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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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Patents Grantslast 30 patents

Information Patent Grant
Hyperspectral image sensor with calibration
- Patent number 11,733,095
- Issue date Aug 22, 2023
- IMEC
- Nicolaas Tack
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit for spectral imaging system
- Patent number 11,029,207
- Issue date Jun 8, 2021
- IMEC
- Nicolaas Tack
- G01 - MEASURING TESTING
Information Patent Grant
Spectral reflectometer
- Patent number 10,900,833
- Issue date Jan 26, 2021
- Seiko Epson Corporation
- Tsugio Gomi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit for spectral imaging system
- Patent number 10,620,049
- Issue date Apr 14, 2020
- IMEC
- Nicolaas Tack
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit for spectral imaging system
- Patent number 10,260,945
- Issue date Apr 16, 2019
- IMEC
- Nicolaas Tack
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit for spectral imaging system
- Patent number 10,139,280
- Issue date Nov 27, 2018
- IMEC
- Nicolaas Tack
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting wavelength of laser beam
- Patent number 5,319,441
- Issue date Jun 7, 1994
- Mitsui Petrochemical Industries, Ltd.
- Mitsugu Terada
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength stabilizer for narrow bandwidth laser
- Patent number 5,243,614
- Issue date Sep 7, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Hitoshi Wakata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for the simultaneous detection of ranges of wavelengths
- Patent number 5,206,708
- Issue date Apr 27, 1993
- Gunter Knapp
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYPERSPECTRAL IMAGE SENSOR WITH CALIBRATION
- Publication number 20210247232
- Publication date Aug 12, 2021
- IMEC
- Nicolaas Tack
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM
- Publication number 20200278252
- Publication date Sep 3, 2020
- IMEC
- Nicolaas Tack
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM
- Publication number 20190285474
- Publication date Sep 19, 2019
- IMEC
- Nicolaas Tack
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Spectral Reflectometer
- Publication number 20190162594
- Publication date May 30, 2019
- SEIKO EPSON CORPORATION
- Tsugio GOMI
- G02 - OPTICS
Information Patent Application
INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM
- Publication number 20160252395
- Publication date Sep 1, 2016
- IMEC
- Klaas TACK
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM
- Publication number 20120327248
- Publication date Dec 27, 2012
- IMEC
- Klaas TACK
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Hyperspectral image sensor with calibration

Integrated circuit for spectral imaging system

Spectral reflectometer

Integrated circuit for spectral imaging system

Integrated circuit for spectral imaging system

Integrated circuit for spectral imaging system

Method and apparatus for detecting wavelength of laser beam

Wavelength stabilizer for narrow bandwidth laser

Apparatus for the simultaneous detection of ranges of wavelengths

Patents Applicationslast 30 patents

HYPERSPECTRAL IMAGE SENSOR WITH CALIBRATION

INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM

INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM

Spectral Reflectometer

INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM

INTEGRATED CIRCUIT FOR SPECTRAL IMAGING SYSTEM