Response verification devices

Industry

CPC
G11C29/38

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/38Response verification devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Storage system of key-value store which executes retrieval in proce...
- Patent number 12,166,862
- Issue date Dec 10, 2024
- Kioxia Corporation
- Kazuhiro Hiwada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Granular voltage tuning
- Patent number 12,158,814
- Issue date Dec 3, 2024
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems configured to perform test mode operations for multipl...
- Patent number 12,159,681
- Issue date Dec 3, 2024
- SK hynix Inc.
- Sang Ah Hyun
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in memory tests for aircraft processing systems
- Patent number 12,154,642
- Issue date Nov 26, 2024
- Hamilton Sundstrand Corporation
- Christopher Brian Noll
- G11 - INFORMATION STORAGE
Information Patent Grant
At-speed synchronous write-through operation for testing two-port m...
- Patent number 12,148,490
- Issue date Nov 19, 2024
- Synopsys, Inc.
- Harold Pilo
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for parallel memory test
- Patent number 12,142,337
- Issue date Nov 12, 2024
- Texas Instruments Incorporated
- Nitesh Mishra
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array test method and system
- Patent number 12,125,548
- Issue date Oct 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Hao Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Output circuitry for non-volatile memory array in neural network
- Patent number 12,112,798
- Issue date Oct 8, 2024
- Silicon Storage Technology, Inc.
- Farnood Merrikh Bayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single event effect mitigation with smart-redundancy
- Patent number 12,112,820
- Issue date Oct 8, 2024
- University of Utah Research Foundation
- Aurelien Alacchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing a memory circuit and memory circuit
- Patent number 12,106,814
- Issue date Oct 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chao-I Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive threshold for bad flash memory blocks
- Patent number 12,087,382
- Issue date Sep 10, 2024
- PURE STORAGE, INC.
- Matthew D. Fleming
- G11 - INFORMATION STORAGE
Information Patent Grant
Summing circuit for neural network
- Patent number 12,057,160
- Issue date Aug 6, 2024
- Silicon Storage Technology, Inc.
- Farnood Merrikh Bayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test access port architecture to facilitate multiple testing modes
- Patent number 12,057,183
- Issue date Aug 6, 2024
- Micron Technology, Inc.
- Michael Richard Spica
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for conducting built-in self-test of memory macro
- Patent number 12,033,710
- Issue date Jul 9, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ted Wong
- G11 - INFORMATION STORAGE
Information Patent Grant
ATPG testing method for latch based memories, for area reduction
- Patent number 12,020,760
- Issue date Jun 25, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory fault handling method and apparatus, device, and storage medium
- Patent number 12,014,791
- Issue date Jun 18, 2024
- Huawei Technologies Co., Ltd.
- Guangyi Qiao
- G11 - INFORMATION STORAGE
Information Patent Grant
Devices and methods for safe mode of operation in event of memory c...
- Patent number 12,001,288
- Issue date Jun 4, 2024
- QUALCOMM Incorporated
- Kunal Desai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Peak power management connectivity check in a memory device
- Patent number 11,990,197
- Issue date May 21, 2024
- Micron Technology, Inc.
- Eleuterio Mannella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Redundant circuit assigning method and device, and medium
- Patent number 11,984,179
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for evaluating integrity of adjacent sub blocks...
- Patent number 11,984,181
- Issue date May 14, 2024
- Western Digital Technologies, Inc.
- Srinivasan Seetharaman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Verification of a weight stored in a non-volatile memory cell in a...
- Patent number 11,972,795
- Issue date Apr 30, 2024
- Silicon Storage Technology, Inc.
- Farnood Merrikh Bayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for extending lifetime of memory device
- Patent number 11,972,826
- Issue date Apr 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yung-Huei Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Repair circuit, memory, and repair method
- Patent number 11,972,828
- Issue date Apr 30, 2024
- Changxin Memory Technologies, Inc.
- Liang Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with error per row counter (EpRC) performing error ch...
- Patent number 11,972,789
- Issue date Apr 30, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zequn Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for testing multicore SSD firmware based on preco...
- Patent number 11,967,391
- Issue date Apr 23, 2024
- SK Hynix Inc.
- Yahor Zaitsau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Formal verification tool to verify hardware design of memory unit
- Patent number 11,948,652
- Issue date Apr 2, 2024
- Imagination Technologies Limited
- Ashish Darbari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for tuning an external memory interface
- Patent number 11,935,613
- Issue date Mar 19, 2024
- Texas Instruments Incorporated
- Zachary John Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for recovery for memory systems and memory systems employin...
- Patent number 11,929,133
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- Rachael Skreen
- G11 - INFORMATION STORAGE
Information Patent Grant
Recovery management of retired super management units
- Patent number 11,929,138
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- Jian Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device and method of detecting wordline defect o...
