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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2005/204prepared by semiconductor processing

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Patents Grantslast 30 patents

Information Patent Grant
Low thermal capacity micro-bolometer and associated manufacturing m...
- Patent number 11,988,560
- Issue date May 21, 2024
- LYNRED
- Nicolas Boudou
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor, infrared sensor array, and method of manufacturing...
- Patent number 11,906,363
- Issue date Feb 20, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kouhei Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Infrared image sensor
- Patent number 11,761,820
- Issue date Sep 19, 2023
- LYNRED
- Nicolas Boudou
- G01 - MEASURING TESTING
Information Patent Grant
Infrared detector, imaging device including the same, and manufactu...
- Patent number 11,193,832
- Issue date Dec 7, 2021
- Fujitsu Limited
- Ryo Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Infrared image sensor
- Patent number 11,060,919
- Issue date Jul 13, 2021
- LYNRED
- Nicolas Boudou
- G01 - MEASURING TESTING
Information Patent Grant
Infrared image sensor
- Patent number 11,015,978
- Issue date May 25, 2021
- ULIS
- Nicolas Boudou
- G01 - MEASURING TESTING
Information Patent Grant
Irradiating a machining field
- Patent number 11,007,576
- Issue date May 18, 2021
- Trumpf Laser- und Systemtechnik GmbH
- Frank Peter Wuest
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Wafer level processed microbolometer focal plane array
- Patent number 10,976,202
- Issue date Apr 13, 2021
- SEEK THERMAL, INC.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a thermoelectric-based infrared detector h...
- Patent number 10,937,824
- Issue date Mar 2, 2021
- MERIDIAN INNOVATION PTE LTD
- Piotr Kropelnicki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Patterned focal plane arrays of carbon nanotube thin film bolometer...
- Patent number 10,908,025
- Issue date Feb 2, 2021
- Carbon Solutions, Inc.
- Elena Borisova Bekyarova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi layered thermal sensor
- Patent number 10,811,556
- Issue date Oct 20, 2020
- TODOS TECHNOLOGIES LTD.
- Yael Nemirovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer level packaging of infrared camera detectors
- Patent number 10,161,803
- Issue date Dec 25, 2018
- FLIR Systems, Inc.
- Gregory A. Carlson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of manufacturing an infrared detector having a micro-cavity...
- Patent number 9,929,196
- Issue date Mar 27, 2018
- Ulis
- Michel Vilain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
340 GHz multipixel transceiver
- Patent number 9,791,321
- Issue date Oct 17, 2017
- California Institute of Technology
- Goutam Chattopadhyay
- G01 - MEASURING TESTING
Information Patent Grant
CMOS bolometer
- Patent number 9,698,281
- Issue date Jul 4, 2017
- Robert Bosch GmbH
- Gary Yama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microbolometer array with improved performance
- Patent number 9,417,134
- Issue date Aug 16, 2016
- Centre Nationale de la Recherche Scientifique-CNRS
- Charlie Koechlin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device having a membrane structure for detecting thermal radiation,...
- Patent number 9,279,730
- Issue date Mar 8, 2016
- Pyreos, Ltd.
- Carsten Giebeler
- G01 - MEASURING TESTING
Information Patent Grant
Conduction structure for infrared microbolometer sensors
- Patent number 7,633,065
- Issue date Dec 15, 2009
- Sensormatic Electronics, LLC
- Ming-Ren Lian
- G01 - MEASURING TESTING
Information Patent Grant
Two stage transformer coupling for ultra-sensitive silicon sensor p...
- Patent number 7,375,333
- Issue date May 20, 2008
- Northrop Grumman Corporation
- Nathan Bluzer
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor film bolometer thermal infrared detector
- Patent number 5,369,280
- Issue date Nov 29, 1994
- The Commonwealth of Australia
- Kevin C. Liddiard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITE MATERIAL, BOLOMETER, AND COMPOSITE MATERIAL FORMING METHOD
- Publication number 20240410759
- Publication date Dec 12, 2024
- NEC Corporation
- Akinobu SHIBUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING THE SURFACE TEMPERATURE OF AN OB...
- Publication number 20240295440
- Publication date Sep 5, 2024
- California Institute of Technology
- Axel SCHERER
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER DETECTORS WITH OPTICAL ABSORBER STRUCTURES FOR DETEC...
- Publication number 20240288310
- Publication date Aug 29, 2024
- Institut National D'Optique
- Hassane OULACHGAR
- G01 - MEASURING TESTING
Information Patent Application
THERMAL SENSOR, THERMAL SENSOR ARRAY, ELECTRONIC APPARATUS INCLUDIN...
- Publication number 20240089568
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Anton Nikolaevich SOFRONOV
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20220364931
- Publication date Nov 17, 2022
- NEC Corporation
- Mayumi KOSAKA
- C01 - INORGANIC CHEMISTRY
Information Patent Application
Low Thermal Capacity Micro-Bolometer and Associated Manufacturing M...
- Publication number 20220228917
- Publication date Jul 21, 2022
- LYNRED
- Nicolas Boudou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFRARED SENSOR, INFRARED SENSOR ARRAY, AND METHOD OF MANUFACTURING...
- Publication number 20210302237
- Publication date Sep 30, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- KOUHEI TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFRARED IMAGE SENSOR
- Publication number 20210270676
- Publication date Sep 2, 2021
- LYNRED
- Nicolas BOUDOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFRARED DETECTOR, IMAGING DEVICE INCLUDING THE SAME, AND MANUFACTU...
- Publication number 20200292391
- Publication date Sep 17, 2020
- Fujitsu Limited
- RYO SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFRARED IMAGE SENSOR
- Publication number 20200083277
- Publication date Mar 12, 2020
- ULIS
- Nicolas BOUDOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERNED FOCAL PLANE ARRAYS OF CARBON NANOTUBE THIN FILM BOLOMETER...
- Publication number 20180156668
- Publication date Jun 7, 2018
- Carbon Solutions, Inc.
- Elena Borisova Bekyarova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL PACKAGING OF INFRARED CAMERA DETECTORS
- Publication number 20170328779
- Publication date Nov 16, 2017
- FLIR SYSTEMS, INC.
- Gregory A. Carlson
- G01 - MEASURING TESTING
Information Patent Application
340 GHz MULTIPIXEL TRANSCEIVER
- Publication number 20150300884
- Publication date Oct 22, 2015
- California Institute of Technology
- Theodore Reck
- G01 - MEASURING TESTING
Information Patent Application
Sealed Infrared Imagers
- Publication number 20140239179
- Publication date Aug 28, 2014
- Vlad Joseph Novotny
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER ARRAY WITH IMPROVED PERFORMANCE
- Publication number 20140226021
- Publication date Aug 14, 2014
- Centre National De La Recherche Scientifique-cnrs
- Charlie Koechlin
- G01 - MEASURING TESTING
Information Patent Application
CMOS BOLOMETER
- Publication number 20140054740
- Publication date Feb 27, 2014
- ROBERT BOSCH GmbH
- Gary Yama
- G01 - MEASURING TESTING
Information Patent Application
DEVICE HAVING A MEMBRANE STRUCTURE FOR DETECTING THERMAL RADIATION,...
- Publication number 20110006211
- Publication date Jan 13, 2011
- Carsten Giebeler
- G01 - MEASURING TESTING
Information Patent Application
Conduction structure for infrared microbolometer sensors
- Publication number 20080093553
- Publication date Apr 24, 2008
- The Sensormatic Electronics Corporation
- Ming-Ren Lian
- G01 - MEASURING TESTING

