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G01J2003/1243
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/1243
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Patents Grants
last 30 patents
Information
Patent Grant
Hyperspectral quantitative imaging cytometry system
Patent number
12,078,585
Issue date
Sep 3, 2024
Cytognos, S.L.
José Mário Tenera Morgado
G01 - MEASURING TESTING
Information
Patent Grant
Optical instrumentation including a spatially variable filter
Patent number
11,099,068
Issue date
Aug 24, 2021
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensor comprising a rotatable Fabry-Perot multilayer etalon
Patent number
10,955,336
Issue date
Mar 23, 2021
Innovative Micro Technology
Christopher S. Gudeman
G01 - MEASURING TESTING
Information
Patent Grant
Filter array reconstructive spectrometry
Patent number
10,852,189
Issue date
Dec 1, 2020
The Regents of the University of California
Zhaowei Liu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for 4-D hyperspectral imaging
Patent number
10,591,417
Issue date
Mar 17, 2020
Verily Life Sciences LLC
Charles Santori
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Technique and apparatus for spectrophotometry using broadband filters
Patent number
10,514,298
Issue date
Dec 24, 2019
Seung Min Jin
G02 - OPTICS
Information
Patent Grant
Systems and methods for 4-D hyperspectral imaging
Patent number
10,365,218
Issue date
Jul 30, 2019
Verily Life Sciences LLC
Charles Santori
G02 - OPTICS
Information
Patent Grant
Optical spectrometer configuration including spatially variable fil...
Patent number
10,240,981
Issue date
Mar 26, 2019
Filmetrics, Inc.
Matthew F. Ross
G01 - MEASURING TESTING
Information
Patent Grant
Spectral imaging method and system
Patent number
10,101,206
Issue date
Oct 16, 2018
RAMOT AT TEL-AVI UNIVERSITY LTD.
Ran Schleyen
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic unit and spectroscopic device using same
Patent number
9,841,323
Issue date
Dec 12, 2017
Konica Minolta, Inc.
Yoshitaka Teraoka
G02 - OPTICS
Information
Patent Grant
Spectroscope and microspectroscopic system
Patent number
9,612,156
Issue date
Apr 4, 2017
Nikon Corporation
Ryoichi Sataka
G02 - OPTICS
Information
Patent Grant
Image pickup device
Patent number
9,541,495
Issue date
Jan 10, 2017
Kabushiki Kaisha Topcon
Fumio Ohtomo
G02 - OPTICS
Information
Patent Grant
Spectral device
Patent number
9,488,827
Issue date
Nov 8, 2016
Hamamatsu Photonics K.K.
Fumitsugu Fukuyo
G02 - OPTICS
Information
Patent Grant
Microscope spectrometer, optical axis shift correction device, spec...
Patent number
9,442,013
Issue date
Sep 13, 2016
Yokogawa Electric Corporation
Mitsuhiro Iga
G01 - MEASURING TESTING
Information
Patent Grant
Thermal control in variable aperture mechanism for cryogenic enviro...
Patent number
9,323,130
Issue date
Apr 26, 2016
Raytheon Company
Jeffrey P. Yanevich
G01 - MEASURING TESTING
Information
Patent Grant
Tunable light source system with wavelength measurement for a hyper...
Patent number
9,274,000
Issue date
Mar 1, 2016
Corning Incorporated
Cameron John Tovey
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Spectroscope and microspectroscopic system
Patent number
9,243,955
Issue date
Jan 26, 2016
Nikon Corporation
Ryoichi Sataka
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic adjustment of multimode lightfield imaging system using exp...
Patent number
9,219,866
Issue date
Dec 22, 2015
Ricoh Co., Ltd.
Sapna A. Shroff
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical spectrum analyzer with continuously rotating tunable filter
Patent number
8,953,161
Issue date
Feb 10, 2015
Optoplex Corporation
Yung-Chieh Hsieh
G01 - MEASURING TESTING
Information
Patent Grant
Optical splitting device, optical multiplexing device and method, a...
Patent number
8,908,281
Issue date
Dec 9, 2014
Huawei Technologies Co., Ltd.
