CPC
G01N21/21
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CZ Biohub SF, LLC.
Shalin Mehta
G01 - MEASURING TESTING
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Singapore Health Services Pte Ltd.
Leopold Schmetterer
G01 - MEASURING TESTING
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Changchun University of Science and Technology
Qiang Fu
G01 - MEASURING TESTING
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Soochow University
Yahong Chen
G01 - MEASURING TESTING
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Freiberger Compound Materials GmbH
Wolfram Fliegel
C01 - INORGANIC CHEMISTRY
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University of Southampton
Sumeet Mahajan
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Carl Zeiss SMT GmbH
Walter Pauls
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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FUJIFILM Corporation
Yujiro Yanai
G01 - MEASURING TESTING
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Korea Research Institute of Standards and Science
Hyun Mo Cho
G01 - MEASURING TESTING
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Toyota Motor Engineering & Manufacturing North America, Inc.
Sean P. Rodrigues
G01 - MEASURING TESTING
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The Board of Trustees of the Leland Stanford Junior University
Jennifer A. Dionne
G01 - MEASURING TESTING
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Applied Materials, Inc.
Prayudi Lianto
B24 - GRINDING POLISHING
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Hefei Institutes of Physical Science, CAS
Congming Dai
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Ramot At Tel-Aviv University Ltd.
Lior Wolf
B82 - NANO-TECHNOLOGY
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Purdue Research Foundation
Zubin Jacob
G06 - COMPUTING CALCULATING COUNTING
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Lumina Instruments Inc.
Steven W. Meeks
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Samsung Electronics Co., Ltd.
Juntaek Oh
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AUROS TECHNOLOGY, INC.
Sang Jun Kim
G01 - MEASURING TESTING
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Shin-Etsu Chemical Co., Ltd.
Takashi Uchida
G01 - MEASURING TESTING
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KLA Corporation
Itay Gdor
H01 - BASIC ELECTRIC ELEMENTS
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Apple Inc.
Miikka M. Kangas
G01 - MEASURING TESTING
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Nippon Telegraph and Telephone Corporation
Tomohiro Taniguchi
G01 - MEASURING TESTING
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AUROS TECHNOLOGY, INC.
Mi Ta Park
G01 - MEASURING TESTING
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Applied Materials Israel Ltd.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
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Abraxis BioScience, LLC
Viktor Peykov
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Tokyo Electron Limited
Ryota Ifuku
C01 - INORGANIC CHEMISTRY
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Ramona Optics Inc.
Jaehee Park
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Dassault Systemes Americas Corp.
Sabine Schweizer
G01 - MEASURING TESTING
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Samsung Display Co., Ltd.
Gil Yeong Park
G02 - OPTICS
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SPECTRICON IKE
Konstantinos Balas
G01 - MEASURING TESTING
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The University of Hong Kong
Yanmin ZHU
G01 - MEASURING TESTING
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YOKOGAWA ELECTRIC CORPORATION
Takeshi SAWADA
G01 - MEASURING TESTING
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Yokogawa Electric Corporation
Syuhei Okada
G01 - MEASURING TESTING
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Seoul National University R&DB Foundation
Gyu Chul Yi
G06 - COMPUTING CALCULATING COUNTING
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Louisiana Tech Research Corporation
Mark A. DECOSTER
G01 - MEASURING TESTING
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HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Xiuguo Chen
G06 - COMPUTING CALCULATING COUNTING
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KLA Corporation
Shova Subedi
G01 - MEASURING TESTING
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The Regents of the University of Michigan
Nicholas A. KOTOV
G01 - MEASURING TESTING
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Advanced Medical Solutions International, LLC
Nassar O. Said
G01 - MEASURING TESTING
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Apple Inc.
Miikka M. Kangas
G01 - MEASURING TESTING
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TIAMA
Raphael DRUETTO
G06 - COMPUTING CALCULATING COUNTING
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HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Hao Jiang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Seoul National University R&DB Foundation
Heui Jae PAHK
G01 - MEASURING TESTING
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KLA Corporation
Yun Xie
G01 - MEASURING TESTING
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SINTEF TTO AS
Sergey I. Bozhevolnyi
G01 - MEASURING TESTING
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KLA Corporation
David Y. Wang
G06 - COMPUTING CALCULATING COUNTING
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Samsung Electronics Co., Ltd.
Kihong CHUNG
H01 - BASIC ELECTRIC ELEMENTS
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Araz Yacoubian
B22 - CASTING POWDER METALLURGY
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Korea Research Institute of Standards and Science
Dong Hyung KIM
G01 - MEASURING TESTING
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14911199 Canada Inc.
David Allan Prystupa
G01 - MEASURING TESTING
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NOVA LTD
Dror SHAFIR
G01 - MEASURING TESTING
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The University of Hong Kong
Yanmin ZHU
G06 - COMPUTING CALCULATING COUNTING
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SAMSUNG DISPLAY CO., LTD.
Gil Yeong PARK
G01 - MEASURING TESTING
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Nanohmics, Inc.
Mark E. Lucente
G01 - MEASURING TESTING
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KLA Corporation
David Y. Wang
H01 - BASIC ELECTRIC ELEMENTS
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Wayne State University
Jitao ZHANG
G01 - MEASURING TESTING
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GM GLOBAL TECHNOLOGY OPERATIONS LLC
Satendra S. GURU
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Arizona Board of Regents on behalf of The University of Arizona
Meredith Kupinski
G01 - MEASURING TESTING
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SONY GROUP CORPORATION
Kentaro SAWADA
G01 - MEASURING TESTING
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National University Corporation Nagaoka University of Technology
MORITSUGU SAKAMOTO
G01 - MEASURING TESTING
