonne
G01 - MEASURING TESTING
Information
Patent Application
Helium ionization detector
Publication number
20040189314
Publication date
Sep 30, 2004
Pierre Le Foll
G01 - MEASURING TESTING