Preparing specimens

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CPC
G01N23/2202

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/2202Preparing specimens

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Fabricating thin film liquid cells
- Patent number 12,209,979
- Issue date Jan 28, 2025
- Universiteit Leiden
- Pauline Marthe Gerardina Van Deursen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Method for simultaneous analysis of radiocarbon and tritium
- Patent number 12,013,499
- Issue date Jun 18, 2024
- Korea Atomic Energy Research Institute
- Hong Joo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to mimic a random structural pattern
- Patent number 11,981,789
- Issue date May 14, 2024
- UNM Rainforest Innovations
- Sang Eon Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nondestructive sensing device and method for inspection and measuri...
- Patent number 11,933,749
- Issue date Mar 19, 2024
- Texas Research International, Inc.
- Doyle T. Motes
- G01 - MEASURING TESTING
Information Patent Grant
Portable XRF data screening method for heavy metal contaminated soil
- Patent number 11,698,354
- Issue date Jul 11, 2023
- BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
- Lina Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 11,513,087
- Issue date Nov 29, 2022
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging in cross-section using un-cut lamella with background...
- Patent number 11,501,951
- Issue date Nov 15, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coordinative alignment of molecules in chiral metal-organic frameworks
- Patent number 11,370,805
- Issue date Jun 28, 2022
- The Regents of the University of California
- Seungkyu Lee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,366,074
- Issue date Jun 21, 2022
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitor for measuring mercury emissions
- Patent number 11,262,320
- Issue date Mar 1, 2022
- UHV Technologies, Inc.
- Nalin Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Opaline flux-calcined diatomite products
- Patent number 11,243,177
- Issue date Feb 8, 2022
- EP Minerals, LLC
- Peter E. Lenz
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method of preparing biological tissue sample and method of observin...
- Patent number 11,221,280
- Issue date Jan 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Akira Sawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
- Patent number 11,175,244
- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and system for X-ray fluorescence (XRF) analysis of explorat...
- Patent number 11,175,246
- Issue date Nov 16, 2021
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- Melvyn Lintern
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for backside planar view lamella preparation
- Patent number 11,069,509
- Issue date Jul 20, 2021
- FEI Company
- James Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric moisture harvester
- Patent number 11,059,838
- Issue date Jul 13, 2021
- The Regents of the University of California
- Omar M. Yaghi
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Dual-arm clamping type holder for transmission electron microscopy...
- Patent number 11,041,784
- Issue date Jun 22, 2021
- Institute of Microbiology, Chinese Academy of Sciences
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic holder for immunoelectron microscopy grids
- Patent number 11,041,820
- Issue date Jun 22, 2021
- Institute of Microbiology, Chinese Academy of Sciences
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Grant
Substrate contamination analysis system
- Patent number 11,022,572
- Issue date Jun 1, 2021
- Rigaku Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system, x-ray analysis device, and vapor phase decom...
- Patent number 10,989,678
- Issue date Apr 27, 2021
- Rigaku Corporation
- Hiroshi Kono
- G01 - MEASURING TESTING
Information Patent Grant
Sample collecting device, sample collecting method, and fluorescent...
- Patent number 10,989,677
- Issue date Apr 27, 2021
- Rigaku Corporation
- Seiitsu Kurita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for reading x-ray-fluorescence marking
- Patent number 10,969,351
- Issue date Apr 6, 2021
- Soreq Nuclear Research Center
- Yair Grof
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing particle accumulation on a filter membrane
- Patent number 10,914,695
- Issue date Feb 9, 2021
- JOMESA MESSYSTEME GMBH
- Johann Metzger
- G01 - MEASURING TESTING
Information Patent Grant
Methods of determining the mineralogy of calcined and flux-calcined...
- Patent number 10,908,102
- Issue date Feb 2, 2021
- EP MINERALS LLC
- Peter E. Lenz
- G01 - MEASURING TESTING
Information Patent Grant
Encoding information in chemical concentrations
- Patent number 10,837,924
- Issue date Nov 17, 2020
- Hewlett-Packard Development Company, L.P.
- Paul Howard Mazurkiewicz
- G01 - MEASURING TESTING
Information Patent Grant
Well plate
- Patent number 10,782,253
- Issue date Sep 22, 2020
- Icagen, LLC
- Eva R. Birnbaum
- G01 - MEASURING TESTING
Information Patent Grant
Coordinative alignment of molecules in chiral metal-organic frameworks
- Patent number 10,766,911
- Issue date Sep 8, 2020
- The Regents of the University of California
- Seungkyu Lee
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reading x-ray-fluorescence marking
- Patent number 10,539,521
- Issue date Jan 21, 2020
- Soreq Nuclear Research Center
- Yair Grof
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN
- Publication number 20240302304
- Publication date Sep 12, 2024
- Carl Zeiss SMT GMBH
- Moritz Becker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20240288389
