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G01S7/352
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01S
RADIO DIRECTION-FINDING RADIO NAVIGATION DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES ANALOGOUS ARRANGEMENTS USING OTHER WAVES
G01S7/00
Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
Current Industry
G01S7/352
Receivers
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Beamforming hardware accelerator for radar systems
Patent number
11,971,470
Issue date
Apr 30, 2024
Texas Instruments Incorporated
Jasbir Singh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for determining user activities using multiple so...
Patent number
11,971,503
Issue date
Apr 30, 2024
Koko Home, Inc.
Bradley Michael Eckert
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for antenna array calibration for cross-coupling...
Patent number
11,953,615
Issue date
Apr 9, 2024
Uhnder Inc.
Murtaza Ali
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radar transceiver
Patent number
11,947,031
Issue date
Apr 2, 2024
Texas Instruments Incorporated
Sreekiran Samala
G01 - MEASURING TESTING
Information
Patent Grant
Mismatched frequency modulated continuous wave radar signal
Patent number
11,946,999
Issue date
Apr 2, 2024
Airbus Defence and Space GmbH
Russel Que
G01 - MEASURING TESTING
Information
Patent Grant
Radar detection system for non-contact human activation of powered...
Patent number
11,933,915
Issue date
Mar 19, 2024
Magna Closures Inc.
Wassim Rafrafi
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Leakage signal cancellation
Patent number
11,923,889
Issue date
Mar 5, 2024
FutureWei Technologies, Inc.
Ricky Lap Kei Cheung
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Distance measurement using millimeter wave radar
Patent number
11,921,229
Issue date
Mar 5, 2024
Texas Instruments Incorporated
Muhammad Zubair Ikram
G01 - MEASURING TESTING
Information
Patent Grant
Radar device, method of detecting failure of radar device, and meth...
Patent number
11,921,186
Issue date
Mar 5, 2024
Mitsubishi Electric Corporation
Takuya Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Trajectory determination system using positional sensing to determi...
Patent number
11,914,025
Issue date
Feb 27, 2024
Density, Inc.
Andrew Farah
G01 - MEASURING TESTING
Information
Patent Grant
System and MMIC architecture for coherent multi-chip phased array M...
Patent number
11,914,069
Issue date
Feb 27, 2024
Infineon Technologies AG
Vincenzo Fiore
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Signal integration with transceiver motion compensation
Patent number
11,914,030
Issue date
Feb 27, 2024
VEONEER SWEDEN AB
Christian Schwert
G01 - MEASURING TESTING
Information
Patent Grant
FMCW radar with interference signal suppression using artificial ne...
Patent number
11,907,829
Issue date
Feb 20, 2024
Infineon Technologies AG
Paul Meissner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
MIMO radar apparatuses and MIMO radar methods
Patent number
11,906,618
Issue date
Feb 20, 2024
Infineon Technologies AG
Byung Kwon Park
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for multi-chip operation of radar systems
Patent number
11,899,126
Issue date
Feb 13, 2024
UHNDER, INC.
Monier Maher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus to test RADAR integrated circuits
Patent number
11,899,129
Issue date
Feb 13, 2024
Texas Instruments Incorporated
Karthik Subburaj
G01 - MEASURING TESTING
Information
Patent Grant
Doppler processing in frequency-modulated continuous wave radar sys...
Patent number
11,899,095
Issue date
Feb 13, 2024
Texas Instruments Incorporated
Sandeep Rao
G01 - MEASURING TESTING
Information
Patent Grant
Non-active chirp dithering in FMCW radar
Patent number
11,874,392
Issue date
Jan 16, 2024
Texas Instruments Incorporated
Shankar Ram Narayana Moorthy
G01 - MEASURING TESTING
Information
Patent Grant
Radar device, signal processor, and signal processing method
Patent number
11,852,712
Issue date
Dec 26, 2023
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Sachio Iida
G08 - SIGNALLING
Information
Patent Grant
Method and apparatus for radar signal processing using recurrent ne...
Patent number
11,852,750
Issue date
Dec 26, 2023
SMART RADAR SYSTEM, INC.
Jong Il Kim
G01 - MEASURING TESTING
Information
Patent Grant
Radar apparatus and radar signal processing method
Patent number
11,841,456
Issue date
Dec 12, 2023
SMART RADAR SYSTEM, INC.