- Patent number 11,915,773
- Issue date Feb 27, 2024
- Samsung Electronics Co., Ltd.
- Kyunghae Lee
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE THRESHOLDS FOR MANAGING FLASH MEMORY
- Publication number 20240420792
- Publication date Dec 19, 2024
- PURE STORAGE, INC.
- Matthew D. Fleming
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
- Publication number 20240412800
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Jui-Chung HSU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF TESTING A MEMORY CIRCUIT AND MEMORY CIRCUIT
- Publication number 20240386982
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-I WU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CIRCUIT
- Publication number 20240355406
- Publication date Oct 24, 2024
- SOCIONEXT INC.
- Tatsushi OTSUKA
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO
- Publication number 20240321377
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ted Wong
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND...
- Publication number 20240312551
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Anil Kavala
- G11 - INFORMATION STORAGE
Information Patent Application
ATPG TESTING METHOD FOR LATCH BASED MEMORIES, FOR AREA REDUCTION
- Publication number 20240296899
- Publication date Sep 5, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan SRINIVASAN
- G11 - INFORMATION STORAGE
Information Patent Application
PEAK POWER MANAGEMENT CONNECTIVITY CHECK IN A MEMORY DEVICE
- Publication number 20240257892
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Eleuterio Mannella
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR EXTENDING LIFETIME OF MEMORY DEVICE
- Publication number 20240249792
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yung-Huei Lee
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE
- Publication number 20240233855
- Publication date Jul 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Zachary John BROWN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNOLOGIES FOR DYNAMIC ACCELERATOR SELECTION
- Publication number 20240195605
- Publication date Jun 13, 2024
- Intel Corporation
- Francesc Guim Bernat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION OF SOFT BIT WINDOWS BASED ON SIGNAL AND NOISE CHARACTE...
- Publication number 20240185915
- Publication date Jun 6, 2024
- Micron Technology, Inc.
- James Fitzpatrick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR RECOVERY FOR MEMORY SYSTEMS AND MEMORY SYSTEMS EMPLOYIN...
- Publication number 20240185941
- Publication date Jun 6, 2024
- Micron Technology, Inc.
- Rachael Skreen
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPL...
- Publication number 20240161851
- Publication date May 16, 2024
- SK HYNIX INC.
- Sang Ah HYUN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM, MEMORY CONTROLLER AND METHOD FOR OPERATING MEMORY SY...
- Publication number 20240153576
- Publication date May 9, 2024
- SK HYNIX INC.
- Seong Chan KIM
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF TESTING STORAGE CONTROLLER INCLUDED IN STORAGE DEVICE
- Publication number 20240153575
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Jongyeong JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY
- Publication number 20240087664
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE
Information Patent Application
READ-ONLY MEMORY DIAGNOSIS AND REPAIR
- Publication number 20240087665
- Publication date Mar 14, 2024
- Siemens Industry Software Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNOLOGIES FOR ALLOCATING RESOURCES ACROSS DATA CENTERS
- Publication number 20230421358
- Publication date Dec 28, 2023
- Intel Corporation
- Anjaneya Reddy CHAGAM REDDY
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
MEMORY CHIP TEST METHOD AND APPARATUS, MEDIUM, AND DEVICE
- Publication number 20230410929
- Publication date Dec 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Beiyou ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNOLOGIES FOR MANAGING A FLEXIBLE HOST INTERFACE OF A NETWORK IN...
- Publication number 20230412365
- Publication date Dec 21, 2023
- Intel Corporation
- Thomas E. Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PARALLEL MEMORY TEST
- Publication number 20230402124
- Publication date Dec 14, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Nitesh MISHRA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICES, OPERATING METHODS OF THE MEMORY DEVICES, AND TEST S...
- Publication number 20230377669
- Publication date Nov 23, 2023
- Samsung Electronics Co., Ltd.
- Wonyoung Choi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ARRAY TEST METHOD AND SYSTEM
- Publication number 20230377670
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hao HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF TESTING A MEMORY CIRCUIT AND MEMORY CIRCUIT
- Publication number 20230377671
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-I WU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL METHOD, SEMICONDUCTOR MEMORY, AND ELECTRONIC DEVICE
- Publication number 20230307082
- Publication date Sep 28, 2023
- ChangXin Memory Technologies, Inc.
- YOONJOO EOM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND METHOD FOR OPERATING SAID MEMORY DEVICE
- Publication number 20230267999
- Publication date Aug 24, 2023
- INFINEON TECHNOLOGIES AG
- Thomas Kern
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE OF NON-VOLATILE MEMORY CELLS
- Publication number 20230259738
- Publication date Aug 17, 2023
- Silicon Storage Technology, Inc.
- Hieu Van Tran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Scanning An Image Using Non-volatile Memory Array Neural...
- Publication number 20230252265
- Publication date Aug 10, 2023
- Silicon Storage Technology, Inc.
- Farnood Merrikh Bayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE SYSTEM OF KEY-VALUE STORE WHICH EXECUTES RETRIEVAL IN PROCE...
- Publication number 20230254128
- Publication date Aug 10, 2023
- KIOXIA Corporation
- Kazuhiro HIWADA
- G06 - COMPUTING CALCULATING COUNTING

