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Y10S977/872

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

Current Industry

Y10S977/872Positioner

Industries

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope for cleaning nanostructures
- Patent number 11,130,159
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Cleaning of nanostructures
- Patent number 10,543,515
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B08 - CLEANING
Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 8,209,766
- Issue date Jun 26, 2012
- Park Systems Corp.
- Sang-il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
End effector for nano manufacturing
- Patent number 8,079,278
- Issue date Dec 20, 2011
- Board of Trustees of Michigan State University
- Ning Xi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Self-sensing tweezer devices and associated methods for micro and n...
- Patent number 7,735,358
- Issue date Jun 15, 2010
- Insitutec, Inc.
- Marcin B. Bauza
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 7,644,447
- Issue date Jan 5, 2010
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope system
- Patent number 7,578,853
- Issue date Aug 25, 2009
- Honda Motor Co., Ltd.
- Tatsuya Hattori
- G01 - MEASURING TESTING
Information Patent Grant
Flexure assembly for a scanner
- Patent number 7,501,615
- Issue date Mar 10, 2009
- Veeco Instruments Inc.
- Jason P. Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
Alignment-tolerant lens structures for acoustic force actuation of...
- Patent number 7,467,542
- Issue date Dec 23, 2008
- Palo Alto Research Center Incorporated
- Scott A. Elrod
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,456,400
- Issue date Nov 25, 2008
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a force curve measurement on a sample
- Patent number 7,387,035
- Issue date Jun 17, 2008
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Fine-adjustment mechanism for scanning probe microscopy
- Patent number 7,288,762
- Issue date Oct 30, 2007
- SII NanoTechnology Inc.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Grant
MEMS differential actuated nano probe and method for fabrication
- Patent number 7,176,457
- Issue date Feb 13, 2007
- Industrial Technology Research Institute
- Shih-Yi Wen
- G01 - MEASURING TESTING
Information Patent Grant
Active cantilever for nanomachining and metrology
- Patent number 7,137,292
- Issue date Nov 21, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for the actuation of the cantilever of a probe...
- Patent number 7,107,825
- Issue date Sep 19, 2006
- Georgia Tech Research Corporation
- F. Levent Degertekin
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Force scanning probe microscope
- Patent number 7,044,007
- Issue date May 16, 2006
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Flexure assembly for a scanner
- Patent number 7,002,138
- Issue date Feb 21, 2006
- Veeco Instruments Inc.
- Jason P. Cleveland
- G01 - MEASURING TESTING
Information Patent Grant
MEMS differential actuated nano probe and method for fabrication
- Patent number 6,995,368
- Issue date Feb 7, 2006
- Industrial Technology Research Institute
- Shih-Yi Wen
- G01 - MEASURING TESTING
Information Patent Grant
Alignment-tolerant lens structures for acoustic force actuation of...
- Patent number 6,990,853
- Issue date Jan 31, 2006
- Palo Alto Research Center Incorporated
- Scott A. Elrod
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for isolating and measuring movement in a metr...
- Patent number 6,928,863
- Issue date Aug 16, 2005
- Veeco Instruments Inc.
- James R. Massie
- G01 - MEASURING TESTING
Information Patent Grant
Device for reducing the impact of distortions in a microscope
- Patent number 6,924,489
- Issue date Aug 2, 2005
- Nanofactory Instruments AB
- Håkan Olin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active cantilever for nanomachining and metrology
- Patent number 6,923,044
- Issue date Aug 2, 2005
- General Nanotechnology L.L.C.
- Victor B. Kley
- B24 - GRINDING POLISHING
Information Patent Grant
Microscopic positioning device and tool position/orientation compen...
- Patent number 6,920,696
- Issue date Jul 26, 2005
- Fanuc Ltd
- Kiyoshi Sawada
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Scanning probe microscope with probe formed by single conductive ma...
- Patent number 6,888,135
- Issue date May 3, 2005
- NEC Corporation
- Yuichi Naitou
- G01 - MEASURING TESTING
Information Patent Grant
Active cantilever for nanomachining and metrology
- Patent number 6,880,388
- Issue date Apr 19, 2005
- General Nanotechnology L.L.C.
- Victor B. Kley
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for the ultrasonic actuation of the cantilever...
- Patent number 6,779,387
- Issue date Aug 24, 2004
- Georgia Tech Research Corporation
- F. Levent Degertekin
- G01 - MEASURING TESTING
Information Patent Grant
Pendulum scanner for scanning probe microscope
- Patent number 6,748,795
- Issue date Jun 15, 2004
- Molecular Imaging Corporation
- Tianwei Jing
- G01 - MEASURING TESTING
Information Patent Grant
Microactuator
- Patent number 6,734,598
- Issue date May 11, 2004
- Narito Shibaike
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexure assembly for a scanner
- Patent number 6,720,551
- Issue date Apr 13, 2004
- Veeco Instruments Inc.
- Jason P. Cleveland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLEANING OF NANOSTRUCTURES
