prohibiting charge accumulation on sample substrate

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G01N2223/351

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/351prohibiting charge accumulation on sample substrate

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Patents Grantslast 30 patents

Information Patent Grant
Electron spectroscopy analyzer and a method of correcting a shift o...
- Patent number 5,352,894
- Issue date Oct 4, 1994
- Sharp Kabushiki Kaisha
- Fumitoshi Yasuo
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed field sample neutralization
- Patent number 4,968,888
- Issue date Nov 6, 1990
- The United States of America as represented by the United States Department o...
- Anthony D. Appelhans
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents