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G01N21/21
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Massachusetts Institute of Technology
Zhongming Li
G06 - COMPUTING CALCULATING COUNTING
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INTER-UNIVERSITY RESEARCH INSTITUTE COPORATION NATIONAL INSTITUTES OF NATURAL...
Hiromi Okamoto
G01 - MEASURING TESTING
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GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Thomas Avery Germer
G01 - MEASURING TESTING
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The Aerospace Corporation
Rocky G. Morales
B64 - AIRCRAFT AVIATION COSMONAUTICS
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Samsung Electronics Co., Ltd.
Yasuhiro Hidaka
H01 - BASIC ELECTRIC ELEMENTS
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Huaqiao University
Changcai Cui
G01 - MEASURING TESTING
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Samsung Electronics Co., Ltd.
Jin Yong Kim
G01 - MEASURING TESTING
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J. A. Woollam Co., Inc.
Ping He
G01 - MEASURING TESTING
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Edwards Lifesciences Corporation
Carolyn Sue Martinez
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Korean Research Institute of Standard and Science
Yong-sik Ghim
G01 - MEASURING TESTING
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Sony Group Corporation
Piergiorgio Sartor
G06 - COMPUTING CALCULATING COUNTING
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Hitachi High-Tech Science Corporation
Hirohito Fujiwara
G01 - MEASURING TESTING
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BRUKER NANO, INC.
Mazen Zawaideh
G01 - MEASURING TESTING
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CZ Biohub SF, LLC.
Shalin Mehta
G01 - MEASURING TESTING
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Camtek Ltd.
Yuval Weissler
G01 - MEASURING TESTING
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SAFRAN
Benoît Vincent Pierre Lasjaunias
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Mitsubishi Heavy Industries, Ltd.
Syusaku Yamamoto
G01 - MEASURING TESTING
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Universite de Bretagne Occidentale
Yann Le Grand
G01 - MEASURING TESTING
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Stratasys, Inc.
J. Samuel Batchelder
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Thruvision Limited
Christopher Mark Mann
G01 - MEASURING TESTING
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SENTRONICS METROLOGY GMBH
Bernd Srocka
G01 - MEASURING TESTING
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Onto Innovation Inc.
Jian Ding
G01 - MEASURING TESTING
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CENTRILLION TECHNOLOGY HOLDINGS CORPORATION
Paul Dentinger
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Samsung Electronics Co., Ltd.
Jaehwang Jung
G01 - MEASURING TESTING
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Samsung Electronics Co., Ltd.
Seoyeon Jeong
G01 - MEASURING TESTING
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Wenzhou University
Zhihong Li
G01 - MEASURING TESTING
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CHANGXIN MEMORY TECHNOLOGIES, INC.
Ying-Chih Wang
G01 - MEASURING TESTING
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Krones AG
Stefan Piana
G01 - MEASURING TESTING
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The Regents of the University of Michigan
Nicholas A. Kotov
G01 - MEASURING TESTING
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Onto Innovation Inc.
James Millerd
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Jiyong Shin
G02 - OPTICS
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SONY GROUP CORPORATION
Matthias SCHINZEL
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Ingi Kim
G01 - MEASURING TESTING
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Industry-Academic Cooperation Foundation, Yonsei University
Young-Joo KIM
G01 - MEASURING TESTING
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Samsung Electronics Co., Ltd.
Jaeho KIM
G01 - MEASURING TESTING
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Samsung Electronics Co., Ltd.
Sangwoo BAE
G01 - MEASURING TESTING
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FemtoMetrix, Inc.
Ken James
H01 - BASIC ELECTRIC ELEMENTS
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Thruvision Limited
Christopher Mark MANN
G01 - MEASURING TESTING
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Centrillion Technology Holdings Corporation
Paul DENTINGER
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Industrial Technology Research Institute
Shih-Hsiang LAI
G01 - MEASURING TESTING
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KLA Corporation
Amnon Manassen
G01 - MEASURING TESTING
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Patent Application
The Regents of the University of Michigan
Nicholas A. KOTOV
G06 - COMPUTING CALCULATING COUNTING
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KLA Corporation
Zhengquan Tan
G01 - MEASURING TESTING
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KLA Corporation
Zhengquan Tan
H01 - BASIC ELECTRIC ELEMENTS
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Corning Incorporated
Ryan Claude Andrews
G01 - MEASURING TESTING
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KLA Corporation
Janardan Nath
G01 - MEASURING TESTING
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Samsung Electronics Co., Ltd.
Min Hwan SEO
G01 - MEASURING TESTING
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Trioptics GmbH
Aiko RUPRECHT
G01 - MEASURING TESTING
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COGNEX CORPORATION
Ben R. Carey
G01 - MEASURING TESTING
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Purdue Research Foundation
Zubin Jacob
G06 - COMPUTING CALCULATING COUNTING
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Carl Zeiss SMT GMBH
Walter Pauls
G01 - MEASURING TESTING
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KLA Corporation
Chao Chang
G01 - MEASURING TESTING
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SAMSUNG ELECTRONICS CO., LTD.
Jooyoun KANG
G01 - MEASURING TESTING
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The University of Hong Kong
Yanmin ZHU
G01 - MEASURING TESTING
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YOKOGAWA ELECTRIC CORPORATION
Takeshi SAWADA
G01 - MEASURING TESTING
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Yokogawa Electric Corporation
Syuhei Okada
G01 - MEASURING TESTING
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Seoul National University R&DB Foundation
Gyu Chul Yi
G06 - COMPUTING CALCULATING COUNTING
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Louisiana Tech Research Corporation
Mark A. DECOSTER
G01 - MEASURING TESTING
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HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Xiuguo Chen
G06 - COMPUTING CALCULATING COUNTING
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KLA Corporation
Shova Subedi
G01 - MEASURING TESTING