Yong Jae Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for radar signal processing using convolutiona...
Patent number
11,835,649
Issue date
Dec 5, 2023
SMART RADAR SYSTEM, INC.
Jong Il Kim
G01 - MEASURING TESTING
Information
Patent Grant
Radio frequency systems integrated with displays and methods of for...
Patent number
11,828,835
Issue date
Nov 28, 2023
Infineon Technologies AG
Ashutosh Baheti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radar device
Patent number
11,822,002
Issue date
Nov 21, 2023
Panasonic Holdings Corporation
Takaaki Kishigami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Digital compensation for mismatches in a radar system
Patent number
11,815,621
Issue date
Nov 14, 2023
Texas Instruments Incorporated
Sriram Murali
G01 - MEASURING TESTING
Information
Patent Grant
Real-time location sensing system
Patent number
11,808,840
Issue date
Nov 7, 2023
NODENS MEDICAL LTD.
Khalid Rajab
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of two-stage signal processing in a radar system
Patent number
11,808,881
Issue date
Nov 7, 2023
Arbe Robotics Ltd.
Noam Arkind
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive high point neighborhood range
Patent number
11,808,884
Issue date
Nov 7, 2023
ZF Friedrichshafen AG
Benjamin Sick
G01 - MEASURING TESTING
Information
Patent Grant
MIMO channel extenders with associated systems and methods
Patent number
11,796,630
Issue date
Oct 24, 2023
Ay Dee Kay LLC
Danny Elad
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dynamic loading of radar unit configuration data based on changing...
Patent number
11,796,633
Issue date
Oct 24, 2023
Waymo LLC
Kevin Duncklee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF PROCESSING RADAR DATA
Publication number
20240133999
Publication date
Apr 25, 2024
NXP B.V.
Jeroen Overdevest
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DOPPLER PROCESSING IN FREQUENCY-MODULATED CONTINUOUS WAVE RADAR SYS...
Publication number
20240134034
Publication date
Apr 25, 2024
TEXAS INSTRUMENTS INCORPORATED
Sandeep Rao
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINATION OF DIRECTION OF ARRIVAL ANGLE
Publication number
20240118404
Publication date
Apr 11, 2024
NXP B.V.
Arie Geert Cornelis Koppelaar
G01 - MEASURING TESTING
Information
Patent Application
RADAR DEVICE, METHOD OF DETECTING FAILURE OF RADAR DEVICE, AND METH...
Publication number
20240094371
Publication date
Mar 21, 2024
Mitsubishi Electric Corporation
Takuya SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
NON-ACTIVE CHIRP DITHERING IN FMCW RADAR
Publication number
20240094335
Publication date
Mar 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Shankar Ram NARAYANA MOORTHY
G01 - MEASURING TESTING
Information
Patent Application
Real-Time Chirp Signal Frequency Linearity Measurement
Publication number
20240077579
Publication date
Mar 7, 2024
INFINEON TECHNOLOGIES AG
Thomas Bauernfeind
G01 - MEASURING TESTING
Information
Patent Application
Multi chip radar synchronization
Publication number
20240069158
Publication date
Feb 29, 2024
GM Cruise Holdings LLC
Gustavo Adolfo Guarín Aristizabal
G01 - MEASURING TESTING
Information
Patent Application
RADAR APPARATUS AND RADAR SIGNAL PROCESSING METHOD
Publication number
20240061076
Publication date
Feb 22, 2024
SMART RADAR SYSTEM, INC.
Yong Jae KIM
G01 - MEASURING TESTING
Information
Patent Application
RADAR SYSTEM, DATA TRANSFER DEVICE, AND METHOD
Publication number
20240036155
Publication date
Feb 1, 2024
Kabushiki Kaisha Toshiba
Ryota SEKIYA
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE FREQUENCY-MODULATED MILLIMETRE-WAVE RADAR DEVICE
Publication number
20240027578
Publication date
Jan 25, 2024
THALES
Yoan VEYRAC
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE AND DETECTION METHOD
Publication number
20240027601
Publication date
Jan 25, 2024
FUJITSU COMPONENT LIMITED
Masaru SAKURAI
G01 - MEASURING TESTING
Information
Patent Application
RADAR DEVICE
Publication number
20240012096
Publication date
Jan 11, 2024
Panasonic Holdings Corporation
TAKAAKI KISHIGAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Dynamic Loading of Radar Unit Configuration Data Based on Changing...
