Polarisation-affecting properties

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

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G01N21/21Polarisation-affecting properties

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vibration insensitive interferometry for measuring thickness and pr...
- Patent number 12,326,402
- Issue date Jun 10, 2025
- Korean Research Institute of Standard and Science
- Yong-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Polarization imaging system and polarization imaging method
- Patent number 12,320,741
- Issue date Jun 3, 2025
- Sony Group Corporation
- Piergiorgio Sartor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for acquiring polarized images
- Patent number 12,320,740
- Issue date Jun 3, 2025
- Hitachi High-Tech Science Corporation
- Hirohito Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Imaging spectropolarimeter and sample characterization methodology...
- Patent number 12,306,092
- Issue date May 20, 2025
- BRUKER NANO, INC.
- Mazen Zawaideh
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for quantitative three dimensional measurement of...
- Patent number 12,306,102
- Issue date May 20, 2025
- CZ Biohub SF, LLC.
- Shalin Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Crystallographic defect inspection
- Patent number 12,292,374
- Issue date May 6, 2025
- Camtek Ltd.
- Yuval Weissler
- G01 - MEASURING TESTING
Information Patent Grant
System for locating a woven preform tracer
- Patent number 12,287,281
- Issue date Apr 29, 2025
- SAFRAN
- Benoît Vincent Pierre Lasjaunias
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Inspection device
- Patent number 12,287,286
- Issue date Apr 29, 2025
- Mitsubishi Heavy Industries, Ltd.
- Syusaku Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Device for polarimetrically characterising the anisotropy of a medi...
- Patent number 12,270,753
- Issue date Apr 8, 2025
- Universite de Bretagne Occidentale
- Yann Le Grand
- G01 - MEASURING TESTING
Information Patent Grant
Part quality monitoring in a stereolithographic additive manufactur...
- Patent number 12,269,215
- Issue date Apr 8, 2025
- Stratasys, Inc.
- J. Samuel Batchelder
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
High frequency detection method and apparatus
- Patent number 12,253,464
- Issue date Mar 18, 2025
- Thruvision Limited
- Christopher Mark Mann
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring the profile of flat objects compris...
- Patent number 12,235,209
- Issue date Feb 25, 2025
- SENTRONICS METROLOGY GMBH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to characterize substrates and films
- Patent number 12,235,091
- Issue date Feb 25, 2025
- Onto Innovation Inc.
- Jian Ding
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for monitoring solid-phase stepwise oligonucleo...
- Patent number 12,226,747
- Issue date Feb 18, 2025
- CENTRILLION TECHNOLOGY HOLDINGS CORPORATION
- Paul Dentinger
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 12,228,499
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,222,282
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Seoyeon Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber multi-parameter sensing system and method
- Patent number 12,222,286
- Issue date Feb 11, 2025
- Wenzhou University
- Zhihong Li
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring element concentration of material
- Patent number 12,222,281
- Issue date Feb 11, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ying-Chih Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting cans
- Patent number 12,216,062
- Issue date Feb 4, 2025
- Krones AG
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for determining chiral optical properties from...
- Patent number 12,216,043
- Issue date Feb 4, 2025
- The Regents of the University of Michigan
- Nicholas A. Kotov
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic phase-shift interferometer utilizing a synchronous optical...
- Patent number 12,216,051
- Issue date Feb 4, 2025
- Onto Innovation Inc.
- James Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for spectral imaging of density, anisotropy, and...
- Patent number 12,209,951
- Issue date Jan 28, 2025
- CZ Biohub SF, LLC.
- Shalin Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for polarization-sensitive optical coherence to...
- Patent number 12,209,952
- Issue date Jan 28, 2025
- Singapore Health Services Pte Ltd.
- Leopold Schmetterer
- G01 - MEASURING TESTING
Information Patent Grant
Simulator and test method of polarization transmission in sea fog
- Patent number 12,203,810
- Issue date Jan 21, 2025
- Changchun University of Science and Technology
- Qiang Fu
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging system and method based on random light field spati...
- Patent number 12,203,845
- Issue date Jan 21, 2025
- Soochow University
- Yahong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Gallium arsenide substrate comprising a surface oxide layer with im...
- Patent number 12,205,815
- Issue date Jan 21, 2025
- Freiberger Compound Materials GmbH
- Wolfram Fliegel
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Method and apparatus for obtaining chemical and/or material specifi...
- Patent number 12,196,615
- Issue date Jan 14, 2025
- University of Southampton
- Sumeet Mahajan
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring an effect of a wavelength-dependent measuring...
- Patent number 12,174,546
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Walter Pauls
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Concentration measuring method of optically active substance and co...
- Patent number 12,158,412
- Issue date Dec 3, 2024
- FUJIFILM Corporation
- Yujiro Yanai
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for multi-reflection solution immersed silicon-ba...
