quality control

Industry

CPC
G01N2223/645

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/645quality control

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Method to use artificial intelligence to enhance visual inspection...
- Patent number 11,988,630
- Issue date May 21, 2024
- Robert Bosch GmbH
- Craig Magera
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Item inspection by dynamic selection of projection angle
- Patent number 11,953,451
- Issue date Apr 9, 2024
- Universiteit Antwerpen
- Jan De Beenhouwer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Line for inspecting empty glass containers
- Patent number 11,927,542
- Issue date Mar 12, 2024
- TIAMA
- Olivier Colle
- G01 - MEASURING TESTING
Information Patent Grant
X-ray and metal detectable thermoset composites for use in food and...
- Patent number 11,920,029
- Issue date Mar 5, 2024
- Molded Fiber Glass Companies
- Routian Gao
- B32 - LAYERED PRODUCTS
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inline x-ray measurement apparatus and method
- Patent number 11,714,054
- Issue date Aug 1, 2023
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable XRF data screening method for heavy metal contaminated soil
- Patent number 11,698,354
- Issue date Jul 11, 2023
- BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
- Lina Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,598,729
- Issue date Mar 7, 2023
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for real time measurement control
- Patent number 11,519,869
- Issue date Dec 6, 2022
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
X-ray filter
- Patent number 11,506,709
- Issue date Nov 22, 2022
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor metrology based on wavelength...
- Patent number 11,460,418
- Issue date Oct 4, 2022
- KLA Corporation
- Alexander Kuznetsov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting battery cells for automation of...
- Patent number 11,378,527
- Issue date Jul 5, 2022
- VIEWORKS CO., LTD.
- Kang Heo
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a layer structure for thin-film solar cells us...
- Patent number 11,183,605
- Issue date Nov 23, 2021
- (CNBM) BENGBU DESIGN RESEARCH INSTITUTE FOR GLASS INDUSTRY CO. LTD
- Helmut Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quality inspection method
- Patent number 11,162,908
- Issue date Nov 2, 2021
- Konica Minolta, Inc.
- Keisuke Mizoguchi
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
- Patent number 11,152,130
- Issue date Oct 19, 2021
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Super-resolution x-ray imaging method and apparatus
- Patent number 11,055,821
- Issue date Jul 6, 2021
- SVXR, Inc.
- Edward R. Ratner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual scan method for detecting a fibre misalignment in an elongated...
- Patent number 11,054,373
- Issue date Jul 6, 2021
- LM WIND POWER US TECHNOLOGY APS
- Klavs Jespersen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method for monitoring the functional state of a system for computer...
- Patent number 11,047,810
- Issue date Jun 29, 2021
- VOLUME GRAPHICS GMBH
- Torsten Schönfeld
- G01 - MEASURING TESTING
Information Patent Grant
X-ray product quality automatic inspection device
- Patent number 10,969,346
- Issue date Apr 6, 2021
- Nuctech Company Limited
- Huaping Tang
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method for characterising a part
- Patent number 10,914,690
- Issue date Feb 9, 2021
- SAFRAN AIRCRAFT ENGINES
- Julien Schneider
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray and metal detectable thermoset composites for use in food and...
- Patent number 10,913,845
- Issue date Feb 9, 2021
- Molded Fiber Glass Companies
- Routian Gao
- B32 - LAYERED PRODUCTS
Information Patent Grant
Inline x-ray measurement apparatus and method
- Patent number 10,803,574
- Issue date Oct 13, 2020
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMALL SPOT
- Publication number 20230288196
- Publication date Sep 14, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
AN APPARATUS TO OPERATE A QUALITY CONTROL IN INDUSTRIAL PRODUCTION...
- Publication number 20220196578
- Publication date Jun 23, 2022
- DE.TEC.TOR S.r.l.
- Giuseppe PITTA'
- G01 - MEASURING TESTING
Information Patent Application
In-Situ 3D printing and Non-Destructive Testing with Computer Tomog...
- Publication number 20220099602
- Publication date Mar 31, 2022