- Publication date Aug 29, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- B08 - CLEANING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
- Publication number 20240151666
- Publication date May 9, 2024
- Shanghai Institute of Measurement and Testing Technology
- Lihua LEI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE W...
- Publication number 20230366840
- Publication date Nov 16, 2023
- Bruker AXS GmbH
- Dominique Porta
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING PROTEIN STRUCTURE USING CRYO-ELECTRON MICROS...
- Publication number 20230349847
- Publication date Nov 2, 2023
- SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY CHINESE ACADEMY OF SCIENCES
- Horst VOGEL
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE BLOCK AND SAMPLE BLOCK HOLDER
- Publication number 20230333031
- Publication date Oct 19, 2023
- ROCKTYPE LTD
- Henrik Nilsen OMMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR DETECTION OF HYDROGEN PERMEATION AND HYDROGEN PER...
- Publication number 20230333032
- Publication date Oct 19, 2023
- National Institute for Materials Science
- Akiko Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Multi-Physical Field Imaging Method and System Based on PET-CT and DAS
- Publication number 20230296797
- Publication date Sep 21, 2023
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Zizhuo Ma
- G01 - MEASURING TESTING
Information Patent Application
COATER FOR THE PREPARATION OF CARBON-BASED TAPE SUBSTRATES FOR USE...
- Publication number 20230286010
- Publication date Sep 14, 2023
- The University of Kansas
- Eduardo ROSA-MOLINAR
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Method and Apparatus of Preparing a Sample of One or More Molecule(...
- Publication number 20230280245
- Publication date Sep 7, 2023
- FEI Company
- Albert KONIJNENBERG
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE XRF DATA SCREENING METHOD FOR HEAVY METAL CONTAMINATED SOIL
- Publication number 20230204526
- Publication date Jun 29, 2023
- BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
- Lina ZHANG
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE STATISTICAL CHARACTERIZATION METHOD OF MICRON-LEVEL SE...
- Publication number 20230184703
- Publication date Jun 15, 2023
- Central Iron & Steel Research Institute
- Dandan Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SIMULTANEOUS ANALYSIS OF RADIOCARBON AND TRITIUM
- Publication number 20230103847
- Publication date Apr 6, 2023
- Korea Atomic Energy Research Institute
- Hong Joo AHN
- G01 - MEASURING TESTING
Information Patent Application
FABRICATING THIN FILM LIQUID CELLS
- Publication number 20230025535
- Publication date Jan 26, 2023
- Universiteit Leiden
- Pauline Marthe Gerardina VAN DEURSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODS OF CHARGED PARTICLE DETECTORS FOR BLAST FURNACE...
- Publication number 20220397539
- Publication date Dec 15, 2022
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Anthony Crego
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...
- Publication number 20220367146
- Publication date Nov 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20220317072
- Publication date Oct 6, 2022
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20220260508
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive Sensing Device and Method for Inspection and Measuri...
- Publication number 20220136986
- Publication date May 5, 2022
- Doyle T. Motes
- G01 - MEASURING TESTING
Information Patent Application
SCINTILLANT NANOPARTICLES FOR DETECTION OF RADIOISOTOPE ACTIVITY
- Publication number 20210341401
- Publication date Nov 4, 2021
- Arizona Board of Regents on behalf of The University of Arizona
- Craig A. Aspinwall
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Graphene Oxide Affinity Sample Grids for Cyro-EM
- Publication number 20210310910
- Publication date Oct 7, 2021
- The Regents of the University of California
- Feng Wang
- C01 - INORGANIC CHEMISTRY
Information Patent Application
DUAL-ARM CLAMPING TYPE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPY...
- Publication number 20210208090
- Publication date Jul 8, 2021
- INSTITUTE OF MICROBIOLOGY, CHINESE ACADEMY OF SCIENCES
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HOLDER FOR IMMUNOELECTRON MICROSCOPY GRIDS
- Publication number 20210208088
- Publication date Jul 8, 2021
- INSTITUTE OF MICROBIOLOGY, CHINESE ACADEMY OF SCIENCES
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20210116398
- Publication date Apr 22, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS SYSTEM, X-RAY ANALYSIS DEVICE, AND VAPOR PHASE DECOM...
- Publication number 20200408706
- Publication date Dec 31, 2020
- Rigaku Corporation
- Hiroshi KONO
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE CONTAMINATION ANALYSIS SYSTEM
- Publication number 20200386697
- Publication date Dec 10, 2020
- Rigaku Corporation
- Motoyuki YAMAGAMI
- G01 - MEASURING TESTING
Information Patent Application
ATMOSPHERIC MOISTURE HARVESTER
- Publication number 20200361965
- Publication date Nov 19, 2020
- The Regents of the University of California
- Omar M. Yaghi
- C07 - ORGANIC CHEMISTRY
Information Patent Application
Coordinative alignment of molecules in chiral metal-organic frameworks
- Publication number 20200354385
- Publication date Nov 12, 2020
- The Regents of the University of California
- Seungkyu Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING PARTICLE ACCUMULATION ON A FILTER MEMBRANE
- Publication number 20200256812
- Publication date Aug 13, 2020
- JOMESA Meßsysteme GmbH
- Johann METZGER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Preparing specimens

