Refractivity Phase-affecting properties

Industry

CPC
G01N21/41

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/41Refractivity Phase-affecting properties

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Biological component measurement apparatus
- Patent number 12,222,288
- Issue date Feb 11, 2025
- Mitsubishi Electric Corporation
- Yuki Tsuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber multi-parameter sensing system and method
- Patent number 12,222,286
- Issue date Feb 11, 2025
- Wenzhou University
- Zhihong Li
- G01 - MEASURING TESTING
Information Patent Grant
Biosensor device
- Patent number 12,203,860
- Issue date Jan 21, 2025
- Electronics and Telecommunications Research Institute
- Jin Tae Kim
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system
- Patent number 12,196,550
- Issue date Jan 14, 2025
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for controlling a production system for planar or...
- Patent number 12,157,263
- Issue date Dec 3, 2024
- Sikora AG
- Harald Sikora
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Cell imaging systems and methods
- Patent number 12,140,538
- Issue date Nov 12, 2024
- Georgia Tech Research Corporation
- Francisco Robles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of imaging a sample material
- Patent number 12,135,282
- Issue date Nov 5, 2024
- The University of Western Australia
- Vincent Patrick Wallace
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement chip, measuring device and measuring method
- Patent number 12,123,831
- Issue date Oct 22, 2024
- Furuno Electric Co., Ltd.
- Keiji Tada
- G01 - MEASURING TESTING
Information Patent Grant
Biological component measurement apparatus
- Patent number 12,111,256
- Issue date Oct 8, 2024
- Mitsubishi Electric Corporation
- Shusaku Hayashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for measuring optical constants of thin film of fluorine-con...
- Patent number 12,105,018
- Issue date Oct 1, 2024
- Shin-Etsu Chemical Co., Ltd.
- Takashi Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device
- Patent number 12,092,582
- Issue date Sep 17, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the refractive-index profile of a cylindrica...
- Patent number 12,085,506
- Issue date Sep 10, 2024
- Heraeus Quarzglas GmbH & Co. KG
- Maximilian Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Prescriptive analytics in highly collinear response space
- Patent number 12,074,073
- Issue date Aug 27, 2024
- Applied Materials, Inc.
- Sidharth Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for obtaining wellbore pressure measurements
- Patent number 12,066,342
- Issue date Aug 20, 2024
- Ziebel AS
- Neil Gardner
- E21 - EARTH DRILLING MINING
Information Patent Grant
Temperature adjustment stage
- Patent number 12,036,558
- Issue date Jul 16, 2024
- Otsuka Pharmaceutical Co., Ltd.
- Koji Miyazaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis threshold generation device and analysis threshold generat...
- Patent number 12,007,387
- Issue date Jun 11, 2024
- JVCKENWOOD CORPORATION
- Atsushi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Differential refractive index measurement method, measurement devic...
- Patent number 12,000,812
- Issue date Jun 4, 2024
- Jasco Corporation
- Tomohiro Moteki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Observation apparatus, optical deflection unit, and image formation...
- Patent number 11,982,617
- Issue date May 14, 2024
- EVIDENT CORPORATION
- Tadashi Hirata
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Data acquisition apparatus
- Patent number 11,965,830
- Issue date Apr 23, 2024
- EVIDENT CORPORATION
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Deflection-type refractometer with extended measurement range
- Patent number 11,953,476
- Issue date Apr 9, 2024
- Polymer Characterization, S.A.
- Alberto Ortin Sebastian
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating sulfur component concentration in gasoline