- Jakko H Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ITEM INSPECTION BY DYNAMIC SELECTION OF PROJECTION ANGLE
- Publication number 20210270755
- Publication date Sep 2, 2021
- UNIVERSITEIT ANTWERPEN
- Jan DE BEENHOUWER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY AND METAL DETECTABLE THERMOSET COMPOSITES FOR USE IN FOOD AND...
- Publication number 20210155794
- Publication date May 27, 2021
- Molded Fiber Glass Companies
- Routian GAO
- B32 - LAYERED PRODUCTS
Information Patent Application
Quality Inspection Method
- Publication number 20210109038
- Publication date Apr 15, 2021
- KONICA MINOLTA, INC.
- Keisuke MIZOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INLINE X-RAY MEASUREMENT APPARATUS AND METHOD
- Publication number 20200408705
- Publication date Dec 31, 2020
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING BATTERY CELLS FOR AUTOMATION OF...
- Publication number 20200363344
- Publication date Nov 19, 2020
- VIEWORKS CO., LTD.
- Kang HEO
- G01 - MEASURING TESTING
Information Patent Application
FOOD PRODUCT PROCESSING DEVICE, FOOD PRODUCT PROCESSING DEVICE MANA...
- Publication number 20200265226
- Publication date Aug 20, 2020
- Ishida Co., Ltd.
- Tono TSUGAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FILTER
- Publication number 20200166569
- Publication date May 28, 2020
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Application
X-RAY AND METAL DETECTABLE THERMOSET COMPOSITES FOR USE IN FOOD AND...
- Publication number 20190276663
- Publication date Sep 12, 2019
- Molded Fiber Glass Companies
- Routian GAO
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
METHOD FOR MONITORING THE FUNCTIONAL STATE OF A SYSTEM FOR COMPUTER...
- Publication number 20190265175
- Publication date Aug 29, 2019
- VOLUME GRAPHICS GMBH
- Torsten Schönfeld
- G01 - MEASURING TESTING
Information Patent Application
Methods for Detecting a Fibre Misalignment in an Elongated Structur...
- Publication number 20190011254
- Publication date Jan 10, 2019
- LM WP PATENT HOLDING A/S
- Lars NIELSEN
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
METHOD AND APPARATUS FOR NON-DESTRUCTIVE INSPECTION OF A LOG TO IDE...
- Publication number 20180313809
- Publication date Nov 1, 2018
- MICROTEC S.R.L.
- ENRICO URSELLA
- B27 - WORKING OR PRESERVING WOOD OR SIMILAR MATERIAL NAILING OR STAPLING MACH...
Information Patent Application
METHOD FOR CHARACTERISING A PART
- Publication number 20180195978
- Publication date Jul 12, 2018
- SNECMA
- Julien SCHNEIDER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING A CHARACTERISTIC OF A MATERIAL FOR ADDITIVE MANUFACTURING
- Publication number 20180001565
- Publication date Jan 4, 2018
- SABIC Global Technologies B.V.
- Thomas Hocker
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING THE QUALITY OF AN OBJECT
- Publication number 20140249663
- Publication date Sep 4, 2014
- EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY-EADS FRANCE
- Hubert Voillaume
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING LINE EDGE ROUGHNESS
- Publication number 20140095097
- Publication date Apr 3, 2014
- International Business Machines Corporation
- Daniel F. Moore
- G01 - MEASURING TESTING
Information Patent Application
SOLID MATERIAL CHARACTERIZATION WITH X-RAY SPECTRA IN BOTH TRANSMIS...
- Publication number 20120321039
- Publication date Dec 20, 2012
- UOP LLC
- SIMON RUSSELL BARE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MATERIALS TESTING OF TEST OBJECTS USING X-RAYS
- Publication number 20120045033
- Publication date Feb 23, 2012
- Ingo Stuke
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROVIDING IMAGE DATA
- Publication number 20110001970
- Publication date Jan 6, 2011
- Andrew Maiden
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20100202694
- Publication date Aug 12, 2010
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND PRODUCTION SYSTEM
- Publication number 20100135459
- Publication date Jun 3, 2010
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Application
Orifice formation control system
- Publication number 20090143885
- Publication date Jun 4, 2009
- Caterpillar, Inc.
- Marion B. Grant
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTING METHOD AND INSPECTING SYSTEM OF ASSEMBLY
- Publication number 20090109287
- Publication date Apr 30, 2009
- Ichiro SASAKI
- G01 - MEASURING TESTING

quality control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus to operate a quality control in industrial production lin...

