Polarisation microscopes

Industry

CPC
G02B21/0092

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B21/00Microscopes

Current Industry

G02B21/0092Polarisation microscopes

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Optical imaging system
- Patent number 12,228,508
- Issue date Feb 18, 2025
- Oxford Nanoimaging Limited
- Matthias Steiner
- G01 - MEASURING TESTING
Information Patent Grant
High resolution light valve detector for detecting x-ray
- Patent number 12,130,392
- Issue date Oct 29, 2024
- Carl Zeiss X-ray Microscopy Inc.
- Xiaochao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical measurement device with universal metasurface and optical m...
- Patent number 12,104,948
- Issue date Oct 1, 2024
- Korea Advanced Institute of Science and Technology
- Jonghwa Shin
- G01 - MEASURING TESTING
Information Patent Grant
Augmented reality microscope, image projection device and image pro...
- Patent number 12,025,787
- Issue date Jul 2, 2024
- Tencent Technology (Shenzhen) Company Limited
- Jun Liao
- G02 - OPTICS
Information Patent Grant
White dwarf: cross-polarized white light slide-free imaging
- Patent number 12,019,250
- Issue date Jun 25, 2024
- The Regents of the University of California
- Farzad Fereidouni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous focusing of an optical system to multiple focal planes...
- Patent number 11,994,661
- Issue date May 28, 2024
- Meadowlark Optics, Inc.
- Christopher Hoy
- G02 - OPTICS
Information Patent Grant
One-to-many randomizing interference microscope
- Patent number 11,954,172
- Issue date Apr 9, 2024
- Photomics, Inc.
- Henry Pinkard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polarimeter with multiple independent tunable channels and method f...
- Patent number 11,867,891
- Issue date Jan 9, 2024
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G02 - OPTICS
Information Patent Grant
Filter switching device for an optical observation instrument with...
- Patent number 11,774,736
- Issue date Oct 3, 2023
- Karl Storz SE & Co. KG
- Jonas Forster
- G02 - OPTICS
Information Patent Grant
Optical scanning microscope and examination method
- Patent number 11,630,292
- Issue date Apr 18, 2023
- Leica Microsystems CMS GmbH
- Christian Schumann
- G02 - OPTICS
Information Patent Grant
Surgical microscope having an illumination apparatus
- Patent number 11,630,294
- Issue date Apr 18, 2023
- Carl Zeiss Meditec AG
- Carl Kuebler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 11,536,940
- Issue date Dec 27, 2022
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Snapshot polarization imaging with a micro-camera array microscope
- Patent number 11,415,791
- Issue date Aug 16, 2022
- Ramona Optics Inc.
- Jaehee Park
- G02 - OPTICS
Information Patent Grant
Metasurface imager for quantitative phase gradient detection
- Patent number 11,385,450
- Issue date Jul 12, 2022
- California Institute of Technology
- Hyounghan Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Polarization and phase microscope
- Patent number 11,366,302
- Issue date Jun 21, 2022
- Arizona Board of Regents on behalf of the University of Arizona
- Stanley Pau
- G01 - MEASURING TESTING
Information Patent Grant
Sample detection device and sample detection method by using the same
- Patent number 11,300,500
- Issue date Apr 12, 2022
- Aligned Genetics, Inc.
- Alexey Dan Chin Yu
- G01 - MEASURING TESTING
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 11,294,161
- Issue date Apr 5, 2022
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Modular, electro-optical device for increasing the imaging field of...
- Patent number 11,294,165
- Issue date Apr 5, 2022
- The Board of Trustees of the Leland Stanford Junior University
- Karl A. Deisseroth
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High numerical aperture telemicroscopy apparatus
- Patent number 10,989,907
- Issue date Apr 27, 2021
- The Regents of the University of California
- Daniel Fletcher
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 10,976,284
- Issue date Apr 13, 2021
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
Structured illumination microscope, observation method, and storage...
- Patent number 10,900,900
- Issue date Jan 26, 2021
- Nikon Corporation
- Hisao Osawa
- G01 - MEASURING TESTING
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,884,228
- Issue date Jan 5, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Infrared microscope
- Patent number 10,845,585
- Issue date Nov 24, 2020
- Bruker Optik GmbH
- Niels Kroeger-Lui
- G02 - OPTICS
Information Patent Grant
Structured illumination optical system and structured illumination...
- Patent number 10,739,574
- Issue date Aug 11, 2020
- Nikon Corporation
- Yumiko Ouchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Epi-illumination Fourier ptychographic imaging for thick samples
- Patent number 10,718,934
- Issue date Jul 21, 2020
- California Institute of Technology
- Roarke W. Horstmeyer
- G02 - OPTICS
Information Patent Grant
Digital holographic microscope
- Patent number 10,712,270
- Issue date Jul 14, 2020
- National University Corporation Kobe University
- Osamu Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Light microscope and optical assembly to provide structured illumin...
- Patent number 10,663,749
- Issue date May 26, 2020
- Carl Zeiss Microscopy GmbH
- Daniel Schwedt
- G02 - OPTICS
Information Patent Grant
Polarized image acquisition apparatus, pattern inspection apparatus...
- Patent number 10,636,138
- Issue date Apr 28, 2020
- NuFlare Technology, Inc.
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D localization microscopy and 4D localization microscopy and track...
- Patent number 10,571,674
- Issue date Feb 25, 2020
- Carl Zeiss Microscopy GmbH
- Christian Soeller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical module and observation device
- Patent number 10,495,896
- Issue date Dec 3, 2019
