Probes with magnetic coating

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G01Q60/56

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/56Probes with magnetic coating

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Cantilever for a scanning type probe microscope
- Patent number 10,203,354
- Issue date Feb 12, 2019
- National University Corporation Nagoya Institute of Technology
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe sensor with a ferromagnetic fluid
- Patent number 9,568,496
- Issue date Feb 14, 2017
- International Business Machines Corporation
- Bernd W. Gotsmann
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field value measuring device and method for measuring magn...
- Patent number 9,482,692
- Issue date Nov 1, 2016
- Akita University
- Hitoshi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic force microscope and magnetic field observation method usi...
- Patent number 8,912,789
- Issue date Dec 16, 2014
- Hitachi, Ltd.
- Seiji Heike
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting thermal assist type magnetic head
- Patent number 8,787,132
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Naoya Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic field sensor device for direct magnetic field imaging and...
- Patent number 8,723,514
- Issue date May 13, 2014
- Yeda Research and Development Company Ltd.
- Amit Finkler
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods for referencing related magnetic head microscopy scans to r...
- Patent number 8,490,211
- Issue date Jul 16, 2013
- Western Digital Technologies, Inc.
- Sean P. Leary
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic device inspection apparatus and magnetic device inspection...
- Patent number 8,359,661
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probes for enhanced magnetic force microscopy resolution
- Patent number 8,214,918
- Issue date Jul 3, 2012
- The Regents of the University of California
- Nissim Amos
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of forming pointed structures
- Patent number 7,935,297
- Issue date May 3, 2011
- United States of America as represented by the Administrator of the National...
- Diane E. Pugel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe system comprising an electric-field-aligned probe tip and met...
- Patent number 7,735,147
- Issue date Jun 8, 2010
- The Regents of the University of California
- Sungho Jin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for analyzing distribution of coercive force in v...
- Patent number 7,560,921
- Issue date Jul 14, 2009
- Japan Science and Technology Agency
- Shunji Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning magnetic force microscope, method for producin...
- Patent number 7,495,215
- Issue date Feb 24, 2009
- National Institute of Advanced Industrial Science and Technology
- Hiroyuki Akinaga
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning microscope
- Patent number 7,398,678
- Issue date Jul 15, 2008
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Near-field magneto-optical microscope
- Patent number 6,972,562
- Issue date Dec 6, 2005
- The United States of America as represented by the United States Department o...
- Vitalii K. Vlasko-Vlasov
- G01 - MEASURING TESTING
Information Patent Grant
Technology for fabrication of a micromagnet on a tip of a MFM/MRFM...
- Patent number 6,676,813
- Issue date Jan 13, 2004
- The Regents of the University of California
- Denis V. Pelekhov
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic tips having stable magnetic moments and disposed on can...
- Patent number 6,448,765
- Issue date Sep 10, 2002
- Read-Rite Corporation
- Hong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of imaging a magnetic field emanating from a surface using a...
- Patent number 6,448,766
- Issue date Sep 10, 2002
- International Business Machines Corporation
- Ruediger Berger
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever magnetic force sensor for magnetic force microscopy and...
- Patent number 6,373,246
- Issue date Apr 16, 2002
- Seiko Instruments Inc.
- Eisuke Tomita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for use in magnetic-field detection and generation devices
- Patent number 6,211,673
- Issue date Apr 3, 2001
- International Business Machines Corporation
- Christoph Gerber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic force microscopy probe with bar magnet tip
- Patent number 6,121,771
- Issue date Sep 19, 2000
- International Business Machines Corporation
- Andreas Moser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever magnetic force sensor for magnetic force microscopy havi...
- Patent number 6,081,113
- Issue date Jun 27, 2000
- Seiko Instruments Inc.
- Eisuke Tomita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus to image metallic patches embedded in a non-me...
- Patent number 6,064,201
- Issue date May 16, 2000
- Chartered Semiconductor Manufacturing Ltd.
- Cher Liang Randall Cha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic force microscopy probe with integrated coil
- Patent number 5,900,729
- Issue date May 4, 1999
- International Business Machines Corporation
- Andreas Moser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Alternating current magnetic force microscopy system with probe hav...
- Patent number 5,900,728
- Issue date May 4, 1999
- International Business Machines Corporation
- Andreas Moser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring a magnetic field using a magneti...
- Patent number 5,623,205
- Issue date Apr 22, 1997
- Seiko Instruments Inc.
- Eisuke Tomita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of measuring magnetic fields on magnetically recorded media...
- Patent number 5,264,794
- Issue date Nov 23, 1993
- The United States of America as represented by the Director, National Securit...
- Edward R. Burke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever unit and atomic force microscope, magnetic force microsc...
- Patent number 5,260,567
- Issue date Nov 9, 1993
- Canon Kabushiki Kaisha
- Ryo Kuroda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spin-polarized scanning tunneling microscope
- Patent number 4,985,627
- Issue date Jan 15, 1991
- International Business Machines Corporation
- Santos F. A. Gutierrez
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092716
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Naoya SAITO
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140096293
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
MODIFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY DEPOSITION OF NANOP...
- Publication number 20130111637
- Publication date May 2, 2013
- CONSEJO SUPERIOR DE INVESTICACIONES CIENTÍFICAS (CSIC)
- Elisa Leonor Roman Garcia
- B82 - NANO-TECHNOLOGY
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC FORCE MICROSCOPE AND MAGNETIC FIELD OBSERVATION METHOD USI...
- Publication number 20120319679
- Publication date Dec 20, 2012
- Hitachi, Ltd
- Seiji HEIKE
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND MET...
- Publication number 20100229265
- Publication date Sep 9, 2010
- Sungho Jin
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR DEVICE FOR DIRECT MAGNETIC FIELD IMAGING AND...
- Publication number 20100207622
- Publication date Aug 19, 2010
- Yeda Research and Development Company Ltd.
- Amit Finkler
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...
- Publication number 20100205699
- Publication date Aug 12, 2010
- Takehiro TACHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBES FOR ENHANCED MAGNETIC FORCE MICROSCOPY RESOLUTION
- Publication number 20100138964
- Publication date Jun 3, 2010
- The Regents of the University of California
- Nissim Amos
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Analyzing Distribution of Coercive Force in V...
- Publication number 20080284422
- Publication date Nov 20, 2008
- Japan Science and Technology Agency
- Shunji Ishio
- G01 - MEASURING TESTING
Information Patent Application
Probe System Comprising an Electric-Field-Aligned Probe Tip and Met...
- Publication number 20080272299
- Publication date Nov 6, 2008
- Sungho Jin
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...
- Publication number 20080166560
- Publication date Jul 10, 2008
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Hiroyuki Akinaga
- G01 - MEASURING TESTING
Information Patent Application
Method of forming pointed structures
- Publication number 20060197052
- Publication date Sep 7, 2006
- Diane E. Pugel
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Probe for an atomic force microscope and method for making such a p...
- Publication number 20050211915
- Publication date Sep 29, 2005
- Stichting voor de Technische Wetenschappen
- Arnout Gerbrand Van den Bos
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for tunable magnetic force interaction in a ma...
- Publication number 20050088173
- Publication date Apr 28, 2005
- David W. Abraham
- G01 - MEASURING TESTING
Information Patent Application
Magnetic force microscopy having a magnetic probe coated with excha...
- Publication number 20030102863
- Publication date Jun 5, 2003
- Data Storage Institute
- Yihong Wu
- G01 - MEASURING TESTING