Response verification devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Storage system of key-value store which executes retrieval in proce...

Granular voltage tuning

Test systems configured to perform test mode operations for multipl...

Built-in memory tests for aircraft processing systems

At-speed synchronous write-through operation for testing two-port m...

System and method for parallel memory test

Memory array test method and system

Output circuitry for non-volatile memory array in neural network

Single event effect mitigation with smart-redundancy

Method of testing a memory circuit and memory circuit

Adaptive threshold for bad flash memory blocks

Summing circuit for neural network

Test access port architecture to facilitate multiple testing modes

System and method for conducting built-in self-test of memory macro

ATPG testing method for latch based memories, for area reduction

Memory fault handling method and apparatus, device, and storage medium

Devices and methods for safe mode of operation in event of memory c...

Peak power management connectivity check in a memory device

Redundant circuit assigning method and device, and medium

Systems and methods for evaluating integrity of adjacent sub blocks...

Verification of a weight stored in a non-volatile memory cell in a...

System and method for extending lifetime of memory device

Repair circuit, memory, and repair method

Memory device with error per row counter (EpRC) performing error ch...

System and method for testing multicore SSD firmware based on preco...

Formal verification tool to verify hardware design of memory unit

Method for tuning an external memory interface

Methods for recovery for memory systems and memory systems employin...

Recovery management of retired super management units

Nonvolatile memory device and method of detecting wordline defect o...

Patents Applicationslast 30 patents

MULTIPLE THRESHOLDS FOR MANAGING FLASH MEMORY

SYSTEM AND METHOD FOR TESTING MEMORY DEVICE

METHOD OF TESTING A MEMORY CIRCUIT AND MEMORY CIRCUIT

MEMORY CIRCUIT

SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO

NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND...

ATPG TESTING METHOD FOR LATCH BASED MEMORIES, FOR AREA REDUCTION

PEAK POWER MANAGEMENT CONNECTIVITY CHECK IN A MEMORY DEVICE

SYSTEM AND METHOD FOR EXTENDING LIFETIME OF MEMORY DEVICE

METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE

TECHNOLOGIES FOR DYNAMIC ACCELERATOR SELECTION

OPTIMIZATION OF SOFT BIT WINDOWS BASED ON SIGNAL AND NOISE CHARACTE...

METHODS FOR RECOVERY FOR MEMORY SYSTEMS AND MEMORY SYSTEMS EMPLOYIN...

TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPL...

MEMORY SYSTEM, MEMORY CONTROLLER AND METHOD FOR OPERATING MEMORY SY...

METHOD OF TESTING STORAGE CONTROLLER INCLUDED IN STORAGE DEVICE

BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY

READ-ONLY MEMORY DIAGNOSIS AND REPAIR

TECHNOLOGIES FOR ALLOCATING RESOURCES ACROSS DATA CENTERS

MEMORY CHIP TEST METHOD AND APPARATUS, MEDIUM, AND DEVICE

TECHNOLOGIES FOR MANAGING A FLEXIBLE HOST INTERFACE OF A NETWORK IN...

SYSTEM AND METHOD FOR PARALLEL MEMORY TEST

MEMORY DEVICES, OPERATING METHODS OF THE MEMORY DEVICES, AND TEST S...

MEMORY ARRAY TEST METHOD AND SYSTEM

METHOD OF TESTING A MEMORY CIRCUIT AND MEMORY CIRCUIT

CONTROL METHOD, SEMICONDUCTOR MEMORY, AND ELECTRONIC DEVICE

MEMORY DEVICE AND METHOD FOR OPERATING SAID MEMORY DEVICE

MEMORY DEVICE OF NON-VOLATILE MEMORY CELLS

Method Of Scanning An Image Using Non-volatile Memory Array Neural...

STORAGE SYSTEM OF KEY-VALUE STORE WHICH EXECUTES RETRIEVAL IN PROCE...