- Hamamatsu Photonics K.K.
- Takashi Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Resolution Light Valve Detector for Detecting X-Ray
- Publication number 20250020818
- Publication date Jan 16, 2025
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OBSERVING A BIOLOGICAL PROBE
- Publication number 20240353667
- Publication date Oct 24, 2024
- Siemens Healthineers AG
- Ramona Seliger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOCUSING DEVICE, FOCUSING SYSTEM, MICROSCOPE AND METHOD FOR IMAGING...
- Publication number 20240264420
- Publication date Aug 8, 2024
- Abberior Instruments GmbH
- Benjamin HARKE
- G02 - OPTICS
Information Patent Application
POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...
- Publication number 20240142758
- Publication date May 2, 2024
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION IMAGE ACQUISITION APPARATUS AND THERMAL ANALYZER
- Publication number 20240125724
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hirohito FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL SCANNING DARK FIELD MICROSCOPY IMAGING METHOD AND DEVICE
- Publication number 20240085683
- Publication date Mar 14, 2024
- Zhejiang University
- Cuifang KUANG
- G02 - OPTICS
Information Patent Application
Apparatus, Optical system, and Method for digital holographic and p...
- Publication number 20240077711
- Publication date Mar 7, 2024
- Christopher B. Raub
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS FOCUSING OF AN OPTICAL SYSTEM TO MULTIPLE FOCAL PLANES...
- Publication number 20230400676
- Publication date Dec 14, 2023
- Meadowlark Optics, Inc.
- Christopher Hoy
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL M...
- Publication number 20230384152
- Publication date Nov 30, 2023
- Korea Advanced Institute of Science and Technology
- Jonghwa SHIN
- G01 - MEASURING TESTING
Information Patent Application
POLARIZED MICROSCOPE AND INTRA IMAGE FIELD CORRECTION ANALYSIS METHOD
- Publication number 20230305282
- Publication date Sep 28, 2023
- Samsung Electronics Co., Ltd.
- Ken OZAWA
- G02 - OPTICS
Information Patent Application
SURGICAL MICROSCOPE HAVING AN ILLUMINATION APPARATUS
- Publication number 20230221539
- Publication date Jul 13, 2023
- Carl Zeiss Meditec AG
- Carl Kuebler
- G02 - OPTICS
Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20230087619
- Publication date Mar 23, 2023
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
ONE-TO-MANY RANDOMIZING INTERFERENCE MICROSCOPE
- Publication number 20230043414
- Publication date Feb 9, 2023
- Photomics, Inc.
- Henry PINKARD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN OPTICAL IMAGING SYSTEM
- Publication number 20220390367
- Publication date Dec 8, 2022
- Oxford Nanoimaging Limited
- Matthias Steiner
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD TO CONVERT A REGULAR BRIGHT-FIELD MICROSCOPE I...
- Publication number 20220026697
- Publication date Jan 27, 2022
- ANA DOBLAS
- G02 - OPTICS
Information Patent Application
AUGMENTED REALITY MICROSCOPE, IMAGE PROJECTION DEVICE AND IMAGE PRO...
- Publication number 20210405340
- Publication date Dec 30, 2021
- TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED
- Jun LIAO
- G02 - OPTICS
Information Patent Application
High Resolution Light Valve Detector for Detecting X-Ray
- Publication number 20210311211
- Publication date Oct 7, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Filter Switching Device for an Optical Observation Instrument with...
- Publication number 20210215920
- Publication date Jul 15, 2021
- Karl Storz SE & Co. KG
- Jonas Forster
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR HIGH-THROUGHPUT POLARIZATION IMAGING OF ZEBRA...
- Publication number 20210208380
- Publication date Jul 8, 2021
- SUZHOU INSTITUTE OF BIOMEDICAL ENGINEERING AND TECHNOLOGY, CHINESE ACADEMY OF
- HUI LI
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20210088768
- Publication date Mar 25, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20210080710
- Publication date Mar 18, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
METASURFACE IMAGER FOR QUANTITATIVE PHASE GRADIENT DETECTION
- Publication number 20200348500
- Publication date Nov 5, 2020
- California Institute of Technology
- Hyounghan KWON
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SCANNING MICROSCOPE AND EXAMINATION METHOD
- Publication number 20200319445
- Publication date Oct 8, 2020
- Leica Microsystems CMS GmbH
- Christian Schumann
- G02 - OPTICS
Information Patent Application
POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...
- Publication number 20200271911
- Publication date Aug 27, 2020
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G01 - MEASURING TESTING
Information Patent Application
HIGH NUMERICAL APERTURE TELEMICROSCOPY APPARATUS
- Publication number 20200257103
- Publication date Aug 13, 2020
- The Regents of the University of California
- Daniel Fletcher
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION AND PHASE MICROSCOPE
- Publication number 20200209602
- Publication date Jul 2, 2020
- Arizona Board of Regents on behalf of The University of Arizona
- Stanley Pau
- G02 - OPTICS
Information Patent Application
HIGH NUMERICAL APERTURE TELEMICROSCOPY APPARATUS
- Publication number 20200159001
- Publication date May 21, 2020
- The Regents of the University of California
- Daniel Fletcher
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS ORTHOGONAL LASER IMAGE RECONSTRUCTION SUPER-RESOLUTION...
- Publication number 20200142169
- Publication date May 7, 2020
- Shiping GU
- Shiping GU
- G02 - OPTICS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20200132629
- Publication date Apr 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Application
OPTICAL SECTIONING APPARATUS USING ADVANCED MIRAU OPTICAL INTERFERE...
- Publication number 20190353883
- Publication date Nov 21, 2019
- AcuSolutions Inc.
- Kuang-Yu HSU
- G01 - MEASURING TESTING

