Scanning by mechanical motion of stage

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CPC
G01N2201/103

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/103Scanning by mechanical motion of stage

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multiple superposition detection system and method for capacitor ap...
- Patent number 12,352,700
- Issue date Jul 8, 2025
- Zhaoqing University
- Rongrong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for multicolor imaging
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- Issue date Mar 11, 2025
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-modal imaging systems and methods
- Patent number 12,184,037
- Issue date Dec 31, 2024
- LI-COR BIOTECH, LLC
- Andrew Ragatz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,044,627
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaya Yamamoto
- G02 - OPTICS
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,808,563
- Issue date Nov 7, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measuring device and method for controlling focus and progr...
- Patent number 11,781,996
- Issue date Oct 10, 2023
- AUROS TECHNOLOGY, INC.
- Ji-Hoon Kang
- G01 - MEASURING TESTING
Information Patent Grant
Process tool and an inspection method
- Patent number 11,720,032
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Raphael Nico Johan Stegen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for multicolor imaging
- Patent number 11,686,681
- Issue date Jun 27, 2023
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,473,903
- Issue date Oct 18, 2022
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Scanning scatterometry overlay measurement
- Patent number 11,428,642
- Issue date Aug 30, 2022
- KLA Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for multicolor imaging
- Patent number 11,415,515
- Issue date Aug 16, 2022
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- G02 - OPTICS
Information Patent Grant
Apparatus and method for fluorescence molecular tomography
- Patent number 11,206,982
- Issue date Dec 28, 2021
- BOE Technology Group Co., Ltd.
- Guohe Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spectral imaging apparatus and methods
- Patent number 10,962,478
- Issue date Mar 30, 2021
- AXON DX, LLC
- Philip R. Couch
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 10,928,188
- Issue date Feb 23, 2021
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Far-field optical super-resolution microscopy method
- Patent number 10,900,895
- Issue date Jan 26, 2021
- South China University of Technology
- Feng Li
- G01 - MEASURING TESTING
Information Patent Grant
Transmission Raman spectroscopy
- Patent number 10,876,894
- Issue date Dec 29, 2020
- Renishaw plc
- Timothy Smith
- G02 - OPTICS
Information Patent Grant
Reducing measurement variation to optical measuring of sample material
- Patent number 10,794,832
- Issue date Oct 6, 2020
- Wallac OY
- Ville Laitala
- G01 - MEASURING TESTING
Information Patent Grant
Image capture for large analyte arrays
- Patent number 10,788,423
- Issue date Sep 29, 2020
- Bio-Rad Laboratories, Inc.
- John Barich
- G01 - MEASURING TESTING
Information Patent Grant
Weld scanner for real-life bridge and scanning method thereof
- Patent number 10,788,432
- Issue date Sep 29, 2020
- HOHAI UNIVERSITY
- Zhongqiu Fu
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus and software for detection and localization of hi...
- Patent number 10,753,862
- Issue date Aug 25, 2020
- STICHTING HET NEDERLANDS KANKER INSTITUUT-ANTONI VAN LEEUWENHOEK ZIEKENHUIS
- Theodoor Jacques Marie Ruers
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Skinning of ceramic honeycomb bodies
- Patent number 10,744,675
- Issue date Aug 18, 2020
- Corning Incorporated
- Joseph Henry Citriniti
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and device for high throughput imaging
- Patent number 10,732,113
- Issue date Aug 4, 2020
- SINGLE TECHNOLOGIES AB
- Raoul Stubbe
- G01 - MEASURING TESTING
Information Patent Grant
Illumination unit for digital pathology scanning
- Patent number 10,663,710
- Issue date May 26, 2020
- Koninklijke Philips N.V.
- Marius Iosif Boamfa
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high speed FOD detection
- Patent number 10,639,680
- Issue date May 5, 2020
- The Boeing Company
- Morteza Safai
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
DNA sequencing with reagent recycling on wiregrid
- Patent number 10,564,104
- Issue date Feb 18, 2020
- Koninklijke Philips N.V.
- Reinhold Wimberger-Friedl
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Image capture for large analyte arrays
- Patent number 10,564,098
- Issue date Feb 18, 2020
- Bio-Rad Laboratories, Inc.
- John Barich
- G02 - OPTICS
Information Patent Grant
System and method for high speed FOD detection
- Patent number 10,335,838
- Issue date Jul 2, 2019
- The Boeing Company
- Morteza Safai
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 10,274,310
- Issue date Apr 30, 2019
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Magnet assisted stage for vibration and heat reduction in wafer sca...
- Patent number 10,077,865
- Issue date Sep 18, 2018
- The Regents of the University of Michigan
- Chinedum E. Okwudire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system based on modulation of line structured laser image...
- Patent number 9,909,997
- Issue date Mar 6, 2018
- Luoyang Landglass Technology Co., Ltd
- Yanbing Li
- C03 - GLASS MINERAL OR SLAG WOOL

