Probes, their manufacture, or their related instrumentation

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G01Q60/22

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/22Probes, their manufacture, or their related instrumentation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Polaritonic fiber probe and method for nanoscale mapping
- Patent number 12,007,409
- Issue date Jun 11, 2024
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 12,000,861
- Issue date Jun 4, 2024
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
Method for referencing a near-field measurement with drift and fluc...
- Patent number 11,899,041
- Issue date Feb 13, 2024
- ATTOCUBE SYSTEMS AG
- Ivan Malovichko
- G01 - MEASURING TESTING
Information Patent Grant
Polaritonic fiber probe and method for nanoscale measurements
- Patent number 11,841,274
- Issue date Dec 12, 2023
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Quantum dot microscope apparatus comprising a nanoscale semiconduct...
- Patent number 11,693,024
- Issue date Jul 4, 2023
- Board of Trustees of Michigan State University
- Stuart Holden Tessmer
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-dot-based measuring system and method
- Patent number 11,644,479
- Issue date May 9, 2023
- SHANGHAI UNIVERSITY
- Na Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe for detecting near field and near-field detecting system incl...
- Patent number 11,579,168
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Ikseon Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Probe for detecting near field and near-field detection system incl...
- Patent number 11,579,167
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Jongmin Yoon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for performing terahertz near-field measurements
- Patent number 11,561,170
- Issue date Jan 24, 2023
- TECHNISCHE UNIVERSITEIT EINDHOVEN
- Niels Jacobus Johan Van Hoof
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 11,415,597
- Issue date Aug 16, 2022
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Metal coated spike array
- Patent number 11,320,608
- Issue date May 3, 2022
- Waymo LLC
- John Simpson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for analyzing spatial resolution of microwave nea...
- Patent number 11,307,219
- Issue date Apr 19, 2022
- Xidian University
- Xiaolong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Evanescent wave based optical profiler array
- Patent number 11,307,144
- Issue date Apr 19, 2022
- Waymo LLC
- John Simpson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Photodetector for scanning probe microscope
- Patent number 11,169,176
- Issue date Nov 9, 2021
- JERUSALEM COLLEGE OF TECHNOLOGY (JCT), LEV ACADEMIC CENTER
- Zeev Zalevsky
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and optical axis adjustment method in sca...
- Patent number 11,162,974
- Issue date Nov 2, 2021
- Shimadzu Corporation
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for detecting the intensity distribution of components of...
- Patent number 11,162,976
- Issue date Nov 2, 2021
- Norik Janunts
- G01 - MEASURING TESTING
Information Patent Grant
Polaritonic fiber probe and method for nanoscale temperature mapping
- Patent number 11,150,141
- Issue date Oct 19, 2021
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Device integrated with scanning probe for optical nanofocusing and...
- Patent number 11,054,440
- Issue date Jul 6, 2021
- The Regents of the University of California
- Ming Liu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for providing illumination for total-internal-ref...
- Patent number 11,047,799
- Issue date Jun 29, 2021
- Centre National de la Recherche Scientifique
- Alejandro Giacomotti
- G01 - MEASURING TESTING
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,877,065
- Issue date Dec 29, 2020
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Plasmonic ultrasensitive multiplex analysis platform for hyperspect...
- Patent number 10,866,263
- Issue date Dec 15, 2020
- The Regents of the University of California
- Arthur Okhtay Montazeri
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Apparatus and methods for non-destructive inspection using microwav...
- Patent number 10,823,757
- Issue date Nov 3, 2020
- BOMBARDIER INC.
- Leandro Rufail
- G01 - MEASURING TESTING
Information Patent Grant
Cell for electrochemical measurement
- Patent number 10,718,731
- Issue date Jul 21, 2020
- Toyota Jidosha Kabushiki Kaisha
- Shinya Nagashima
- G01 - MEASURING TESTING
Information Patent Grant
Metallic device for scanning probe microscopy and method for manufa...
- Patent number 10,605,827
- Issue date Mar 31, 2020
- UNIVERSIDADE FEDERAL DE MENAS GERAIS-UFMG
- Thiago De Lourenço E Vasconcelos
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for a scanning probe microscope, scanning probe mi...
- Patent number 10,539,591
- Issue date Jan 21, 2020
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scanning near-field optical micro...
- Patent number 10,473,693
- Issue date Nov 12, 2019
- Bruker Nano, Inc.
- Honghua Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...
- Publication number 20230280369