- Patent number 11,933,725
- Issue date Mar 19, 2024
- Toyota Jidosha Kabushiki Kaisha
- Akihiro Honda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis threshold determination device and analysis threshold dete...
- Patent number 11,927,521
- Issue date Mar 12, 2024
- JVCKENWOOD CORPORATION
- Atsushi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Pressure compensated Venturi dispensing system
- Patent number 11,891,741
- Issue date Feb 6, 2024
- Delaware Capital Formation, Inc.
- Terry Tincher
- G01 - MEASURING TESTING
Information Patent Grant
System for reconstructing and outputting a structure of an estimati...
- Patent number 11,867,624
- Issue date Jan 9, 2024
- EVIDENT CORPORATION
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Nanoplasmonic instrumentation, materials, methods and system integr...
- Patent number 11,867,597
- Issue date Jan 9, 2024
- OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Nikhil Bhalla
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Apparatus and method for dynamic characterization of materials
- Patent number 11,860,088
- Issue date Jan 2, 2024
- San Diego State University (SDSU) Foundation
- George Youssef
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring phase of extreme ultraviolet (EU...
- Patent number 11,852,583
- Issue date Dec 26, 2023
- Samsung Electronics Co., Ltd.
- Jongju Park
- G01 - MEASURING TESTING
Information Patent Grant
Biological material measuring apparatus
- Patent number 11,832,942
- Issue date Dec 5, 2023
- Mitsubishi Electric Corporation
- Kosuke Shinohara
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test system and method for the mutual solubility of biomass-based b...
- Patent number 11,828,706
- Issue date Nov 28, 2023
- HENAN ACADEMY OF SCIENCES INSTITUTE OF ENERGY CO., LTD.
- Tingzhou Lei
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring three-dimensional refractive ind...
- Patent number 11,821,834
- Issue date Nov 21, 2023
- TOMOCUBE, INC.
- Yongkeun Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION METHOD, EVALUATION DEVICE, AND INFORMATION PROCESSING PR...
- Publication number 20250052678
- Publication date Feb 13, 2025
- Hamamatsu Photonics K.K.
- Kozo TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT CHIP, MEASURING DEVICE AND MEASURING METHOD
- Publication number 20250012718
- Publication date Jan 9, 2025
- Furuno Electric Co., Ltd.
- Keiji TADA
- G01 - MEASURING TESTING
Information Patent Application
CELL IMAGING SYSTEMS AND METHODS
- Publication number 20240426749
- Publication date Dec 26, 2024
- Georgia Tech Research Corporation
- Francisco Robles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
- Publication number 20240410825
- Publication date Dec 12, 2024
- Hamamatsu Photonics K.K.
- Osamu YASUHIKO
- G01 - MEASURING TESTING
Information Patent Application
MOLECULAR DIFFUSION EVALUATION METHOD AND SYSTEM
- Publication number 20240402081
- Publication date Dec 5, 2024
- Nippon Telegraph and Telephone Corporation
- Tomomi Murai
- G01 - MEASURING TESTING
Information Patent Application
DETECTION TUBE, DETECTION SYSTEM AND OPTICAL DETECTION METHOD FOR P...
- Publication number 20240402080
- Publication date Dec 5, 2024
- SKYLA Corporation
- Chua-Zu Huang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR CHIP, OPTICAL SENSOR SYSTEM, AND MEASUREMENT METHOD
- Publication number 20240402082
- Publication date Dec 5, 2024
- Mitsubishi Electric Corporation
- Akihiro FUJIE
- G01 - MEASURING TESTING
Information Patent Application
Bead-based analysis of a sample
- Publication number 20240385184
- Publication date Nov 21, 2024
- Alentic Microscience Inc.
- Alan Marc Fine
- G01 - MEASURING TESTING
Information Patent Application
ULTRA LOW-NA REFRACTIVE INDEX PROFILING SYSTEM AND METHOD FOR FILTE...
- Publication number 20240369479
- Publication date Nov 7, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE REFRACTIVE INDEX OF A SURFACE...
- Publication number 20240369480
- Publication date Nov 7, 2024
- Sikora AG
- Harald Sikora