- Publication number 20200094295
- Publication date Mar 26, 2020
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Methods and apparatus for nanolapping
- Publication number 20140051333
- Publication date Feb 20, 2014
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERH...
- Publication number 20100170015
- Publication date Jul 1, 2010
- Sang-il PARK
- G01 - MEASURING TESTING
Information Patent Application
End Effector for Nano Manufacturing
- Publication number 20090217508
- Publication date Sep 3, 2009
- Board of Trustees of Michigan State University
- Ning Xi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Scanning probe microscope capable of measuring samples having overh...
- Publication number 20080078932
- Publication date Apr 3, 2008
- PSIA Co, LTD
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope System
- Publication number 20080017809
- Publication date Jan 24, 2008
- Honda Motor Co., Ltd.
- Tatsuya Hattori
- G01 - MEASURING TESTING
Information Patent Application
Self-sensing tweezer devices and associated methods for micro and n...
- Publication number 20070240516
- Publication date Oct 18, 2007
- INSITUTEC, INC.
- Marcin B. Bauza
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
FORCE SCANNING PROBE MICROSCOPE
- Publication number 20060283240
- Publication date Dec 21, 2006
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20060113472
- Publication date Jun 1, 2006
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Flexure assembly for a scanner
- Publication number 20060097142
- Publication date May 11, 2006
- Veeco Instruments Inc.
- Jason P. Cleveland
- G02 - OPTICS
Information Patent Application
Alignment-tolerant lens structures for acoustic force actuation of...
- Publication number 20060075807
- Publication date Apr 13, 2006
- Palo Alto Research Center Incorporated
- Scott A. Elrod
- G01 - MEASURING TESTING
Information Patent Application
MEMS differential actuated nano probe and method for fabrication
- Publication number 20060016986
- Publication date Jan 26, 2006
- INDUSTRIAL TECHNOLOGY RESEARCH INSTUTITE
- Shih-Yi Wen
- G01 - MEASURING TESTING
Information Patent Application
Fine-adjustment mechanism for scanning probe microscopy
- Publication number 20050231066
- Publication date Oct 20, 2005
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
MEMS differential actuated nano probe and method for fabrication
- Publication number 20050082474
- Publication date Apr 21, 2005
- Shih-Yi Wen
- G01 - MEASURING TESTING
Information Patent Application
Force scanning probe microscope
- Publication number 20050081610
- Publication date Apr 21, 2005
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Microscopic positioning device and tool position/orientation compen...
- Publication number 20040244208
- Publication date Dec 9, 2004
- FANUC LTD.
- Kiyoshi Sawada
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Flexure assembly for a scanner
- Publication number 20040201327
- Publication date Oct 14, 2004
- Veeco Instruments Inc.
- Jason P. Cleveland
- G02 - OPTICS
Information Patent Application
Device for reducing the impact of distortions in a microscope
- Publication number 20040195523
- Publication date Oct 7, 2004
- Hakan Olin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus and method for isolating and measuring movement in a metr...
- Publication number 20040134264
- Publication date Jul 15, 2004
- Veeco Instruments Inc.
- James R. Massie
- G01 - MEASURING TESTING
Information Patent Application
Alignment-tolerant lens structures for acoustic force actuation of...
- Publication number 20040118191
- Publication date Jun 24, 2004
- Palo Alto Research Center Incorporated
- Scott A. Elrod
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for the actuation of the cantilever of a probe...
- Publication number 20040020279
- Publication date Feb 5, 2004
- Georgia Tech Research Corporation
- F. Levent Degertekin
- G01 - MEASURING TESTING
Information Patent Application
Force scanning probe microscope
- Publication number 20030110844
- Publication date Jun 19, 2003
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20030089162
- Publication date May 15, 2003
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for the ultrasonic actuation of the cantilever...
- Publication number 20030041669
- Publication date Mar 6, 2003
- F. Levent Degertekin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for the ultrasonic actuation of the cantilever...
- Publication number 20030041657
- Publication date Mar 6, 2003
- F. Levent Degertekin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microactuator
- Publication number 20020190604
- Publication date Dec 19, 2002
- Matsushita Electric Industrial Co., Ltd.
- Narito Shibaike
- B82 - NANO-TECHNOLOGY
Information Patent Application
Flexure assembly for a scanner
- Publication number 20020153480
- Publication date Oct 24, 2002
- Jason P. Cleveland
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus and method for isolating and measuring movement in metrol...
- Publication number 20020124636
- Publication date Sep 12, 2002
- Veeco Instruments Inc.
- James R. Massie
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus and method for isolating and measuring movement in a metr...
- Publication number 20020125415
- Publication date Sep 12, 2002
- James R. Massie
- B82 - NANO-TECHNOLOGY