- Publication date Sep 7, 2023
- attocube systems AG
- Ivan MALOVICHKO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
- Publication number 20230204503
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20220390485
- Publication date Dec 8, 2022
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF
- Publication number 20220349916
- Publication date Nov 3, 2022
- OptiPro Systems, LLC
- James Fredric Munro
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
- Publication number 20220260611
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...
- Publication number 20220155340
- Publication date May 19, 2022
- Samsung Electronics Co., Ltd.
- Ikseon Jeon
- G01 - MEASURING TESTING
Information Patent Application
Quantum Dot Microscope Apparatus
- Publication number 20220120784
- Publication date Apr 21, 2022
- Board of Trustees of Michigan State University
- Stuart Holden TESSMER
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTION SYSTEM INCL...
- Publication number 20220082584
- Publication date Mar 17, 2022
- Samsung Electronics Co., Ltd.
- Jongmin YOON
- G01 - MEASURING TESTING
Information Patent Application
Polaritonic Fiber Probe and Method for Nanoscale Mapping
- Publication number 20220011172
- Publication date Jan 13, 2022
- Baylor University
- Zhenrong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM-DOT-BASED MEASURING SYSTEM AND METHOD
- Publication number 20210382086
- Publication date Dec 9, 2021
- SHANGHAI UNIVERSITY
- Na CHEN
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Analyzing Spatial Resolution of Microwave Nea...
- Publication number 20210333305
- Publication date Oct 28, 2021
- Xidian University
- Xiaolong Chen
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...
- Publication number 20210302465
- Publication date Sep 30, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278435
- Publication date Sep 9, 2021
- Bar-llan University
- Zeev ZALEVSKY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING TERAHERTZ NEAR-FIELD MEASUREMENTS
- Publication number 20210270733
- Publication date Sep 2, 2021
- Technische Universiteit Eindhoven
- Niels Jacobus Johan VAN HOOF
- G01 - MEASURING TESTING
Information Patent Application
Assembly for Detecting the Intensity Distribution of Components of...
- Publication number 20210263070
- Publication date Aug 26, 2021
- Norik JANUNTS
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Scanning Probe Sample Property Measurement...
- Publication number 20210080484
- Publication date Mar 18, 2021
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20210041477
- Publication date Feb 11, 2021
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
Polaritonic Fiber Probe and Method for Nanoscale Temperature Mapping
- Publication number 20200386626
- Publication date Dec 10, 2020
- Baylor University
- Zhenrong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND...
- Publication number 20200309815
- Publication date Oct 1, 2020
- The Regents of the University of California
- Ming LIU
- G01 - MEASURING TESTING
Information Patent Application
Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...
- Publication number 20190346480
- Publication date Nov 14, 2019
- Hitachi, Ltd
- Kaifeng ZHANG
- C01 - INORGANIC CHEMISTRY
Information Patent Application
Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...
- Publication number 20190170789
- Publication date Jun 6, 2019
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR NON-DESTRUCTIVE INSPECTION USING MICROWAV...
- Publication number 20190004085
- Publication date Jan 3, 2019
- Bombardier Inc.
- Leandro RUFAIL
- G01 - MEASURING TESTING
Information Patent Application
METALLIC DEVICE FOR SCANNING PROBE MICROSCOPY AND METHOD FOR MANUFA...
- Publication number 20180372777
- Publication date Dec 27, 2018
- Universidade Federal De Minas Gerais-UFMG
- Thiago DE LOURENÇO E VASCONCELOS
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DETECTION SENSOR AND TERAHERTZ IMAGE MEASUREMENT DEVICE
- Publication number 20180364094
- Publication date Dec 20, 2018
- TOKYO INSTITUTE OF TECHNOLOGY
- Yukio KAWANO
- G01 - MEASURING TESTING
Information Patent Application
FIELD-MAPPING AND FOCAL-SPOT TRACKING FOR S-SNOM
- Publication number 20180364276
- Publication date Dec 20, 2018
- BRUKER NANO, INC.
- Sergey Osechinskiy
- G01 - MEASURING TESTING
Information Patent Application
FIBER-COUPLED METAL-TIP NEAR-FIELD CHEMICAL IMAGING SPECTROSCOPY
- Publication number 20180238806
- Publication date Aug 23, 2018
- Baylor University
- Zhenrong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR INVESTIGATING A SAMPLE SURFACE
- Publication number 20180149673
- Publication date May 31, 2018
- Nanyang Technological University
- Fengwei HUO
- G01 - MEASURING TESTING
Information Patent Application
METALLIC DEVICE FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPEC...
- Publication number 20180120345
- Publication date May 3, 2018
- Universidade Federal De Minas Gerais-UFMG
- Thiago DE LOURENÇO E VASCONCELOS
- G01 - MEASURING TESTING
Information Patent Application
SCANNING RESONATOR MICROSCOPY
- Publication number 20180095107
- Publication date Apr 5, 2018
- Robert Conley Dunn
- G01 - MEASURING TESTING

