TREA

Positron sources

Follow

Industry

  • CPC
  • H01J2237/06391
This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/06391Positron sources
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Positron source and method
    • Patent number 12,219,689
    • Issue date Feb 4, 2025
    • Ian Clague
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Real-time S-parameter imager
    • Patent number 8,053,724
    • Issue date Nov 8, 2011
    • The University of Hong Kong
    • Pranab Sabitru Naik
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Real-time S-parameter imager
    • Patent number 7,781,732
    • Issue date Aug 24, 2010
    • The University of Hong Kong
    • Pranab Sabitru Naik
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Apparatus and method for long-term storage of antimatter
    • Patent number 7,709,819
    • Issue date May 4, 2010
    • Positronics Research LLC
    • Gerald A. Smith
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
  • Information Patent Grant

    Real-time S-parameter imager
    • Patent number 7,420,166
    • Issue date Sep 2, 2008
    • The University of Hong Kong
    • Pranab Sabitru Naik
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Positron source
    • Patent number 6,818,902
    • Issue date Nov 16, 2004
    • Commissariat a l'Energie Atomique
    • Patrice Perez
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Positron trap beam source for positron microbeam production
    • Patent number 6,630,666
    • Issue date Oct 7, 2003
    • Roderick G. Greaves
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
  • Information Patent Grant

    Positron source
    • Patent number 6,043,489
    • Issue date Mar 28, 2000
    • Leo Elektronenmikroskopie GmbH
    • Martin Tongbhoyai
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    REAL-TIME S-PARAMETER IMAGER
    • Publication number 20100322505
    • Publication date Dec 23, 2010
    • THE UNIVERSITY OF HONG KONG
    • Pranab Sabitru Naik
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    APPARATUS AND METHOD FOR LONG-TERM STORAGE OF ANTIMATTER
    • Publication number 20100012864
    • Publication date Jan 21, 2010
    • Positronics Research LLC
    • Gerald A. Smith
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
  • Information Patent Application

    Real-time S-parameter imager
    • Publication number 20070265789
    • Publication date Nov 15, 2007
    • THE UNIVERSITY OF HONG KONG
    • Pranab Sabitru Naik
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Real-time S-parameter imager
    • Publication number 20060011831
    • Publication date Jan 19, 2006
    • Pranab Sabitru Naik
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Positron source
    • Publication number 20040178353
    • Publication date Sep 16, 2004
    • COMMISSARIAT A L'ENERGIE ATOMIQUE
    • Patrice Perez
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Positron trap beam source for positron microbeam production
    • Publication number 20020030160
    • Publication date Mar 14, 2002
    • Roderick G. Greaves
    • G01 - MEASURING TESTING