- Patent number 12,152,982
- Issue date Nov 26, 2024
- Korea Research Institute of Standards and Science
- Hyun Mo Cho
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH FREQUENCY DETECTION METHOD AND APPARATUS
- Publication number 20250155369
- Publication date May 15, 2025
- Thruvision Limited
- Christopher Mark MANN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MONITORING SOLID-PHASE STEPWISE OLIGONUCLEO...
- Publication number 20250144590
- Publication date May 8, 2025
- Centrillion Technology Holdings Corporation
- Paul DENTINGER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE
- Publication number 20250137773
- Publication date May 1, 2025
- Industrial Technology Research Institute
- Shih-Hsiang LAI
- G01 - MEASURING TESTING
Information Patent Application
SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING
- Publication number 20250137920
- Publication date May 1, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
POLARIZED BLACK-BODY EMISSION FOR MACHINE VISION AND OBJECT RECOGNI...
- Publication number 20250116599
- Publication date Apr 10, 2025
- The Regents of the University of Michigan
- Nicholas A. KOTOV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spectroscopic Ellipsometry With Detector Resolved Numerical Apertur...
- Publication number 20250110042
- Publication date Apr 3, 2025
- KLA Corporation
- Zhengquan Tan
- G01 - MEASURING TESTING
Information Patent Application
Electrical Performance Prediction Based On Structural Measurements...
- Publication number 20250105064
- Publication date Mar 27, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS OF DETERMINING A STRESS-RELATED CHARACTERISTI...
- Publication number 20250085177
- Publication date Mar 13, 2025
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
Angle Of Incidence And Azimuth Angle Resolved Spectroscopic Ellipso...
- Publication number 20250076185
- Publication date Mar 6, 2025
- KLA Corporation
- Janardan Nath
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250076204
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Min Hwan SEO
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...
- Publication number 20250067659
- Publication date Feb 27, 2025
- Trioptics GmbH
- Aiko RUPRECHT
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...
- Publication number 20250067660
- Publication date Feb 27, 2025
- COGNEX CORPORATION
- Ben R. Carey
- G01 - MEASURING TESTING
Information Patent Application
HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IM...
- Publication number 20250060251
- Publication date Feb 20, 2025
- Purdue Research Foundation
- Zubin Jacob
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING...
- Publication number 20250060677
- Publication date Feb 20, 2025
- Carl Zeiss SMT GMBH
- Walter Pauls
- G01 - MEASURING TESTING
Information Patent Application
DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER
- Publication number 20250052666
- Publication date Feb 13, 2025
- KLA Corporation
- Chao Chang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20250052667
- Publication date Feb 13, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Jooyoun KANG
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for Multi-Modal Polarization Holographic Spect...
- Publication number 20250035538
- Publication date Jan 30, 2025
- The University of Hong Kong
- Yanmin ZHU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND OPTICAL MEASURING APPARATUS
- Publication number 20250027874
- Publication date Jan 23, 2025
- YOKOGAWA ELECTRIC CORPORATION
- Takeshi SAWADA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20250020588
- Publication date Jan 16, 2025
- Yokogawa Electric Corporation
- Syuhei Okada
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...
- Publication number 20250011918
- Publication date Jan 9, 2025
- Seoul National University R&DB Foundation
- Gyu Chul Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHEMICAL SENSORS USING COPPER HIGH-ASPECT STRUCTURES (CuHARS) AND M...
- Publication number 20250003867
- Publication date Jan 2, 2025
- Louisiana Tech Research Corporation
- Mark A. DECOSTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING OPTICAL PROPERTIES AND GEOMETRIC PROPERTIES OF...
- Publication number 20250003866
- Publication date Jan 2, 2025
- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Xiuguo Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM...
- Publication number 20240418632
- Publication date Dec 19, 2024
- The Regents of the University of Michigan
- Nicholas A. KOTOV
- G01 - MEASURING TESTING
Information Patent Application
BIOLOGICS DETECTION DEVICE
- Publication number 20240407661
- Publication date Dec 12, 2024
- Advanced Medical Solutions International, LLC
- Nassar O. Said
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES
- Publication number 20240410822
- Publication date Dec 12, 2024
- Apple Inc.
- Miikka M. Kangas
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-COMPUTING DEVICE AND METHOD FOR ANALYSING LIGHT PASSING THR...
- Publication number 20240404035
- Publication date Dec 5, 2024
- TIAMA
- Raphael DRUETTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUASI-DYNAMIC IN SITU ELLIPSOMETRY METHOD AND SYSTEM FOR MEASURING...
- Publication number 20240402614
- Publication date Dec 5, 2024
- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Hao Jiang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ANGLE-RESOLVED SPECTROSCOPIC ELLIPSOMETER USING SPATIAL LIGHT MODUL...
- Publication number 20240369473
- Publication date Nov 7, 2024
- Seoul National University R&DB Foundation
- Heui Jae PAHK
- G01 - MEASURING TESTING
Information Patent Application
WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...
- Publication number 20240353350
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Kihong CHUNG
- H01 - BASIC ELECTRIC ELEMENTS

