Reflection microscopes

Industry

CPC
H01J37/29

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/29Reflection microscopes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Arbitrary electron dose waveforms for electron microscopy
- Patent number 12,080,514
- Issue date Sep 3, 2024
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Shewmon Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 12,009,176
- Issue date Jun 11, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,749,498
- Issue date Sep 5, 2023
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arbitrary electron dose waveforms for electron microscopy
- Patent number 11,728,128
- Issue date Aug 15, 2023
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Shewmon Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 11,694,874
- Issue date Jul 4, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for the particle-optical examinatio...
- Patent number 11,657,999
- Issue date May 23, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 11,515,121
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Tomohiko Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arbitrary electron dose waveforms for electron microscopy
- Patent number 11,476,082
- Issue date Oct 18, 2022
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Shewmon Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration reduction in multipass electron microscopy
- Patent number 11,456,148
- Issue date Sep 27, 2022
- The Board of Trustees of the Leland Stanford Junior University
- Mark A. Kasevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,398,368
- Issue date Jul 26, 2022
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling transmission electron microscope and transmis...
- Patent number 11,251,016
- Issue date Feb 15, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application device
- Patent number 11,227,740
- Issue date Jan 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,217,425
- Issue date Jan 4, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for alignment of cathodoluminescence optics
- Patent number 11,205,559
- Issue date Dec 21, 2021
- Gatan, Inc.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaging of semiconductor X-ray detectors
- Patent number 11,199,634
- Issue date Dec 14, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for electron diffraction analysis
- Patent number 11,195,692
- Issue date Dec 7, 2021
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
- Patent number 11,114,275
- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system and method for the particle-optical examinatio...
- Patent number 11,049,686
- Issue date Jun 29, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for zone axis alignment
- Patent number 11,024,480
- Issue date Jun 1, 2021
- FEI Company
- Zhenxin Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holography reconstruction method and program
- Patent number 11,024,482
- Issue date Jun 1, 2021
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometric electron microscope
- Patent number 11,011,344
- Issue date May 18, 2021
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron channeling pattern acquisition from small crystalline areas
- Patent number 11,003,942
- Issue date May 11, 2021
- International Business Machines Corporation
- Stephen W. Bedell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mirror device, mirror drive method, light irradiation device, and i...
- Patent number 10,962,768
- Issue date Mar 30, 2021
- Hamamatsu Photonics K.K.
- Akira Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device, observation method, and diffraction grating
- Patent number 10,948,426
- Issue date Mar 16, 2021
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Method of acquiring holograms by off-axis electron holography in pr...
- Patent number 10,884,379
- Issue date Jan 5, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Victor Boureau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and specimen tilt angle adjustment method
- Patent number 10,867,771
- Issue date Dec 15, 2020
- Jeol Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for photocathode illumination inspection
- Patent number 10,840,055
- Issue date Nov 17, 2020
- KLA Corporation
- Gildardo Delgado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 10,811,222
- Issue date Oct 20, 2020
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction imaging system for determining molecular struc...
- Patent number 10,784,078
- Issue date Sep 22, 2020
- Roger D. Durst
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Fully Integrated Microcrystal Electron Diffra...
- Publication number 20240387141
- Publication date Nov 21, 2024
- The Regents of the University of California
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
- Publication number 20240355577
- Publication date Oct 24, 2024
- Eldico Scientific AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND SYSTEMS FOR SPATIAL SUBTRACTION OF ELECTRON BACKSCATTER...
- Publication number 20240186105
- Publication date Jun 6, 2024
- Katholieke Universiteit Leuven
- Etienne Brodu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20240186103
- Publication date Jun 6, 2024
- Hitachi High-Tech Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
- Publication number 20240128050
- Publication date Apr 18, 2024
- FEI Company
- Yuchen DENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20240021407
- Publication date Jan 18, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
- Publication number 20230411112
- Publication date Dec 21, 2023
- Integrated Dynamic Electron Solutions, Inc.
- Ruth Shewmon BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230395350
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Patrick Trimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
- Publication number 20230314348
- Publication date Oct 5, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Byron Freelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230298853
- Publication date Sep 21, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS METHOD, COMPUTER PROGRAM PRODUCT AND SAMP...
- Publication number 20230178333
- Publication date Jun 8, 2023
- CARL ZEISS MICROSCOPY GMBH
- Bruno Linn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING
- Publication number 20230145436
- Publication date May 11, 2023
- DIRECT ELECTRON, LP
- Benjamin BAMMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun, Charged Particle Beam System, and Lock Nut
- Publication number 20230126658
- Publication date Apr 27, 2023
- Hitachi High-Tech Corporation
- Teruaki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM ARRAY GEOMETRY OPTIMIZER FOR MULTI-BEAM INSPECTION SYSTEM
- Publication number 20230086984
- Publication date Mar 23, 2023
- ASML NETHERLANDS B.V.
- Te-Yu CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230020957
- Publication date Jan 19, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
- Publication number 20220406561
- Publication date Dec 22, 2022
- Integrated Dynamic Electron Solutions, Inc.
- Ruth Shewmon BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
- Publication number 20220336185
- Publication date Oct 20, 2022
- Integrated Dynamic Electron Solutions, Inc.
- Ruth Shewmon BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR
- Publication number 20220268715
- Publication date Aug 25, 2022
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20220115205
- Publication date Apr 14, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, APPARATUS AND METHODS FOR FORMING METAL STRIPS INTO DIES
- Publication number 20220044051
- Publication date Feb 10, 2022
- Ontario Die International Inc.
- Tin To Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...
- Publication number 20210313137
- Publication date Oct 7, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR ELECTRONIC INSPECTION DEVICE
- Publication number 20210313138
- Publication date Oct 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Masahiro YAMAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration reduction in multipass electron microscopy
- Publication number 20210217578
- Publication date Jul 15, 2021
- The Board of Trustees of the Leland Stanford Junior University
- Mark A. KASEVICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210193433
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ALIGNMENT OF CATHODOLUMINESCENCE OPTICS
- Publication number 20210125807
- Publication date Apr 29, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20210042943
- Publication date Feb 11, 2021
- Shimadzu Corporation
- Ryuta MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
- Publication number 20210005420
- Publication date Jan 7, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20200411282
- Publication date Dec 31, 2020
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...
- Publication number 20200319452
- Publication date Oct 8, 2020
- HAMAMATSU PHOTONICS K. K.
- Akira TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS

