provided with temperature control or heating devices

Industry

CPC
G01N23/20033

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20033provided with temperature control or heating devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
Anti-frosting and anti-dew device for spectroscopic measurements
- Patent number 11,921,062
- Issue date Mar 5, 2024
- UNIVERSITE DE ROUEN NORMANDIE
- Gérard Coquerel
- G01 - MEASURING TESTING
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Soaking machine and soaking method of sample for single-crystal X-r...
- Patent number 11,774,379
- Issue date Oct 3, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Device, system and method for X-ray diffraction analysis of an elec...
- Patent number 11,181,492
- Issue date Nov 23, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
MEMS frame heating platform for electron imagable fluid reservoirs...
- Patent number 11,170,968
- Issue date Nov 9, 2021
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G01 - MEASURING TESTING
Information Patent Grant
Device for clamping and controlling the temperature of planar sampl...
- Patent number 10,948,433
- Issue date Mar 16, 2021
- Helmholtz-Zentrum Geesthacht Zentrum Für Material—und Küstenforschung GmbH
- Armin Kriele
- G01 - MEASURING TESTING
Information Patent Grant
Modular specimen holders for high pressure freezing and X-ray cryst...
- Patent number 10,809,211
- Issue date Oct 20, 2020
- Leica Mikrosysteme GmbH
- Rainer Wogritsch
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder
- Patent number 10,768,124
- Issue date Sep 8, 2020
- Mel-Build Corporation
- Hiroya Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell for X-ray analysis and X-ray analysis apparatus
- Patent number 10,753,889
- Issue date Aug 25, 2020
- Inter-University Research Institute Corporation High Energy Accelerator Resea...
- Ken'ichi Kimijima
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device
- Patent number 10,712,328
- Issue date Jul 14, 2020
- TOSHIBA MEMORY CORPORATION
- Yuji Yamada
- G01 - MEASURING TESTING
Information Patent Grant
In-situ coin cell support device for transmission mode X-ray diffra...
- Patent number 10,644,284
- Issue date May 5, 2020
- Korea Institute of Science and Technology
- Kyung Yoon Chung
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for X-ray analysis
- Patent number 10,359,376
- Issue date Jul 23, 2019
- Malvern Panalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting and real time processing x-ray pulses from mic...
- Patent number 10,345,249
- Issue date Jul 9, 2019
- The United States of America, as represented by the Secretary of Commerce
- Terrence J. Jach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryogenic cooling positioning apparatus, methods and applications
- Patent number 10,241,015
- Issue date Mar 26, 2019
- MITEGEN, LLC
- Stephen Hollabaugh
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Furnace for transmission mode X-ray diffractometer and transmission...
- Patent number 10,113,980
- Issue date Oct 30, 2018
- Korea Institute of Science and Technology
- Kyung Yoon Chung
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Heated wafer carrier profiling
- Patent number 9,653,340
- Issue date May 16, 2017
- Veeco Instruments Inc.
- Vadim Boguslavskiy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Temperature control chamber for compact X-ray machine
- Patent number 9,459,219
- Issue date Oct 4, 2016
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring scattering of X-rays, its applications and impl...
- Patent number 9,255,898
- Issue date Feb 9, 2016
- Universite de Rouen
- Gerard Coquerel
- G01 - MEASURING TESTING
Information Patent Grant
Heating apparatus for X-ray inspection
- Patent number 9,161,392
- Issue date Oct 13, 2015
- Yoshinobu Anbe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cryogenic specimen holder
- Patent number 9,010,202
- Issue date Apr 21, 2015
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Grant
Sample presentation device for radiation-based analytical equipment
- Patent number 8,597,598
- Issue date Dec 3, 2013
- University of Cape Town
- Michael Christian Maximilian Claeys
- G01 - MEASURING TESTING
Information Patent Grant
Microcalorimetry for X-ray spectroscopy
- Patent number 8,357,894
- Issue date Jan 22, 2013
- FEI Company
- Milos Toth
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic specimen holder
- Patent number 8,336,405
- Issue date Dec 25, 2012
- E. A. Fischione Instruments, Inc.
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Grant
Open flow helium cryostat system and related method of using
- Patent number 6,003,321
- Issue date Dec 21, 1999
- The University of Toledo
- A. Alan Pinkerton
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Apparatus for rapid in-situ X-ray stress measurement during thermal...
