Probes, their manufacture, or their related instrumentation

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G01Q60/48

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/48Probes, their manufacture, or their related instrumentation

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Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,808,783
- Issue date Nov 7, 2023
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy apparatus, methods, and applications
- Patent number 11,175,306
- Issue date Nov 16, 2021
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 9,506,947
- Issue date Nov 29, 2016
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 8,895,923
- Issue date Nov 25, 2014
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining dopant density in semiconducto...
- Patent number 8,315,819
- Issue date Nov 20, 2012
- Agilent Technologies, Inc.
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for scanning capacitance microscopy and spectr...
- Patent number 7,856,665
- Issue date Dec 21, 2010
- Asylum Research Corporation
- Maarten Rutgers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Signal coupling system for scanning microwave microscope
- Patent number 7,793,356
- Issue date Sep 7, 2010
- Agilent Technologies, Inc.
- Hassan Tanbakuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring electrical properties in torsion...
- Patent number 7,757,544
- Issue date Jul 20, 2010
- Veeco Instruments Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Telegraph signal microscopy device and method
- Patent number 7,427,754
- Issue date Sep 23, 2008
- The Regents of the University of California
- Kang L. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal microwave imaging probe
- Patent number 7,190,175
- Issue date Mar 13, 2007
- Stanford University
- Michael Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring electrical properties in torsion...
- Patent number 7,155,964
- Issue date Jan 2, 2007
- Veeco Instruments Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Electrical scanning probe microscope apparatus
- Patent number 6,975,129
- Issue date Dec 13, 2005
- National Applied Research Labratories
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with probe formed by single conductive ma...
- Patent number 6,888,135
- Issue date May 3, 2005
- NEC Corporation
- Yuichi Naitou
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring electrical capacitance
- Patent number 6,828,804
- Issue date Dec 7, 2004
- Sharp Kabushiki Kaisha
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Grant
Non-resonant microwave imaging probe
- Patent number 6,825,645
- Issue date Nov 30, 2004
- Stanford University Office of Technology Licensing
- Michael A. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe with cantilever and scanning micro-wave microscope in...
- Patent number 6,715,345
- Issue date Apr 6, 2004
- NEC Corporation
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microwave microscope capable of realizing high resolution...
- Patent number 6,614,227
- Issue date Sep 2, 2003
- NEC Corporation
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe test head and process using same
- Patent number 6,426,499
- Issue date Jul 30, 2002
- Deutsche Telekom AG
- Hans Wilfried Peter Koops
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method for obtaining topographic imag...
- Patent number 5,742,172
- Issue date Apr 21, 1998
- Seiko Instruments Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning capacitance microscope
- Patent number 4,481,616
- Issue date Nov 6, 1984
- RCA Corporation
- James R. Matey
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20220043024
- Publication date Feb 10, 2022
- Cornell University
- John Marohn
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20200204112
- Publication date Jun 25, 2020
- Cornell University
- John Marohn
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20140143912
- Publication date May 22, 2014
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
Signal Coupling System For Scanning Microwave Microscope
- Publication number 20100058846
- Publication date Mar 11, 2010
- Hassan Tanbakuchi
- G01 - MEASURING TESTING
Information Patent Application
Microwave resonator and microwave microscope including the same
- Publication number 20100045306
- Publication date Feb 25, 2010
- Norio Ookubo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for scanning capacitance microscopy and spectr...
- Publication number 20090084952
- Publication date Apr 2, 2009
- Maarten Rutgers
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES IN TORSION...
- Publication number 20070163335
- Publication date Jul 19, 2007
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Scanning capacitance microscope, method of driving the same, and re...
- Publication number 20070012093
- Publication date Jan 18, 2007
- PSIA Co, LTD
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
TELEGRAPH SIGNAL MICROSCOPY DEVICE AND METHOD
- Publication number 20060231754
- Publication date Oct 19, 2006
- Kang L. Wang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor probe, method of manufacturing the same, and method a...
- Publication number 20060076487
- Publication date Apr 13, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Ju-hwan Jung
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring electrical properties in torsion...
- Publication number 20050212529
- Publication date Sep 29, 2005
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Electrical scanning probe microscope apparatus
- Publication number 20050030054
- Publication date Feb 10, 2005
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Application
Cantilever having improved resolution and manufacturing method therof
- Publication number 20040150413
- Publication date Aug 5, 2004
- Renesas Technology Corp.
- Hitoshi Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring electrical capacitance
- Publication number 20040108864
- Publication date Jun 10, 2004
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Application
Non-resonant microwave imaging probe
- Publication number 20030071605
- Publication date Apr 17, 2003
- Michael A. Kelly
- G01 - MEASURING TESTING
Information Patent Application
Coaxial probe and scanning micro-wave microscope including the same
- Publication number 20030034453
- Publication date Feb 20, 2003
- NEC Corporation
- Norio Ookubo
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning microwave microscope capable of realizing high resolution...
- Publication number 20020067170
- Publication date Jun 6, 2002
- NEC Corporation
- Norio Ookubo
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope with probe formed by single conductive ma...
- Publication number 20020043101
- Publication date Apr 18, 2002
- NEC Corporation
- Yuichi Naitou
- B82 - NANO-TECHNOLOGY

Probes, their manufacture, or their related instrumentation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Atomic force microscopy apparatus, methods, and applications

Atomic force microscopy apparatus, methods, and applications

System and method for non-contact microscopy for three-dimensional...

System and method for non-contact microscopy for three-dimensional...

Method and apparatus for determining dopant density in semiconducto...

Apparatus and method for scanning capacitance microscopy and spectr...

Signal coupling system for scanning microwave microscope

Method and apparatus for measuring electrical properties in torsion...

Telegraph signal microscopy device and method

Orthogonal microwave imaging probe

Method and apparatus for measuring electrical properties in torsion...

Electrical scanning probe microscope apparatus

Scanning probe microscope with probe formed by single conductive ma...

Method of measuring electrical capacitance

Non-resonant microwave imaging probe

Coaxial probe with cantilever and scanning micro-wave microscope in...

Scanning microwave microscope capable of realizing high resolution...

Multi-probe test head and process using same

Scanning probe microscope and method for obtaining topographic imag...

Scanning capacitance microscope

Patents Applicationslast 30 patents

ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS

ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...

Signal Coupling System For Scanning Microwave Microscope

Microwave resonator and microwave microscope including the same

Apparatus and method for scanning capacitance microscopy and spectr...

METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES IN TORSION...

Scanning capacitance microscope, method of driving the same, and re...

TELEGRAPH SIGNAL MICROSCOPY DEVICE AND METHOD

Semiconductor probe, method of manufacturing the same, and method a...

Method and apparatus for measuring electrical properties in torsion...

Electrical scanning probe microscope apparatus

Cantilever having improved resolution and manufacturing method therof

Method of measuring electrical capacitance

Non-resonant microwave imaging probe

Coaxial probe and scanning micro-wave microscope including the same

Scanning microwave microscope capable of realizing high resolution...

Scanning probe microscope with probe formed by single conductive ma...