- G01 - MEASURING TESTING
Information Patent Application
PRESCRIPTIVE ANALYTICS IN HIGHLY COLLINEAR RESPONSE SPACE
- Publication number 20240355687
- Publication date Oct 24, 2024
- Applied Materials, Inc.
- Sidharth Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ELEMENT AND OPTICAL SENSOR
- Publication number 20240319420
- Publication date Sep 26, 2024
- FUJIFILM CORPORATION
- Yukito SAITOH
- G01 - MEASURING TESTING
Information Patent Application
Automated Photography and Inspection Station
- Publication number 20240319107
- Publication date Sep 26, 2024
- M & G Jewelers, Inc.
- Michael Insalago
- G01 - MEASURING TESTING
Information Patent Application
ON-THE-FLY MEASUREMENT OF SUBSTRATE STRUCTURES
- Publication number 20240321649
- Publication date Sep 26, 2024
- Applied Materials, Inc.
- Amikam Sade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SENSOR AND METHOD OF FABRICATING THE OPTICAL SENSOR
- Publication number 20240302273
- Publication date Sep 12, 2024
- KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
- Khurram Karim QURESHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS
- Publication number 20240280504
- Publication date Aug 22, 2024
- Heuft Systemtechnik GmbH
- Bernhard HEUFT
- G01 - MEASURING TESTING
Information Patent Application
Method for Accumulating Microscopic Objects, and Method for Detecti...
- Publication number 20240272157
- Publication date Aug 15, 2024
- University Public Corporation Osaka
- Takuya Iida
- G01 - MEASURING TESTING
Information Patent Application
REFRACTOMETER AND METHOD FOR MEASURING REFRACTIVE INDEX
- Publication number 20240241046
- Publication date Jul 18, 2024
- SHENZHEN DIGITIZING FLUID TECHNOLOGY CO., LTD.
- Ti PENG
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE COMPENSATED VENTURI DISPENSING SYSTEM
- Publication number 20240200255
- Publication date Jun 20, 2024
- Delaware Capital Formation, Inc.
- Terry Tincher
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
BIOSENSOR AND CELL MANIPULATION METHOD
- Publication number 20240165611
- Publication date May 23, 2024
- VisEra Technologies Company Limited
- Hsin-Yi HSIEH
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR DETERMINING THE PHASE AND/OR REFRACTIVE INDEX OF A REGIO...
- Publication number 20240133805
- Publication date Apr 25, 2024
- CARL ZEISS MICROSCOPY GMBH
- Dirk SEIDEL
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR PRISM-BASED ANALYTICAL INSTRUMENTS
- Publication number 20240118201
- Publication date Apr 11, 2024
- Mainline Scientific LLC
- Yousheng MAO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT AND OPTICAL SENSOR
- Publication number 20240085320
- Publication date Mar 14, 2024
- FUJIFILM CORPORATION
- Yukito SAITOH
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD USING SURFACE SCANNING PATTERN/PROTOCOL BASED ON...
- Publication number 20240085691
- Publication date Mar 14, 2024
- IZMIR BIYOTIP VE GENOM MERKEZI
- Serhat TOZBURUN
- G02 - OPTICS
Information Patent Application
TRANSFORMER LIFETIME EVALUATION APPARATUS AND METHOD
- Publication number 20240077415
- Publication date Mar 7, 2024
- LS ELECTRIC CO., LTD.
- Jae-Hun YOON
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF AND A SYSTEM FOR DETERMINING A PARAMETER OF A FLUID
- Publication number 20240077418
- Publication date Mar 7, 2024
- Radiometer Medical ApS
- Thomas KJAER
- G01 - MEASURING TESTING
Information Patent Application
A REFRACTOMETER
- Publication number 20240068940
- Publication date Feb 29, 2024
- KXS TECHNOLOGIES OY
- Harri SALO
- G01 - MEASURING TESTING
Information Patent Application
PLANAR WAVEGUIDE-BASED OPTOFLUIDIC SENSOR AND USE THEREOF
- Publication number 20240044789
- Publication date Feb 8, 2024
- NATIONAL CHUNG CHENG UNIVERSITY
- GUO-EN CHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE, A SYSTEM AND A METHOD FOR ANALYSIS OF A LIQUID IN A MIXTURE...
- Publication number 20240035964
- Publication date Feb 1, 2024
- Stichting IMEC Nederland
- Mark ZENTILE
- G01 - MEASURING TESTING