- Patent number 5,848,122
- Issue date Dec 8, 1998
- Advanced Technology Materials, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of X-ray topography at cryogenic temperature
- Patent number 3,992,624
- Issue date Nov 16, 1976
- The United States of America as represented by the Secretary of the Army
- Robert E. Flannery
- G01 - MEASURING TESTING
Information Patent Grant
Variable temperature flat plate powder diffraction camera
- Patent number 3,969,623
- Issue date Jul 13, 1976
- The University of Mississippi
- Theodore J. Klingen
- G01 - MEASURING TESTING
Information Patent Grant
3860815
- Patent number 3,860,815
- Issue date Jan 14, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3839635
- Patent number 3,839,635
- Issue date Oct 1, 1974
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PR...
- Publication number 20230314349
- Publication date Oct 5, 2023
- SHANGHAI JIAOTONG UNIVERSITY
- Jiao ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20220146441
- Publication date May 12, 2022
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SOAKING MACHINE AND SOAKING METHOD OF SAMPLE FOR SINGLE-CRYSTAL X-R...
- Publication number 20220011248
- Publication date Jan 13, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements
- Publication number 20210223191
- Publication date Jul 22, 2021
- UNIVERSITÉ DE ROUEN NORMANDIE
- Gérard Coquerel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...
- Publication number 20210109043
- Publication date Apr 15, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Device For Clamping And Controlling The Temperature Of Planar Sampl...
- Publication number 20200150061
- Publication date May 14, 2020
- Helmholtz-Zentrum Geesthacht Zentrum fur Material-und Kustenforschung GmbH
- Armin Kriele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN HOLDER
- Publication number 20190310209
- Publication date Oct 10, 2019
- Mel-Build Corporation
- Hiroya Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
MODULAR SPECIMEN HOLDERS FOR HIGH PRESSURE FREEZING AND X-RAY CRYST...
- Publication number 20190195814
- Publication date Jun 27, 2019
- Leica Mikrosysteme GmbH
- Rainer WOGRITSCH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETECTING AND REAL TIME PROCESSING X-RAY PULSES FROM MIC...
- Publication number 20190187075
- Publication date Jun 20, 2019
- Terrence J. Jach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CELL FOR X-RAY ANALYSIS AND X-RAY ANALYSIS APPARATUS
- Publication number 20190145915
- Publication date May 16, 2019
- Inter-University Research Institute Corporation High Energy Accelerator Resea...
- Ken'ichi Kimijima
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU COIN CELL SUPPORT DEVICE FOR TRANSMISSION MODE X-RAY DIFFRA...
- Publication number 20190074498
- Publication date Mar 7, 2019
- Korea Institute of Science and Technology
- Kyung Yoon CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS DEVICE
- Publication number 20180088100
- Publication date Mar 29, 2018
- Toshiba Memory Corporation
- Yuji YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder for X-ray Analysis
- Publication number 20180024081
- Publication date Jan 25, 2018
- PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Temperature Control Chamber for Compact X-Ray Machine
- Publication number 20150071409
- Publication date Mar 12, 2015
- ANTON PAAR GMBH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING SCATTERING OF X-RAYS, ITS APPLICATIONS AND IMPL...
- Publication number 20140185768
- Publication date Jul 3, 2014
- UNIVERSITE DE ROUEN
- Gerard Coquerel
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT
- Publication number 20130052100
- Publication date Feb 28, 2013
- University of Cape Town
- Michael Christian Maximilian Claeys
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT
- Publication number 20130017125
- Publication date Jan 17, 2013
- University of Cape Town
- Michael Christian Maximilian Claeys
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SPECIMEN HOLDER
- Publication number 20130014528
- Publication date Jan 17, 2013
- E.A. FISCHIONE, INC.
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SPECIMEN HOLDER
- Publication number 20120024086
- Publication date Feb 2, 2012
- Halina Stabacinskiene
- G01 - MEASURING TESTING
Information Patent Application
HEATING APPARATUS FOR X-RAY INSPECTION
- Publication number 20110147364
- Publication date Jun 23, 2011
- Yoshinobu ANBE
- G01 - MEASURING TESTING
Information Patent Application
HEATING APPARATUS FOR X-RAY INSPECTION
- Publication number 20110096902
- Publication date Apr 28, 2011
- Yoshinobu ANBE
- G01 - MEASURING TESTING
Information Patent Application
MICROCALORIMETRY FOR X-RAY SPECTROSCOPY
- Publication number 20110064191
- Publication date Mar 17, 2011
- FEI Company
- Milos Toth
- G01 - MEASURING TESTING