Publication number
20240004029
Publication date
Jan 4, 2024
WAYMO LLC
Kevin Duncklee
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR FAST FREQUENCY HOPPING WAVEFORMS WITH CONTINU...
Publication number
20230408671
Publication date
Dec 21, 2023
UHNDER, INC.
Christopher Deng
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SENSING DISTANCE AND/OR MOVEMENT
Publication number
20230400563
Publication date
Dec 14, 2023
TransRobotics, Inc.
Sayf Alalusi
G01 - MEASURING TESTING
Information
Patent Application
DELAY CALIBRATION CIRCUIT AND METHOD, ANALOG-TO-DIGITAL CONVERTER,...
Publication number
20230387931
Publication date
Nov 30, 2023
CALTERAH SEMICONDUCTOR TECHNOLOGY (SHANGHAI) CO., LTD.
Xinlong ZHANG
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Radar Device
Publication number
20230384439
Publication date
Nov 30, 2023
Aptiv Technologies Limited
Dennis Vollbracht
G01 - MEASURING TESTING
Information
Patent Application
Radar
Publication number
20230384416
Publication date
Nov 30, 2023
Cambridge Sensoriis Ltd
Michael Peter HALL
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE RADAR CLUTTER REMOVAL
Publication number
20230375664
Publication date
Nov 23, 2023
TEXAS INSTRUMENTS INCORPORATED
Anil Varghese MANI
G01 - MEASURING TESTING
Information
Patent Application
HIGH-RESOLUTION IMAGING RADAR APPARATUS AND OPERATING METHOD THEREOF
Publication number
20230358858
Publication date
Nov 9, 2023
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Pil Jae PARK
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MODULATED CONTINUOUS WAVE SIGNAL-BASED POSITIONING IN NEW...
Publication number
20230350045
Publication date
Nov 2, 2023
QUALCOMM Incorporated
Srinivas YERRAMALLI
G01 - MEASURING TESTING
Information
Patent Application
RADAR SYSTEM
Publication number
20230341514
Publication date
Oct 26, 2023
Sicoya GmbH
Christoph HOEHN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE, METHOD FOR CONTROLLING ELECTRONIC DEVICE, AND PR...
Publication number
20230333234
Publication date
Oct 19, 2023
Kyocera Corporation
Tooru SAHARA
G01 - MEASURING TESTING
Information
Patent Application
BEAMFORMING HARDWARE ACCELERATOR FOR RADAR SYSTEMS
Publication number
20230324538
Publication date
Oct 12, 2023
TEXAS INSTRUMENTS INCORPORATED
Jasbir SINGH
G01 - MEASURING TESTING
Information
Patent Application
RADAR DEVICE WITH COMPENSATION OF NONLINEARITIES
Publication number
20230324512
Publication date
Oct 12, 2023
INFINEON TECHNOLOGIES AG
Niels CHRISTOFFERS
G01 - MEASURING TESTING
Information
Patent Application
RADAR DEVICE
Publication number
20230314555
Publication date
Oct 5, 2023
PANASONIC CORPORATION
TAKAAKI KISHIGAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW PHASE NOISE RADAR SYSTEM
Publication number
20230314600
Publication date
Oct 5, 2023
GM Cruise Holdings LLC
Benedikt Sanftl
G01 - MEASURING TESTING
Information
Patent Application
ANTENNA FOR A RADAR APPARATUS
Publication number
20230288532
Publication date
Sep 14, 2023
Vaisala Oyj
Reino KERÄNEN
G01 - MEASURING TESTING
Information
Patent Application
ANTENNA FOR A RADAR APPARATUS
Publication number
20230288535
Publication date
Sep 14, 2023
Vaisala Oyj
Reino KERÄNEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS WITH MEASURING OF THREE-DIMENSIONAL POSITION U...
Publication number
20230258790
Publication date
Aug 17, 2023
Samsung Electronics Co., Ltd.
Sungdo CHOI
G01 - MEASURING TESTING