Power spectrum

Follow

Industry

CPC
G01J2003/4418

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2003/4418Power spectrum

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for identifying a Raman spectrum from backgrou...
- Patent number 11,441,949
- Issue date Sep 13, 2022
- CytoVeris Inc.
- Gary Root
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Raman spectrum detection apparatus and method based on power of ref...
- Patent number 10,823,678
- Issue date Nov 3, 2020
- Nuctech Company Limited
- Haihui Liu
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measurement apparatus and spectrum measurement method
- Patent number 10,444,153
- Issue date Oct 15, 2019
- Samsung Electronics Co., Ltd.
- Sang Kyu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring concentration of substances
- Patent number 4,828,388
- Issue date May 9, 1989
- Olympus Optical Co., Ltd.
- Akihiro Namba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IDENTIFYING A RAMAN SPECTRUM FROM BACKGROU...
- Publication number 20210310868
- Publication date Oct 7, 2021
- CytoVeris Inc.
- Gary Root
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RAMAN SPECTRUM DETECTION APPARATUS AND METHOD BASED ON POWER OF REF...
- Publication number 20190195804
- Publication date Jun 27, 2019
- Nuctech Company Limited
- Haihui Liu
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT APPARATUS AND SPECTRUM MEASUREMENT METHOD
- Publication number 20190033217
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- Sang Kyu KIM
- G01 - MEASURING TESTING