Probes with magnetic coating

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cantilever for a scanning type probe microscope

Scanning probe sensor with a ferromagnetic fluid

Magnetic field value measuring device and method for measuring magn...

Magnetic force microscope and magnetic field observation method usi...

Method and apparatus for inspecting thermal assist type magnetic head

Magnetic field sensor device for direct magnetic field imaging and...

Cantilever of scanning probe microscope and method for manufacturin...

Methods for referencing related magnetic head microscopy scans to r...

Magnetic device inspection apparatus and magnetic device inspection...

Probes for enhanced magnetic force microscopy resolution

Method of forming pointed structures

Probe system comprising an electric-field-aligned probe tip and met...

Method and device for analyzing distribution of coercive force in v...

Probe for a scanning magnetic force microscope, method for producin...

Probe for a scanning microscope

Near-field magneto-optical microscope

Technology for fabrication of a micromagnet on a tip of a MFM/MRFM...

Microscopic tips having stable magnetic moments and disposed on can...

Method of imaging a magnetic field emanating from a surface using a...

Cantilever magnetic force sensor for magnetic force microscopy and...

Apparatus for use in magnetic-field detection and generation devices

Magnetic force microscopy probe with bar magnet tip

Cantilever magnetic force sensor for magnetic force microscopy havi...

Method and apparatus to image metallic patches embedded in a non-me...

Magnetic force microscopy probe with integrated coil

Alternating current magnetic force microscopy system with probe hav...

Method and apparatus for measuring a magnetic field using a magneti...

Method of measuring magnetic fields on magnetically recorded media...

Cantilever unit and atomic force microscope, magnetic force microsc...

Spin-polarized scanning tunneling microscope

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

MODIFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY DEPOSITION OF NANOP...

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

MAGNETIC FORCE MICROSCOPE AND MAGNETIC FIELD OBSERVATION METHOD USI...

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND MET...

MAGNETIC FIELD SENSOR DEVICE FOR DIRECT MAGNETIC FIELD IMAGING AND...

MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...

PROBES FOR ENHANCED MAGNETIC FORCE MICROSCOPY RESOLUTION

Method and Device for Analyzing Distribution of Coercive Force in V...

Probe System Comprising an Electric-Field-Aligned Probe Tip and Met...

PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...

Method of forming pointed structures

Probe for a scanning microscope

Probe for an atomic force microscope and method for making such a p...

Method and apparatus for tunable magnetic force interaction in a ma...

Magnetic force microscopy having a magnetic probe coated with excha...