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Y10S977/874
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GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10
USPC classification
Y10S
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S977/00
Nanotechnology
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Y10S977/874
Probe tip array
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Patents Grants
last 30 patents
Information
Patent Grant
Polymer pen lithography
Patent number
10,474,029
Issue date
Nov 12, 2019
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Polymer pen lithography
Patent number
10,222,694
Issue date
Mar 5, 2019
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope capable of measuring samples having overh...
Patent number
7,644,447
Issue date
Jan 5, 2010
Park Systems Corp.
Sang-il Park
G01 - MEASURING TESTING
Information
Patent Grant
Rotatable multi-cantilever scanning probe microscopy head
Patent number
7,597,717
Issue date
Oct 6, 2009
The United States of America as represented by the Secretary of the Navy
Ryan P. Lu
G01 - MEASURING TESTING
Information
Patent Grant
Method of calibrating a caliper AFM
Patent number
7,493,794
Issue date
Feb 24, 2009
Xidex Corporation
Vladimir Mancevski
G01 - MEASURING TESTING
Information
Patent Grant
Software synchronization of multiple scanning probes
Patent number
7,444,857
Issue date
Nov 4, 2008
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Grant
Shape memory alloy information storage device
Patent number
7,443,003
Issue date
Oct 28, 2008
GM Global Technology Operations, Inc.
Jihui Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Parallel, individually addressable probes for nanolithography
Patent number
7,402,849
Issue date
Jul 22, 2008
The Board of Trustees of the University of Illinois
Chang Liu
G01 - MEASURING TESTING
Information
Patent Grant
Storage device having first and second magnetic elements that inter...
Patent number
7,362,549
Issue date
Apr 22, 2008
Seagate Technology LLC
Corbin L. Champion
G11 - INFORMATION STORAGE
Information
Patent Grant
Multiple local probe measuring device and method
Patent number
7,312,619
Issue date
Dec 25, 2007
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maxmilian Altmann
G01 - MEASURING TESTING
Information
Patent Grant
Strongly textured atomic ridge nanowindows
Patent number
7,259,099
Issue date
Aug 21, 2007
StarMega Corporation
Don L. Kendall
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Dual stage instrument for scanning a specimen
Patent number
7,100,430
Issue date
Sep 5, 2006
KLA-Tencor Corporation
Amin Samsavar
G01 - MEASURING TESTING
Information
Patent Grant
Multiple local probe measuring device and method
Patent number
7,098,678
Issue date
Aug 29, 2006
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maxmilian Altmann
G01 - MEASURING TESTING
Information
Patent Grant
Strongly textured atomic ridge and dot MOSFETs, sensors and filters
Patent number
7,019,324
Issue date
Mar 28, 2006
StarMega Corporation
Don Kendall
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Diode-type nanotweezers and nanomanipulator device using the same
Patent number
6,981,727
Issue date
Jan 3, 2006
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Caliper method, system, and apparatus
Patent number
6,955,078
Issue date
Oct 18, 2005
Xidex Corporation
Vladimir Mancevski
G01 - MEASURING TESTING
Information
Patent Grant
Software synchronization of multiple scanning probes
Patent number
6,951,130
Issue date
Oct 4, 2005
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Grant
Multiple local probe measuring device and method
Patent number
6,943,574
Issue date
Sep 13, 2005
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maximilian Altmann
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscope
Patent number
6,912,892
Issue date
Jul 5, 2005
Hewlett-Packard Development Company, L.P.
Darin D. Lindig
G01 - MEASURING TESTING
Information
Patent Grant
Use of scanning probe microscope for defect detection and repair
Patent number
6,884,999
Issue date
Apr 26, 2005
Advanced Micro Devices, Inc.
Sanjay K. Yedur
G01 - MEASURING TESTING
Information
Patent Grant
Software synchronization of multiple scanning probes
Patent number
6,880,389
Issue date
Apr 19, 2005
Multiprobe, Inc.
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Grant
Parallel, individually addressable probes for nanolithography
Patent number
6,867,443
Issue date
Mar 15, 2005
The Board of Trustees of the University of Illinois
Chang Liu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for evaluating electrical characteristics
Patent number
6,833,719
Issue date
Dec 21, 2004
Japan Science and Technology Corporation
Tsuyoshi Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Multiple local probe measuring device and method
Patent number
6,798,226
Issue date
Sep 28, 2004
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephen Maximilian Altmann
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor-device inspecting apparatus and a method for manufact...
Patent number
6,774,654
Issue date
Aug 10, 2004
Renesas Technology Corp.
Masatoshi Kanamaru
G01 - MEASURING TESTING
Information
Patent Grant
Microprobe and scanning probe apparatus having microprobe
Patent number
6,667,467
Issue date
Dec 23, 2003
Seiko Instruments Inc.
Nobuhiro Shimizu
G01 - MEASURING TESTING
Information
Patent Grant
Parallel, individually addressable probes for nanolithography
Patent number
6,642,129
Issue date
Nov 4, 2003
The Board of Trustees of the University of Illinois
Chang Liu
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope
Patent number
6,593,571
Issue date
Jul 15, 2003
Seiko Instruments Inc.
Masatoshi Yasutake
G01 - MEASURING TESTING
Information
Patent Grant
Optical system for scanning microscope
Patent number
6,590,703
Issue date
Jul 8, 2003
ThermoMicroscopes Corporation
Sang-Il Park
G01 - MEASURING TESTING
Information
Patent Grant
Multiple local probe measuring device and method
Patent number
6,583,411
Issue date
Jun 24, 2003
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maximilian Altmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Scanning probe microscope capable of measuring samples having overh...