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fabricating thin film liquid cells

Systems and methods for voltage contrast defect detection

System to inspect, modify or analyze a region of interest of a samp...

Method for simultaneous analysis of radiocarbon and tritium

Method and system to mimic a random structural pattern

Nondestructive sensing device and method for inspection and measuri...

Portable XRF data screening method for heavy metal contaminated soil

Systems and methods for voltage contrast defect detection

X-ray imaging in cross-section using un-cut lamella with background...

Coordinative alignment of molecules in chiral metal-organic frameworks

Method for cross-section sample preparation

Monitor for measuring mercury emissions

Opaline flux-calcined diatomite products

Method of preparing biological tissue sample and method of observin...

Graphene-based electro-microfluidic devices and methods for protein...

Method and system for X-ray fluorescence (XRF) analysis of explorat...

Method and system for backside planar view lamella preparation

Atmospheric moisture harvester

Dual-arm clamping type holder for transmission electron microscopy...

Magnetic holder for immunoelectron microscopy grids

Substrate contamination analysis system

X-ray analysis system, x-ray analysis device, and vapor phase decom...

Sample collecting device, sample collecting method, and fluorescent...

System and method for reading x-ray-fluorescence marking

Method for analyzing particle accumulation on a filter membrane

Methods of determining the mineralogy of calcined and flux-calcined...

Encoding information in chemical concentrations

Well plate

Coordinative alignment of molecules in chiral metal-organic frameworks

System and method for reading x-ray-fluorescence marking

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...

SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE W...

METHOD FOR DETERMINING PROTEIN STRUCTURE USING CRYO-ELECTRON MICROS...

SAMPLE BLOCK AND SAMPLE BLOCK HOLDER

SAMPLE HOLDER FOR DETECTION OF HYDROGEN PERMEATION AND HYDROGEN PER...

Multi-Physical Field Imaging Method and System Based on PET-CT and DAS

COATER FOR THE PREPARATION OF CARBON-BASED TAPE SUBSTRATES FOR USE...

Method and Apparatus of Preparing a Sample of One or More Molecule(...

PORTABLE XRF DATA SCREENING METHOD FOR HEAVY METAL CONTAMINATED SOIL

QUANTITATIVE STATISTICAL CHARACTERIZATION METHOD OF MICRON-LEVEL SE...

METHOD FOR SIMULTANEOUS ANALYSIS OF RADIOCARBON AND TRITIUM

FABRICATING THIN FILM LIQUID CELLS

SYSTEM AND METHODS OF CHARGED PARTICLE DETECTORS FOR BLAST FURNACE...

X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

Nondestructive Sensing Device and Method for Inspection and Measuri...

SCINTILLANT NANOPARTICLES FOR DETECTION OF RADIOISOTOPE ACTIVITY

Graphene Oxide Affinity Sample Grids for Cyro-EM

DUAL-ARM CLAMPING TYPE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPY...

MAGNETIC HOLDER FOR IMMUNOELECTRON MICROSCOPY GRIDS

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

X-RAY ANALYSIS SYSTEM, X-RAY ANALYSIS DEVICE, AND VAPOR PHASE DECOM...

SUBSTRATE CONTAMINATION ANALYSIS SYSTEM

ATMOSPHERIC MOISTURE HARVESTER

Coordinative alignment of molecules in chiral metal-organic frameworks

METHOD FOR ANALYZING PARTICLE ACCUMULATION ON A FILTER MEMBRANE