Zhenghua Fu
G01 - MEASURING TESTING
Information
Patent Grant
Variable monochromatic uniform calibration source
Patent number
8,861,106
Issue date
Oct 14, 2014
Raytheon Company
John R. Moore
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for optical filtering with two passbands
Patent number
8,294,990
Issue date
Oct 23, 2012
Raytheon Canada Limited
Douglas J. Brown
G01 - MEASURING TESTING
Information
Patent Grant
Optical devices, spectroscopic systems and methods for detecting sc...
Patent number
8,130,376
Issue date
Mar 6, 2012
Avalon Instruments Ltd.
Julien S. Villaumie
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectrum analyzer with continuously rotating tunable filter
Patent number
7,961,316
Issue date
Jun 14, 2011
Optoplex Corporation
Yung-Chieh Hsieh
G01 - MEASURING TESTING
Information
Patent Grant
Downhole tools utilizing electroactive polymers for actuating relea...
Patent number
7,857,066
Issue date
Dec 28, 2010
Baker Hughes Incorporated
Rocco DiFoggio
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Grant
Downhole uses of electroactive polymers
Patent number
7,559,358
Issue date
Jul 14, 2009
Baker Hughes Incorporated
Rocco DiFoggio
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Grant
Optical microscope and spectrum measuring method
Patent number
7,561,265
Issue date
Jul 14, 2009
Nanophoton Corp.
Minoru Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for recording a sequence of images using a mov...
Patent number
7,554,596
Issue date
Jun 30, 2009
The Trustees of Columbia University In the City of New York
Shree K. Nayar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Two-dimensional spectroradiometer
Patent number
7,365,850
Issue date
Apr 29, 2008
Konica Minolta Sensing, Inc.
Kenji Imura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for a high resolution downhole spectrometer
Patent number
7,280,214
Issue date
Oct 9, 2007
Baker Hughes Incorporated
Rocco DiFoggio
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL SYSTEMS WITH TILTABLE FILTERS
Publication number
20230324671
Publication date
Oct 12, 2023
Semiconductor Components Industries, LLC
David Wayne JASINSKI
G02 - OPTICS
Information
Patent Application
WAVELENGTH SELECTION MODULE, ILLUMINATION SYSTEM AND METROLOGY SYSTEM
Publication number
20220299365
Publication date
Sep 22, 2022
ASML NETHERLANDS B.V.
Gerbrand VAN DER ZOUW
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
HYPERSPECTRAL QUANTITATIVE IMAGING CYTOMETRY SYSTEM
Publication number
20220228968
Publication date
Jul 21, 2022
Cytognos, S.L.
José Mário TENERA MORGADO
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for 4-D Hyperspectral Imaging
Publication number
20190310199
Publication date
Oct 10, 2019
Verily Life Sciences LLC
Charles Santori
G02 - OPTICS
Information
Patent Application
SPECTRAL IMAGING METHOD AND SYSTEM
Publication number
20180252583
Publication date
Sep 6, 2018
Ramot at Tel Aviv University Ltd.
Ran SCHLEYEN
G01 - MEASURING TESTING
Information
Patent Application
Short-Wavelength Infrared (SWIR) Multi-Conjugate Liquid Crystal Tun...
Publication number
20140362331
Publication date
Dec 11, 2014
Lei Shi
G02 - OPTICS
Information
Patent Application
THERMAL CONTROL IN VARIABLE APERTURE MECHANISM FOR CRYOGENIC ENVIRO...
Publication number
20140363151
Publication date
Dec 11, 2014
Raytheon Company
Jeffrey P. Yanevich
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPE AND MICROSPECTROSCOPIC SYSTEM
Publication number
20140340677
Publication date
Nov 20, 2014
Ryoichi SATAKA
G02 - OPTICS
Information
Patent Application
TUNABLE LIGHT SOURCE SYSTEM WITH WAVELENGTH MEASUREMENT FOR A HYPER...
Publication number
20140327816
Publication date
Nov 6, 2014
Cameron John Tovey
G01 - MEASURING TESTING
Information
Patent Application
Image Pickup Device
Publication number
20140232858
Publication date
Aug 21, 2014
Fumio Ohtomo
G02 - OPTICS
Information
Patent Application
Dynamic Adjustment of Multimode Lightfield Imaging System Using Exp...
Publication number
20140192255
Publication date
Jul 10, 2014
RICOH CO., LTD.
