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G01N2201/105
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
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G01N2201/105
Purely optical scan
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Patents Grants
last 30 patents
Information
Patent Grant
Digital mirror device based code-division multiplexed Raman optical...
Patent number
12,163,891
Issue date
Dec 10, 2024
CytoVeris, Inc.
Alan Kersey
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Inspection apparatus and focal position adjustment method
Patent number
12,135,295
Issue date
Nov 5, 2024
NuFlare Technology, Inc.
Masaya Takeda
G01 - MEASURING TESTING
Information
Patent Grant
System and method for mobile device display and housing diagnostics
Patent number
12,013,348
Issue date
Jun 18, 2024
BLANCCO TECHNOLOGY GROUP IP OY
William Fitzgerald
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High speed deep tissue imaging system using multiplexed scanned tem...
Patent number
11,988,603
Issue date
May 21, 2024
University of Vienna
Alipasha Vaziri
G01 - MEASURING TESTING
Information
Patent Grant
Line scanning mechanical streak systems and methods for phosphoresc...
Patent number
11,815,456
Issue date
Nov 14, 2023
Purdue Research Foundation
Meng Cui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
Patent number
11,808,563
Issue date
Nov 7, 2023
The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
Information
Patent Grant
Scanning infrared measurement system
Patent number
11,674,882
Issue date
Jun 13, 2023
1087 Systems, Inc.
Matthias Wagner
G01 - MEASURING TESTING
Information
Patent Grant
Multifocal photoacoustic microscopy through an ergodic relay
Patent number
11,530,979
Issue date
Dec 20, 2022
California Institute of Technology
Lihong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
Patent number
11,473,903
Issue date
Oct 18, 2022
The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
Information
Patent Grant
Scanning infrared measurement system
Patent number
11,320,361
Issue date
May 3, 2022
1087 Systems, Inc.
Matthias Wagner
G02 - OPTICS
Information
Patent Grant
Biological material measuring apparatus
Patent number
11,304,635
Issue date
Apr 19, 2022
Mitsubishi Electric Corporation
Kosuke Shinohara
G01 - MEASURING TESTING
Information
Patent Grant
Multi-focal structured illumination microscopy systems and methods
Patent number
11,086,113
Issue date
Aug 10, 2021
The United States of America
Hari Shroff
G02 - OPTICS
Information
Patent Grant
Welding monitoring system and welding monitoring method
Patent number
11,029,254
Issue date
Jun 8, 2021
Hitachi, Ltd.
Ryoji Nakagawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Fast two-photon imaging by diffracted swept-laser excitation
Patent number
11,009,459
Issue date
May 18, 2021
The Regents of the University of California
Sebastian Karpf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Uniform and scalable light-sheets generated by extended focusing
Patent number
10,989,661
Issue date
Apr 27, 2021
The Board of Regents of the University of Texas System
Reto P. Fiolka
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence observation device
Patent number
10,983,323
Issue date
Apr 20, 2021
Nikon Corporation
Fumihiro Dake
G01 - MEASURING TESTING
Information
Patent Grant
Mirror device, mirror drive method, light irradiation device, and i...
Patent number
10,962,768
Issue date
Mar 30, 2021
Hamamatsu Photonics K.K.
Akira Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Welding monitoring system and welding monitoring method
Patent number
10,935,500
Issue date
Mar 2, 2021
Hitachi, Ltd.
Ryoji Nakagawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
Patent number
10,928,188
Issue date
Feb 23, 2021
The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for instant total internal reflection fluoresce...
Patent number
10,914,933
Issue date
Feb 9, 2021
The United States of America, as represented by the Secretary, Department of...
Hari Shroff
G01 - MEASURING TESTING
Information
Patent Grant
EUV mask inspection apparatus and method, and EUV mask manufacturin...
Patent number
10,890,527
Issue date
Jan 12, 2021
Samsung Electronics Co., Ltd.
Byeong-hwan Jeon
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence lifetime sensor module and method of determining a flu...