provided with temperature control or heating devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Serial synchrotron crystallography sample holding system

Anti-frosting and anti-dew device for spectroscopic measurements

Structure for pressurization analysis, X-ray diffraction apparatus...

Soaking machine and soaking method of sample for single-crystal X-r...

Device, system and method for X-ray diffraction analysis of an elec...

MEMS frame heating platform for electron imagable fluid reservoirs...

Device for clamping and controlling the temperature of planar sampl...

Modular specimen holders for high pressure freezing and X-ray cryst...

Specimen holder

Cell for X-ray analysis and X-ray analysis apparatus

Analysis device

In-situ coin cell support device for transmission mode X-ray diffra...

Sample holder for X-ray analysis

System for detecting and real time processing x-ray pulses from mic...

Cryogenic cooling positioning apparatus, methods and applications

Furnace for transmission mode X-ray diffractometer and transmission...

Heated wafer carrier profiling

Temperature control chamber for compact X-ray machine

Method of measuring scattering of X-rays, its applications and impl...

Heating apparatus for X-ray inspection

Cryogenic specimen holder

Sample presentation device for radiation-based analytical equipment

Microcalorimetry for X-ray spectroscopy

Cryogenic specimen holder

Open flow helium cryostat system and related method of using

Apparatus for rapid in-situ X-ray stress measurement during thermal...

Apparatus and method of X-ray topography at cryogenic temperature

Variable temperature flat plate powder diffraction camera

3860815

3839635

Patents Applicationslast 30 patents

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PR...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SOAKING MACHINE AND SOAKING METHOD OF SAMPLE FOR SINGLE-CRYSTAL X-R...

Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...

Device For Clamping And Controlling The Temperature Of Planar Sampl...

SPECIMEN HOLDER

MODULAR SPECIMEN HOLDERS FOR HIGH PRESSURE FREEZING AND X-RAY CRYST...

SYSTEM FOR DETECTING AND REAL TIME PROCESSING X-RAY PULSES FROM MIC...

CELL FOR X-RAY ANALYSIS AND X-RAY ANALYSIS APPARATUS

IN-SITU COIN CELL SUPPORT DEVICE FOR TRANSMISSION MODE X-RAY DIFFRA...

ANALYSIS DEVICE

Sample Holder for X-ray Analysis

Temperature Control Chamber for Compact X-Ray Machine

METHOD OF MEASURING SCATTERING OF X-RAYS, ITS APPLICATIONS AND IMPL...

SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT

SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT

CRYOGENIC SPECIMEN HOLDER

CRYOGENIC SPECIMEN HOLDER

HEATING APPARATUS FOR X-RAY INSPECTION

HEATING APPARATUS FOR X-RAY INSPECTION

MICROCALORIMETRY FOR X-RAY SPECTROSCOPY