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G01N35/00613
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N35/00
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00 Handling materials therefor
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G01N35/00613
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Patents Grants
last 30 patents
Information
Patent Grant
System, method, and apparatus for automating specimen testing
Patent number
12,241,903
Issue date
Mar 4, 2025
Illinois Tool Works Inc.
Adrian Riddick
G01 - MEASURING TESTING
Information
Patent Grant
Method for quality assessment of a processing operation with adapti...
Patent number
12,203,949
Issue date
Jan 21, 2025
Fronius International GmbH
Helmut Ennsbrunner
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Apparatus to operate a quality control in industrial production lin...
Patent number
12,181,429
Issue date
Dec 31, 2024
DE.TEC.TOR S.r.l.
Giuseppe Pitta'
G01 - MEASURING TESTING
Information
Patent Grant
Centering unit for diagnostic laboratory transporting compartment
Patent number
12,163,969
Issue date
Dec 10, 2024
Roche Diagnostics Operations, Inc.
Daniel Arnold
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Facing and quality control in microtomy
Patent number
12,158,404
Issue date
Dec 3, 2024
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for classifying an identification tag on a sample tube conta...
Patent number
12,111,328
Issue date
Oct 8, 2024
Roche Diagnostics Operations, Inc.
René Henri Monnard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for performing quality control on a diagnostic an...
Patent number
12,072,690
Issue date
Aug 27, 2024
Sysmex Corporation
Scott Lesher
G01 - MEASURING TESTING
Information
Patent Grant
Failure state prediction for automated analyzers for analyzing a bi...
Patent number
12,072,341
Issue date
Aug 27, 2024
Roche Diagnostics Operations, Inc.
Fabian Heinemann
G01 - MEASURING TESTING
Information
Patent Grant
Automated sample quality assessment
Patent number
12,050,228
Issue date
Jul 30, 2024
Metabolon, Inc.
Adam D. Kennedy
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for providing quality assurance for validation...
Patent number
12,038,448
Issue date
Jul 16, 2024
Walter LLC
Walter J. Hinchman
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzer
Patent number
12,025,626
Issue date
Jul 2, 2024
HITACHI HIGH-TECH CORPORATION
Riku Tamura
G01 - MEASURING TESTING
Information
Patent Grant
Management system for point of care testing
Patent number
11,995,598
Issue date
May 28, 2024
Abbott Point of Care Inc.
Paul Glavina
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
History logging for samples of biological material
Patent number
11,977,088
Issue date
May 7, 2024
Beckman Coulter, Inc.
Wido Menhardt
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Remote automated chemical crossover system for use with an automate...
Patent number
11,971,421
Issue date
Apr 30, 2024
Elemental Scientific, Inc.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Grant
Automatic nucleic acid detection system and method thereof
Patent number
11,965,898
Issue date
Apr 23, 2024
TCI GENE INC
Yung-Hsiang Lin
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Quality control method, quality control system, management apparatu...
Patent number
11,933,796
Issue date
Mar 19, 2024
Sysmex Corporation
Keiji Fujimoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Facing and quality control in microtomy
Patent number
11,898,948
Issue date
Feb 13, 2024
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatuses for reaction screening and optimization, and methods th...
Patent number
11,885,822
Issue date
Jan 30, 2024
SRI International
Nathan Collins
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Facing and quality control in microtomy
Patent number
11,821,826
Issue date
Nov 21, 2023
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for characterizing a specimen container and s...
Patent number
11,815,446
Issue date
Nov 14, 2023
Siemens Healthcare Diagnostics Inc.
Patrick Wissmann
G01 - MEASURING TESTING
Information
Patent Grant
Industrial inspection system with interlock
Patent number
11,733,255
Issue date
Aug 22, 2023
United Arab Emirates University
Waleed Khalil Ahmed
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Remote automated chemical crossover system for use with an automate...
Patent number
11,703,518
Issue date
Jul 18, 2023
Elemental Scientific, Inc.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Grant
Optimization-based load planning systems and methods for laboratory...
Patent number
11,698,380
Issue date
Jul 11, 2023
Siemens Healthcare Diagnostics Inc.
Ahmet Tuysuzoglu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for performing quality control on a diagnostic an...
Patent number
11,675,341
Issue date
Jun 13, 2023
Sysmex Corporation
Scott Lesher
G01 - MEASURING TESTING
Information
Patent Grant
Deep learning volume quantifying methods and apparatus
Patent number
11,657,593
Issue date
May 23, 2023
Siemens Healthcare Diagnostics Inc.
Stefan Kluckner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic analyzer
Patent number
11,624,752
Issue date
Apr 11, 2023
HITACHI HIGH-TECH CORPORATION
Tooru Inaba
G01 - MEASURING TESTING
Information
Patent Grant
Method for generating an index for quality control, apparatus for g...
Patent number
11,619,640
Issue date
Apr 4, 2023
Sysmex Corporation
Mamoru Ashida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Facing and quality control in microtomy
Patent number
11,609,162
Issue date
Mar 21, 2023
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Specimen processing system
Patent number
11,543,421
Issue date
Jan 3, 2023
HITACHI HIGH-TECH CORPORATION
Shunsuke Baba
G01 - MEASURING TESTING
Information
Patent Grant
Measuring cartridge for measuring a liquid sample
Patent number
11,536,711
Issue date
Dec 27, 2022
EXIAS Medical GmbH
Wolfgang Hofmann
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
Publication number
20250027887
Publication date
Jan 23, 2025
Applied Materials, Inc.