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning probe microscope for cleaning nanostructures

Cleaning of nanostructures

Scanning probe microscope capable of measuring samples having overh...

End effector for nano manufacturing

Self-sensing tweezer devices and associated methods for micro and n...

Scanning probe microscope capable of measuring samples having overh...

Scanning probe microscope system

Flexure assembly for a scanner

Alignment-tolerant lens structures for acoustic force actuation of...

Scanning probe microscope and scanning method

Method of making a force curve measurement on a sample

Fine-adjustment mechanism for scanning probe microscopy

MEMS differential actuated nano probe and method for fabrication

Active cantilever for nanomachining and metrology

Method and apparatus for the actuation of the cantilever of a probe...

Dual stage instrument for scanning a specimen

Force scanning probe microscope

Flexure assembly for a scanner

MEMS differential actuated nano probe and method for fabrication

Alignment-tolerant lens structures for acoustic force actuation of...

Apparatus and method for isolating and measuring movement in a metr...

Device for reducing the impact of distortions in a microscope

Active cantilever for nanomachining and metrology

Microscopic positioning device and tool position/orientation compen...

Scanning probe microscope with probe formed by single conductive ma...

Active cantilever for nanomachining and metrology

Method and apparatus for the ultrasonic actuation of the cantilever...

Pendulum scanner for scanning probe microscope

Microactuator

Flexure assembly for a scanner

Patents Applicationslast 30 patents

CLEANING OF NANOSTRUCTURES

Methods and apparatus for nanolapping

SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERH...

End Effector for Nano Manufacturing

Scanning probe microscope capable of measuring samples having overh...

Scanning Probe Microscope System

Self-sensing tweezer devices and associated methods for micro and n...

FORCE SCANNING PROBE MICROSCOPE

Scanning probe microscope and scanning method

Flexure assembly for a scanner

Alignment-tolerant lens structures for acoustic force actuation of...

MEMS differential actuated nano probe and method for fabrication

Fine-adjustment mechanism for scanning probe microscopy

MEMS differential actuated nano probe and method for fabrication

Force scanning probe microscope

Dual stage instrument for scanning a specimen

Microscopic positioning device and tool position/orientation compen...

Flexure assembly for a scanner

Device for reducing the impact of distortions in a microscope

Apparatus and method for isolating and measuring movement in a metr...

Alignment-tolerant lens structures for acoustic force actuation of...

Method and apparatus for the actuation of the cantilever of a probe...

Force scanning probe microscope

Dual stage instrument for scanning a specimen

Method and apparatus for the ultrasonic actuation of the cantilever...

Method and apparatus for the ultrasonic actuation of the cantilever...

Microactuator

Flexure assembly for a scanner

Apparatus and method for isolating and measuring movement in metrol...

Apparatus and method for isolating and measuring movement in a metr...