Polarisation microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical imaging system

High resolution light valve detector for detecting x-ray

Optical measurement device with universal metasurface and optical m...

Augmented reality microscope, image projection device and image pro...

White dwarf: cross-polarized white light slide-free imaging

Simultaneous focusing of an optical system to multiple focal planes...

One-to-many randomizing interference microscope

Polarimeter with multiple independent tunable channels and method f...

Filter switching device for an optical observation instrument with...

Optical scanning microscope and examination method

Surgical microscope having an illumination apparatus

3D microscope including insertable components to provide multiple i...

Snapshot polarization imaging with a micro-camera array microscope

Metasurface imager for quantitative phase gradient detection

Polarization and phase microscope

Sample detection device and sample detection method by using the same

3D microscope including insertable components to provide multiple i...

Modular, electro-optical device for increasing the imaging field of...

High numerical aperture telemicroscopy apparatus

Inspection device and inspection method

Structured illumination microscope, observation method, and storage...

3D microscope including insertable components to provide multiple i...

Infrared microscope

Structured illumination optical system and structured illumination...

Epi-illumination Fourier ptychographic imaging for thick samples

Digital holographic microscope

Light microscope and optical assembly to provide structured illumin...

Polarized image acquisition apparatus, pattern inspection apparatus...

3D localization microscopy and 4D localization microscopy and track...

Optical module and observation device

Patents Applicationslast 30 patents

High Resolution Light Valve Detector for Detecting X-Ray

DEVICE AND METHOD FOR OBSERVING A BIOLOGICAL PROBE

FOCUSING DEVICE, FOCUSING SYSTEM, MICROSCOPE AND METHOD FOR IMAGING...

POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...

POLARIZATION IMAGE ACQUISITION APPARATUS AND THERMAL ANALYZER

CONFOCAL SCANNING DARK FIELD MICROSCOPY IMAGING METHOD AND DEVICE

Apparatus, Optical system, and Method for digital holographic and p...

SIMULTANEOUS FOCUSING OF AN OPTICAL SYSTEM TO MULTIPLE FOCAL PLANES...

OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL M...

POLARIZED MICROSCOPE AND INTRA IMAGE FIELD CORRECTION ANALYSIS METHOD

SURGICAL MICROSCOPE HAVING AN ILLUMINATION APPARATUS

3D Microscope Including Insertable Components To Provide Multiple I...

ONE-TO-MANY RANDOMIZING INTERFERENCE MICROSCOPE

AN OPTICAL IMAGING SYSTEM

APPARATUS AND METHOD TO CONVERT A REGULAR BRIGHT-FIELD MICROSCOPE I...

AUGMENTED REALITY MICROSCOPE, IMAGE PROJECTION DEVICE AND IMAGE PRO...

High Resolution Light Valve Detector for Detecting X-Ray

Filter Switching Device for an Optical Observation Instrument with...

DEVICE AND METHOD FOR HIGH-THROUGHPUT POLARIZATION IMAGING OF ZEBRA...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

METASURFACE IMAGER FOR QUANTITATIVE PHASE GRADIENT DETECTION

OPTICAL SCANNING MICROSCOPE AND EXAMINATION METHOD

POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...

HIGH NUMERICAL APERTURE TELEMICROSCOPY APPARATUS

POLARIZATION AND PHASE MICROSCOPE

HIGH NUMERICAL APERTURE TELEMICROSCOPY APPARATUS

SYNCHRONOUS ORTHOGONAL LASER IMAGE RECONSTRUCTION SUPER-RESOLUTION...

INSPECTION DEVICE AND INSPECTION METHOD

OPTICAL SECTIONING APPARATUS USING ADVANCED MIRAU OPTICAL INTERFERE...