Srikanth V. Racherla
G01 - MEASURING TESTING
Information
Patent Application
EXAMINATION APPARATUS
Publication number
20240426755
Publication date
Dec 26, 2024
FUJIFILM CORPORATION
Yoshinobu MIURA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING CHEMICALLY CONTAMINATED SAMPLES
Publication number
20240410909
Publication date
Dec 12, 2024
KLA Corporation
Mandar Paranjape
G01 - MEASURING TESTING
Information
Patent Application
MANAGEMENT SYSTEM FOR POINT OF CARE TESTING
Publication number
20240403793
Publication date
Dec 5, 2024
ABBOTT POINT OF CARE INC.
Paul Glavina
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Integrated Quality Monitoring View for Battery Manufacturing Process
Publication number
20240377336
Publication date
Nov 14, 2024
Honeywell International Inc.
Anjali Chandran
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR AUTOMATED ANALYSIS OF FLUID SAMPL...
Publication number
20240377420
Publication date
Nov 14, 2024
Cellares Corporation
John CESAREK
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...
Publication number
20240369516
Publication date
Nov 7, 2024
Bruker Daltonics GmbH & Co. KG
Nikolas KESSLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS SYSTEM
Publication number
20240345109
Publication date
Oct 17, 2024
HITACHI HIGH-TECH CORPORATION
Miwa Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
REMOTE AUTOMATED CHEMICAL CROSSOVER SYSTEM FOR USE WITH AN AUTOMATE...
Publication number
20240302392
Publication date
Sep 12, 2024
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20240280597
Publication date
Aug 22, 2024
HITACHI HIGH-TECH CORPORATION
Takashi YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
HISTORY LOGGING FOR SAMPLES OF BIOLOGICAL MATERIAL
Publication number
20240264183
Publication date
Aug 8, 2024
Beckman Coulter, Inc.
Wido MENHARDT
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AUTOMATIC ANALYZING APPARATUS
Publication number
20240241142
Publication date
Jul 18, 2024
Canon Medical Systems Corporation
Shozo HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
METHOD, A SYSTEM AND AN APPARATUS FOR PAPERLESS LABORATORY MONITORING
Publication number
20240230696
Publication date
Jul 11, 2024
Manisha Jain
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR AUTOMATED SPECIMEN CHARACTERIZATION USING...
Publication number
20240169517
Publication date
May 23, 2024
Siemens Healthcare Diagnostics Inc.
Venkatesh NarasimhaMurthy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TECHNIQUES FOR DIAGNOSING SOURCES OF ERROR IN A SAMPLE PROCESSING W...
Publication number
20240159785
Publication date
May 16, 2024
INVITAE CORPORATION
Emil Ragip Keyder
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES FOR REACTION SCREENING AND OPTIMIZATION, AND METHODS TH...
Publication number
20240159784
Publication date
May 16, 2024
SRI International
Nathan Collins
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20240069045
Publication date
Feb 29, 2024
HITACHI HIGH-TECH CORPORATION
Masaki TSUJIKAWA
G01 - MEASURING TESTING
Information
Patent Application
A SURFACE ROUGHNESS MEASUREMENT SYSTEM
Publication number
20240060773
Publication date
Feb 22, 2024
Eaton Intelligent Power Limited
Salma ABDULAZIZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR CONDUCTING AUTOMATED CLINICAL DIAGNOSTIC CROS...
Publication number
20240044926
Publication date
Feb 8, 2024
Bio-Rad Laboratories, Inc.
John Yundt-Pacheco
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION AND VALIDATION OF CUVETTES IN AUTOMATED CHEMICAL ANALYZERS
Publication number
20240003923
Publication date
Jan 4, 2024
Beckman Coulter, Inc.
Kana KAMI
G01 - MEASURING TESTING
Information
Patent Application
Assay Error Reduction
Publication number
20230408534
Publication date
Dec 21, 2023
ESSENLIX CORPORATION
Stephen Y. CHOU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION DEVICE FOR THE QUALITY CONTROL OF ROD-SHAPED ARTICLES
Publication number
20230393160
Publication date
Dec 7, 2023
Philip Morris Products S.A.
Eugenio Navacchia
A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information
Patent Application
REMOTE AUTOMATED CHEMICAL CROSSOVER SYSTEM FOR USE WITH AN AUTOMATE...
Publication number
20230375579
Publication date
Nov 23, 2023
ELEMENTAL SCIENTIFIC, INC.
Tyler Yost
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETER
Publication number
20230343573
Publication date
Oct 26, 2023
SHIMADZU CORPORATION
Tatsuki OKUBO
G01 - MEASURING TESTING
Information
Patent Application
ARTICLE INSPECTION VERIFICATION SYSTEM
Publication number
20230305029
Publication date
Sep 28, 2023
Anritsu Corporation
Eiji ASAI
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
METHOD OF QUALITY CONTROL, QUALITY CONTROL APPARATUS, AND PROGRAM
Publication number
20230288438
Publication date
Sep 14, 2023
SYSMEX CORPORATION
Hajimu KAWAKAMI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR AUTOMATIC QUALITY INSPECTION OF AN AERONAUTICAL PART
Publication number
20230274409
Publication date
Aug 31, 2023
SAFRAN
Sylvaine PICARD
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC AN...
Publication number
20230266751
Publication date
Aug 24, 2023
SYSMEX CORPORATION
Scott Lesher
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analyzer
Publication number
20230251279
Publication date
Aug 10, 2023
Hitachi High-Tech Corporation
Takahiro KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR QUALITY ASSESSMENT OF A PROCESSING OPERATION
Publication number
20230236212
Publication date
Jul 27, 2023
FRONIUS INTERNATIONAL GMBH
Helmut ENNSBRUNNER
G01 - MEASURING TESTING