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20250237615
- Publication date Jul 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MULTICOLOR IMAGING
- Publication number 20250172498
- Publication date May 29, 2025
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...
- Publication number 20240369498
- Publication date Nov 7, 2024
- Republic of Korea (National Forensic Service Director Ministry of the Interio...
- Kyu Young LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...
- Publication number 20240280506
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Elad EIZNER
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTE...
- Publication number 20240280500
- Publication date Aug 22, 2024
- NuFlare Technology, Inc.
- Ryoichi HIRANO
- G01 - MEASURING TESTING
Information Patent Application
System and method for optical mapping of semiconductor wafers at cr...
- Publication number 20240201105
- Publication date Jun 20, 2024
- Epir, Inc.
- Issac L. Chang
- G01 - MEASURING TESTING
Information Patent Application
LASER INDUCED BREAKDOWN SPECTROSCOPY FOR GEOLOGICAL ANALYSIS
- Publication number 20240167961
- Publication date May 23, 2024
- Enersoft Inc.
- Grant I. SANDEN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20240096667
- Publication date Mar 21, 2024
- Hitachi High-Tech Corporation
- Hiromichi YAMAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAVITY ENHANCED OPTICAL MICROSCOPY
- Publication number 20240044788
- Publication date Feb 8, 2024
- Ludwig-Maximilians-Universitaet Munich
- Thomas Huemmer
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20240019243
- Publication date Jan 18, 2024
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SENSOR FOR TESTING VALUE DOCUMENTS
- Publication number 20230316842
- Publication date Oct 5, 2023
- GIESECKE+DEVRIENT CURRENCY TECHNOLOGY GMBH
- Wolfgang RAUSCHER
- G07 - CHECKING-DEVICES
Information Patent Application
SYSTEMS AND METHODS FOR MULTICOLOR IMAGING
- Publication number 20230280274
- Publication date Sep 7, 2023
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- G01 - MEASURING TESTING
Information Patent Application
EDGE PORTION MEASURING APPARATUS AND METHOD FOR MEASURING EDGE PORTION
- Publication number 20230258577
- Publication date Aug 17, 2023
- Shin-Etsu Handotai Co., Ltd.
- Shigeru Oba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hybrid Optical Parametrically-Oscillating Emitter
- Publication number 20230194412
- Publication date Jun 22, 2023
- Versitech Limited
- Kenneth Kin Yip WONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20230184681
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Satoshi YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ASSESSING THE QUALITY OF A COMPONENT OF OPTICAL MATERIAL
- Publication number 20230087046
- Publication date Mar 23, 2023
- SCHOTT AG
- Thomas Korb
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20230003515
- Publication date Jan 5, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MULTICOLOR IMAGING
- Publication number 20220334062
- Publication date Oct 20, 2022
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20220317058
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Masaya YAMAMOTO
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR MULTICOLOR IMAGING
- Publication number 20220214278
- Publication date Jul 7, 2022
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCANNING SCATTEROMETRY OVERLAY MEASUREMENT
- Publication number 20220214285
- Publication date Jul 7, 2022
- KLA Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPE WITH SPATIAL IMAGING AND BEAM HOMOGENIZER
- Publication number 20220206280
- Publication date Jun 30, 2022
- Q-STATE BIOSCIENCES, INC.
- Christopher Werley
- G01 - MEASURING TESTING
Information Patent Application
A PROCESS TOOL AND AN INSPECTION METHOD
- Publication number 20210349397
- Publication date Nov 11, 2021
- ASML NETHERLANDS B.V.
- Raphael Nico Johan STEGEN
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20210131797
- Publication date May 6, 2021
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
Multiplexed Single Molecule Analyzer
- Publication number 20200249164
- Publication date Aug 6, 2020
- NOVILUX, LLC
- Richard Livingston
- G01 - MEASURING TESTING
Information Patent Application
FAR-FIELD OPTICAL SUPER-RESOLUTION MICROSCOPY METHOD
- Publication number 20200025682
- Publication date Jan 23, 2020
- SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- Feng LI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL IMAGING APPARATUS AND METHODS
- Publication number 20200018702
- Publication date Jan 16, 2020
- AXON DX, LLC
- Philip R. COUCH
- G01 - MEASURING TESTING
Information Patent Application
WELD SCANNER FOR REAL-LIFE BRIDGE AND SCANNING METHOD THEREOF
- Publication number 20190331610
- Publication date Oct 31, 2019
- HOHAI UNIVERSITY
- Zhongqiu Fu
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPY APPARATUS AND METHODS
- Publication number 20190226995
- Publication date Jul 25, 2019
- RENISHAW PLC
- Thomas Anthony MASON
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20190212132
- Publication date Jul 11, 2019
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING

