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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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Patents Grantslast 30 patents

Information Patent Grant
Monolithically configured spectroscopic instrument
- Patent number 10,732,040
- Issue date Aug 4, 2020
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Heinrich Grueger
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element simultaneous analysis atomic absorption spectroscopy...
- Patent number 5,283,624
- Issue date Feb 1, 1994
- Hitachi, Ltd.
- Masamichi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer for the simultaneous measurement of intensity in vario...
- Patent number 4,993,834
- Issue date Feb 19, 1991
- Fried. Krupp GmbH
- Christoph Carlhoff
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for a multidetector array spectrograph
- Patent number 4,966,458
- Issue date Oct 30, 1990
- Milton Roy Company
- Richard Burns
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for a multidetector array spectrograph
- Patent number 4,875,773
- Issue date Oct 24, 1989
- Milton Roy Company
- Richard Burns
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONOLITHICALLY CONFIGURED SPECTROSCOPIC INSTRUMENT
- Publication number 20190368931
- Publication date Dec 5, 2019
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Heinrich Grueger
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE INCLUDING SLOT AND APPARATUS EMPLOYING THE OPTICAL D...
- Publication number 20170370773
- Publication date Dec 28, 2017
- Samsung Electronics Co., Ltd.
- Jineun KIM
- G02 - OPTICS