Polarisation-affecting properties

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vibration insensitive interferometry for measuring thickness and pr...

Polarization imaging system and polarization imaging method

Apparatus for acquiring polarized images

Imaging spectropolarimeter and sample characterization methodology...

Method and system for quantitative three dimensional measurement of...

Crystallographic defect inspection

System for locating a woven preform tracer

Inspection device

Device for polarimetrically characterising the anisotropy of a medi...

Part quality monitoring in a stereolithographic additive manufactur...

High frequency detection method and apparatus

Device and method for measuring the profile of flat objects compris...

Apparatus to characterize substrates and films

Methods and systems for monitoring solid-phase stepwise oligonucleo...

Pupil ellipsometry measurement apparatus and method and method of f...

Semiconductor measurement apparatus

Optical fiber multi-parameter sensing system and method

Method for measuring element concentration of material

Apparatus and method for inspecting cans

Devices and methods for determining chiral optical properties from...

Dynamic phase-shift interferometer utilizing a synchronous optical...

Method and system for spectral imaging of density, anisotropy, and...

Methods and systems for polarization-sensitive optical coherence to...

Simulator and test method of polarization transmission in sea fog

Optical imaging system and method based on random light field spati...

Gallium arsenide substrate comprising a surface oxide layer with im...

Method and apparatus for obtaining chemical and/or material specifi...

Method for measuring an effect of a wavelength-dependent measuring...

Concentration measuring method of optically active substance and co...

Device and method for multi-reflection solution immersed silicon-ba...

Patents Applicationslast 30 patents

HIGH FREQUENCY DETECTION METHOD AND APPARATUS

METHODS AND SYSTEMS FOR MONITORING SOLID-PHASE STEPWISE OLIGONUCLEO...

FILM THICKNESS MEASUREMENT DEVICE

SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING

POLARIZED BLACK-BODY EMISSION FOR MACHINE VISION AND OBJECT RECOGNI...

Spectroscopic Ellipsometry With Detector Resolved Numerical Apertur...

Electrical Performance Prediction Based On Structural Measurements...

METHODS AND APPARATUS OF DETERMINING A STRESS-RELATED CHARACTERISTI...

Angle Of Incidence And Azimuth Angle Resolved Spectroscopic Ellipso...

IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME

TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...

SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...

HEAT ASSISTED DETECTION AND RANGING BASED ON SPECTROPOLARIMETRIC IM...

METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING...

DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

Method and apparatus for Multi-Modal Polarization Holographic Spect...

OPTICAL SYSTEMS AND OPTICAL MEASURING APPARATUS

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

AUTOMATED THIN FILM DEPOSITION SYSTEM AND THIN FILM DEPOSITION METH...

CHEMICAL SENSORS USING COPPER HIGH-ASPECT STRUCTURES (CuHARS) AND M...

METHOD FOR MEASURING OPTICAL PROPERTIES AND GEOMETRIC PROPERTIES OF...

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM...

BIOLOGICS DETECTION DEVICE

REFERENCE SWITCH ARCHITECTURES FOR NONCONTACT SENSING OF SUBSTANCES

OPTICAL-COMPUTING DEVICE AND METHOD FOR ANALYSING LIGHT PASSING THR...

QUASI-DYNAMIC IN SITU ELLIPSOMETRY METHOD AND SYSTEM FOR MEASURING...

ANGLE-RESOLVED SPECTROSCOPIC ELLIPSOMETER USING SPATIAL LIGHT MODUL...

WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...