Probes, their manufacture, or their related instrumentation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection apparatus and method of inspecting wafer

Polaritonic fiber probe and method for nanoscale mapping

System and method for a non-tapping mode scattering-type scanning n...

Methods and systems for scanning probe sample property measurement...

Method for referencing a near-field measurement with drift and fluc...

Polaritonic fiber probe and method for nanoscale measurements

Cantilever, scanning probe microscope, and measurement method using...

Quantum dot microscope apparatus comprising a nanoscale semiconduct...

Quantum-dot-based measuring system and method

Probe for detecting near field and near-field detecting system incl...

Probe for detecting near field and near-field detection system incl...

Method and system for performing terahertz near-field measurements

System and method for a non-tapping mode scattering-type scanning n...

Metal coated spike array

Method and system for analyzing spatial resolution of microwave nea...

Evanescent wave based optical profiler array

Photodetector for scanning probe microscope

Scanning probe microscope and optical axis adjustment method in sca...

Assembly for detecting the intensity distribution of components of...

Polaritonic fiber probe and method for nanoscale temperature mapping

Device integrated with scanning probe for optical nanofocusing and...

Device and method for providing illumination for total-internal-ref...

Near field scanning probe microscope, probe for scanning probe micr...

Plasmonic ultrasensitive multiplex analysis platform for hyperspect...

Apparatus and methods for non-destructive inspection using microwav...

Cell for electrochemical measurement

Metallic device for scanning probe microscopy and method for manufa...

Measuring device for a scanning probe microscope, scanning probe mi...

Compact probe for atomic-force microscopy and atomic-force microsco...

Method and apparatus for infrared scanning near-field optical micro...

Patents Applicationslast 30 patents

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER

System and Method for a Non-Tapping Mode Scattering-Type Scanning N...

NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF

CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...

PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...

Quantum Dot Microscope Apparatus

PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTION SYSTEM INCL...

Polaritonic Fiber Probe and Method for Nanoscale Mapping

QUANTUM-DOT-BASED MEASURING SYSTEM AND METHOD

Method and System for Analyzing Spatial Resolution of Microwave Nea...

SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...

PHOTODETECTOR FOR SCANNING PROBE MICROSCOPE

METHOD AND SYSTEM FOR PERFORMING TERAHERTZ NEAR-FIELD MEASUREMENTS

Assembly for Detecting the Intensity Distribution of Components of...

Methods And Systems For Scanning Probe Sample Property Measurement...

System and Method for a Non-Tapping Mode Scattering-Type Scanning N...

Polaritonic Fiber Probe and Method for Nanoscale Temperature Mapping

DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND...

Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...

Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...

APPARATUS AND METHODS FOR NON-DESTRUCTIVE INSPECTION USING MICROWAV...

METALLIC DEVICE FOR SCANNING PROBE MICROSCOPY AND METHOD FOR MANUFA...

TERAHERTZ DETECTION SENSOR AND TERAHERTZ IMAGE MEASUREMENT DEVICE

FIELD-MAPPING AND FOCAL-SPOT TRACKING FOR S-SNOM

FIBER-COUPLED METAL-TIP NEAR-FIELD CHEMICAL IMAGING SPECTROSCOPY

APPARATUS AND METHODS FOR INVESTIGATING A SAMPLE SURFACE

METALLIC DEVICE FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPEC...

SCANNING RESONATOR MICROSCOPY