Probe tip array

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CPC
Y10S977/874

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/874Probe tip array

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Patents Grantslast 30 patents

Information Patent Grant
Polymer pen lithography
- Patent number 10,474,029
- Issue date Nov 12, 2019
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Polymer pen lithography
- Patent number 10,222,694
- Issue date Mar 5, 2019
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 7,644,447
- Issue date Jan 5, 2010
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Rotatable multi-cantilever scanning probe microscopy head
- Patent number 7,597,717
- Issue date Oct 6, 2009
- The United States of America as represented by the Secretary of the Navy
- Ryan P. Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a caliper AFM
- Patent number 7,493,794
- Issue date Feb 24, 2009
- Xidex Corporation
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Grant
Software synchronization of multiple scanning probes
- Patent number 7,444,857
- Issue date Nov 4, 2008
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Grant
Shape memory alloy information storage device
- Patent number 7,443,003
- Issue date Oct 28, 2008
- GM Global Technology Operations, Inc.
- Jihui Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel, individually addressable probes for nanolithography
- Patent number 7,402,849
- Issue date Jul 22, 2008
- The Board of Trustees of the University of Illinois
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Storage device having first and second magnetic elements that inter...
- Patent number 7,362,549
- Issue date Apr 22, 2008
- Seagate Technology LLC
- Corbin L. Champion
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,312,619
- Issue date Dec 25, 2007
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Strongly textured atomic ridge nanowindows
- Patent number 7,259,099
- Issue date Aug 21, 2007
- StarMega Corporation
- Don L. Kendall
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,098,678
- Issue date Aug 29, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Strongly textured atomic ridge and dot MOSFETs, sensors and filters
- Patent number 7,019,324
- Issue date Mar 28, 2006
- StarMega Corporation
- Don Kendall
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Diode-type nanotweezers and nanomanipulator device using the same
- Patent number 6,981,727
- Issue date Jan 3, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Caliper method, system, and apparatus
- Patent number 6,955,078
- Issue date Oct 18, 2005
- Xidex Corporation
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Grant
Software synchronization of multiple scanning probes
- Patent number 6,951,130
- Issue date Oct 4, 2005
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,943,574
- Issue date Sep 13, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 6,912,892
- Issue date Jul 5, 2005
- Hewlett-Packard Development Company, L.P.
- Darin D. Lindig
- G01 - MEASURING TESTING
Information Patent Grant
Use of scanning probe microscope for defect detection and repair
- Patent number 6,884,999
- Issue date Apr 26, 2005
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- G01 - MEASURING TESTING
Information Patent Grant
Software synchronization of multiple scanning probes
- Patent number 6,880,389
- Issue date Apr 19, 2005
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Grant
Parallel, individually addressable probes for nanolithography
- Patent number 6,867,443
- Issue date Mar 15, 2005
- The Board of Trustees of the University of Illinois
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for evaluating electrical characteristics
- Patent number 6,833,719
- Issue date Dec 21, 2004
- Japan Science and Technology Corporation
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,798,226
- Issue date Sep 28, 2004
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephen Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
- Patent number 6,774,654
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Microprobe and scanning probe apparatus having microprobe
- Patent number 6,667,467
- Issue date Dec 23, 2003
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Parallel, individually addressable probes for nanolithography
- Patent number 6,642,129
- Issue date Nov 4, 2003
- The Board of Trustees of the University of Illinois
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,593,571
- Issue date Jul 15, 2003
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for scanning microscope
- Patent number 6,590,703
- Issue date Jul 8, 2003
- ThermoMicroscopes Corporation
- Sang-Il Park
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,583,411
- Issue date Jun 24, 2003
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning probe microscope capable of measuring samples having overh...
- Publication number 20080078932
- Publication date Apr 3, 2008
- PSIA Co, LTD
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Application
Caliper method, system, and apparatus
- Publication number 20080078229
- Publication date Apr 3, 2008
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Application
Information storage device
- Publication number 20070081444
- Publication date Apr 12, 2007
- Jihui Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20060255818
- Publication date Nov 16, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Parallel, individually addressable probes for nanolithography
- Publication number 20060082379
- Publication date Apr 20, 2006
- The Board Trustees of the University of Illinois
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Application
Caliper method, system, and apparatus
- Publication number 20060037379
- Publication date Feb 23, 2006
- Vladimar Mancevski
- G01 - MEASURING TESTING
Information Patent Application
Software synchronization of multiple scanning probes
- Publication number 20060032296
- Publication date Feb 16, 2006
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Application
Strongly textured atomic ridge nanowindows
- Publication number 20060006376
- Publication date Jan 12, 2006
- Starmega Cororation
- Don Kendall
- C30 - CRYSTAL GROWTH
Information Patent Application
Storage device having first and second magnetic elements that inter...
- Publication number 20050259366
- Publication date Nov 24, 2005
- Corbin L. Champion
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050184746
- Publication date Aug 25, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Software synchronization of multiple scanning probes
- Publication number 20050097944
- Publication date May 12, 2005
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050040836
- Publication date Feb 24, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Parallel, individually addressable probes for nanolithography
- Publication number 20040119490
- Publication date Jun 24, 2004
- The Board of trustees of the University of Illinois
- Chang Liu
- G01 - MEASURING TESTING
Information Patent Application
Software synchronization of multiple scanning probes
- Publication number 20040025578
- Publication date Feb 12, 2004
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Application
Diode-type nanotweezers and nanomanipulator device using the same
- Publication number 20040004364
- Publication date Jan 8, 2004
- DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Atomic force microscope
- Publication number 20030200798
- Publication date Oct 30, 2003
- Darin D. Lindig
- G01 - MEASURING TESTING
Information Patent Application
Strongly textured atomic ridge and dot MOSFETs, sensors and filters
- Publication number 20030127692
- Publication date Jul 10, 2003
- Don L. Kendall
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
- Publication number 20030102880
- Publication date Jun 5, 2003
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20030089162
- Publication date May 15, 2003
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Parallel, individually addressable probes for nanolithography
- Publication number 20030022470
- Publication date Jan 30, 2003
- The Board of trustees of the University of Illinois
- Chang Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20030020500
- Publication date Jan 30, 2003
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Caliper method, system, and apparatus
- Publication number 20020189330
- Publication date Dec 19, 2002
- Vladimir Mancevski
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus for evaluating electrical characteristics
- Publication number 20020178800
- Publication date Dec 5, 2002
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
Molecular memory systems and methods
- Publication number 20020172072
- Publication date Nov 21, 2002
- Yong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe tip configuration and a method of fabrication thereof
- Publication number 20020040884
- Publication date Apr 11, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microprobe and scanning type probe apparatus using thereof
- Publication number 20020020805
- Publication date Feb 21, 2002
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical system for scanning microscope
- Publication number 20010054691
- Publication date Dec 27, 2001
- Sang-Il Park
- B82 - NANO-TECHNOLOGY
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20010047682
- Publication date Dec 6, 2001
- Amin Samsavar
- B82 - NANO-TECHNOLOGY

Probe tip array

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Polymer pen lithography

Polymer pen lithography

Scanning probe microscope capable of measuring samples having overh...

Rotatable multi-cantilever scanning probe microscopy head

Method of calibrating a caliper AFM

Software synchronization of multiple scanning probes

Shape memory alloy information storage device

Parallel, individually addressable probes for nanolithography

Storage device having first and second magnetic elements that inter...

Multiple local probe measuring device and method

Strongly textured atomic ridge nanowindows

Dual stage instrument for scanning a specimen

Multiple local probe measuring device and method

Strongly textured atomic ridge and dot MOSFETs, sensors and filters

Diode-type nanotweezers and nanomanipulator device using the same

Caliper method, system, and apparatus

Software synchronization of multiple scanning probes

Multiple local probe measuring device and method

Atomic force microscope

Use of scanning probe microscope for defect detection and repair

Software synchronization of multiple scanning probes

Parallel, individually addressable probes for nanolithography

Apparatus for evaluating electrical characteristics

Multiple local probe measuring device and method

Semiconductor-device inspecting apparatus and a method for manufact...

Microprobe and scanning probe apparatus having microprobe

Parallel, individually addressable probes for nanolithography

Scanning probe microscope

Optical system for scanning microscope

Multiple local probe measuring device and method

Patents Applicationslast 30 patents

Scanning probe microscope capable of measuring samples having overh...

Caliper method, system, and apparatus

Information storage device

Multiple local probe measuring device and method

Parallel, individually addressable probes for nanolithography

Caliper method, system, and apparatus

Software synchronization of multiple scanning probes

Strongly textured atomic ridge nanowindows

Storage device having first and second magnetic elements that inter...

Multiple local probe measuring device and method

Software synchronization of multiple scanning probes

Multiple local probe measuring device and method

Dual stage instrument for scanning a specimen

Parallel, individually addressable probes for nanolithography

Software synchronization of multiple scanning probes

Diode-type nanotweezers and nanomanipulator device using the same

Atomic force microscope

Strongly textured atomic ridge and dot MOSFETs, sensors and filters

SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...

Dual stage instrument for scanning a specimen

Parallel, individually addressable probes for nanolithography

Multiple local probe measuring device and method

Caliper method, system, and apparatus

Apparatus for evaluating electrical characteristics

Molecular memory systems and methods

Probe tip configuration and a method of fabrication thereof

Microprobe and scanning type probe apparatus using thereof

Optical system for scanning microscope

Dual stage instrument for scanning a specimen