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residual life, life expectancy
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CPC
G01N2223/632
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/632
residual life, life expectancy
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for evaluating rotor-mast fatigue damage
Patent number
11,738,887
Issue date
Aug 29, 2023
Textron Innovations Inc.
Steve Cates
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Analysis of antimicrobial coatings using XRF
Patent number
11,442,032
Issue date
Sep 13, 2022
SRFC BIO, INC.
Parham Asgari
G01 - MEASURING TESTING
Information
Patent Grant
Analysis of antimicrobial coatings using XRF
Patent number
11,029,266
Issue date
Jun 8, 2021
ALLIED BIOSCIENCE, INC.
Parham Asgari
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for materials analysis
Patent number
10,458,929
Issue date
Oct 29, 2019
United Technologies Corporation
Iuliana Cernatescu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for materials analysis
Patent number
10,161,887
Issue date
Dec 25, 2018
United Technologies Corporation
Iuliana Cernatescu
G01 - MEASURING TESTING
Information
Patent Grant
Deterioration analyzing method
Patent number
9,851,342
Issue date
Dec 26, 2017
Sumitomo Rubber Industries, Ltd.
Fusae Kaneko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection method for bearing part and inspection apparatus for bea...
Patent number
9,702,834
Issue date
Jul 11, 2017
NTN Corporation
Takumi Fujita
G01 - MEASURING TESTING
Information
Patent Grant
X-Ray diffraction apparatus
Patent number
4,426,718
Issue date
Jan 17, 1984
Hitachi, Ltd.
Makoto Hayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANALYSIS OF ANTIMICROBIAL COATINGS USING XRF
Publication number
20210239630
Publication date
Aug 5, 2021
Allied Bioscience, Inc.
Parham Asgari
G01 - MEASURING TESTING
Information
Patent Application
DISTRIBUTED SENSOR NETWORK FOR NONDESTRUCTIVELY MONITORING AND INSP...
Publication number
20190234888
Publication date
Aug 1, 2019
GENERAL ELECTRIC COMPANY
Ehsan DEHGHAN NIRI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MATERIALS ANALYSIS
Publication number
20190086343
Publication date
Mar 21, 2019
United Technologies Corporation
luliana Cernatescu
G01 - MEASURING TESTING
Information
Patent Application
DETERIORATION ANALYZING METHOD
Publication number
20140349407
Publication date
Nov 27, 2014
Fusae Kaneko
G01 - MEASURING TESTING