Sapna A. Shroff
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTRUM ANALYZER WITH CONTINUOUSLY ROTATING TUNABLE FILTER
Publication number
20140125975
Publication date
May 8, 2014
OPTOPLEX CORPORATION
Yung-Chieh Hsieh
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC APPARATUS AND SPECTROSCOPIC LIGHT SOURCE
Publication number
20140125981
Publication date
May 8, 2014
YOKOGAWA ELECTRIC CORPORATION
Mitsuhiro IGA
G02 - OPTICS
Information
Patent Application
IMAGING DEVICE AND IMAGING METHOD
Publication number
20130321640
Publication date
Dec 5, 2013
SONY CORPORATION
TATSUYA NAKATSUJI
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPE SPECTROMETER, OPTICAL AXIS SHIFT CORRECTION DEVICE, SPEC...
Publication number
20130258332
Publication date
Oct 3, 2013
YOKOGAWA ELECTRIC CORPORATION
Mitsuhiro Iga
G02 - OPTICS
Information
Patent Application
VARIABLE MONOCHROMATIC UNIFORM CALIBRATION SOURCE
Publication number
20130141791
Publication date
Jun 6, 2013
Raytheon Company
John R. Moore
G01 - MEASURING TESTING
Information
Patent Application
Optical Splitting Device, Optical Multiplexing Device and Method, a...
Publication number
20130077177
Publication date
Mar 28, 2013
Huawei Technologies Co., Ltd
Zhenghua Fu
G02 - OPTICS
Information
Patent Application
SPECTRAL DEVICE
Publication number
20120314295
Publication date
Dec 13, 2012
Hamamatsu Photonics K. K.
Fumitsugu Fukuyo
G02 - OPTICS
Information
Patent Application
OPTICAL SPECTRUM ANALYZER WITH CONTINUOUSLY ROTATING TUYNABLE FILTER
Publication number
20110211194
Publication date
Sep 1, 2011
OPTOPLEX CORPORATION
Yung-Chieh Hsieh
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER AND METHOD OF OPERATING A SPECTROMETER
Publication number
20110189787
Publication date
Aug 4, 2011
Pierre R. Graves
G01 - MEASURING TESTING
Information
Patent Application
ARRANGEMENT ADAPTED FOR SPECTRAL ANALYSIS
Publication number
20110109905
Publication date
May 12, 2011
SENSEAIR AB
Hans Göran Evald Martin
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Optical Filtering with Two Passbands
Publication number
20110058256
Publication date
Mar 10, 2011
Raytheon Company
Douglas J. Brown
G02 - OPTICS
Information
Patent Application
OPTICAL DEVICES AND SYSTEMS USING THEM
Publication number
20100110423
Publication date
May 6, 2010
Julien S. Villaumie
G01 - MEASURING TESTING
Information
Patent Application
Optical Analyser
Publication number
20090290159
Publication date
Nov 26, 2009
Nils Wihlborg
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus For Recording A Sequence Of Images Using A Mov...
Publication number
20090180020
Publication date
Jul 16, 2009
Shree K. Nayar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
FILTER ASSEMBLY AND IMAGE ENHANCEMENT SYSTEM FOR A SURVEILLANCE CAM...
Publication number
20080252882
Publication date
Oct 16, 2008
JOHN KESTERSON
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Optical Analyser
Publication number
20080192348
Publication date
Aug 14, 2008
Nils Wihlborg
G01 - MEASURING TESTING
Information
Patent Application
DOWNHOLE TOOLS UTILIZING ELECTROACTIVE POLYMERS FOR ACTUATING RELEA...
Publication number
20080149348
Publication date
Jun 26, 2008
BAKER HUGHES INCORPORATED
Rocco DiFoggio
E21 - EARTH DRILLING MINING
Information
Patent Application
Hybrid-imaging spectrometer
Publication number
20080130001
Publication date
Jun 5, 2008
E. Neil Lewis
G01 - MEASURING TESTING
Information
Patent Application
Optical spectrum analyzer with continuously rotating tuynable filter
Publication number
20070285659
Publication date
Dec 13, 2007
OPTOPLEX CORPORATION
Yung-Chieh Hsieh
G01 - MEASURING TESTING