Scanning by mechanical motion of stage

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiple superposition detection system and method for capacitor ap...

Systems and methods for multicolor imaging

Multi-modal imaging systems and methods

Defect inspection device and defect inspection method

Surface sensing systems and methods for imaging a scanned surface o...

Overlay measuring device and method for controlling focus and progr...

Process tool and an inspection method

Systems and methods for multicolor imaging

Surface sensing systems and methods for imaging a scanned surface o...

Scanning scatterometry overlay measurement

Systems and methods for multicolor imaging

Apparatus and method for fluorescence molecular tomography

Spectral imaging apparatus and methods

Surface sensing systems and methods for imaging a scanned surface o...

Far-field optical super-resolution microscopy method

Transmission Raman spectroscopy

Reducing measurement variation to optical measuring of sample material

Image capture for large analyte arrays

Weld scanner for real-life bridge and scanning method thereof

Method, apparatus and software for detection and localization of hi...

Skinning of ceramic honeycomb bodies

Method and device for high throughput imaging

Illumination unit for digital pathology scanning

System and method for high speed FOD detection

DNA sequencing with reagent recycling on wiregrid

Image capture for large analyte arrays

System and method for high speed FOD detection

Surface sensing systems and methods for imaging a scanned surface o...

Magnet assisted stage for vibration and heat reduction in wafer sca...

Detection system based on modulation of line structured laser image...

Patents Applicationslast 30 patents

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

SYSTEMS AND METHODS FOR MULTICOLOR IMAGING

WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...

OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...

ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTE...

System and method for optical mapping of semiconductor wafers at cr...

LASER INDUCED BREAKDOWN SPECTROSCOPY FOR GEOLOGICAL ANALYSIS

DEFECT INSPECTION DEVICE

CAVITY ENHANCED OPTICAL MICROSCOPY

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

METHOD AND SENSOR FOR TESTING VALUE DOCUMENTS

SYSTEMS AND METHODS FOR MULTICOLOR IMAGING

EDGE PORTION MEASURING APPARATUS AND METHOD FOR MEASURING EDGE PORTION

Hybrid Optical Parametrically-Oscillating Emitter

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

METHOD FOR ASSESSING THE QUALITY OF A COMPONENT OF OPTICAL MATERIAL

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

SYSTEMS AND METHODS FOR MULTICOLOR IMAGING

Defect Inspection Device and Defect Inspection Method

SYSTEMS AND METHODS FOR MULTICOLOR IMAGING

SCANNING SCATTEROMETRY OVERLAY MEASUREMENT

MICROSCOPE WITH SPATIAL IMAGING AND BEAM HOMOGENIZER

A PROCESS TOOL AND AN INSPECTION METHOD

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

Multiplexed Single Molecule Analyzer

FAR-FIELD OPTICAL SUPER-RESOLUTION MICROSCOPY METHOD

SPECTRAL IMAGING APPARATUS AND METHODS

WELD SCANNER FOR REAL-LIFE BRIDGE AND SCANNING METHOD THEREOF

SPECTROSCOPY APPARATUS AND METHODS

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...