Publication number
20080078932
Publication date
Apr 3, 2008
PSIA Co, LTD
Sang-il Park
G01 - MEASURING TESTING
Information
Patent Application
Caliper method, system, and apparatus
Publication number
20080078229
Publication date
Apr 3, 2008
Vladimir Mancevski
G01 - MEASURING TESTING
Information
Patent Application
Information storage device
Publication number
20070081444
Publication date
Apr 12, 2007
Jihui Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multiple local probe measuring device and method
Publication number
20060255818
Publication date
Nov 16, 2006
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maxmilian Altmann
G01 - MEASURING TESTING
Information
Patent Application
Parallel, individually addressable probes for nanolithography
Publication number
20060082379
Publication date
Apr 20, 2006
The Board Trustees of the University of Illinois
Chang Liu
G01 - MEASURING TESTING
Information
Patent Application
Caliper method, system, and apparatus
Publication number
20060037379
Publication date
Feb 23, 2006
Vladimar Mancevski
G01 - MEASURING TESTING
Information
Patent Application
Software synchronization of multiple scanning probes
Publication number
20060032296
Publication date
Feb 16, 2006
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Application
Strongly textured atomic ridge nanowindows
Publication number
20060006376
Publication date
Jan 12, 2006
Starmega Cororation
Don Kendall
C30 - CRYSTAL GROWTH
Information
Patent Application
Storage device having first and second magnetic elements that inter...
Publication number
20050259366
Publication date
Nov 24, 2005
Corbin L. Champion
G01 - MEASURING TESTING
Information
Patent Application
Multiple local probe measuring device and method
Publication number
20050184746
Publication date
Aug 25, 2005
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maxmilian Altmann
G01 - MEASURING TESTING
Information
Patent Application
Software synchronization of multiple scanning probes
Publication number
20050097944
Publication date
May 12, 2005
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Application
Multiple local probe measuring device and method
Publication number
20050040836
Publication date
Feb 24, 2005
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maximilian Altmann
G01 - MEASURING TESTING
Information
Patent Application
Dual stage instrument for scanning a specimen
Publication number
20050005688
Publication date
Jan 13, 2005
Amin Samsavar
G01 - MEASURING TESTING
Information
Patent Application
Parallel, individually addressable probes for nanolithography
Publication number
20040119490
Publication date
Jun 24, 2004
The Board of trustees of the University of Illinois
Chang Liu
G01 - MEASURING TESTING
Information
Patent Application
Software synchronization of multiple scanning probes
Publication number
20040025578
Publication date
Feb 12, 2004
Casey Patrick Hare
G01 - MEASURING TESTING
Information
Patent Application
Diode-type nanotweezers and nanomanipulator device using the same
Publication number
20040004364
Publication date
Jan 8, 2004
DAIKEN CHEMICAL CO., LTD.
Yoshikazu Nakayama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Atomic force microscope
Publication number
20030200798
Publication date
Oct 30, 2003
Darin D. Lindig
G01 - MEASURING TESTING
Information
Patent Application
Strongly textured atomic ridge and dot MOSFETs, sensors and filters
Publication number
20030127692
Publication date
Jul 10, 2003
Don L. Kendall
C30 - CRYSTAL GROWTH
Information
Patent Application
SEMICONDUCTOR-DEVICE INSPECTING APPARATUS AND A METHOD FOR MANUFACT...
Publication number
20030102880
Publication date
Jun 5, 2003
Masatoshi Kanamaru
G01 - MEASURING TESTING
Information
Patent Application
Dual stage instrument for scanning a specimen
Publication number
20030089162
Publication date
May 15, 2003
Amin Samsavar
G01 - MEASURING TESTING
Information
Patent Application
Parallel, individually addressable probes for nanolithography
Publication number
20030022470
Publication date
Jan 30, 2003
The Board of trustees of the University of Illinois
Chang Liu
B82 - NANO-TECHNOLOGY
Information
Patent Application
Multiple local probe measuring device and method
Publication number
20030020500
Publication date
Jan 30, 2003
Europaisches Laboratorium fur Molekularbiologie (EMBL)
Stephan Maximilian Altmann
B82 - NANO-TECHNOLOGY
Information
Patent Application
Caliper method, system, and apparatus
Publication number
20020189330
Publication date
Dec 19, 2002
Vladimir Mancevski
B82 - NANO-TECHNOLOGY
Information
Patent Application
Apparatus for evaluating electrical characteristics
Publication number
20020178800
Publication date
Dec 5, 2002
Tsuyoshi Hasegawa
B82 - NANO-TECHNOLOGY
Information
Patent Application
Molecular memory systems and methods
Publication number
20020172072
Publication date
Nov 21, 2002
Yong Chen
B82 - NANO-TECHNOLOGY
Information
Patent Application
Probe tip configuration and a method of fabrication thereof
Publication number
20020040884
Publication date
Apr 11, 2002
Thomas Hantschel
B82 - NANO-TECHNOLOGY
Information
Patent Application
Microprobe and scanning type probe apparatus using thereof
Publication number
20020020805
Publication date
Feb 21, 2002
Nobuhiro Shimizu
B82 - NANO-TECHNOLOGY
Information
Patent Application
Optical system for scanning microscope
Publication number
20010054691
Publication date
Dec 27, 2001
Sang-Il Park
B82 - NANO-TECHNOLOGY
Information
Patent Application
Dual stage instrument for scanning a specimen
Publication number
20010047682
Publication date
Dec 6, 2001
Amin Samsavar
B82 - NANO-TECHNOLOGY