System, method, and apparatus for x-ray backscatter inspection of p...

X-ray automated calibration and monitoring

Method to use artificial intelligence to enhance visual inspection...

Characterizing and measuring in small boxes using XPS with multiple...

Item inspection by dynamic selection of projection angle

System and method for in-situ X-ray diffraction-based real-time mon...

Line for inspecting empty glass containers

X-ray and metal detectable thermoset composites for use in food and...

X-ray collimator and related X-ray inspection apparatus

Inline x-ray measurement apparatus and method

Portable XRF data screening method for heavy metal contaminated soil

Inspection device, inspection method, and method for producing obje...

X-ray inspection device

System and method using x-rays for depth-resolving metrology and an...

Method acquiring projection image, control apparatus, control progr...

Methods and systems for real time measurement control

X-ray filter

Methods and systems for semiconductor metrology based on wavelength...

Apparatus and method for inspecting battery cells for automation of...

Method for producing a layer structure for thin-film solar cells us...

Quality inspection method

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...

Super-resolution x-ray imaging method and apparatus

Dual scan method for detecting a fibre misalignment in an elongated...

Method for monitoring the functional state of a system for computer...

X-ray product quality automatic inspection device

Method for characterising a part

X-ray and metal detectable thermoset composites for use in food and...

Inline x-ray measurement apparatus and method

Patents Applicationslast 30 patents

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

SMALL SPOT

AN APPARATUS TO OPERATE A QUALITY CONTROL IN INDUSTRIAL PRODUCTION...

In-Situ 3D printing and Non-Destructive Testing with Computer Tomog...

ITEM INSPECTION BY DYNAMIC SELECTION OF PROJECTION ANGLE

X-RAY AND METAL DETECTABLE THERMOSET COMPOSITES FOR USE IN FOOD AND...

Quality Inspection Method

INLINE X-RAY MEASUREMENT APPARATUS AND METHOD

APPARATUS AND METHOD FOR INSPECTING BATTERY CELLS FOR AUTOMATION OF...

FOOD PRODUCT PROCESSING DEVICE, FOOD PRODUCT PROCESSING DEVICE MANA...

X-RAY FILTER

X-RAY AND METAL DETECTABLE THERMOSET COMPOSITES FOR USE IN FOOD AND...

METHOD FOR MONITORING THE FUNCTIONAL STATE OF A SYSTEM FOR COMPUTER...

Methods for Detecting a Fibre Misalignment in an Elongated Structur...

METHOD AND APPARATUS FOR NON-DESTRUCTIVE INSPECTION OF A LOG TO IDE...

METHOD FOR CHARACTERISING A PART

IDENTIFYING A CHARACTERISTIC OF A MATERIAL FOR ADDITIVE MANUFACTURING

SYSTEM AND METHOD FOR CONTROLLING THE QUALITY OF AN OBJECT

SYSTEM AND METHOD FOR DETERMINING LINE EDGE ROUGHNESS

SOLID MATERIAL CHARACTERIZATION WITH X-RAY SPECTRA IN BOTH TRANSMIS...

APPARATUS FOR MATERIALS TESTING OF TEST OBJECTS USING X-RAYS

METHOD AND APPARATUS FOR PROVIDING IMAGE DATA

INSPECTION APPARATUS

X-RAY INSPECTION DEVICE AND PRODUCTION SYSTEM

Orifice formation control system

INSPECTING METHOD AND INSPECTING SYSTEM OF ASSEMBLY