Patent number
10,871,448
Issue date
Dec 22, 2020
AMS AG
Martin Münzer
G01 - MEASURING TESTING
Information
Patent Grant
Mirror device, mirror drive method, light irradiation device, and i...
Patent number
10,761,318
Issue date
Sep 1, 2020
Hamamatsu Photonics K.K.
Akira Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, apparatus and software for detection and localization of hi...
Patent number
10,753,862
Issue date
Aug 25, 2020
STICHTING HET NEDERLANDS KANKER INSTITUUT-ANTONI VAN LEEUWENHOEK ZIEKENHUIS
Theodoor Jacques Marie Ruers
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus for optical detection of bio-contaminants based upon meas...
Patent number
10,724,954
Issue date
Jul 28, 2020
Steris Inc.
Daniel Rochette
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for optical detection of bio-contaminants with...
Patent number
10,705,020
Issue date
Jul 7, 2020
Steris Inc.
Francois Baribeau
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Laser scanning microscope apparatus
Patent number
10,690,897
Issue date
Jun 23, 2020
Canon Kabushiki Kaisha
Koji Makara
G02 - OPTICS
Information
Patent Grant
Scanning infrared measurement system
Patent number
10,677,710
Issue date
Jun 9, 2020
1087 Systems, Inc.
Matthias Wagner
G01 - MEASURING TESTING
Information
Patent Grant
Scattered radiation optical scanner
Patent number
10,648,928
Issue date
May 12, 2020
Lumina Instruments Inc.
Steven W. Meeks
G02 - OPTICS
Information
Patent Grant
Nondestructive inspection method for coatings and ceramic matrix co...
Patent number
10,648,937
Issue date
May 12, 2020
General Electric Company
Russell Craig Baucke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS FOR LOCALIZING SINGLE FLUORESCENT MOLECULES COMPRISED IN...
Publication number
20240393250
Publication date
Nov 28, 2024
ABBELIGHT
Nicolas BOURG
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
Publication number
20240393261
Publication date
Nov 28, 2024
PRECITEC OPTRONIK GMBH
Tobias Beck
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED DEEP TISSUE IMAGING SYSTEM USING MULTIPLEXED SCANNED TEM...
Publication number
20240377322
Publication date
Nov 14, 2024
UNIVERSITY OF VIENNA
Alipasha VAZIRI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY
Publication number
20240361252
Publication date
Oct 31, 2024
LG ENERGY SOLUTION, LTD.
Tae Young KIM
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL FLUORESCENCE IMAGING SYSTEM COMPRISING SINGLE-OBJ...
Publication number
20240345375
Publication date
Oct 17, 2024
Wuhan Smartview Biotechnology Co., Ltd.
Yuxuan ZHAO
G01 - MEASURING TESTING
Information
Patent Application
SIDE SURFACE INSPECTION DEVICE OF CYLINDRICAL BATTERY
Publication number
20240345000
Publication date
Oct 17, 2024
LG ENERGY SOLUTION, LTD.
Jiwon KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
An FTIR-based Sensor System for Monitoring Gas, Vapor, or Fluid Emi...
Publication number
20240280479
Publication date
Aug 22, 2024
Lightsense Technology, Inc.
John Coates
G01 - MEASURING TESTING
Information
Patent Application
STIMULATED RAMAN PHOTOTHERMAL MICROSCOPE
Publication number
20240255429
Publication date
Aug 1, 2024
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Information
Patent Application
FAST MULTIPHOTON MICROSCOPE
Publication number
20240210320
Publication date
Jun 27, 2024
APPLIKATE TECHNOLOGIES LLC
Michael Levene
G01 - MEASURING TESTING
Information
Patent Application
IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTU...