Reflection microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Arbitrary electron dose waveforms for electron microscopy

Crystal defect observation method for compound semiconductor

Method and system for generating a diffraction image

System and method for preparation and delivery of biological sample...

Arbitrary electron dose waveforms for electron microscopy

Method and system for generating a diffraction image

Particle beam system and method for the particle-optical examinatio...

Electron beam device

Arbitrary electron dose waveforms for electron microscopy

Aberration reduction in multipass electron microscopy

Apparatus of plural charged-particle beams

Method of controlling transmission electron microscope and transmis...

Electron gun and electron beam application device

System and method for preparation and delivery of biological sample...

System and method for alignment of cathodoluminescence optics

Packaging of semiconductor X-ray detectors

System for electron diffraction analysis

Methods and systems for acquiring electron backscatter diffraction...

Particle beam system and method for the particle-optical examinatio...

Method and system for zone axis alignment

Holography reconstruction method and program

Interferometric electron microscope

Electron channeling pattern acquisition from small crystalline areas

Mirror device, mirror drive method, light irradiation device, and i...

Particle beam device, observation method, and diffraction grating

Method of acquiring holograms by off-axis electron holography in pr...

Electron microscope and specimen tilt angle adjustment method

System and method for photocathode illumination inspection

Apparatus of plural charged-particle beams

Electron diffraction imaging system for determining molecular struc...

Patents Applicationslast 30 patents

System and Method for Fully Integrated Microcrystal Electron Diffra...

CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS

DEVICES AND SYSTEMS FOR SPATIAL SUBTRACTION OF ELECTRON BACKSCATTER...

Transmission Electron Microscope

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

ANALYSIS SYSTEM, ANALYSIS METHOD, COMPUTER PROGRAM PRODUCT AND SAMP...

METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING

Charged Particle Gun, Charged Particle Beam System, and Lock Nut

BEAM ARRAY GEOMETRY OPTIMIZER FOR MULTI-BEAM INSPECTION SYSTEM

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY

ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY

CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

SYSTEMS, APPARATUS AND METHODS FOR FORMING METAL STRIPS INTO DIES

PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...

MIRROR ELECTRONIC INSPECTION DEVICE

Aberration reduction in multipass electron microscopy

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

SYSTEM AND METHOD FOR ALIGNMENT OF CATHODOLUMINESCENCE OPTICS

SCANNING ELECTRON MICROSCOPE

METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...