Refractivity Phase-affecting properties

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Biological component measurement apparatus

Optical fiber multi-parameter sensing system and method

Biosensor device

Optical measurement system

Method and device for controlling a production system for planar or...

Cell imaging systems and methods

Method of imaging a sample material

Measurement chip, measuring device and measuring method

Biological component measurement apparatus

Method for measuring optical constants of thin film of fluorine-con...

Optical inspection device

Method for determining the refractive-index profile of a cylindrica...

Prescriptive analytics in highly collinear response space

Apparatus for obtaining wellbore pressure measurements

Temperature adjustment stage

Analysis threshold generation device and analysis threshold generat...

Differential refractive index measurement method, measurement devic...

Observation apparatus, optical deflection unit, and image formation...

Data acquisition apparatus

Deflection-type refractometer with extended measurement range

Method for estimating sulfur component concentration in gasoline

Analysis threshold determination device and analysis threshold dete...

Pressure compensated Venturi dispensing system

System for reconstructing and outputting a structure of an estimati...

Nanoplasmonic instrumentation, materials, methods and system integr...

Apparatus and method for dynamic characterization of materials

Apparatus and method for measuring phase of extreme ultraviolet (EU...

Biological material measuring apparatus

Test system and method for the mutual solubility of biomass-based b...

Method and apparatus for measuring three-dimensional refractive ind...

Patents Applicationslast 30 patents

EVALUATION METHOD, EVALUATION DEVICE, AND INFORMATION PROCESSING PR...

MEASUREMENT CHIP, MEASURING DEVICE AND MEASURING METHOD

CELL IMAGING SYSTEMS AND METHODS

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

OBSERVATION DEVICE AND OBSERVATION METHOD

MOLECULAR DIFFUSION EVALUATION METHOD AND SYSTEM

DETECTION TUBE, DETECTION SYSTEM AND OPTICAL DETECTION METHOD FOR P...

OPTICAL SENSOR CHIP, OPTICAL SENSOR SYSTEM, AND MEASUREMENT METHOD

Bead-based analysis of a sample

ULTRA LOW-NA REFRACTIVE INDEX PROFILING SYSTEM AND METHOD FOR FILTE...

METHOD AND DEVICE FOR DETERMINING THE REFRACTIVE INDEX OF A SURFACE...

PRESCRIPTIVE ANALYTICS IN HIGHLY COLLINEAR RESPONSE SPACE

OPTICAL ELEMENT AND OPTICAL SENSOR

Automated Photography and Inspection Station

ON-THE-FLY MEASUREMENT OF SUBSTRATE STRUCTURES

OPTICAL SENSOR AND METHOD OF FABRICATING THE OPTICAL SENSOR

METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS

Method for Accumulating Microscopic Objects, and Method for Detecti...

REFRACTOMETER AND METHOD FOR MEASURING REFRACTIVE INDEX

PRESSURE COMPENSATED VENTURI DISPENSING SYSTEM

BIOSENSOR AND CELL MANIPULATION METHOD

METHOD FOR DETERMINING THE PHASE AND/OR REFRACTIVE INDEX OF A REGIO...

SAMPLE HOLDER FOR PRISM-BASED ANALYTICAL INSTRUMENTS

OPTICAL ELEMENT AND OPTICAL SENSOR

SYSTEM AND METHOD USING SURFACE SCANNING PATTERN/PROTOCOL BASED ON...

TRANSFORMER LIFETIME EVALUATION APPARATUS AND METHOD

A METHOD OF AND A SYSTEM FOR DETERMINING A PARAMETER OF A FLUID

A REFRACTOMETER

PLANAR WAVEGUIDE-BASED OPTOFLUIDIC SENSOR AND USE THEREOF

PROBE, A SYSTEM AND A METHOD FOR ANALYSIS OF A LIQUID IN A MIXTURE...