prepared by semiconductor processing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Low thermal capacity micro-bolometer and associated manufacturing m...

Infrared sensor, infrared sensor array, and method of manufacturing...

Infrared image sensor

Infrared detector, imaging device including the same, and manufactu...

Infrared image sensor

Infrared image sensor

Irradiating a machining field

Wafer level processed microbolometer focal plane array

Method for manufacturing a thermoelectric-based infrared detector h...

Patterned focal plane arrays of carbon nanotube thin film bolometer...

Multi layered thermal sensor

Wafer level packaging of infrared camera detectors

Method of manufacturing an infrared detector having a micro-cavity...

340 GHz multipixel transceiver

CMOS bolometer

Microbolometer array with improved performance

Device having a membrane structure for detecting thermal radiation,...

Conduction structure for infrared microbolometer sensors

Two stage transformer coupling for ultra-sensitive silicon sensor p...

Semiconductor film bolometer thermal infrared detector

Patents Applicationslast 30 patents

COMPOSITE MATERIAL, BOLOMETER, AND COMPOSITE MATERIAL FORMING METHOD

SYSTEMS AND METHODS FOR MONITORING THE SURFACE TEMPERATURE OF AN OB...

MICROBOLOMETER DETECTORS WITH OPTICAL ABSORBER STRUCTURES FOR DETEC...

THERMAL SENSOR, THERMAL SENSOR ARRAY, ELECTRONIC APPARATUS INCLUDIN...

BOLOMETER AND METHOD FOR MANUFACTURING SAME

Low Thermal Capacity Micro-Bolometer and Associated Manufacturing M...

INFRARED SENSOR, INFRARED SENSOR ARRAY, AND METHOD OF MANUFACTURING...

INFRARED IMAGE SENSOR

INFRARED DETECTOR, IMAGING DEVICE INCLUDING THE SAME, AND MANUFACTU...

INFRARED IMAGE SENSOR

PATTERNED FOCAL PLANE ARRAYS OF CARBON NANOTUBE THIN FILM BOLOMETER...

WAFER LEVEL PACKAGING OF INFRARED CAMERA DETECTORS

340 GHz MULTIPIXEL TRANSCEIVER

Sealed Infrared Imagers

MICROBOLOMETER ARRAY WITH IMPROVED PERFORMANCE

CMOS BOLOMETER

DEVICE HAVING A MEMBRANE STRUCTURE FOR DETECTING THERMAL RADIATION,...

Conduction structure for infrared microbolometer sensors