Publication number
20240159669
Publication date
May 16, 2024
UNM Rainforest Innovations
Steven R.J. BRUECK
G01 - MEASURING TESTING
Information
Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
Publication number
20240102937
Publication date
Mar 28, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
Publication number
20240060880
Publication date
Feb 22, 2024
HITACHI HIGH-TECH CORPORATION
Masahiro WATANABE
G02 - OPTICS
Information
Patent Application
MULTI-SPOT CONFOCAL IMAGING SYSTEM WITH SPECTRAL MULTIPLEXING
Publication number
20240035978
Publication date
Feb 1, 2024
FEI Deutschland GmbH
Rainer DAUM
G02 - OPTICS
Information
Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
Publication number
20240019243
Publication date
Jan 18, 2024
The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR LIVE PROJECTION IMAGING FOR FLUORESCENCE MI...
Publication number
20230314787
Publication date
Oct 5, 2023
The Board of Regents of the University of Texas System
Reto FIOLKA
G02 - OPTICS
Information
Patent Application
LINE FIELD SWEPT SOURCE OCT SYSTEM AND SPECTROSCOPY SYSTEM
Publication number
20230296508
Publication date
Sep 21, 2023
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
METHOD, APPARATUS AND COMPUTER PROGRAM FOR LOCALIZING AN EMITTER IN...
Publication number
20230251479
Publication date
Aug 10, 2023
Abberior Instruments GmbH
Roman SCHMIDT
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND FOCAL POSITION ADJUSTMENT METHOD
Publication number
20230137226
Publication date
May 4, 2023
NuFlare Technology, Inc.
Masaya TAKEDA
G01 - MEASURING TESTING
Information
Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
Publication number
20230003515
Publication date
Jan 5, 2023
The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL MIRROR DEVICE BASED CODE-DIVISION MULTIPLEXED RAMAN OPTICAL...
Publication number
20220317046
Publication date
Oct 6, 2022
CytoVeris Inc.
Alan Kersey
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
LINE SCANNING MECHANICAL STREAK SYSTEMS AND METHODS FOR PHOSPHORESC...
Publication number
20220065783
Publication date
Mar 3, 2022
Purdue Research Foundation
Meng Cui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Affinity Reagent and Catalyst Discovery Through Fiber-Optic Array S...
Publication number
20210208157
Publication date
Jul 8, 2021
SRI International
Nathan Collins
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
Publication number
20210131797
Publication date
May 6, 2021
The Boeing Company
Jeffrey H. Hunt
G01 - MEASURING TESTING
Information
Patent Application
MULTI-FOCAL STRUCTURED ILLUMINATION MICROSCOPY SYSTEMS AND METHODS
Publication number
20210096348
Publication date
Apr 1, 2021
The USA, as represented by the Secretary, Dept. of Health & Human Services
Hari Shroff
G01 - MEASURING TESTING
Information
Patent Application
OPTOCHEMICAL SENSOR, SENSOR CAP, USE OF THE OPTOCHEMICAL SENSOR, AN...
Publication number
20210055229
Publication date
Feb 25, 2021
Endress + Hauser Conducta GmbH + Co. KG
Andreas Löbbert
G01 - MEASURING TESTING
Information
Patent Application
MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...
Publication number
20200319452
Publication date
Oct 8, 2020
HAMAMATSU PHOTONICS K. K.
Akira TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESS AND SYSTEM FOR MEASURING MORPHOLOGICAL CHARACTERISTICS OF F...
Publication number
20200321363
Publication date
Oct 8, 2020
IPG Photonics Corporation
Florian HUBER
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Multiplexed Single Molecule Analyzer
Publication number
20200249164
Publication date
Aug 6, 2020
NOVILUX, LLC
Richard Livingston
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED DEEP TISSUE IMAGING SYSTEM USING MULTIPLEXED SCANNED TEM...
Publication number
20200182792
Publication date
Jun 11, 2020
UNIVERSITY OF VIENNA
Alipasha Vaziri
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR INSTANT TOTAL INTERNAL REFLECTION FLUORESCE...
Publication number
20200064611
Publication date
Feb 27, 2020
The USA, as represented by the Secretary, Dept. of Health & Human Services
Hari Shroff
G02 - OPTICS