Polarised dual wavelength spectrometry

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G01J2003/4275

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/4275Polarised dual wavelength spectrometry

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for axially-offset differential interference cont...
- Patent number 11,692,877
- Issue date Jul 4, 2023
- Purdue Research Foundation
- Garth Jason Simpson
- G01 - MEASURING TESTING
Information Patent Grant
Crop growth measurement device
- Patent number 10,561,060
- Issue date Feb 18, 2020
- Topcon Corporation
- Taichi Yuasa
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Device for optically determining the concentration of alcohol and c...
- Patent number 10,132,787
- Issue date Nov 20, 2018
- Haffmans B.V.
- Geert Hubert Willem Levels
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for extended infrared spectroscopic ellipsometry
- Patent number 9,921,152
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
Double polarized light beam spectrophotometer of light source modul...
- Patent number 4,645,341
- Issue date Feb 24, 1987
- Hitachi, Ltd.
- Masataka Koga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems And Methods For Extended Infrared Spectroscopic Ellipsometry
- Publication number 20170205342
- Publication date Jul 20, 2017
- KLA-Tencor Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING