Pulsed source

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H01J2237/2626

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2626Pulsed source

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Patents Grantslast 30 patents

Information Patent Grant
Automated tomography field ion microscope
- Patent number 11,791,129
- Issue date Oct 17, 2023
- Centre National de la Recherche Scientifique
- François Vurpillot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field-of-view atom probe
- Patent number 10,615,001
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Joseph Hale Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam generation for transmission electron microscope
- Patent number 10,529,536
- Issue date Jan 7, 2020
- Technische Universiteit Eindhoven
- Otger Jan Luiten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for time-resolved pump-probe electron microscopy
- Patent number 9,978,559
- Issue date May 22, 2018
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Nahid Talebi Sarvari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for electron microscope with multiple cathodes
- Patent number 9,464,998
- Issue date Oct 11, 2016
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for electron emission and device including such a...
- Patent number 9,263,229
- Issue date Feb 16, 2016
- Centre National de la Recherche Scientifique (Cnrs)
- Arnaud Arbouet
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR
- Publication number 20220254601
- Publication date Aug 11, 2022
- Centre National de la Recherche Scientifique
- Angela VELLA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE
- Publication number 20220139666
- Publication date May 5, 2022
- Centre National de la Recherche Scientifique
- François VURPILLOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Generation for Transmission Electron Microscope
- Publication number 20180301317
- Publication date Oct 18, 2018
- Otger Jan Luiten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE FIELD-OF-VIEW ATOM PROBE
- Publication number 20180130636
- Publication date May 10, 2018
- Cameca Instruments, Inc.
- Joseph Hale BUNTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR TIME-RESOLVED PUMP-PROBE ELECTRON MICROSCOPY
- Publication number 20170271123
- Publication date Sep 21, 2017
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Nahid TALEBI SARVARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Short duration variable amplitude high voltage pulse generator
- Publication number 20070018504
- Publication date Jan 25, 2007
- Scott Albert Wiener
- G06 - COMPUTING CALCULATING COUNTING